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Class 356/512 - By wavefront detection


Subclass of Class 356 - Optics: measuring and testing
Definition: Contour or profile measurement wherein a wavefront representative
No. of patents: 416
Last issue date: 05/08/2012


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NumberTitleIssue Date
4225240Method and system for determining interferometric optical path length difference
A method and system for determining interferometric optical path length difference including: varying the interferometric optical path length difference between a first and a second surface in three steps at one-quarter wavelength intervals; sensing the i...
09/30/1980
4222669Interferometer for determining the shape of an object
This invention relates to an interferometric process, and particularly to a process for examining the planarity of surfaces....
09/16/1980
4200394Hologram technique for establishing the integrity of packages
A technique for detecting whether a package has been tampered with or altd. A package is first coated with a transparent material, such material having bubbles or particles of random size and/or spacing trapped within it. A hologram is then made of the p...
04/29/1980
4190365Optical testing of surface flatness
Surface flatness of a machined work piece, such as a mechanical seal, is determined by placing the surface to be tested against the top surface of a horizontally-disposed "optical flat", projecting monochromatic light rays, such as from a helium lamp, dow...
02/26/1980
4188124Interferometric measuring system
In an interferometric measuring system, a collimated monochromatic and coherent beam of light (1, I1 -In)impinges on a grating 1 disposed parallel to the test surface 2. It has been found that in the above arrangement, a diffraction ...
02/12/1980
4169980Method and apparatus for interference fringe center sensing
An electro-optical sensor is described which provides an output for precisely locating the centers of interference fringes in either a real-time interference pattern or an interferogram. By scanning the fringe pattern either by moving the fringe pattern, ...
10/02/1979
4159522Apparatus and method for measuring interference patterns and interferograms
An apparatus and method are herein disclosed for measuring interference patterns and interferograms using a standard monochrome closed-circuit television camera. The invention comprises, in one embodiment, means for processing the video output signal of t...
06/26/1979
4145140Measurement of surface roughness
A method and apparatus for measuring surface roughness, waviness, cracks or any irregularities or flatnesses in a surface utilizing statistical properties of dichromatic speckle patterns. In practice surface roughness is normally measured utilizing standa...
03/20/1979
4141038Apparatus and method for quantifying irregularities in interference patterns
Apparatus and methods are herein disclosed for use in conjuction with a standard monochrome closed-circuit television system for the generation, display, and manipulation of geometrical patterns upon the screen of the video monitor for the purpose of quan...
02/20/1979
4072423Light interference device with low degree of spacial coherence
A light interference device comprising a light source having a low degree of spacial coherence, an optical element having a reference surface for interference, an optical system for providing a parallel light bundle, and an optical projection system for p...
02/07/1978
4018531Speckle pattern interferometer
In a "speckle pattern" interferometer a coherent light beam is split into object and reference beams, the former being directed to illuminate a surface under inspection. Light scattered from this surface is imaged at an image location, at which there may ...
04/19/1977
3997266Lens testing using total internal reflection holography
Accurate, rapid and inexpensive testing and inspecting of lens surfaces tugh holographic means requiring no beamsplitters, mirrors or overpower optics, and wherein a hologram formed in accordance with one aspect of the invention contains the entire inter...
12/14/1976
3982835Interferometric system
To facilitate visual and/or electronic determination of the shape of a light-reflecting test object, a source of coherent light such as a laser produces an illuminating beam and a reference beam, the latter beam being combined in an optical system with re...
09/28/1976
3970390Multifrequency laser oscillator for holographic contouring
A multifrequency laser oscillator which generates coherent light of two closely adjacent optical frequencies in rapid succession for recording contour holograms by the double exposure technique. The two light frequencies are selected by an optical interca...
07/20/1976
3964830Method for inspecting flaws of material
A method for inspecting flaws existing on the surface or existing in the inside of material through employment of a coherent and spherical wave of light is disclosed, in which method a flat wave of light, such as He-Ne Laser light, is converted by a lens ...
06/22/1976
3953129Testing and inspecting lens by holographic means
Processes for the accurate, rapid and inexpensive testing and inspecting of oncave and convex lens surfaces through holographic means requiring no beamsplitters, mirrors or overpower optics, and wherein a hologram formed in accordance with one aspect of th...
04/27/1976
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