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Class 356/32 - MATERIAL STRAIN ANALYSIS


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter for examining an article or material by noting
No. of patents: 262
Last issue date: 02/21/2012


1              
NumberTitleIssue Date
8120759Optical transmission strain sensor for wind turbines
The invention relates to a broad band optical strain sensing system for a wind turbine. The strain sensing system includes an optical fiber with an input at one end and an output at the opposite end. The optical fiber is provided with Bragg sensors between the input...
02/21/2012
8111384Method for measuring thermo-optically induced material phase-change response in a multiple layer thin film structure using visible and ultraviolet spectroscopy
A method and device for facilitating measurement of thermo-optically induced material phase change response in a thin planar or a grating film stack is disclosed. The method may include using small-spot visible and ultraviolet spectra (ellipsometric or reflectance) ...
02/07/2012
8009276System and method of surface wave imaging to map pressure on a surface
A system and a method for detecting surface pressure on a surface is provided. A plurality of transponders are located on the surface for transmitting electromagnetic surface waves and for receiving the electromagnetic surface waves upon being reflected, diffracted,...
08/30/2011
7944550System and method for detecting local mechanical stress in integreated devices
A method of detecting local mechanical stress in integrated devices is provided, the method comprising: enabling the detection of a photovoltage difference between a scan probe device and a surface portion of an integrated device, the scan probe device being configu...
05/17/2011
7812934Physical quantity measuring apparatus
A physical quantity measuring system according to the present invention comprises: an optical fiber having fiber Bragg gratings; a light source connected to the optical fiber; an arrayed waveguide grating connected between the light source and the optical fiber via ...
10/12/2010
7796240Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, and light-emitting device and electric appliance having light-emitting element
The present invention provides an evaluation method for evaluating whether a light-emitting element material to be evaluated is suitable for a host material or a guest material. By carrying out a first step of measuring absorption intensity of a light-emitting eleme...
09/14/2010
7787108Inline stress evaluation in microstructure devices
By performing optical measurements and evaluating the optical response of an appropriately prepared measurement site, stress-related characteristics, such as intrinsic stress of dielectric layers, may be evaluated due to the dependency of the optical response on str...
08/31/2010
7733466Measurement of constitutive properties of a powder subject to compressive axial and radial loading, using optical sensing
A method and system for measuring radial strain on powder or other granular material while the powder is subject to compressive axial and radial loading. The powder is contained within a pliable sleeve. As pressure is applied to the powder, the sleeve changes diamet...
06/08/2010
7679730Surface inspection apparatus and surface inspection method for strained silicon wafer
An image pickup device disposed in a predetermined position relative to a surface of a strained silicon wafer photographs the surface of the strained silicon wafer in a plurality of rotation angle positions on photographing conditions under which bright lines appear...
03/16/2010
7667827Systems and methods for remote monitoring of vibrations in machines
A system and method for monitoring the vibrations of a machine that includes a reflective patch affixed to the machine and a vibration detection unit including an optics module. The optics module may be positioned remotely from the machine such that the optics modul...
02/23/2010
7623223Stress measurement method
An object of this invention is to provide stress measurement method that is stress of the measuring object nondestructively in a short period of time. In order to attain this object, the stress measurement apparatus 1 comprises a correlation data stora...
11/24/2009
7612873Surface form measuring apparatus and stress measuring apparatus and surface form measuring method and stress measuring method
In a stress measuring apparatus, reflected light of light emitted to a substrate through an objective lens is received by a light shielding pattern imaging part, to acquire an image of a light shielding pattern positioned at an aperture stop part of an optical syste...
11/03/2009
7599047Method and system for simultaneous measurement of strain and temperature
A method and system for simultaneously measuring strain and temperature characteristics of an object involves the attachment to the object of a pair of optical fibers having different refractive indices, the fibers being connected together at least one end thereof, ...
10/06/2009
7583367Catheter surgery simulation
It is possible to observe a state of stress applied to a region around a cavity replicating a body cavity such as a blood vessel and the like in a three-dimensional model. In catheter insert simulation, when stress is applied to the region around the cavity in the t...
09/01/2009
7551268System for monitoring sealing wear
A system for determining at least one condition of a seal including an optical fiber for transmitting light from a light source. The optical fiber is embedded in the seal and operatively coupled to an interferometric system. The interferometric system is operatively...
06/23/2009
7522269Bonded part peeling shape identification device
A bonded part peeling shape identification device includes: a processor for obtaining measurement value information indicating a spectrum from an output light of an optical fiber sensor arranged in a bonded part, the optical fiber sensor outputting a light in which ...
04/21/2009
7505122Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, light-emitting element, and light-emitting device and electric appliance having light-emitting element
The present invention provides an evaluation method for evaluating whether a light-emitting element material to be evaluated is suitable for a host material or a guest material. By carrying out a first step of measuring absorption intensity of a light-emitting eleme...
03/17/2009
7495750Monitoring device for rotating body
The present invention relates to a monitoring device for a rotating body, which can accurately measure signals from a fiber Bragg grating sensor provided on the rotating body by compensating a transmission loss variation and a distortion of the sensor signals. A rot...
02/24/2009
7495749Rapid method for sub-critical fatigue crack growth evaluation
In a method and system for evaluating sub-critical fatigue crack growth in a semiconductor device, a plurality of energy pulses generated by an energy source are repeatedly impinged onto the semiconductor device for a predefined time interval. The repeated impinging...
02/24/2009
7460216Surface strain measuring device
The device enables strains of at least one surface (1) of a sample (2) to be measured versus temperature. Strains in a direction perpendicular to a predetermined plane, for example the plane of the surface (1), are measured by composite images. ...
