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Class 356/621 - Occulting a projected light beam


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter wherein a position of an object is determined
No. of patents: 139
Last issue date: 02/28/2012


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NumberTitleIssue Date
8125653Apparatus and method for the determination of the position of a disk-shaped object
The invention relates to an apparatus for the determination of the position of a disc-shaped object, particularly of a wafer (10). Thereby, a mount (14) for supporting the sensor device (11) is provided on a movable carrier (22). ...
02/28/2012
7366323Hierarchical static shadow detection method
There is provided a hierarchical shadow detection system for color aerial images. The system performs well with highly complex images as well as images having different brightness and illumination conditions. The system consists of two hierarchical levels of process...
04/29/2008
7359041Method and system for optically tracking a target using a triangulation technique
An optical position-tracking system comprises a first light beam steering device for sweeping a first light beam through a first angular range to cause a reflection of the first light beam by a target. Additionally, the optical position-tracking system further compr...
04/15/2008
7352524Magnetic disk drive
A magnetic disk drive comprises a recording medium, a slider, and an alignment device for aligning the slider with respect to the medium. No film made of liquid lubricant is disposed on the surface of the medium. The slider incorporates: a slider main body including...
04/01/2008
7320237Method for measuring misalignment of continuance mill and apparatus for measuring the same
While a reference means having a positional relationship to the pass-line of a continuance mill determined in advance and caliber profile (area enclosed by the groove profile of a rolling roll) formed by a rolling roll at each stand are imaged within the same visual...
01/22/2008
7321359Method and device for optical navigation
An method and device suitable for navigation on a wide variety of surfaces is introduced. Specular reflection is used to determine relative motion over typical surfaces. A specific application is a computer mouse. ...
01/22/2008
7315373Wafer positioning method and device, wafer process system, and wafer seat rotation axis positioning method for wafer positioning device
In wafer positioning by moving a center point (0) of a wafer (21) to a given position and orienting a notch part (21a) of the wafer in a given direction, wafer seat drive means (2,3,8, or 9) positions a rotation axis (B) of ...
01/01/2008
7312879Distance determination in a scanned beam image capture device
Methods, systems, and devices can determine spatial relationships between a probe and a target surface. Specular reflections from the target surface vary dramatically with small changes in angle between the scanning beam and the target surface, and as the geometry o...
12/25/2007
7313462Integrated tool with automated calibration system and interchangeable wet processing components for processing microfeature workpieces
An integrated tool and automatic calibration systems that enable wet chemical processing chambers, lift-rotate units and other hardware to be quickly interchanged without having to recalibrate the transport system or other components to the replacement items. These ...
12/25/2007
7295329Position detection system
A position detection system. In representative embodiments, the position detection system comprises a support structure having a cavity, a first light source configured to emit light into at least part of the cavity, a second light source configured to emit light in...
11/13/2007
7292325Method and apparatus for determining absolute angle and torque with optical detection module
The present invention relates to a method and apparatus for determining an absolute angle and torque with an optical detection module, in which the absolute angle and the torque are determined on the basis of measurements including marked waveforms at both ends of a...
11/06/2007
7289088Electroluminescent display device
An organic electroluminescent (EL) display device has a touch panel function and includes a display panel that has first and second light sources disposed along sides of the display portion and first and second light detecting portions disposed on sides of the displ...
10/30/2007
7277188Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrate
Systems and methods are disclosed for focusing a beam for an interaction with a film deposited on a substrate wherein the focused beam defines a short axis and a long axis. In one aspect, the system may include a detecting system to analyze light reflected from the ...
10/02/2007
7274800Dynamic gesture recognition from stereo sequences
According to an embodiment, an apparatus and method are disclosed for dynamic gesture recognition from stereo sequences. In an embodiment, a stereo sequence of images of a subject is obtained and a depth disparity map is generated from the stereo sequence. The syste...
09/25/2007
7268941Module inspection fixture
An apparatus for inspecting semiconductor module packages which includes a cylindrical base section, a truncated spherical section superimposed on the cylindrical base capable of being rotated and tilted on the cylindrical base section, and a tray section superimpos...
09/11/2007
7256898Method and device for determining the position of rotationally drivable tools
To determine the position of rotationally drivable tools in machine tools, the moment of separation of the tool to be measured and a measuring beam, for example a laser beam of a light barrier, is used. The tool to be measured is first positioned in such a manner th...
08/14/2007
7253910Optical measuring device
An optical measuring device capable of improving the precision of detection of contamination on a protective glass is disclosed. With threshold values as large as 90%, 50%, 10% of a peak value of a scan signal, measured values Q90, Q50, Q1...
08/07/2007
7217071Method for testing the fit or imbalance of a tool
In the method, a tool is tested for an aligning fit or an imbalance in a tool spindle. The tool spindle is set into rotation. A light beam is used to check whether the tool wobbles. The tool spindle and the light beam are moved relative to one another until the ligh...
05/15/2007
7194818Mount table, surface texture measuring machine and surface texture measuring method
A mount table having a mount surface on which a workpiece as an object to be measured or worked includes a support unit for supporting the mount table so as to be floated from a surface plate so that the mount table can freely move or rotate on the surface plate fin...
03/27/2007
7170613Surface inspecting apparatus that determines an edge position of an object
A surface inspecting apparatus for inspecting a shape of a surface of an object to be inspected is disclosed. The surface inspecting apparatus includes a mounting base for mounting the object, a positioning device for positioning the object to an inspecting position...
