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Class 356/601 - SHAPE OR SURFACE CONFIGURATION


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter for determining the general shape of an
No. of patents: 814
Last issue date: 05/01/2012


1                      
NumberTitleIssue Date
8169622Optical sensor for mounting to a washing machine or dish washer
An optical sensor (10) for fitting to a washing machine or dishwasher is proposed, comprising: a housing (16), an arrangement, which is housed in the housing, of optical components, the optical components comprising a controllable light emitter (26
05/01/2012
81696213-dimensional imaging by acoustic warping and defocusing
The present invention relates to a system for three-dimensional (3-D) acoustic imaging of a scattering structure using information from a two-dimensional (2-D) image. The system uses a characterized sensor array to emit a signal from the sensor array into an object ...
05/01/2012
8164758Internal inspection system and method
In some embodiments, an inspection system for measuring at least a portion of the threaded surface of an internally threaded component includes at least one measuring probe, a component retention device that allows positioning of the internally threaded component re...
04/24/2012
8159680Single-transducer, three-dimensional laser imaging system and method
Disclosed herein are a system and method for three-dimensional imaging using a single transducer. A laser in a transmitter emits a sequence of short pulses, each of which is at a different center wavelength (frequency). A dispersive element in the transmitter spatia...
04/17/2012
8139230Acquisition of topographies of objects having arbitrary geometries
There is described a method for positioning an object on an optical sensor system for acquiring a surface thereof, the sensor system having a set of motors for rotating the object around a motor axis perpendicular to an optical axis of the sensor system and for tran...
03/20/2012
8139229Calibrating jig, profile measuring device, and method of offset calculation
A calibrating jig comprises a reference sphere, and a reflecting plate configured to support the reference sphere from a lower side thereof and mirror-reflect light in a case that the reference sphere is illuminated from an upper side thereof. ...
03/20/2012
8120784Optical device for analyzing a scattering medium held by a support
An optical device intended for the analysis of a scattering medium, including at least one light source distant from the scattering medium and capable of providing an incident light beam intended to illuminate the scattering medium; at least one sensor capable of de...
02/21/2012
8120785System and method for inspecting three-dimensional sensor
The invention provides a system and method for inspecting a three-dimensional sensor. According to the invention, a light source is controlled to emit a light of a known phase, and the known phase of the emitted light is altered by at least two known phase values. T...
02/21/2012
8107086Three-dimensional imaging using absorption
The attenuation and other optical properties of a medium are exploited to measure a thickness of the medium between a sensor and a target surface. Disclosed herein are various mediums, arrangements of hardware, and processing techniques that can be used to capture t...
01/31/2012
8102538Method and apparatus for colour imaging a three-dimensional structure
Provided is a device for determining the surface topology and associated color of a structure, such as a teeth segment, including a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an imag...
01/24/2012
8098382Beam scanner and surface measurement apparatus
Disclosed are a beam scanner and a surface measurement apparatus. The beam scanner includes a spinning mirror having top and bottom reflective surfaces and a plurality of side reflective surfaces between the top and bottom reflective surfaces, and rotating about a r...
01/17/2012
8089635Method and system for fast three-dimensional imaging using defocusing and feature recognition
Described is a method and system for fast three-dimensional imaging using defocusing and feature recognition is disclosed. The method comprises acts of capturing a plurality of defocused images of an object on a sensor, identifying segments of interest in each of th...
01/03/2012
8085409Surface profile measuring apparatus
A surface profile measuring apparatus of the invention has a changing section for changing the cross section of a flux of light to be projected onto a sample by a light projecting section in measuring a surface profile of the sample. The surface profile measuring ap...
12/27/2011
8072612Method and apparatus for detecting a feature of an input pattern using a plurality of feature detectors, each of which corresponds to a respective specific variation type and outputs a higher value when variation received by the input pattern roughly matches the respective specific variation type
A method includes detecting a feature of an input pattern using a plurality of feature detectors, selecting at least one of the feature detectors based on their output values, and calculating a feature quantity of the input pattern based on an output value from at l...
12/06/2011
8059279Method and system for inspecting tire surface
Disclosed is a tire surface inspecting technique capable of surely discriminating rubber pieces of a quality different from that of a tire embedded in the surface of the tire by vulcanization from the tire. A first illuminating unit 11 include paired first li...
11/15/2011
8049901Measuring device and measuring method
A measuring device includes a light-sending part sending light in a first direction which is a depth direction of a hollow shape, a conversion part converting a direction of the light into a circumference direction approximately orthogonal to the first direction, a ...
11/01/2011
8045180Device for flexible detection of the geometric shape of objects by means of optical 3D measuring technology
A device for detecting the geometrical shape of measurement objects with a computer, a 3D sensor and an object carrier for fixing the measurement object. The computer combines the measurements recorded by a 3D sensor. The image registration is improved by using an a...
10/25/2011
8045181Inspection system and method with multi-image phase shift analysis
An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to pro...
10/25/2011
8023121Method for optically collecting numismatic data and associated algorithms for unique identification of coins
A method to generate an optical signature of a coin is disclosed. A plurality of parameters are generated and recorded related to rotational positions around the circumference of a coin. The data from these parameters are combined to produce a searchable value. ...
09/20/2011
8023122Method and system for measuring patterned structures
A method and system are presented for determining a line profile in a patterned structure, aimed at controlling a process of manufacture of the structure. The patterned structure comprises a plurality of different layers, the pattern in the structure being formed by...
