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Class 451/36 - Utilizing fluent abradant


Subclass of Class 451 - Abrading
Definition: Method utilizing an unbonded particulate mass through or
No. of patents: 932
Last issue date: 05/01/2012


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NumberTitleIssue Date
6957511Single-step electromechanical mechanical polishing on Ni-P plated discs
Beginning with a smooth ground aluminum blank with a relatively thin layer of leveled Ni—P, circumferential electropolishing/texturing is carried out to achieve a smooth oriented surface. A conductive slurry is provided between the disc and a porous texturing tape...
10/25/2005
6957900Glass reflector for projector and manufacturing method for the same
For example, the reflector according to the present invention is a reflector made of glass for a projector which is composed of amorphous glass whose thermal expansion coefficient is 30 to 45×10−7/° C. and includes a reflective surface for reflecting ...
10/25/2005
6955586CMP composition and process
The present invention provides a chemical metal polishing (CMP) method with improved flexibility and improved processing window, especially as it relates to the chemical aspect of CMP technology. Broadly speaking, the invention has two aspects: according to one aspe...
10/18/2005
6955589Delivery system for magnetorheological fluid
A magnetorheological fluid delivery system includes a mixing and tempering vessel. Fluid is admitted to the vessel via a plurality of tangential ports, creating a mixing of the fluid in the vessel and promoting homogeneity. Fluid may be reconstituted in the vessel b...
10/18/2005
6953387Method and apparatus for measuring flow rate through and polishing a workpiece orifice
A method and apparatus for comparing the flow rate through an orifice within a master part with the orifice within a workpiece by subjecting each orifice to an identical fluid at an identical temperature, under an identical pressure, and comparing the downstream pre...
10/11/2005
6953489Capsulated abrasive composition and polishing pad using the same
Capsulated abrasive compositions and a polishing pad using the same. More specifically, a polishing pad coated with compositions, which contain a capsulated abrasive, thereby used for planarizing interlayer insulating film formed on a semiconductor substrate by chem...
10/11/2005
6953391Methods for reducing slurry usage in a linear chemical mechanical planarization system
Methods for dispensing slurry in a linear chemical mechanical planarization (CMP) system are provided. One method involves the use of a pulsing flow of slurry instead of a continuous flow of slurry. Another method involves spraying a mist of slurry onto the polishin...
10/11/2005
6953389Metal CMP slurry compositions that favor mechanical removal of oxides with reduced susceptibility to micro-scratching
Metal CMP slurry compositions having relatively low chemical etch rate and relatively high mechanical polishing rate characteristics are provided. The relatively high mechanical polishing rate characteristics are achieved using relatively high concentrations of mech...
10/11/2005
6951597Dynamic polishing fluid delivery system for a rotational polishing apparatus
Methods and apparatus are provided for performing a chemical-mechanical process on a workpiece surface. The apparatus includes a platen having a top surface and at least one inlet configured to receive a polishing fluid, a plurality of holes formed in the top surfac...
10/04/2005
6951695High surface quality GaN wafer and method of fabricating same
AlxGayInzN, wherein 0≦x≦1, 0≦y≦1, 0≦z≦1, and x+y+z=1, characterized by a root mean square surface roughness of less than 1 nm in a 10×10 μm2 area. The AlxGayInzN may be in the...
10/04/2005
6945851CMP formulations
CMP formulations for use on nickel/phosphorus alloys comprising abrasive particles and an oxidant, a modifier for the action of the oxidant and first and second accelerants to sequester removed materials containing phosphonate and ammonium or amine groups respective...
09/20/2005
6947862Method for simulating slurry flow for a grooved polishing pad
A method for determining the flow of a fluid (60) in a gap (64) between a pad (48) and a substrate (12) includes the step of utilizing a hybrid Navier-Stokes/lubrication formulation to calculate the flow of the fluid (60) in the ga...
09/20/2005
6945855Method and apparatus for cleaning a web-based chemical mechanical planarization system
A method and apparatus for cleaning a web-based chemical-mechanical planarization (CMP) system. Specifically, a fluid spray bar is coupled to a frame assembly which may be mounted on a CMP system. The fluid spray bar will move along the frame assembly. As the fluid ...
