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| Number | Title | Issue Date |
| 8169616 | Interferometer step scanning systems and methods In some embodiments, the pathlength difference (retardation) in a step scanning infrared (IR) spectrometer interferometer is maintained under AC servomechanism (servo) control for a first period following a step change, and under DC servo control for a second period... | 05/01/2012 |
| 7733493 | Fourier transform spectrometer The invention relates to a Fourier transform spectrometer comprising a binary grating with variable depth, the grating comprising a first set of mirrors and a second set of mirrors, the mirrors of the first set of mirrors and the mirrors of the second set of mirrors... | 06/08/2010 |
| 7710574 | Devices in miniature for interferometric use and fabrication thereof A device in miniature and fabrication of such a device for interferometric use is described, the device including a substrate with at least one deep reactive ion etching structure on at least one surface of the substrate forming an optical bench. The optical bench p... | 05/04/2010 |
| 7427932 | Compressive sampling and signal inference An optical signal is copressively sampled using an imaging system. The imaging system is created from a plurality of subimaging systems. Each subimaging system comprises a subaperture and a plurality of sensors. The optical signal is collected at each subaperture of... | 09/23/2008 |
| 7411682 | Real time high speed high resolution hyper-spectral imaging Real time high speed high resolution hyper-spectral imaging. (a) electromagnetic radiation collimating element (16), collimating electromagnetic radiation (44) emitted by objects (12) in a scene or a sample (14); (b) optical interferomete... | 08/12/2008 |
| 7408713 | Step-phase interferometric optical interleaver The cavity in the mirror arm of a conventional interleaver is replaced by a wedge integral with the beamsplitter structure of the interleaver. Thus, the light reflected from the AR-coated surface of the wedge is dispersed away from the optics of the device. The beam... | 08/05/2008 |
| 7359058 | Miniature fourier transform spectrophotometer The Miniature Fourier Transform Spectrophotometer provides the capability, in a miniaturized device, of determining the light absorption/transmission spectra of a collected sample of gas or liquid though Fourier Transform spectroscopy techniques. The device takes an... | 04/15/2008 |
| 7355705 | Using a fixed-frequency oscillation in a dispersive spectrometer to measure scene inhomogeneity A method for measuring scene inhomogeneity includes the steps of directing radiance of a scene into a dispersive spectrometer, and changing the field-of-view (FOV) of the spectrometer, while directing the radiance of the scene into the spectrometer. The method then ... | 04/08/2008 |
| 7342664 | Scanning double-beam interferometer Scanning interferometer and method of using same providing for rapid, reliable detection of chemical compounds that are readily implemented in low-cost, portable configurations for application in a variety of monitoring and detection applications. A scanning double-... | 03/11/2008 |
| 7333210 | Method and apparatus for feedback control of tunable laser wavelength A method and system for controlling the wavelength of light emitted by a tunable laser. The system includes a wavelength tuner that provides information of a desired wavelength; a coupler for tapping a portion of the light from the tunable laser; and an apparatus fo... | 02/19/2008 |
| 7327465 | Compensation for effects of beam misalignments in interferometer metrology systems In general, in a first aspect, the invention features methods that include deriving a first beam and a second beam from an input beam and directing the first and second beams along different paths, where the path of the first beam contacts a measurement object, prod... | 02/05/2008 |
| 7317179 | Systems and methods to shape laser light as a homogeneous line beam for interaction with a film deposited on a substrate Systems and methods are disclosed for shaping and homogenizing a laser beam for interaction with a film. The shaping and homogenizing system may include a lens array and a lens that is positioned to receive laser light from the lens array and produce a respective el... | 01/08/2008 |
| 7305158 | Interferometric signal conditioner for measurement of absolute static displacements and dynamic displacements of a Fabry-Perot interferometer A signal conditioner to measure the length of an interferometric gap in a Fabry-Perot sensor (interferometer). The invention includes a light source, a Fabry-Perot interferometer capable of spanning a range of gaps in response to physical changes in the environment,... | 12/04/2007 |
