Bizarre Patents
Decorative Jeweled Wheel Cover
An improved wheel is provided wherein decorative items such as gem stones are embedded in either the wheel surface, a special mounting section attached to the wheel surface, or to a spoke strap that wraps around each spoke and positions embedded gem stones on the outside surface of the spoke.
PatentStorm News
Make the Most of Our Site
See this month's Top Inventors and Most Cited Patents.
Stay on top of the latest innovations by subscribing to an RSS feed.
Registered users: Manage your profile.
| Number | Title | Issue Date |
| 8031346 | Coating evaluation process System and method for evaluating coating thickness variations along a turbine blade contour. In one embodiment, applied to a first region extending 360 degrees about the blade and to a second region including an exposed reference surface, the first region includes a... | 10/04/2011 |
| 7369233 | Optical system for measuring samples using short wavelength radiation In an optical system measuring sample characteristics, by reducing the amount of ambient absorbing gas or gases and moisture present in at least a portion of the illumination and detection paths experienced by vacuum ultraviolet (VUV) radiation used in the measureme... | 05/06/2008 |
| 7283256 | Method and apparatus for measuring wafer thickness A system for non-contact measurement of thickness of a test object. A laser beam is split into two identical directly opposed input beams. A calibration object of known thickness causes beams to be reflected from sides of the test object. Each reflected beam passes ... | 10/16/2007 |
| 7280232 | Method and apparatus for measuring wafer thickness A system for non-contact measurement of thickness of an object. A laser beam is split into two identical input beams that are directly opposed. A calibration object of known thickness causes beams to be reflected from sides of the test object. Each reflected beam pa... | 10/09/2007 |
| 7253889 | Shaft cone metrology system and method Aspects include metrology methods and systems for determining characteristics of conical shaft portions, such as angle of taper. In an example, a metrology system includes a fixture for supporting a workpiece. The fixture provides for translation in a longitudinal d... | 08/07/2007 |
| 7199884 | Thin thickness measurement method and apparatus Techniques for non-contacting thickness or caliper measurements of moving webs or sheets employ a sensor device that includes a first sensor head and a second sensor head that are spaced apart to define a path through which the moving web travels. The sensor device ... | 04/03/2007 |
| 7190826 | Measuring the location of objects arranged on a surface, using multi-camera photogrammetry A method and apparatus for measuring the location of objects arranged on a convex surface. A plurality of cameras is arranged in a stationary array about the surface, and is used to capture images of the objects. A parameterized model of the surface is developed usi... | 03/13/2007 |
| 7179334 | System and method for performing semiconductor processing on substrate being processed A semiconductor process system (10) includes a measuring section (40), an information processing section (51), and a control section (52). The measuring section (40) measures a characteristic of a test target film formed on a targe... | 02/20/2007 |
| 7145662 | Method for measuring thickness of an optical disc A method of measuring thickness of an optical disc by using an interference effect of the optical disc layer is disclosed. The method includes detecting an intensity of a reflective light according to a wavelength of a light as spectrum data for each wavelength, con... | 12/05/2006 |
| 7126699 | Systems and methods for multi-dimensional metrology and/or inspection of a specimen Systems and methods for multi-dimensional metrology and inspection of a specimen such as a bumped wafer are provided. One method includes scanning the specimen with partial oblique illumination to form an image of the structure, either through the normal collection ... | 10/24/2006 |
| 7110912 | Method of applying parametric oscillators to model dielectric functions Methodology for segmentally modeling Real and Imaginary Parts of Optical Constants or Dielectric Functions using Kroneig-Kramer (K-K) Consistant Oscillators with substantially definite start and end points. ... | 09/19/2006 |
| 7078720 | Range finder for measuring three-dimensional geometry of object and method thereof A range finder for measuring a three-dimensional geometry of an object includes a projector unit for projecting the pattern light onto the object, a first image capturing unit for capturing an image reflected from the object, a second image capturing unit for captur... | 07/18/2006 |