01/30/2007
7161686Sensor for determining the angular position of a radiating point source in two dimensions and method of operation
A sensor for determining the angular position of a radiating point source in two dimensions includes a mask encoded in two skewed directions with waveforms consisting of several frequencies in prescribed patterns. The frequency spectra of the received detector patte...
01/09/2007
7142198Method and apparatus for remote pointing
A remote pointing apparatus including a remote control that generates an optical signal that is periodically expanded and/or reduced around the origin and an optical sensor that detects whether the optical signal is received, and a remote pointing method therefor. T...
11/28/2006
7130778Computer touch screen radio station control system
A computerized audio or video signal control system controlled by an announcer and having a display of the available signal sources and scheduled events which can be activated, mixed, faded and cued by the announcer in the scheduled order or in an order the announce...
10/31/2006
7123357Method of detecting and classifying scratches and particles on thin film disks or wafers
Scratches, pits and particles which are smaller or larger than the beam size may be measured and identified by single and multiple beam techniques. In one embodiment, the invention uses a pair of orthogonally oriented laser beams, one in the radial and one in the ci...
10/17/2006
7114393Method and apparatus for laser vibrometry
Apparatus and method for identifying a remote target (7; 7a) is described. The remote target (6; 6a) is illuminated with radiation (5; 5a) generated by a laser (1; 1a) and the radiation scattered by the target ...
10/03/2006
7102743Semiconductor wafer inspection apparatus
A semiconductor wafer inspection apparatus is provided with a rotatable table on which a semiconductor wafer is held by suction, an illuminating device which illuminates at least an edge portion of the semiconductor wafer held on the rotatable table, an imaging devi...
09/05/2006
7084989Measuring apparatus and method in a distribution system
The present invention relates to the field of measuring apparatuses in distribution systems allowing for measuring presence, position and/or shape of an object placed on a carrier and a method for such measuring. The measuring apparatus comprises at least one light ...
08/01/2006
7068270Design of integrated circuit package using parametric solids modeller
A computer is used to model objects by accepting commands from a user. The object is altered in response to the commands. Dimensions are formed between the features, and relations between the dimensions are formed in order to present inconsistence relations which pr...
06/27/2006
7050177Method and apparatus for approximating depth of an object's placement onto a monitored region with applications to virtual interface devices
Structured light is directed across a monitored region. An image is captured of a light pattern that forms on the object as a result of the object intersecting the structured light when the object is placed at a first position in the monitored region. A geometric ch...
05/23/2006
7027166Method for measurement of the distance between a component which is moved past a reference surface and that reference surface, and a measurement system for carrying out the method
A method for measurement of the distance between a component which is moved past a reference surface and that reference surface is intended to be suitable in particular for use for the measurement of radial gaps in a turbine, while having particularly high measureme...
04/11/2006
6993165System having a rotating optical system and a non-planar prism that are used to obtain print and other hand characteristic information
A rotating optical system includes an optical element and a measuring device for locating and/or scanning a full palm print and/or full palm and fingerprint for a hand positioned on a non-planar surface of an optical element. The hand is placed on the non-planar sur...
01/31/2006
6963394Inspecting device for semiconductor wafer
A inspecting device for a semiconductor wafer comprises: a holding unit which holds a wafer; an aligner unit which detects a cutout position and a center position of the wafer held by the holding unit and obtains position determining data of the wafer; an observing ...
11/08/2005
6956226Light image sensor test of opto-electronics for in-circuit test
A method for testing at least one light source on a printed circuit assembly, includes: detecting a light signal from a plurality of light sources on a printed circuit assembly; generating a plurality of electrical analog signals from an image array, in response to ...
10/18/2005
6906794Semiconductor wafer inspection apparatus
A semiconductor wafer inspection apparatus is provided with a rotatable table on which a semiconductor wafer is held by suction, an illuminating device which illuminates at least an edge portion of the semiconductor wafer held on the rotatable table, an imaging devi...
06/14/2005
6906702Coordinate input device and its control method, and computer readable memory
A device has a plurality of linear sensors which are arranged for at least one coordinate axis and detect the beam spot. The levels of detected data are measured by a sensor controller, and the measured levels are compared. Based on the comparison result, the detect...
06/14/2005
6853459Scanning using position transmission for triggering the recording of measured values
The start of the displacement movement is initiated by a software instruction when measuring surface topologies with microscopic resolution. Trigger pulses which serve to trigger the recording of measured values on the sensor are generated in discrete local interval...
02/08/2005
6775014System and method for determining the location of a target in a room or small area
A system is provided for locating a target, such as a person, relative to a projection screen, the system including two infrared light sources for casting separate shadows of the target on a translucent screen, such as those commonly used for back-projection display...
08/10/2004
6753519Arrangement for the detection of relative movements or relative positions of two objects
An optoelectronic arrangement for the detection of relative movements or relative positions of two objects, which comprises at least three light emitting means as optoelectronic elements, with the light emitting means being arranged on a closed, imaginary first surf...
06/22/2004
6734981Multiple laser optical systems and methods
A multiple laser optical sensing system and method for detecting target characteristics are disclosed. The system includes a laser source with at least two emission apertures from which laser signals are emitted. The system also includes at least one detector, which...
05/11/2004
6717684Target scoring system
A device for target scoring includes an elongated retro-reflective member, a first light source, a second light source, a first light sensor, a second light sensor and a processor. The first light source is disposed at a first location and is spaced apart from the r...
04/06/2004
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