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Class 356/455 - Having a rotating, pendulous, or wedge scanning element


Subclass of Class 356 - Optics: measuring and testing
Definition: Spectroscopy wherein scanning is accomplished by rotating
No. of patents: 96
Last issue date: 06/22/2010


1      
NumberTitleIssue Date
7742172Apparatus for varying the path length of a beam of radiation
An apparatus for varying the path length of a beam of radiation, the apparatus comprising: an element (51) rotatably mounted about an axis, said element comprising two reflective surfaces in fixed relation to one another such that radiation may be reflected b...
06/22/2010
7738108Interferometer
The present invention relates to an interferometer, comprising at least a beamsplitter (10), at least one end reflector (11) for returning beams (S2, S3), and a set of reflectors (14, 15) for reflecting the beams (S2, S3
06/15/2010
7528958Optical scanner for measuring sheet properties
An optical scanner for use in conjunction with an infrared spectrometer is disclosed. The optical scanner translates a beam of radiation to a stationary spot on a traveling sheet of material so that ample integration time within the spectrometer is achieved. The bea...
05/05/2009
7480055Two-beam interferometer for fourier transform spectroscopy with double pivot scanning mechanism
A two-beam interferometer for Fourier Transform spectroscopy has a double pivot scanning mechanism. The interferometer has two rigid pendulums that are each rotatable to swing around an associated one of distinct axes of rotation. A linkage links the two rigid pendu...
01/20/2009
7423257Signal transmission device and method for transfer of signals between two elements moving relative to one another using an optically-readable strip conductor
In a signal transmission device as well as a method for transmission of signals between two elements moving relative to one another, in particular for transfer of measurement and/or control data between a rotating part and a stationary part of a computed tomography ...
09/09/2008
7388669Method of generating interferometric information
The present invention provides methods for generating interferometric information. Interferometric information from refractively scanned interferometers can contain errors due to wavelength-dependent refractive indices. The wavelength-dependent refractive indices of...
06/17/2008
7364543Paired angled rotation scanning probes and methods of use
Probes, and systems and methods for optically scanning a conical volume in front of a probe, for use with an imaging modality, such as Optical Coherence Tomography (OCT). A probe includes an optical fiber having a proximal end and a distal end and defining an axis, ...
04/29/2008
7362449Digital holographic microscope for 3D imaging and process using it
The present invention is related to a compact microscope able to work in digital holography for obtaining high quality 3D images of samples, including fluorescent samples and relatively thick samples such as biological samples, said microscope comprising illuminatio...
04/22/2008
7342664Scanning double-beam interferometer
Scanning interferometer and method of using same providing for rapid, reliable detection of chemical compounds that are readily implemented in low-cost, portable configurations for application in a variety of monitoring and detection applications. A scanning double-...
03/11/2008
7330263Measurement method and apparatus
A measurement apparatus includes a dielectric block, a laser light source for generating a light beam, an optical system for causing the light beam to enter the interface between the dielectric block and a metal film at various incident angles, and a light detection...
02/12/2008
7295321VISAR interferometer with field elements
The present invention includes an interferometer for VISAR. Optionally, the present VISAR system includes intracavity imaging design with converging beams and field elements to, among other possible purposes, image the array. An optional embodiment of the present VI...
11/13/2007
7280217Interferometer utilizing a rotating rigid structure
The invention relates to an interferometer, comprising at least a beam splitter (10), an end mirror (11) for returning beams (S2, S3), and a set of mirrors (12, 13, 14, 15) for reflecting the beams (S2, S3) between th...
10/09/2007
7277811Calibration apparatus and process
The invention discloses differing embodiments of calibration apparatus, and methods of use. In one embodiment, the calibration apparatus may be used to calibrate a tool, positioning system, robot, machine, or device. The calibration apparatus may include a first mem...
10/02/2007
7261687Forward scanning imaging optical fiber probe
Probes, and systems and methods for optically scanning a conical volume in front of a probe, for use with an imaging modality, such as Optical Coherence Tomography (OCT). A probe includes an optical fiber having a proximal end and a distal end and defining an axis, ...
08/28/2007
7257334Device to detect or generate optical signals
The present invention relates to a device for detecting or generating and modulating optical signals, and having an angular dispersive element arranged to change angles of the optical signals or carrier and/or reference rays brought to interference. ...
08/14/2007
7253909Phase shift measurement using transmittance spectra
An apparatus and method for determining a physical parameter of features on a substrate by illuminating the substrate with an incident light covering an incident wavelength range Δλ, e.g., from 190 nm to 1000 nm, where the substrate is at least semi-transparent. A...
08/07/2007
7202951Laser-based cleaning device for film analysis tool
A system for analyzing a thin film uses an energy beam, such as a laser beam, to remove a portion of a contaminant layer formed on the thin film surface. This cleaning operation removes only enough of the contaminant layer to allow analysis of the underlying thin fi...
04/10/2007
7187446Measuring apparatus
A measuring apparatus includes a sensor well unit having a plurality of sample wells, which are formed in a dielectric block and a thin film layer provided on the inner bottom surface of each sample well. A light beam projector causes a plurality of light beams to i...
03/06/2007
7170920Laser device
A laser device capable of efficiently oscillating laser light and always obtaining a stable beam form is provided. For this purpose, in the laser device including an amplifying section (18) in which a laser medium is amplified to oscillate laser light (11
01/30/2007
7161679Interferometer spectrometer with reduced alignment sensitivity
An interferometer spectrometer that has reduced alignment sensitivity is described herein. Parallelism of an output ray pair formed by a single input ray is not affected by variations in relative alignment of the components. In comparison to other compensated interf...
