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| Number | Title | Issue Date |
| 8106946 | Circuitry testing method and circuitry testing device A circuitry testing method, comprising: providing a circuit board needing testing; applying a potential (160) to the circuit board needing testing so that the circuit board works and operating elements of the circuit board needing testing emit infrared rays; ... | 01/31/2012 |
| 8081212 | Abnormality detecting apparatus An abnormality detecting apparatus comprises a synchronous detecting circuit for detecting a synchronous signal from a video signal outputted from a camera unit, and an abnormality detecting circuit for judging whether or not a first direct current signal level obta... | 12/20/2011 |
| 7629993 | Automated wafer defect inspection system using backside illumination A defect inspection system for the semiconductor and microelectronics industry. More particularly, the present invention relates to an automated defect inspection system for wafers or other semiconductor or electronic substrates of any kind or type that are transpar... | 12/08/2009 |
| 7412090 | Method of managing wafer defects A method of managing wafer defects includes inspecting each chip in a wafer to generate a unit of wafer defect raw data, using a server to integrate the unit of wafer defect raw data to generate a unit of wafer defect distribution data for recording positions, types... | 08/12/2008 |
| 7388979 | Method and apparatus for inspecting pattern defects The present invention relates to a pattern defect inspection method and apparatus that reveal ultramicroscopic defects on an inspection target in which ultramicroscopic circuit patterns are formed, and inspect the defects with high sensitivity and at a high speed. T... | 06/17/2008 |
| 7385687 | Inspection device A device for inspecting a substrate having at least one printed-on layer, including a guide carrier on which the substrate is supported. An inspection head is movable in at least two directions relative to the guide carrier and is provided with an illumination mecha... | 06/10/2008 |
| 7372632 | Apparatus and methods for the inspection of microvias in printed circuit boards An imaging method and imaging system for inspecting features located at a known inter-feature pitch on portions of a target surface. The system includes a lens array having a plurality of lenses wherein the lenses of the lens array have an inter-lens pitch and an in... | 05/13/2008 |
| 7365837 | Vision inspection apparatus using a full reflection mirror The present invention relates to a vision inspection apparatus and method using total reflection mirrors. The present invention provides a vision inspection apparatus using the total reflection mirrors comprising; a board position control module for fixing a printed... | 04/29/2008 |
| 7342218 | Methods and systems for optical inspection of surfaces based on laser screening A method for imaging and an imaging system, the system includes the steps of: (i) scanning a beam of coherent radiation over a surface along a scan axis; (ii) focusing the beam to a spot on the surface, so that the spot has a predetermined dimension along the scan a... | 03/11/2008 |
| 7339388 | Intra-clip power and test signal generation for use with test structures on wafers The fabrication of the wafer may be analyzed starting from when the wafer is in a partially fabricated state. The value of a specified performance parameter may be determined at a plurality of locations on an active area of a die of the wafer. The specified performa... | 03/04/2008 |
| 7319229 | Illumination apparatus and methods Disclosed are apparatus and methods for illuminating a sample, e.g., during an inspection of such sample for defects. In one aspect, the illumination apparatus includes a bundle of fibers that each has a first end and a second end. The illumination apparatus further... | 01/15/2008 |
| 7316938 | Adjustable film frame aligner A film frame aligner for automatically aligning a film frame includes a film frame support, a film frame pusher for pushing the film frame, and a film frame location mechanism for locating at least one notch in the film frame. ... | 01/08/2008 |
| 7317522 | Verification of non-recurring defects in pattern inspection A system and method for verifying defects in electrical circuit patterns including supplying a plurality of like electrical circuit patterns to a defect verification assembly after identification of candidate defects at an automated inspection assembly; verifying se... | 01/08/2008 |
| 7314403 | Apparatus and method for fabricating liquid crystal display panel An apparatus and method for fabricating a liquid crystal display panel are disclosed. In case of the single mode that liquid crystal display panels are fabricated with the same size on a large glass substrate, unit liquid crystal display panels are kept and discarde... | 01/01/2008 |
| 7295314 | Metrology/inspection positioning system A metrology/inspection system moves the imaging and/or measuring equipment of the system relative to a wafer. Accordingly, measurement or inspection of the wafer does not require that the wafer be mounted on a precision stage. This allows the wafer to be at rest on ... | 11/13/2007 |
| 7289215 | Image control in a metrology/inspection positioning system A metrology system includes a positioning system that produces linear and rotational motion between an imaging system and the wafer. The imaging system produces signals representing the image of the wafer in the field of view of the imaging system. A control system ... | 10/30/2007 |
| 7283660 | Multi-layer printed circuit board fabrication system and method A method for aligning an image to be recorded by a direct image scanner on an upper layer of a printed circuit board with an image recorded on a lower layer thereof, the method comprising: visually imaging a portion of the image on... | 10/16/2007 |
| 7274812 | Image processing device and method In an image processing device capable of collectively estimating an object based upon results of plural times of inspection, regions (1(1)) and (1(2)) to be photographed are defined on opposite end portions of an object (w). When an image... | 09/25/2007 |
| 7266235 | Pattern inspection method and apparatus A pattern inspection method in which an image can be detected without an image detection error caused by an adverse effect to be given by such factors as ions implanted in a wafer, pattern connection/non-connection, and pattern edge formation. A digital image of an ... | 09/04/2007 |