09/20/2011
8004693Lens holder and lens shape measuring apparatus
A lens holder includes a lens holding member having a mounting shaft portion and is configured to hold a lens provided with at least one hole mounting a fitting for a rimless frame or a dummy lens provided with at least one hole, a main body including an opened bott...
08/23/2011
7999949Spectroscopic ellipsometers
The present invention discloses an optical measurement and/or inspection device that, in one application, may be used for inspection of semiconductor devices. A method is disclosed for extracting information of a device-under-test for an ellipsometer, comprising the...
08/16/2011
7995214Apparatus and method for recording the shape of an ear section
An apparatus for recording a shape of a section of the human ear is provided. The apparatus has a recording device for recording a spatial shape of a first and a second subsection of the section and for recording a position or a variable representing the position of...
08/09/2011
7990546High throughput across-wafer-variation mapping
A method for characterizing a surface of a sample object, the method including dividing the surface into pixels which are characterized by a parameter variation, and defining blocks of the surface as respective groups of the pixels. The method further includes irrad...
08/02/2011
7990545Surface measurement of in-vivo subjects using spot projector
The invention provides for surface mapping of in-vivo imaging subjects using a single camera and an illuminator that projects a plurality of targets such as spots on the subject. By limiting the depth-of-field of the camera lens, or of the illuminator optics, or bot...
08/02/2011
7990547Apparatus and a method of measuring erosion of an edge of a turbomachine aerofoil
An apparatus for measuring erosion of an edge of an aerofoil portion of a fan blade includes a laser source to direct light at a position on the edge of the fan blade. A detector detects light reflected from the position on the edge of the fan blade. A computer meas...
08/02/2011
7978343Nanoscale optical tomography based on volume-scanning near-field microscopy
An apparatus and methods for nanoscale optical tomography based on back-scattering mode near-field scanning optical microscopy with a volumetric scan of the probe. The back-scattered data collected by a volumetric scan of the probe contains three-dimensional structu...
07/12/2011
7969582Laser scanning microscope apparatus, and surface shape measuring method thereof
A laser scanning microscope apparatus comprising, a controlling unit for obtaining height information at each scanning point of a sample to be examined by obtaining a relative distance that maximizes an intensity output from a photo-detecting unit, which is obtained...
06/28/2011
7952727Compact optical contour digitizer
An optical contour digitizer including a radiation source for emitting radiation therefrom, a first mirror for folding the radiation emitted from the radiation source towards an object being measured, a second mirror for folding a reflection of the radiation from th...
05/31/2011
7929152Apparatus for detecting press-bonded ball at bonding portion in bonding apparatus and method for detecting press-bonded ball at bonding portion
A detecting apparatus used in a bonding apparatus including a capillary and a detection camera disposed with a certain amount of offset from the capillary and capable of detecting a press-bonded ball at a bonding portion after bonding. For a pad in which two edges o...
04/19/2011
7929151Intra-oral camera for diagnostic and cosmetic imaging
An apparatus for obtaining images of a tooth comprises at least one image sensor disposed along an optical axis to take polarized reflectance image and fluorescence image, at least one broadband illumination apparatus for reflectance imaging, and a narrow-band ultra...
04/19/2011
7924439Method and system for parameter extraction of a cutting tool
A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurali...
04/12/2011
7924438Method for measuring wear in the refractory lining of a metallurgical melting vessel
A method of a method for measuring wear in the lining of a metallurgical melting vessel such as a steel converter (1), by a laser scanner (2) A laser having a contouring system on a cart can be moved between measurements The laser contouring system ref...
04/12/2011
7916308Method and optical profiler
An optical profiler for an ultra-smooth surface, such as a magnetic recording disk, provides for a normally incident beam deflection against the target surface to be profiled. A linearly polarized laser light of a first polarization is focused on the target surface ...
03/29/2011
7916309Single-lens, single-aperture, single-sensor 3-D imaging device
A device and method for three-dimensional (3-D) imaging using a defocusing technique is disclosed. The device comprises a lens having a substantially oblong aperture, a sensor operable for capturing light transmitted from an object through the lens and the substanti...
03/29/2011
7903260Scatterometry metrology using inelastic scattering
A system for characterizing material properties in miniature semiconductor structures performs a scatterometry analysis on inelastically scattered light. The system can include a narrowband probe beam generator and a detector. A single wavelength probe beam from the...
03/08/2011
7898673Systems and methods for focusing optics
Systems and methods for focusing optics are disclosed herein. In some embodiments, methods are disclosed for focusing an optical device, wherein the methods can include: collecting light from a region of an object to be imaged with an objective lens, said region hav...
03/01/2011
7894078Single-lens 3-D imaging device using a polarization-coded aperture masks combined with a polarization-sensitive sensor
A device and method for three-dimensional (3-D) imaging using a defocusing technique is disclosed. The device comprises a lens, at least one polarization-coded aperture obstructing the lens, a polarization-sensitive sensor operable for capturing electromagnetic radi...
02/22/2011
7880898Method for measuring three-dimensional objects by single-view optical shadowgraphy, using the optical laws of light propagation
According to the invention, to measure an object (32), for example a hollow, translucent or transparent sphere with respect to a visible light, using Snell-Descartes laws, relating to the propagation of light through the object, an equation is established whi...
02/01/2011
7876454Method and system for measurement of a cutting tool
A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanni...
01/25/2011
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