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Class 427/255.18 - Silicon containing coating


Subclass of Class 427 - Coating processes
Definition: Process wherein the base is coated with a material which
No. of patents: 314
Last issue date: 10/28/2008


1                
NumberTitleIssue Date
7442412Hydrophobic coating for oxide surfaces
The disclosure relates to hydrophobic coatings for oxidized surfaces and methods of producing the same. Such coatings may be produced by applying a compound of the general formula AXn or A(R1)mXn to an oxidized surface fol...
10/28/2008
7425350Apparatus, precursors and deposition methods for silicon-containing materials
A method for making a Si-containing material comprises transporting a pyrolyzed Si-precursor to a substrate and polymerizing the pyrolyzed Si-precursor on the substrate to form a Si-containing film. Polymerization of the pyrolyzed Si-precursor may be carried out in ...
09/16/2008
7396783Fibrous structure and absorbent article comprising said fibrous structure
A fibrous structure testable in a series of run-off tests, wherein each run-off test includes exposing the fibrous structure to a volume of a test solution and the fibrous structure initially is hydrophobic and has been treated to be hydrophilic, wherein the fibrous...
07/08/2008
7384665Formation of protective coatings for color filters
A structure and method for producing color filters with a protective silation layer is described. In one embodiment, each filter is coated with a silation layer to prevent bleeding of material between closely spaced filters during the fabrication process. In a secon...
06/10/2008
7358197Method for avoiding polysilicon film over etch abnormal
The method for avoiding polysilicon film over etch abnormal includes cleaning a semiconductor substrate. A dielectric layer is formed on the substrate. Subsequently, a first silicon source gas at a first flow rate is next performed injecting into a reaction chamber ...
04/15/2008
7329716Siloxane oligomers by phase transfer catalysis
A process for forming a siloxane oligomer from a mixture comprising at least one alkoxysilane, at least one phase transfer catalyst having a specified structure, and water is described. ...
02/12/2008
7299657Method of making high strain point glass
A method of forming a glass sheet includes obtaining a preform generated from a glass composition and conveying the preform through a channel having a temperature that decreases along a length of the channel to form a glass sheet having a predetermined width and thi...
11/27/2007
7294583Methods for the use of alkoxysilanol precursors for vapor deposition of SiOfilms
A method for depositing conformal dielectric films uses alkoxy silanol or silanediol precursors and oxidizing and/or hydrolyzing agents. The method produces a material with liquid-like flow properties capable of achieving improved high aspect ratio gap fill more eff...
11/13/2007
7265427Semiconductor apparatus and method of manufacturing the semiconductor apparatus
A semiconductor apparatus wherein a device formed on a semiconductor substrate comprises a gate insulating film including a high dielectric constant film formed on the substrate and an anti-reaction film formed on the high dielectric constant film, and a gate electr...
09/04/2007
7265064Semiconductor device with porous interlayer insulating film
In a method of manufacturing a semiconductor device, semiconductor circuit elements or wiring patterns are formed on a semiconductor substrate then, a porous semiconductor oxide film is formed as an interlayer insulating film on the semiconductor substrate including...
09/04/2007
7252860Process for producing a high temperature stable fiber reinforced ceramic
A process is disclosed for producing a high temperature stable fiber composite ceramic by chemical vapor infiltration (CVI) with a silicon carbide precursor in a suitable carrier gas on carbon fiber preforms or silicon carbide fiber preforms. This process is charact...
08/07/2007
7208427Precursor compositions and processes for MOCVD of barrier materials in semiconductor manufacturing
Metalorganic precursors of the formula: (R1R2N)a−bMXb wherein: M is the precursor metal center, selected from the group of Ta, Ti, W, Nb, Si, Al and B; a is a number equal to the valence of M; 1≦bâ‰...
04/24/2007
7201937Methods for forming composite coatings on MEMS devices
The present invention provides unique methods of coating and novel coatings for MEMS devices. In general a two step process includes the coating of a first silane onto a substrate surface followed by a second treatment with or without a second silane and elevated te...