09/20/2005
6939204Abrasive machine and method of abrading work piece
The abrasive machine is capable of feeding a proper amount of slurry and preventing a work piece from sticking on an upper abrasive plate. The abrasive machine comprises: the upper abrasive plate abrading an upper face of the work piece and having a plurality of slu...
09/06/2005
6939210Slurry delivery arm
A polishing fluid delivery apparatus has been provided that in one embodiment includes a support member, a dispense arm, a polishing fluid delivery tube and a variable restricting device. The dispense arm extends from an upper portion of the support member and has a...
09/06/2005
6935928Chemical mechanical polishing aqueous dispersion and chemical mechanical polishing method
A chemical mechanical polishing aqueous dispersion comprises a component (A) composed of abrasive grains, a component (B) composed of at least one of quinolinecarboxylic acid and pyridinecarboxylic acid, a component (C) composed of an organic acid other than quinoli...
08/30/2005
6935932Polishing apparatus and method
A polishing apparatus and method has a function of polishing a surface of a film formed on a substrate to a flat mirror finish and a function of polishing unnecessary metal film such as copper film deposited on an outer peripheral portion of the substrate to remove ...
08/30/2005
6935927Blasting method for deburring junction part between main bore and branch bore
A method of a blast process for a junction part between a large-diameter main bore tubularly drilled through an article and a small-diameter branch bore branching off at an angle from the main bore inside the article. A pillar-shaped rod is inserted from a first ope...
08/30/2005
6935013Apparatus and method for precise lapping of recessed and protruding elements in a workpiece
A lapping method utilizing textured and conditioned lapping plates most suitable for finishing magnetic heads resulting in improved surface quality, less sensitivity to electrical shorts due to smears, and reduced surface height difference between the head elements ...
08/30/2005
6935926System and method for reducing surface defects in integrated circuits
The fabrication of integrated circuits entails the repeated application of many basic processing steps, for instance, planarization—the process of making a surface flat, or planar. One specific technique for making surfaces flat is chemical-mechanical planarizatio...
08/30/2005
6936133Method and apparatus for fixed abrasive substrate preparation and use in a cluster CMP tool
A method of creating and using a polishing substrate having a coating layer is described. The method that includes providing a substrate having one or more predetermined patterns disposed on a surface of the substrate and coating the surface of the substrate with an...
08/30/2005
6932679Apparatus and method for loading a wafer in polishing system
The present invention includes a polishing pad or belt secured to a mechanism that allows the pad or belt to move in a reciprocating manner, i.e. in both forward and reverse directions, at high speeds. The constant bidirectional movement of the polishing pad or belt...
08/23/2005
6929532Method and apparatus for filtering a chemical polishing slurry of a wafer fabrication process
A polishing slurry supply circuit for a semiconductor wafer fabrication process includes a tangential flow filter. The tangential flow filter is positioned upstream of a wafer polishing apparatus. The tangential flow filter may take the form of a hollow fiber filter...
08/16/2005
6929533Methods for enhancing within-wafer CMP uniformity
A method for enhancing uniformity in the polishing profile of a substrate during chemical mechanical polishing. According to a first embodiment, the method is adapted for a rotary-type chemical mechanical polisher and includes dispensing the polishing slurry onto th...
08/16/2005
6926584Dual mode hybrid control and method for CMP slurry
A DMHC (dual mode hybrid control) system and method which facilitates enhanced control in the delivery of polishing slurry to a CMP (chemical mechanical polishing) apparatus. The DMHC comprises a linear table and a PID (proportional integrated differential) controll...
08/09/2005
6926587CMP apparatus, CMP polishing method, semiconductor device and its manufacturing method
A CMP apparatus is provided for polishing wafers that are substrates to be polished by CMP. The CMP apparatus comprises a stage that is structured to be rotatable and holds a wafer to be polished, a polishing head holding section that holds a polishing head equipped...
