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Class 356/431 - Including transverse scanning


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter including means for scanning in a direction
No. of patents: 268
Last issue date: 08/10/2010


1              
NumberTitleIssue Date
7773226Web inspection calibration system and related methods
Systems and methods for calibrating a web inspection system. ...
08/10/2010
7397563Pass-line insensitive sensor
Devices, systems and methods for detecting surface characteristics of a sample surface are disclosed. The exemplary system may have a conveying device for moving a sample surface and a light source for reflecting a beam of light off the sample surface. A light detec...
07/08/2008
7385702Process and apparatus to control the integrity of a planar substrate
The process comprises the following steps: detection of the passage of an edge of the substrate by a first trigger, detection of the passage of said edge of the substrate at least at a first selected checkpoint on the substrate; control of the presence of the detect...
06/10/2008
7340085Rotating prism component inspection system
An inspection system is provided. The system includes a rotating prism having a first end and a second end. The first end receives a first image area, such as a circular view, and rotates about a center point so as to cover a field of view area that is larger than t...
03/04/2008
7339675Apparatus for stacking sheet members, apparatus for measuring dimensions of sheet members, and apparatus for and method of marking sheet members
An apparatus for stacking a predetermined number of X-ray films has a sheet member holding device disposed above a stacking position for temporarily holding at least a first X-ray film, and an actuating device for displacing the sheet member holding device from the ...
03/04/2008
7326861Shielding cover having cooling fin and optical scanning device
The present invention insulates the source of noise efficiently by forming a thick noise insulating portion to the cover to tightly seal a drive unit which generates heat and noise and at the same time, increases the cooling effect of cooling fins by making the surf...
02/05/2008
7307729Electro-optically inspecting and determining internal properties and characteristics of a longitudinally moving rod of material
Electro-optically inspecting a longitudinally moving rod of material (12). Guiding rod (12) along its longitudinal axis by rod guiding unit (14), along optical path (20) within transparent passageway (22). Optical path (20) ...
12/11/2007
7304740Methods for detecting compression wood in lumber
Methods are provided for detecting compression wood, blue stain, or pitch in lumber. A light beam is projected towards the wood sample. Line or area cameras acquire images of light that is reflected from the wood sample. Based on the intensity of the reflected light...
12/04/2007
7304743Diffuse reflectance readhead
A glucose monitoring system comprising a readhead positioned a predetermined distance from a sample aperture. The readhead comprises first and second LEDs adapted to emit intersecting paths of light. A beam splitter is positioned at the intersection of the light pat...
12/04/2007
7292949Method and apparatus for estimating surface moisture content of wood chips
Method and apparatus for estimating surface moisture content of wood chips employing a surface moisture measurement obtained from a non-contact surface moisture sensor, which measurement is calibrated with values of a set of optical parameters, such as HSL color cam...
11/06/2007
7292329Test head for optically inspecting workpieces comprising a lens for elongating a laser spot on the workpieces
An optical test head comprises a laser source for providing a laser beam. The laser beam passes through a cylindrical lens for modifying the shape of the beam and a spherical lens for concentrating the beam onto a workpiece (typically a magnetic disk platter). The c...
11/06/2007
7292341Optical system operating with variable angle of incidence
An optical system for use in measurements in a sample comprising a light source (102) operable to produce an incident light beam propagating in a certain direction towards the sample (S) through an illumination channel (IC), a detector unit (104) for c...
11/06/2007
7263240Method, system, and software for improving signal quality using pyramidal decomposition
A method, system, and software are disclosed for improving the quality of a signal. A base signal is recursively decomposed for a desired number of pyramid levels. The decomposed signal from the lowest level is modified to generate a preprocessed signal. The preproc...
08/28/2007
7248346Apparatus for defining orientation of an alignment layer in a pixel unit of an LCD device and the method thereof
An apparatus for determining orientation of an alignment layer in a pixel unit of an LCD device is provided. The pixel unit includes a glass substrate having an outer surface provided with the alignment layer treated by photolithographic masking and rubbing operatio...
07/24/2007
7248366Method for marking defect and device therefor
The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using t...
07/24/2007
7245378Measuring laser light transmissivity in a to-be-welded region of a work piece
Methods for measuring laser light transmissivity of a specific position in a work piece prior to the work piece undergoing laser welding at the specific position with a laser beam having a specific welding wavelength. To obtain a baseline measurement reading, a lase...
07/17/2007
7212312Automatic scanner calibration
An automatic scanner calibration method and apparatus is disclosed in which a calibrated target, such as a Kodak® gray strip, is attached to a scanning surface of a scanner. The target is thin and has a width or length of platen of a scanner. During a normal scan, ...
05/01/2007
7205561Media sensor apparatus using a two component media sensor for media absence detection
An imaging apparatus includes a media support surface. A light source and a light detector are positioned in relation to a reflective surface such that when a sheet of print media covers the reflective surface, a reflected specular light component of a light beam is...
04/17/2007
7200458Wood tracking by identification of surface characteristics
A “woodprint™” characterization and identification technique unique employs cameras (16), lighting (14), camera interface hardware (18), a computer (20), and/or image processing software to collect and analyze surface characteristic...
04/03/2007
7190458Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity
A semiconductor wafer having two regions of different dopant concentration profiles is evaluated by performing two (or more) measurements in the two regions, and comparing measurements from the two regions to obtain a reflectivity change measure indicative of a diff...