04/10/2007
7192888Low selectivity deposition methods
A deposition method includes forming a nucleation layer over a substrate, forming a layer of a first substance at least one monolayer thick chemisorbed on the nucleation layer, and forming a layer of a second substance at least one monolayer thick chemisorbed on the...
03/20/2007
7189431Method for forming a passivated metal layer
A method for forming a passivated metal layer that preserves the properties and morphology of an underlying metal layer during subsequent exposure to oxygen-containing ambients. The method includes providing a substrate in a process chamber, exposing the substrate t...
03/13/2007
7182122Heating and cooling apparatus, and vacuum processing apparatus equipped with this apparatus
A heating and cooling apparatus with which batch processing is possible and throughput can be increased, and furthermore which is more compact and uses less energy. A substrate heating chamber and a substrate cooling chamber each capable of simultaneously holding a ...
02/27/2007
7153584Hybrid film, antireflection film comprising it, optical product, and method for restoring the defogging property of hybrid film
Hybrid films, such as those having good abrasion-resistance and defogging properties, antireflection films including it, optical products, and methods for restoring the defogging property of the hybrid films are disclosed. The hybrid films having a defogging propert...
12/26/2006
7153544Method of manufacturing transparent electro-conductive film
A touch panel includes a transparent electro-conductive film. The transparent electro-conductive film comprises a primary layer formed on a polymer film, and a transparent electro-conductive thin film or a multi-lamination film composed of at least one metal-compoun...
12/26/2006
7145285Piezoelectric element, fabrication method for the same, and inkjet head, inkjet recording apparatus and angular velocity sensor including the same
A piezoelectric element includes a first electrode; a piezoelectric layered film composed of a first piezoelectric film formed on the first electrode film and a second piezoelectric film that is formed on the first piezoelectric film and is controlled in crystal ori...
12/05/2006
7135418Optimal operation of conformal silica deposition reactors
Methods of forming conformal films that reduce the amount of metal-containing precursor and/or silicon containing precursor materials required are described. The methods increase the amount of film grown following each dose of metal-containing and/or silicon-contain...
11/14/2006
7129563Method of fabricating a semiconductor device comprising a gate dielectric made of high dielectric permittivity material
A process and a device for fabricating a semiconductor device having a gate dielectric made of high-k material, includes a step of depositing, directly on the gate dielectric, a first layer of Si1−xGex, where 0.5
10/31/2006
7125758Controlling the properties and uniformity of a silicon nitride film by controlling the film forming precursors
We have developed a method of PECVD depositing a-SiNx:H films which are useful in a TFT device as gate dielectric and passivation layers, when a series of TFT devices are arrayed over a substrate having a surface area larger than about 1 m2, wh...
10/24/2006
7109129Optimal operation of conformal silica deposition reactors
Methods of forming conformal films that reduce the amount of metal-containing precursor and/or silicon containing precursor materials required are described. The methods increase the amount of film grown following each dose of metal-containing and/or silicon-contain...
09/19/2006
7101591Production method for copolymer film, copolymer film produced by the forming method and semiconductor device using copolymer film
This invention provides a process for producing an organic polymer film whereby when using it as an interlayer insulating film in a semiconductor device, the film exhibits higher adhesiveness at its interfaces where other semiconductor materials are in contact with ...
09/05/2006
7097878Mixed alkoxy precursors and methods of their use for rapid vapor deposition of SiOfilms
A method employing rapid vapor deposition (RVD) deposits a dielectric material on small features of a substrate surface. The resulting dielectric film is thicker, faster growing, shows better gap fill performance and has improved film properties compared to films re...
08/29/2006
7070833Method for chemical vapor deposition of silicon on to substrates for use in corrosive and vacuum environments
A method of passivating the surface of a substrate to protect the surface against corrosion, the surface effects on a vacuum environment, or both. The substrate surface is placed in a treatment environment and is first dehydrated and then the environment is evacuate...