| 7039228 | System and method for three-dimensional surface inspection An optical inspection system and method for inspecting a component on a printed circuit board (PCB) which determines three-dimensional information in a single scan. A first visual light source illuminates the PCB surface and component with a green light while a seco... | 05/02/2006 |
| 6975410 | Measuring device A method is provided for measuring the wall thickness of transparent articles using non-collimated and diverging light in the form of a small point source or elongated narrow line of light, measuring the spacial separation of the reflections from the nearest and fur... | 12/13/2005 |
| 6967726 | Means for in-place automated calibration of optically-based thickness sensor The calibration of a laser caliber is described. The laser caliber uses first and second sensors to determine the distance to different sides of a sheet. A third sensor is used to determine the distance between the first and second sensors. The calibration of the fi... | 11/22/2005 |
| 6952270 | Apparatus and methods for surface contour measurements Apparatus and methods of measuring three-dimensional position information of a point on the surface of an object. The invention also relates to an apparatus for projecting fringes onto a surface of an object including two sources of radiation separated by a distance... | 10/04/2005 |
| 6891629 | Method and apparatus for detecting a substrate feature The invention is directed to a method and apparatus for detecting a substrate feature. A sensor is secured opposite the substrate. The sensor emits a signal onto the surface of the substrate. The sensor detects the amount of signal reflected from the substrate. The ... | 05/10/2005 |
| 6743645 | Method of inspecting process for manufacturing semiconductor device and method of manufacturing semiconductor device A method of inspecting a process for manufacturing a semiconductor device, used to determine the status of a processing operation during the manufacturing process, according to the embodiment of the present invention, comprises: detecting an image of a desired area ... | 06/01/2004 |
| 6745136 | Pipe inspection systems and methods A method for inspecting pipe, the method, in at least certain aspects, including detecting an inspection parameter in at least a first part of a pipe, the pipe having a length, a hollow body, an outer surface, and a generally circular pipe wall with an inner diamete... | 06/01/2004 |
| 6714301 | Spectral ellipsometer without chromatic aberrations A spectral ellipsometer includes a light incident optical system for focusing a incidence spot of polarized light of multi-wavelengths onto a sample surface. A detecting optical system receives the reflected light influenced by the sample surface so that the amount ... | 03/30/2004 |
| 6621060 | Autofocus feedback positioning system for laser processing The present invention provides a laser processing and autofocusing system that measures the position of the work-piece at the machining spot, to allow the laser processing of work-pieces which are not flat and have surface variations, with the autofocusin... | 09/16/2003 |
| 6621578 | Elliposometer, sample positioning mechanism, and polarization angular adjusting mechanism, used in the elliposometer An ellipsometer, which detects polarization of light successively reflected from a reference sample and an objective sample to study the objective sample, comprises first and second sample holder units for holding first and second samples, a beam projecti... | 09/16/2003 |
| 6618689 | Method for the non-destructive inspection of wall strength A method for non-destructively inspecting the wall thickness of a component, where the dimensions of the component or of the component surface are measured, substantially without making any contact, and are described by digital data. In accordance with th... | 09/09/2003 |
| 6597463 | System to determine suitability of sion arc surface for DUV resist patterning A system and method are disclosed for providing in-situ monitoring of an oxidized ARC layer disposed over an ARC layer. By monitoring the thickness of the oxidized portion of the ARC layer during semiconductor processing, one or more process control param... | 07/22/2003 |
| 6549293 | Apparatus for process for measuring the thickness and out-of-roundness of elongate workpieces The invention relates to an apparatus and process for measuring the diameter and out-of-roundness of elongate workpieces, particularly those of round products advanced in their longitudinal direction in rolling mill trains. A reliable discrimination of or... | 04/15/2003 |
| 6501555 | Optical technique to detect etch process termination The disclosure describes an exemplary method of detecting a process end point during etching in the fabrication of an integrated circuit. This method can include receiving a reference signal indicative of an intensity of a light source, collecting a refle... | 12/31/2002 |