| 7304814 | Compact infrared spectrometer, and methods and systems for manufacture and assembly of components used in same A compact spectrometer operable in a wavelength range of 4.5 or more microns includes an entrance slit, a collimating mirror, a grating, a focusing mirror and a first focal plane. At least some radiation passing through the slit follows an optical path in which at l... | 12/04/2007 |
| 7301643 | Arrangement for building a miniaturized fourier transform interferometer for optical radiation according to the michelson principle or a principle derived therefrom An arrangement for building a compact Fourier transform interferometer for optical radiation according to the Michelson principle or a principle derived therefrom. According to the invention, this arrangement is characterized in that the optical modulation of the ra... | 11/27/2007 |
| 7283231 | Compressive sampling and signal inference A transmission mask or cooled aperture is used in spectroscopy to compressively sample an optical signal. The locations of transmissive and opaque elements of the mask are determined by a transmission function. The optical signal transmitted by the mask is detected ... | 10/16/2007 |
| 7277188 | Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrate Systems and methods are disclosed for focusing a beam for an interaction with a film deposited on a substrate wherein the focused beam defines a short axis and a long axis. In one aspect, the system may include a detecting system to analyze light reflected from the ... | 10/02/2007 |
| 7238931 | Displacement detection apparatus The present invention provides a displacement detection apparatus uses short scales and can provide a long measurable range comparable to a single long scale with a short bed length. The displacement detection apparatus includes a scale, a first head and a second he... | 07/03/2007 |
| 7215457 | Apparatus and methods for modulating refractive index An iono-refractive structure that includes one or more ion insertion layers having a real portion and an imaginary portion of the dielectric constant is provided. While both the real portion and the imaginary portion of the dielectric constant change, the change in ... | 05/08/2007 |
| 7167325 | Flexured athermalized pseudokinematic mount A method for designing a base includes (1) selecting a location of a first center of expansion of a child part (CEchild) relative to a parent part; (2) determining a location of a second center of expansion of a bond joint (CEbond) bonding the ... | 01/23/2007 |
| 7145709 | Apparatus and methods for modulating refractive index An iono-refractive structure that includes one or more ion insertion layers having a real portion and an imaginary portion of the dielectric constant is provided. While both the real portion and the imaginary portion of the dielectric constant change, the change in ... | 12/05/2006 |
| 7116017 | Device for reducing deterioration of image quality in display using laser Disclosed is a device for reducing deterioration of image quality which can get rid of speckle by equalizing a laser from a light source on a screen by vibrating a reflective mirror installed between the light source and the screen at a predetermined amplitude. The ... | 10/03/2006 |
| 7088451 | Scatterometry by phase sensitive reflectometer A phase-sensitive interferometric broadband reflectometer includes an illumination source for generating an optical beam. A beam splitter or other optical element splits the optical beam into probe beam and reference beam portions. The probe beam is reflected by a s... | 08/08/2006 |
| 7079254 | Method and apparatus for imaging internal structures of transparent and translucent materials An apparatus and method for spectral interferometry comprising providing an interferometer comprising a light source and dithering an element to provide a continuous relative phase shift between target and reference arms of the interferometer. ... | 07/18/2006 |
| 7075738 | Linear positioning apparatus A linear positioning apparatus includes an intermediate portion having an axis, and first and second end portions mounted with flexure legs thereto. The flexure legs accommodate motion of the intermediate portion relative to the end portions along the axis, but inhi... | 07/11/2006 |
| 7075655 | Alignment self check for a wavelength meter An alignment self check of a wavelength meter is performed. A reference signal is placed into a reference signal path of the wavelength meter. The reference signal is also placed into an unknown signal path of the wavelength meter. It is then detected whether after ... | 07/11/2006 |
