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| Number | Title | Issue Date |
| 4641329 | Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus A fixture is provided for supporting and aligning small samples of material on a goniometer for X-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the X-ray beam by selectively adjusting the fixture to posit... | 02/03/1987 |
| 4637041 | Kinematic X-ray analyses apparatus In an X-ray analysis apparatus, a moving mechanism is provided by a main guide member along which a main slide device can be displaced. Rotatably connected with the main slide device is a detector guide member along which a detection slide device is displ... | 01/13/1987 |
| 4534050 | X-ray goniometer An X-ray goniometer is provided which comprises, a pair of wooden endplates held in a parallel, adjustably spaced relationship by a plurality of connecting dowel rods, a rotatable support mounted to each endplate, each support being rotatable about a comm... | 08/06/1985 |
| 4528657 | Fluid sample cell for X-ray analysis A cell for introducing fluid to be examined into a radiation path. The cell is constructed of metallic back and face plates, the back plate has a cavity for the fluid while the face plate presents a cavity with a thin layer of metal defining an aperture f... | 07/09/1985 |
| 4409854 | Sample cup with venting means for use in X-ray spectroscopy There is disclosed a sample cup for use in holding a sample for spectrochemical analysis. The sample cup consists of a cell member which is cup shaped and has a closed bottom and an opened top. The top surface of the closed bottom has a recessed section w... | 10/18/1983 |
| 4358854 | Measuring devices for X-ray fluorescence analysis A measuring device for X-ray fluorescence analysis, in which a specimen dosed on a carrier is stimulated by glancing incident radiation and examined spectrometrically by a detector which may be arranged above the specimen. On the upper side of an e.g., b... | 11/09/1982 |
| 4351063 | X-Ray diffraction apparatus Semiconductor crystals for use, for example, in the manufacture of integrated circuits are required to be inspected for crystal lattice perfection before any subsequent circuit processing. This can be done by X-ray diffraction in which the crystal is curv... | 09/21/1982 |
| 4278883 | Sample mount for X-ray diffraction A sample mount assembly for use with an X-ray diffractometer. The assembly includes a holder with an opening extending therethrough, an insert to fit into the holder through its opening, a substrate filter layer, and the exposed sample layer mounted on th... | 07/14/1981 |
| 4151418 | Multiple crystal holder assembly for wavelength dispersive X-ray spectrometers A novel crystal holder for the wavelength dispersive spectrometers of electron microprobes arranges four crystals as a cylinder segment which may be moved to a position in which it partially encompasses the viewing optics assembly so that low Bragg angle ... | 04/24/1979 |
| 4115689 | Leveling device for forming X-ray specimen A leveling apparatus used in conjunction with a specimen holder and plastic film window material to accurately and consistently form a flat, bubble free analysis window on the open face of the specimen holder. The specimen holder in the form of a shallow ... | 09/19/1978 |
| 4078175 | Apparatus for use in examining the lattice of a semiconductor wafer by X-ray diffraction An improved apparatus for examining the crystal lattice of a semiconductor wafer utilizing x-ray diffraction techniques. The apparatus is employed in a method which includes the step of recording the image of a wafer supported in a bent configuration conf... | 03/07/1978 |
| 4037109 | Sample cell A sample cell useful in fluorescent X-ray analytical devices is provided herein, which cell is composed of an inner frame; an inner frame cover and a radiation-permeable sheet which houses the sample to be analyzed and an outer frame which covers the samp... | 07/19/1977 |
| 4027156 | X-ray source safety shutter An apparatus is provided for controlling the activation of a high energy radiation source having a shutter. The apparatus includes magnets and magnetically responsive switches appropriately placed and interconnected so that only with the shutter and other... | 05/31/1977 |
| 3973120 | Specimen holder for an X-ray diffraction apparatus A specimen holder comprising a specimen space to be conditioned for an X-ray diffraction apparatus which is provided with a radiation window which is made of beryllium and which closes an opening in the holder over an arc of 180° in a vacuumtight manner.... | 08/03/1976 |
| 3969623 | Variable temperature flat plate powder diffraction camera A flat-plate camera for X-ray diffraction studies of powdered materials under various conditions of temperature. A spindle assembly is provided for rotating a sample specimen about the longitudinal axis of the sample and such that the axis of an X-ray bea... | 07/13/1976 |
| 3934138 | Apparatus for measuring surface stress by X-ray diffraction An apparatus for measuring stress on the surface of a polycristalline body X-ray diffraction including an X-ray source assembled together with two position-sensitive radiation detectors of known type located symmetrically with respect to the primary X-ray... | 01/20/1976 |