01/09/2007
7152007Imaging apparatus and method
A system for investigating a sample, the system including a detector having non-linear current voltage characteristics and being configured to mix two radiation signals having frequencies in the range from 25 GHz to 100 THz, one of the signals being a local oscillat...
12/19/2006
7075657Surface plasmon resonance measuring apparatus
A measuring apparatus comprising a measuring chip, an optical incidence system, a photodiode array, a differentiation part, and a computation part. The differentiation part differentiates an optical detection signal output from each light-receiving element, in a dir...
07/11/2006
7067812Multispectral selective reflective Lidar
A multispectral selective reflection Lidar system generates alternating pulses of at least two wavelengths and senses returns for determining the presence of a predetermined material absorbing and reradiating one wavelength as selective reflections, but not the othe...
06/27/2006
7053928Method and system for combining multi-spectral images of a scene
A system (100) for combining multi-spectral images of a scene (102) is disclosed. The system (100) is compatible with a viewing system (104) for viewing the scene (102) in a first spectral range. The viewing system (104) has...
05/30/2006
7042580Apparatus for imaging metrology
This invention is an apparatus for imaging metrology, which in particular embodiments may be integrated with a processor station such that a metrology station is apart from but coupled to a process station. The metrology station is provided with a first imaging came...
05/09/2006
7034944Digital FTIR spectrometer
The present invention relates to an FTIR spectrometer comprising a single-element detector to analyze a detector light beam emitted by a sample, with a unit to digitize the voltage available at the detector output and with a unit to process the digitized voltage. Th...
04/25/2006
7016039Purging light beam paths in optical equipment
Purging of a light beam path in an effective manner that minimizes the affect of the purging requirement on system throughput. In one embodiment, the invention is incorporated into a birefringence measurement system that has several components for directing light th...
03/21/2006
6982795Surface plasmon resonance measuring apparatus
A measuring apparatus comprising a measuring chip, an optical incidence system, a photodiode array, a differentiation part, and a computation part. The differentiation part differentiates an optical detection signal output from each light-receiving element, in a dir...
01/03/2006
6967722Tilt-compensated interferometers
The tilt-compensated interferometers of the present invention are novel variations of Michelson's interferometer that use tilt- and shear-compensation to provide excellent photometric accuracy even when there are imperfections in the scanning motion used to produce ...
11/22/2005
6965625Apparatuses and methods for generating coherent electromagnetic laser radiation
The present disclosure is directed to laser apparatuses for generating coherent electromagnetic laser radiation having an electron beam generator, a diffraction grating element oriented such that a beam of electrons from the electron beam generator is directed over ...
11/15/2005
6952266Interferometer alignment
The present invention provides means for correcting interferometer alignment errors through the use of corrective elements. The corrective elements allow reduced accuracy in the assembly process. Residual alignment errors caused by imprecise mounting of permanently ...
10/04/2005
6930781Miniaturized holographic fourier transform spectrometer with digital aberration correction
A digitally aberration corrected miniaturized holographic Fourier transform spectrometer (HFTS) made from simple optical components and with no moving parts is provided. The disclosed digitally aberration corrected HFTS is comprised of a two beam interferometer, whi...
08/16/2005
6922296Optical path adjusting device
An optical path adjusting device comprises a hollow cylindrical mount having a center axis in alignment with an optical path of a light beam and an optical parallel mounted on the hollow cylindrical barrel so as to intersect the optical path of the light beam at a s...
07/26/2005
6842252Laser wavelength meter
A long life laser wavelength meter is based on a Michelson interferometer with a flexure scanner. The scanner has a bar, preferably balanced about a pivot axis defined by a flexural pivot which supports the bar. Retroreflectors are mounted on the bar, equally spaced...
01/11/2005
6816265Passive tilt correction on two axes
A tilt compensator and delay element for use in an interferometer. The interferometer can be a scanning or a non-scanning interferometer. For example, the interferometer can be a Michelson-Morley interferometer or a Mach-Zehnder interferometer having a scanning mirr...
11/09/2004
6570658Optical part driving device incorporated into a detachable block and optical interferometer including same
An optical part driving device for moving an optical part, comprises; a driving timing pulley, a pair of driven timing pulleys, a timing belt wound by the driving timing pulley and the driven timing pulleys and connected with the optical part between the ...
05/27/2003
6552795Method and apparatus for illuminating a transparent specimen
A method and an apparatus for illuminating a transparent specimen (1), in particular for use in double confocal scanning microscopy, wherein for illumination of a point of the specimen (1), two light waves of a coherent light source (4) focused from oppos...
04/22/2003
6504614Interferometer spectrometer with reduced alignment sensitivity
An interferometer spectrometer that has reduced alignment sensitivity is described herein. Parallelism of an output ray pair formed by a single input ray is not affected by variations in relative alignment of the components. In comparison to other compens...
01/07/2003
6504613Optical interferometer with a casing and an optical part that is movable with respect to the casing
An optical interferometer in which a reference light and a light to be measured interfere with each other includes a casing, a movable optical part which is movable with respect to the casing, a fixed optical part which is fixed to the casing, and an atta...
01/07/2003
6469790Tilt-compensated interferometers
A novel variation of Michelson's interferometer uses tilt- and shear-compensation optics to allow various mirror motions to produce variation of path difference. The tilt-compensation mechanism consists of two complementary reflections from a single plane...
10/22/2002
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