07/04/2006
7071094Dual layer barrier film techniques to prevent resist poisoning
Provided is a process for forming a barrier film to prevent resist poisoning in a semiconductor device by depositing a second nitrogen-free barrier layer on top of a first barrier layer containing nitrogen. A low-k dielectric layer is formed over the second barrier ...
07/04/2006
7056806Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces
The present disclosure provides methods and apparatus useful in depositing materials on batches of microfeature workpieces. One implementation provides a method in which a quantity of a first precursor gas is introduced to an enclosure at a first enclosure pressure....
06/06/2006
7055236Joining method for high-purity ceramic parts
A method for joining high-purity ceramic parts useful as parts for semi-conductor production apparatus, in particular, ceramic jigs used in the production of semi-conductors. Two related joining methods are described. First, high purity ceramic parts made of silicon...
06/06/2006
7053010Methods of depositing silicon dioxide comprising layers in the fabrication of integrated circuitry, methods of forming trench isolation, and methods of forming arrays of memory cells
This invention includes methods of depositing silicon dioxide comprising layers in the fabrication of integrated circuitry, methods of forming trench isolation, and methods of forming bit line over capacitor arrays of memory cells. In one implementation, a semicondu...
05/30/2006
7045170Anti-stiction coating for microelectromechanical devices
A method for depositing an anti-stiction coating on a MEMS device comprises reacting the vapor of an amino-functionalized silane precursor with a silicon surface of the MEMS device in a vacuum chamber. The method can further comprise cleaning the silicon surface of ...
05/16/2006
7037803Manufacture of semiconductor device having STI and semiconductor device manufactured
A semiconductor device manufacture method has the steps of: (a) forming a polishing stopper layer over a semiconductor substrate; (b) etching the semiconductor substrate to form a trench; (c) forming a first liner insulating layer of silicon oxide over the surface o...
05/02/2006
7015061Low temperature curable materials for optical applications
The invention relates to low temperature curable spin-on glass materials which are useful for electronic applications, such as optical devices. A substantially crack-free and substantially void-free silicon polymer film is produced by (a) preparing a composition com...
03/21/2006
7005160Methods for depositing polycrystalline films with engineered grain structures
Methods for controlling the grain structure of a polycrystalline Si-containing film involve depositing the film in stages so that the morphology of a first film layer deposited in an initial stage favorably influences the morphology of a second film layer deposited ...
02/28/2006
6998153Suppression of NiSiformation in a nickel salicide process using a pre-silicide nitrogen plasma
A method that includes placing a wafer within a process chamber, generating a nitrogen plasma that is remote from the process chamber, nitriding a surface of the wafer with the nitrogen plasma, depositing a nickel film over the nitrided silicon substrate surface, an...
02/14/2006
6971165Method for fabrication of separators for electrode pairs in diodes
An improved method for manufacturing a matching pair of electrodes comprises the steps of: fabricating a first electrode with a substantially flat surface; depositing islands of an oxidizable material over regions of the surface; depositing a layer of a third materi...
12/06/2005
6967040Method of treating cured rubber
A curable rubber composition comprising a curable organopolysiloxane or perfluoropolyether group-containing organosilicon compound, a curing agent, and a silica filler having a mean particle size of 0.001-10 μm is cured into a cured rubber. For improving compressio...
11/22/2005
6962732Process for controlling thin film uniformity and products produced thereby
Processes for controlling thickness uniformity of thin organosilicate films as they are deposited on a substrate, and as they finally result. During deposition of the film, which may be accomplished by CVD, PECVD, rapid thermal processing or the like, the substrate ...
11/08/2005
6962859Thin films and method of making them
Thin, smooth silicon-containing films are prepared by deposition methods that utilize a silicon-containing precursor. In preferred embodiments, the methods result in Si-containing films that are continuous and have a thickness of about 150 â„« or less, a surface rou...
11/08/2005
6962727Organosiloxanes
The present invention provides an organosiloxane comprising at least 80 weight percent of Formula 1: [Y0.01-1.0SiO1.5-2]a{Z0.01-1.0SiO1.5-2]b[H0.01-1.0SiO1.5-2]c (wher...
11/08/2005
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