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Class 378/74 - Topography


Subclass of Class 378 - X-ray or gamma ray systems or devices
Definition: Subject matter including measuring surface features of a
No. of patents: 29
Last issue date: 11/17/2009


NumberTitleIssue Date
7620149Characterization of three-dimensional distribution of defects by X-ray topography
Provided is a method of determining a three-dimensional distribution of structural defects in a single crystal material, the method comprising: (a) disposing a single crystal sample on a holder, the sample being set to a symmetric reflection in the Bragg Geometry; (...
11/17/2009
7466798Digital X-ray camera for quality evaluation three-dimensional topographic reconstruction of single crystals of biological macromolecules
The present invention provides a digital topography imaging system for determining the crystalline structure of a biological macromolecule, wherein the system employs a charge coupled device (CCD) camera with antiblooming circuitry to directly convert x-ray signals ...
12/16/2008
7412131Multilayer optic device and system and method for making same
An optic device, system and method for making are described. The optic device includes a first solid phase layer having a first index of refraction with a first photon transmission property and a second solid phase layer having a second index of refraction with a se...
08/12/2008
7263162Sample mounts for microcrystal crystallography
Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surfac...
08/28/2007
7242745X-ray diffraction screening system convertible between reflection and transmission modes
An X-ray diffraction apparatus provides analysis in either transmission or reflective mode and easy conversion between the two modes. An X-ray source and X-ray detector are each connected to a different circle of a goniometer. The two circles may be rotated independ...
07/10/2007
7236566In-situ X-ray diffraction system using sources and detectors at fixed angular positions
An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation—with a collimating optic disposed with respect to t...
06/26/2007
7231017Lobster eye X-ray imaging system and method of fabrication thereof
A Lobster Eye X-ray Imaging System based on a unique Lobster Eye (LE) structure, X-ray generator, scintillator-based detector and cooled CCD (or Intensified CCD) for real-time, safe, staring Compton backscatter X-ray detection of objects hidden under ground, in cont...
06/12/2007
7149279Detecting unit for X-ray diffraction measurements
Detecting unit comprises position-sensitive detector 1 and collimating system 2, situated in front of its window 19. Collimating system being made in the form of honeycomb structure comprising multitude of tubular channels for transmittance of d...
12/12/2006
7001245Substrate carrier with a textured membrane
A carrier head for a chemical mechanical polishing apparatus includes a membrane with an exterior grooved surface for improved chemical mechanical polishing. The exterior grooved surface provides a path for the flow of air from the portion between the membrane and a...
02/21/2006
6963630Method for evaluating an SOI substrate, evaluation processor, and method for manufacturing a semiconductor device
A method for evaluating an SOI layer on an insulating film disposed on a base substrate so as to construct an SOI substrate, includes: measuring a first diffraction intensity distribution of an X-ray beam corresponding to an incident angle formed with the X-ray beam...
11/08/2005
6920238Precision imaging system
An imaging system is disclosed for use in low-light environments or environments where low-levels of such radiation is desirable. Examples of such environments are night photography, laparoscopy, and mammography. In the case of radiation that is other than visible l...
07/19/2005
6918698Integrated crystal mounting and alignment system for high-throughput biological crystallography
A method and apparatus for the transportation, remote and unattended mounting, and visual alignment and monitoring of protein crystals for synchrotron generated x-ray diffraction analysis. The protein samples are maintained at liquid nitrogen temperatures at all tim...
07/19/2005
6782076X-ray topographic system
An X-ray topographic system comprises an X-ray generator producing a beam of X-rays impinging on a limited area of a sample such as a silicon wafer. A solid state detector is positioned to intercept the beam after transmission through or reflection from the sample. ...
08/24/2004
6775350Method of examining a wafer of semiconductor material by means of X-rays
A method of examining a wafer of crystalline semiconductor material by means of X-rays, in which method a surface of the wafer is scanned by means of an X-ray beam and secondary radiation generated by said X-ray beam is detected. Prior to the examination the surface...
08/10/2004
6678347Method and apparatus for quantitative phase analysis of textured polycrystalline materials