08/09/2005
6926597Intermediate lens pad
An intermediate lens pad having a side secured to curved surface of a lens tool when the pad is in use. The pad has a surface on its other side which is substantially smooth, but which is formed with a multiplicity of substantially uniformly distributed holes or rec...
08/09/2005
6921455Device for polishing outer peripheral edge of semiconductor wafer
A polishing machine for a peripheral edge of a semiconductor wafer comprises a rotary mechanism 2 which rotates a stack 1 of semiconductor wafers 4 mounted thereon, and a polishing mechanism 3 which is arranged to be movable in the radial...
07/26/2005
6918824Uniform fluid distribution and exhaust system for a chemical-mechanical planarization device
An assembly for a chemical-mechanical polishing process includes a platen having an outer edge, a top surface, and at least one inlet for introducing fluid to the top surface; a manifold system, entrenched in the top surface and in communication with the at least on...
07/19/2005
6918937Abrasive polishing composition
The present invention is based on the practice of abrasive machining with no sealed working chamber by the employment of a visco-elastic abrasive medium, behaving predominantly as an elastic solid at the applied strain of the orbital working motion, and applying orb...
07/19/2005
6919276Method to reduce dishing and erosion in a CMP process
A CMP process for selectively polishing an overlying material layer with an underlying layer comprising at least one material in a semiconductor device fabrication process including providing a semiconductor wafer process surface including a first material layer ove...
07/19/2005
6918301Methods and systems to detect defects in an end effector for conditioning polishing pads used in polishing micro-device workpieces
Methods and systems to detect defects in an end effector for conditioning polishing pads used in polishing micro-device workpieces are disclosed herein. In one embodiment, a method of detecting defects in an end effector includes applying energy to a contact element...
07/19/2005
6918818Polishing method
In a method for the machine polishing of workpieces, the workpiece is immersed into a container filled with abrasive and is moved relative to the abrasive container. The workpiece is here moved up and down in the vertical direction, rotated about its own central axi...
07/19/2005
6918819Method for defect reduction
A method of removing at least one particle from a substrate is disclosed comprising polishing a metallized layer over the substrate using a slurry to remove a portion of the metallized layer and polishing the substrate using the slurry to remove a portion of a barri...
07/19/2005
6916227Method and apparatus for processing sliders for use in disk drives and the like
A system and method are described for processing a slider (e.g., one to be used in a disk drive apparatus). Corners of the sliders are abraded while still a part of a row of sliders in a part-off operation. By abrading the corners of the sliders, head slap events be...
07/12/2005
6916742Modular barrier removal polishing slurry
An aqueous slurry is useful for chemical mechanical planarizing a semiconductor substrate. The slurry includes by weight percent, 0.1 to 25 oxidizing agent, 0.1 to 20 silica particles having an average particle size of less than 200 nm, 0.005 to 0.8 polyvinyl pyrrol...
07/12/2005
6916226Chemical mechanical polishing apparatus having a stepped retaining ring and method for use thereof
A chemical mechanical processing apparatus includes a polishing pad capable of polishing a substrate; a stepped retaining having an inner side, a bottom side, and an open region, the open region extending radially outward from the inner side and upward from the bott...
07/12/2005
6913528Low amplitude, high speed polisher and method
A method and apparatus for improving uniformity of the rate of removal of material from the surface of a workpiece, such as semiconductor substrate, by polishing. In accordance with the invention, the workpiece is subjected to a vibratory polishing method, and optio...
07/05/2005
6913523Method for controlling pH during planarization and cleaning of microelectronic substrates
A method and apparatus for processing a microelectronic substrate. In one embodiment, the method can include planarizing the microelectronic substrate with a planarizing liquid and rinsing the substrate with a rinsing liquid having a pH approximately the same as a p...
07/05/2005
6910951Materials and methods for chemical-mechanical planarization
Provided are materials and methods for the chemical mechanical planarization of material layers such as oxide or metal formed on semiconductor substrates during the manufacture of semiconductor devices using a fixed abrasive planarization pad having an open cell foa...
06/28/2005
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