12/02/2008
7430038Apparatus for enhancing visualization of mechanical stress
Photoelastic elements are formed deliberately with stress concentrations so that, when evaluated with a polariscope, more pronounced isochromatic bands or fringes result when loads are applied to these elements or to assemblies of these elements. A toy for producing...
09/30/2008
7403323Process control monitors for interferometric modulators
Process control monitors are disclosed that are produced using at least some of the same process steps used to manufacture a MEMS device. Analysis of the process control monitors can provide information regarding properties of the MEMS device and components or sub-c...
07/22/2008
7391507Method of photo-reflectance characterization of strain and active dopant in semiconductor structures
A new method of photo-reflectance characterization of strain and active dopant in semiconductor structures has been developed for characterization of physical properties of semiconductor structures. The underlying principle of the strain and active dopant characteri...
06/24/2008
7372559Systems and methods for inspecting a wafer with increased sensitivity
Systems and methods for inspecting a wafer with increased sensitivity are provided. One system includes an inspection subsystem configured to direct light to a spot on the wafer and to generate output signals responsive to light scattered from the spot on the wafer....
05/13/2008
7372879Wavelength locker using modulator current and photodetector
The wavelength of light emitted by a laser and modulated by a frequency response modulator is determined from the power of the emitted light and the current drawn by the modulator. From the temperature and current applied to the modulator and the optical power of th...
05/13/2008
7368827Electrical assembly for monitoring conditions in a combustion turbine operating environment
An electrical assembly for use in various operating environments such as a casing of a combustion turbine 10 is provided. The assembly may include an electrical energy-harvesting device 51 disposed in a component within the casing of the turbine to con...
05/06/2008
7363173Techniques for analyzing non-uniform curvatures and stresses in thin-film structures on substrates with non-local effects
Techniques and devices are described to use spatially-varying curvature information of a layered structure to determine stresses at each location with non-local contributions from other locations of the structure. For example, a local contribution to stresses at a s...
04/22/2008
7358858Road-ice detecting sensor, method for installing same, and road-ice detecting method
A road-ice detecting sensor includes: a temperature sensing member of T shape made of a highly heat conductive metal, having a temperature sensor to be grounded onto a road and a fin part erected from this temperature sensor; an optical fiber having an FBG bonded on...
04/15/2008
7334330Thermally insulating layer incorporating a distinguishing agent and method for inspecting the same
Thermally insulating layer incorporating a distinguishing agent and method for inspecting the insulating layer are provided. The distinguishing agent may be used for determining a remaining thickness of the thermally insulating layer. ...
02/26/2008
7327444Substrate inspection apparatus and method
The present invention provides a method and substrate examining device that sequentially and automatically measures at least the thickness and the internal stress of the thin film at a predetermined measurement point on the surface of every manufactured semiconducto...
02/05/2008
7317514System and method for optimizing heat management
Disclosed are heat management method, and system, and computer program product that include at least one optical strain gauge that is mounted on a printed board in proximity to an object being monitored for temperature changes. Power for controlling heat to the obje...
01/08/2008
7312435Determination of a physical state of an optical device
The present invention relates to a determination of a physical state of an optical device by measuring a response signal. At least two subsequent measurements are executed. Therefore, a first optical signal is transmitted to the optical device, wherein a firs...
12/25/2007
7307702Color switchable stress-fracture sensor for damage control
A color switchable stress/fracture sensor in combination with a structure. The combination apparatus includes a structure requiring stress and/or fracture detection, and at least one elasto-mechanoluminescent material at least partially dispersed in and/or on the st...
12/11/2007
7295307Method of and apparatus for measuring stress of semiconductor material
The present invention provides a method of and a device for measuring the stress in a semiconductor material. An excitation light is irradiated on a semiconductor material formed with a silicon germanium layer and a strained silicon layer in a multilayer structure o...
11/13/2007
7289231Apparatus and method for determining physical properties of a mask blank
An apparatus for determining physical properties of a mask blank. The apparatus includes, for example, an illumination device for radiating a predetermined light laterally into the mask blank, a detection device opposite the illumination device for detecting the lig...
10/30/2007
7286210Passive optical sensor using carbon nanotubes
A passive optical sensor operates independently of light amplitude by using a semiconducting carbon nanotube material. The material has an optical property dependent on wavelength, e.g., wavelength of absorption, ratio of absorptions at two wavelengths, or fluoresce...
10/23/2007
7277162Dynamic performance monitoring of long slender structures using optical fiber strain sensors
A method is described using optical fiber technology to measure the vibration characteristics of long slender structures subjected to dynamic disturbances imposed by water or wind generated loads. The method is based on making bending strain measurements at selected...
10/02/2007
7277822Embedded system for diagnostics and prognostics of conduits
An apparatus providing a means for assessment of the integrity of insulated conduits, harnesses, cables, pipelines and other interconnection systems constructed with integral sensitized media, discrete sensors, and electronics providing a means for transforming sens...
10/02/2007
7251028Scanning spectrum analyzer
A system for spectral analysis of a multi-wavelength signal is disclosed. The illustrative embodiment of the present invention, like the prior art, uses a grating or prism to disperse the spectral components of a multi-wavelength signal, and then uses a reciprocatin...
07/31/2007
7245790System and method for resolution enhancement of a distributed sensor
A Brillouin Optical Time-Domain Analysis (BOTDA) distributed sensor system and method use a continuous wave (cw) Stokes wave interrupted with a dark pulse for improved spatial resolution. The cw Stokes wave causes a continuous depletion of the pump wave. The dark pu...
07/17/2007
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