| 6353478 | Digital range sensor system A digital range sensor comprises a light source, an optical element to focus the light from the source down to a small spot on a target, a second optical element that is mounted obliquely from the source axis, and a prism mounted on a multi-element detect... | 03/05/2002 |
| 6091500 | Method and apparatus for measuring overclad tubes A method and apparatus for measuring and determining certain parameters of an overclad tube measures the OD and the wall thickness of the tube at a plurality of longitudinal points and a plurality of angles at each point or longitudinal position. A laser ... | 07/18/2000 |
| 6038028 | High-speed non-contact measuring apparatus for gauging the thickness of moving sheet material An optical measurement apparatus is provided for measuring the thickness of a moving sheet material (18). The apparatus has a pair of optical measurement systems (21, 31) attached to opposing surfaces (14, 16) of a rigid support structure (10). A pair of ... | 03/14/2000 |
| 5911161 | Apparatus and method for binocular measurement system An apparatus and method are disclosed wherein a linear array of electromagnetic radiation emitting devices are arranged in association with a moving workpiece. Electromagnetic radiation emitted by the array is received by two or more receivers. Several no... | 06/08/1999 |
| 5821423 | Apparatus and method for binocular measurement system An apparatus and method are disclosed wherein a linear array of electromagnetic radiation emitting devices are arranged in association with a moving workpiece. Electromagnetic radiation emitted by the array is received by two or more receivers. Several no... | 10/13/1998 |
| 5671054 | Method and apparatus for measuring position of pattern formed on a substrate having a thickness The thickness of a substrate is one of the most important parameters in detecting the flexure of the substrate. The thickness of a reference substrate disposed on a stage and its amount of flexure are measured. Thus measured data are stored in a memory of... | 09/23/1997 |
| 5606173 | Arrangement for aligning, focusing and normalizing imaging system A set of track gauges for use in aligning, focusing and normalizing an imaging system of a high speed document processor have been provided. Each of the gauges fit within a track (14) in front of the imaging system (10 or 12). The depth gauge (70) is used... | 02/25/1997 |
| 5594548 | In-furnace inspection machine utilizing a double-walled structure A machine for inspecting the surface conditions of structural members within a furnace, particularly within a furnace operating at a high temperature or with a highly radioactive environment, such as a melting furnace for processing radioactive wastes. Th... | 01/14/1997 |
| 5581353 | Laser-based measurement apparatus and method for the on-line measurement of multiple corrugated board characteristics The apparatus and method of the present invention utilize a pair of fixed-position laser triangulation sensors, with one sensor located above the board and one directly below. Each sensor produces a measurement signal proportional to the distance between ... | 12/03/1996 |
| 5457537 | Optical-electrical measuring method for determining cross-sectional dimensions An optical-electrical measuring method for determining cross-sectional dimensions particularly of elongate articles with reference to at least one straight line, which is applied to the periphery of the cross-section and contacts the cross-section at, at ... | 10/10/1995 |
| 5450204 | Inspecting device for inspecting printed state of cream solder An inspecting device inspects the printed state of cream solder by projecting a plurality of light patterns varying in phase onto a printed circuit board printed with cream solder, and processing signals obtained by an image pick-up device for picking up ... | 09/12/1995 |
| 5442573 | Laser thickness gauge An apparatus for determining the position of a surface of a specimen relative to a reference point. The apparatus has a beam source which produces a narrow beam and a beam splitter splits the narrow beam into a primary beam and the secondary beam. The pri... | 08/15/1995 |
| 5420945 | Methods for aligning focusing and normalizing imaging system A set of track gauges for use in aligning, focussing and normalizing an imaging system of a high speed document processor have been provided. Each of the gauges fit within a track (14) in front of the imaging system (10 or 12). The depth gauge (70) is use... | 05/30/1995 |
| 5420944 | Techniques for aligning, focusing and normalizing imaging system A set of track gauges for use in aligning, focussing and normalizing an imaging system of a high speed document processor have been provided. Each of the gauges fit within a track (14) in front of the imaging system (10 or 12). The depth gauge (70) is use... | 05/30/1995 |
