Bizarre Patents
Behavior Modification Wristwatch
A wristwatch including a watch band and a watch body having an octagon shaped perimeter and being red in color and having the word STOP thereon to resemble a stop sign.
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| Number | Title | Issue Date |
| 4836680 | Flatness measuring device for strip-shaped rolled material A flatness measuring device for thin-gage strip in cold rolling mills comprises a rotating measuring roller (13) is arranged transversely to the strip travel direction (a) and across the strip width (b) and detects the rolled strip (6), with at least one ... | 06/06/1989 |
| 4763006 | Device determining surface element inclination angle for the optical detection of form errors of a low order A device is provided for the optical detection of form errors of a low order, for example of roughness. The device possesses a light source whose light probes the body to be examined and a light-receiving device for the light reflected by the body. The de... | 08/09/1988 |
| 4735508 | Method and apparatus for measuring a curvature of a reflective surface A method for measuring a curvature of a reflective surface includes the steps of directing a pair of collimated light beams onto a substantially smooth portion of the reflective surface and measuring the separation of the light beam images reflected from ... | 04/05/1988 |
| 4695163 | Method and apparatus for determining surface shapes using reflected laser light A method and apparatus for determining the surface shape of an object having an index of refraction. A laser light source (12) is incrementally movable in a rectilinear path along a track (10), and pivotal about the track (10), for scanning the surface of... | 09/22/1987 |
| 4677473 | Soldering inspection system and method therefor A soldering inspection system wherein light is irradiated on a soldered part at different incident angles by a light emitting means to collect information indicative of three-dimensional configuration of the soldered part and discriminate whether or not t... | 06/30/1987 |
| 4595288 | Method and apparatus for measuring deep mirrors A measuring apparatus (11) for measuring the contours of a deep mirror (10) includes a laser (14) for generating a light beam (20). The light beam impinges upon a reflecting surface (16) for reflection therefrom to a point P. The light ray is then reflect... | 06/17/1986 |
| 4585343 | Apparatus and method for inspecting glass The present invention relates to an inspection apparatus for detecting the surface distortion in a sheet of material such as a sheet of glass, for example, and for indicating whether the level of distortion detected in the inspected sheet is unacceptable.... | 04/29/1986 |
| 4547073 | Surface examining apparatus and method The surface of a polished semiconductor wafer is examined by an apparatus comprising a light source, a first optical means for converging the light to a parallel light and projecting it onto the surface to be examined and a second optical means for conver... | 10/15/1985 |
| 4522510 | Thin film thickness measurement with thermal waves A method and apparatus for thin film thickness measurements with thermal waves in which heating and detection laser beams are focused onto the film, normal to the surface of the film, with the two beams parallel and non-coaxial.... | 06/11/1985 |
| 4521118 | Method for detection of thermal waves with a laser probe A method for measuring thermal waves in a sample is disclosed. More particularly, thermal waves, which may be used for imaging, are generated in a sample through local periodic heating as, for example, by impinging an intensity modulated beam of energy on... | 06/04/1985 |
| 4427295 | Measuring apparatus A measuring apparatus is disclosed in which a surface to be measured in scanned by a scanning beam essentially normally incident upon the surface and the angular deviation of the beam of light regularly reflected from the surface is detected to measure th... | 01/24/1984 |
| 4425041 | Measuring apparatus A measuring apparatus is disclosed in which a surface to be measured is scanned by a scanning beam and the angular deviation of the scanning beam of light regularly reflected from the surface is detected to know the flatness of the surface. The measuring ... | 01/10/1984 |
| 4412743 | Off-axis light beam defect detector A method and apparatus for detecting a property such as a defect in a surface to be scanned. A focusing, or objective lens is provided together with a subsystem for maintaining a substantially fixed distance between the focusing lens and the scanned surfa... | 11/01/1983 |
| 4410269 | Apparatus and method for testing a rotating polygon mirror An apparatus and method are disclosed for testing the faces of a polygon mirror for angular inclination and flatness while the polygon mirror is rotating at its intended operating speed. The apparatus includes an autocollimator for making the test reading... | 10/18/1983 |
| 4390277 | Flat sheet scatterometer A scatterometer for determining root mean square (RMS) scattering of light from reflective surfaces using monochromatic light which is generated by a source, expanded, collimated into a sampling beam, directed to a movable reflective surface which directs... | 06/28/1983 |
| 4355871 | Keratometer In an optical beam-doubling and image-rotating device, beam splitting means are provided for creating a first and a second image of an optical target in conjunction with means for rotating the light-ray family associated with the second image yielding a s... | 10/26/1982 |
| 4332477 | Flatness measuring apparatus A flatness measuring apparatus or the like for measuring the flatness of a thin specimen such as a wafer for producing semi-conductor devices by detecting, with a photoreceptor, the first-order time-differentiated signal of the reflection angle of a laser... | 06/01/1982 |
| 4291990 | Apparatus for measuring the distribution of irregularities on a mirror surface An optical apparatus for measuring irregularities on the mirror surface of, for example, a silicon wafer used to provide a semiconductor integrated circuit. Irradiates on the mirror surface light fluxes arranged in a special form, for example, in the latt... | 09/29/1981 |
| 4289400 | Apparatus for measuring a gradient of a surface An apparatus for continuously measuring a gradient of a curved surface at a number of different points thereon is disclosed in which a laser beam reflected at the point to be measured on the surface makes a beam spot on a photo sensor. The photo sensor fo... | 09/15/1981 |
| 4255055 | Surface inspection system for detecting flatness of planar sheet materials An inspection system for detecting the flatness of planar glass sheets or other materials having reflective surfaces by observing areas of preselected size on the surfaces. The system includes a collimated beam of light directed toward the surface of the ... | 03/10/1981 |
| 4215939 | Glue drop detector This invention relates to a method and apparatus for determining whether a glue drop is present on the reflective inner surface of a closure. Collimated light is projected onto the reflective inner surface of the closure, and a measurement is taken of the... | 08/05/1980 |
| 4126395 | Method for determining the spatial location of points on a specular surface The spatial locations of points defining a specular surface are determined by disposing the specular surface in the field of view of a lens and by using the specular surface to view by reflection an irradiated reference surface disposed successively in di... | 11/21/1978 |
| 4062623 | Device for observing an object A device for observing an object such as, for example, a mask, wafer, and so forth to be used in a printer for IC and LSI, and including a flat reflection surface and an inclined reflection surface having a certain inclination with respect to the flat ref... | 12/13/1977 |
| 3977789 | Scanning differential photoelectric autocollimator An apparatus is disclosed which automatically measures the geometrical deviations of a reflecting surface from a reference surface, and which also can be used to automatically measure the deviations of some light beam deviating property of a transparent a... | 08/31/1976 |
| 3975102 | Scanning photoelectric autocollimator An electro-optical apparatus is disclosed which provides outputs proportional either to the surface profile and the first derivative of the surface profile of a reflecting surface or to some light beam deviating property of a transparent article in a non-... | 08/17/1976 |
| 3969019 | Curvature measuring optical system in ophthalmometer A curvature measuring optical system in an ophthalmometer comprises a first and a second lens group and rotary prisms disposed between the two lens groups. The first lens group has the focal point thereof lying at the location of the virtual image of an i... | 07/13/1976 |