03/13/2007
7176433Resolution enhancement for macro wafer inspection
A method and apparatus for improving system resolution for a defect line scanner while not increasing aliasing effects, or alternatively to maintain system resolution for a defect scanner while decreasing aliasing effects. This is accomplished by decreasing effectiv...
02/13/2007
7167245Alignment of light collector to laser scanline
An optical imaging system and method for the alignment of a light collector with a laser scanline. The optical imaging system includes: an optical assembly for producing a laser beam scanline directed at a scanning platen, the scanning platen including an opening di...
01/23/2007
7164511Distinguishing positive and negative films system and method
A system and method for scanning a photographic film using a scanner automatedly identifies the film as either a positive or negative and controls the scanner settings to perform the scan accordingly. The method includes performing a pre-scan of the film, sampling a...
01/16/2007
7146049Making the apparent speed of elements imaged at different speeds approximately the same for image recognition
A method for image recognition. In the method, a section of an element is imaged while the element is at a first speed to obtain a first image pattern. The section of the element is also imaged while the element is at a second speed to obtain a second image pattern....
12/05/2006
7123765Apparatus and method for inspecting articles
Method and apparatus for inspecting articles with multiple elements to determine if the elements are properly located, which includes pinching at least a portion of the article including at least some of the elements at an inspection station; irradiating the pinched...
10/17/2006
7119875Apparatus for forming pattern
An apparatus for forming a pattern has a scanning-time setter, a time-error detector, a scanning-time corrector, a pulse data selector, and a control pulse signal generator. The scanning-time setter sets a “fine-section scanning-time” as a pass-time of the beam ...
10/10/2006
7113627Location of extended linear defects
A method of locating a linear defect on a photographic element, the element having a useful imaging width and the defect aligned with length of the element, includes the steps of: exposing a region of the element to create a latent image which is substantially unifo...
09/26/2006
7106458Device for detecting edges of sheet-shaped materials
A device for detecting edges of sheet-shaped print materials (1), especially of transparencies, that are moved along a transport path through a sheet-processing machine has a beam transmitter (31) and a beam receiver (32), whereby beam transmitt...
09/12/2006
7101461Method and apparatus for imaging a paper web
A system and process for measuring paper formation characteristics in real time is disclosed. The system comprises apparatus used in a papermaking process, and includes a rotating forming fabric having an upper and lower surface. A paper slurry is deposited upon the...
09/05/2006
7079263Method and apparatus for on-line log diameter measurement and closed-loop control
A measurement system for measuring a parameter of a log is provided. A measuring device produces an emission in a direction of the log. A portion of the emission measures the parameter, such as log diameter, and communicates the diameter to the measuring device, whi...
07/18/2006
7077120Substrate cutting method
A method of producing a semiconductor device constructed by arranging a plurality of substrates, on each of which, thin film semiconductor elements two-dimensionally arranged are installed. The method includes the steps of cutting a substrate along at least a slice ...
07/18/2006
7047153Method and apparatus for improved inspection classification of attributes of a workpiece
An apparatus for detecting the probable existence, location, and type of defects in a workpiece is described. The apparatus includes a sensor subsystem, an optimizer, a control subsystem, and a computer system having a processor and computer readable memory. Sensor ...
05/16/2006
7027934Apparatus and method for automated web inspection
A method of inspecting a moving web. The method includes imaging a sequential portion of the continuously moving web to provide digital information. The digital information is then processed with an initial algorithm to identify any regions on the web containing ano...
04/11/2006
7023542Imaging method and apparatus
The present invention relates to imaging apparatus and method for detecting optical properties of transparent media. The present invention superimposes, either optically or electronically, at least two images of the transparent media in order to obtain the optical p...
04/04/2006
7020344Match blur system and method
A method for blurring in signal processing, for example, in digital film processing, is performed with digital artifacts. The digital artifacts are derived, such as by scanning, and include a noisy artifact and a less noisy artifact. The artifacts are subdivided int...
03/28/2006
7016080Method and system for improving scanned image detail
Methods are provided for generating a dynamic image mask for improving image detail in a digital image. An electronic representation of an image is scanned. A dynamic image mask is generated from the electronic representation of the image. The dynamic image mask has...
03/21/2006
6995838Device for automatic surface inspection of an unwinding strip
The invention concerns a device for automatic surface inspection of an unwinding strip to detect surface defects, comprising at least a camera (10) whereof the optical axis is directed towards the surface to be inspected and forming on said surface a transver...
02/07/2006
6978041Review work supporting system
An object of the present invention is to increase efficiency in review work by appropriately narrowing down review work that verifies shapes of visual defects relating to an enormous amount of defects detected by a visual inspecting apparatus with high sensitivity. ...
12/20/2005
6967721Method and device for non-invasively optically determining bulk density and uniformity of web configured material during in-line processing
Method and device for non-invasively optically determining bulk density and uniformity of web material during in-line processing, by measuring and analyzing light scattered by volume segments of transported web material. Influence of process operating parameters of ...
11/22/2005
6961127Device and method for optical inspection
The invention relates to a method for optical inspection with a scanner which is arranged for detection and measurement of defects in or on a material which is inspected. The inspection takes place in successive sweeps essentially in the transverse direction of the ...
11/01/2005
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