A method for quantitatively determining the phase composition of a sample mixture that comprises two or more textured polycrystalline materials, based on corrected and integrated x-ray diffraction intensities. The effect of texture has been analytically e...
01/13/2004
6090609Crystallized N-terminal domain of influenza virus matrix protein M1 and method of determining and using same
The matrix protein, M1, of influenza virus strain A/PR/8/34 has been purified from virions and crystallized. The crystals consist of a stable fragment (18 Kd) of the M1 protein. X-ray diffraction studies indicated that the crystals have a space group of P...
07/18/2000
5418828Nondestructive method and apparatus for imaging grains in curved surfaces of polycrystalline articles
A nondestructive method, and associated apparatus, are provided for determining the grain flow of the grains in a convex curved, textured polycrystalline surface. The convex, curved surface of a polycrystalline article is aligned in a horizontal x-ray dif...
05/23/1995
5136624Process for inspecting monocrystalline material for precipitation of impurities
In the manufacture and processing of monocrystalline material, it is important to be able to detect and measure deviations from the ideal crystal structure. Data are required on the density and average extent of impurity precipitations. The irradiation of...
08/04/1992
5077767Determining the existence of misorientation in a crystal
A method and apparatus for determining the existence of misorientation in a crystal, comprising irradiating the crystal with X-rays pre-orientating any crystallographic plane of the crystal with respect to the axis of the X-rays, imaging X-rays received f...
12/31/1991
5007071Method of inspecting bonded wafers
A method of inspecting bonded wafers, which involves obtaining a Lang topograph of bonded wafers as a sample by using a Lang camera, or further treating an image thereon, thereby detecting unbonded regions at the interface of the bonded wafers. In bonding...
04/09/1991
4928294Method and apparatus for line-modified asymmetric crystal topography
An improved asymmetric crystal topography x-ray imaging system employing a ine focus horizontal line source of x-rays and a crystal monochromator used in a compression mode. Relatively large horizontal and vertical dimensions of the monochromating crystal ...
05/22/1990
4641329Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus
A fixture is provided for supporting and aligning small samples of material on a goniometer for X-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the X-ray beam by selectively adjusting the fixture to posit...
02/03/1987
4558450Cathode bleed arrangement for electrically excited flowing gas lasers
A high power, electrically excited laser is disclosed wherein a laser gas is caused to flow through an excitation region in which an electric discharge is established along a direction transverse to the direction of flow of the laser gas between an anode ...
12/10/1985
4223219Method of and apparatus for producing texture topograms
A method of and apparatus for producing texture topograms at surface layers of non-amorphous polycrystalline bodies comprises means for producing a divergent beam of monochromatic radiation. The divergent monochromatic radiation beam is diffracted at a po...
09/16/1980
4125770Diamond identification
A method of determining whether a diamond is the same as or different to a known diamond characterized by the steps of producing one or more records of internal defects of the diamond using X-ray topography and comparing the record or records so produced ...
11/14/1978
4078175Apparatus for use in examining the lattice of a semiconductor wafer by X-ray diffraction
An improved apparatus for examining the crystal lattice of a semiconductor wafer utilizing x-ray diffraction techniques. The apparatus is employed in a method which includes the step of recording the image of a wafer supported in a bent configuration conf...
03/07/1978
3992624Apparatus and method of X-ray topography at cryogenic temperature
A method of x-ray topography of crystals at cryogenic temperatures which s not require continuous pumping of the sample chamber during low-temperature operation. The method eliminates the problems of vibrations degrading the high-resolution photographic ...
11/16/1976
3982127Method and apparatus for displaying the internal structure of an object
The pattern of X-rays produced by interaction of a beam of X-rays and a ted object is converted to an optical signal by a fine-grained zinc silicate screen which is viewed by a television camera through a magnifying optical system. The combination of a f...
09/21/1976
3944823X-Ray topograph reproducing apparatus
An X-ray topograph reproducing apparatus is provided whereby the X-ray topograph throughout the total surface of a specimen crystal may be reproduced in positive and rapid succession. The reproduction of the X-ray topograph is effected by providing means ...
03/16/1976
 
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