| 7059781 | Optical detection device and optical device An optical detection device is provided with an optical path dividing section which is disposed on an optical path toward a light receiving surface which receives an optical beam. The optical path dividing section is provided with an aperture section through which a... | 06/13/2006 |
| 7057733 | Scanning IR microscope An FT-IR microscope is operated in association with a scanning spectrometer in such a way that incremental movement of the movable stage of the microscope is synchronized with the scans of the scanning spectrometer. This minimizes delays in processing time. ... | 06/06/2006 |
| 7019841 | System and method for inspecting a component using interferometry A system for inspecting a component is provided. The system includes an interferometer having a coated mirror, such as a coating that allows only a fraction of light to pass, where the coating has a predetermined thickness. An interference inspection system receives... | 03/28/2006 |
| 7009750 | Apparatus and methods for modulating refractive index An iono-refractive structure that includes one or more ion insertion layers having a real portion and an imaginary portion of the dielectric constant is provided. While both the real portion and the imaginary portion of the dielectric constant change, the change in ... | 03/07/2006 |
| 6967722 | Tilt-compensated interferometers The tilt-compensated interferometers of the present invention are novel variations of Michelson's interferometer that use tilt- and shear-compensation to provide excellent photometric accuracy even when there are imperfections in the scanning motion used to produce ... | 11/22/2005 |
| 6963595 | Automatic gas control system for a gas discharge laser An automatic F2 laser gas control, for a modular high repetition rate ultraviolet gas discharge laser. The laser gas control includes techniques, monitors, and processor for monitoring the F2 consumption rates through the operating life of the ... | 11/08/2005 |
| 6934063 | MEMS mirror A MEMS mirror and method for fabricating the mirror is provided. The mirror has a plurality of structures that operatively rotate around a support structure. The mirror is fabricated, such that the silicon components are separated from a glass structure having elect... | 08/23/2005 |
| 6930780 | Method for taking a spatially resolved spectrum by means of a fourier-transform (FT)-spectrometer and such spectrometer A method for taking a spatially resolved spectrum, in particular an infrared (IR) spectrum, of a sample by means of a Fourier-transform (FT)-spectrometer, is described wherein light emitted by a light source is fed to an interferometer, directed onto the sample and ... | 08/16/2005 |
| 6922278 | Switched laser array modulation with integral electroabsorption modulator A photonic device including an array of lasers providing light to an array of electro-absorption modulators, both on a common substrate. In some embodiments the lasers are in a closely spaced array and lase at different wavelengths, providing with associated electro... | 07/26/2005 |
| 6788717 | Wavelength stabilized laser module A wavelength stabilized laser module is provided which is so configured as to be simplified and smaller in size and is capable of emitting semiconductor laser light whose wavelength is stablized with high accuracy. The wavelength stablized laser module includes a se... | 09/07/2004 |
| 6747742 | Microspectrometer based on a tunable fabry-perot interferometer and microsphere cavities The present invention is a cost-effective and compact micro-spectrometer for rapid detection of chemical compounds in the low concentration limit. The invention provides for significantly higher sensitivity compared to conventional spectroscopy techniques (continuou... | 06/08/2004 |
| 6667808 | Multifunctional fourier transform infrared spectrometer system A multifunctional infrared spectrometer system has an interferometer which receives the infrared beam from a source and provides a modulated output beam on beam paths to multiple spatially separated infrared detectors. A multi-position mirror element moun... | 12/23/2003 |
| 6570658 | Optical part driving device incorporated into a detachable block and optical interferometer including same An optical part driving device for moving an optical part, comprises; a driving timing pulley, a pair of driven timing pulleys, a timing belt wound by the driving timing pulley and the driven timing pulleys and connected with the optical part between the ... | 05/27/2003 |
| 6559947 | Reference fringe counting fourier transform spectroscopy Fringe counting in a Michelson type interferometer is carried out by detecting when the amplitude of the reference fringe attains a given value eg a zero crossing. Reversals in scan direction are recognized by monitoring parameters of the waveform such as... | 05/06/2003 |