| 7265822 | Method and apparatus for determining presence of a component in a printed circuit board A method and apparatus for determining color, presence and/or polarity of a component in a printed circuit board includes a sensor and an LED positioned behind a faceplate. The faceplate abuts the component and light is reflected from the LED off the component and r... | 09/04/2007 |
| 7254263 | Apparatus and method for defect detection and program thereof A reference mask generating part, inspecting mask generating part, defect detecting part are disposed in a control part of a defect detection apparatus. Based on a captured image of an inspection object substrate (an inspecting image data), the inspecting mask gener... | 08/07/2007 |
| 7245758 | Whole-wafer photoemission analysis A method and system for collecting and analyzing photoemission data wherein illumination and photoemission images are acquired for a plurality of die, such as for each die on a wafer. Then, the images are overlaid, aligned, and assembled in a mosaic, thereby allowin... | 07/17/2007 |
| 7239740 | Image processing apparatus and method, medium storing program for image processing, and inspection apparatus In a gray level image, the direction and the magnitude of a level gradient are found for each of pixels. With respect to the pixel having a level gradient whose magnitude exceeds a predetermined value, a line segment having a predetermined length is drawn in the dir... | 07/03/2007 |
| 7239399 | Pick and place machine with component placement inspection Improved component placement inspection and verification is performed by a pick and place machine. Improvements include stereovision imaging of the intended placement location; enhanced illumination to facilitate the provision of relatively high-power illumination i... | 07/03/2007 |
| 7236625 | Systems and method for identifying foreign objects and debris (FOD) and defects during fabrication of a composite structure Systems and methods for identifying foreign objects and debris (FOD) and defects during fabrication of a composite structure. The system includes at least one light source positioned to emit light that illuminates a portion of the composite structure with bright fie... | 06/26/2007 |
| 7218793 | Reducing differential resolution of separations Certain disclosed implementations use digital image processing to reduce the differential resolution among separations or images in film frames, such as, for example, red flare. A location in the red image may be selected using information from another image. The se... | 05/15/2007 |
| 7215808 | High throughout image for processing inspection images Disclosed is an image processing system for analyzing images of a specimen to determine whether the specimen contains defects. The system includes a plurality of processors for receiving image data from a specimen and for analyzing one or more selected patch(es) of ... | 05/08/2007 |
| 7214925 | Pattern method and system for detecting foreign object debris A method of detecting a non-fixed object in a system (12) includes applying a light emitting or generating substance to multiple objects. The objects are illuminated with an object illuminator (13). At least one of the objects (10) is determined... | 05/08/2007 |
| 7203355 | Automatic optical inspection system and method A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article. ... | 04/10/2007 |
| 7199816 | Device and method for picking up image of component, and component mounting apparatus An image pickup camera is arranged, so that a plurality of components are adapted to be sequentially imaged by corresponding image pickup device with a timing whereby light for imaging is prevented from affecting the other image pickup operation while the components... | 04/03/2007 |
| 7190393 | Camera with improved illuminator An illumination and imaging system is provided with a co-axial illuminator that does not include a beamsplitter. The co-axial illuminator achieves efficiencies substantially in excess of those achieved with a beamsplitter. In one aspect, an optical stop is used to r... | 03/13/2007 |
| 7190822 | Method for customizing an integrated circuit element A customizing method includes steps which consist in: a) determining on the basis of a circuit model, a set of vectors each corresponding to a theoretical operating time of the circuit when a predetermined sequence of tests is applied, the coefficients of each vecto... | 03/13/2007 |
| 7180530 | Visual display testing, optimization and harmonization method and system A method and system for automatically testing visual displays and automatically optimizing the voltage settings for each visual display being tested by harmonizing and tailoring the voltage settings applied to the display and automatically setting into memory the co... | 02/20/2007 |
| 7181058 | Method and system for inspecting electronic components mounted on printed circuit boards A method and system are provided for inspecting electronic components mounted on printed circuit boards utilizing both 3-D and 2-D data associated with the components and the background on which they are mounted on the printed circuit board. Preferably, a 3-D scanne... | 02/20/2007 |
| 7177458 | Reduction of false alarms in PCB inspection A method for automatically optically inspecting an electrical circuit (12), comprising: acquiring at least one optical image of an electrical circuit (12); generating at least one first inspection image from the at least one image and determining regio... | 02/13/2007 |
| 7159754 | Apparatus and method for corrective soldering The invention relates to a method for soldering an object comprising several soldered joints. The method comprises the steps of mechanically soldering of at least some of the soldered joints, visually assessing the soldered joints, and correctively soldering the vis... | 01/09/2007 |
| 7158153 | Method and circuit for adjusting background contrast in a display device A method for adjusting the contrast of a background region in a display device is provided. A video signal for a background region is received in a background region mode. The gain of the video signal is adjusted responsive to a background region control signal ther... | 01/02/2007 |
| 7155652 | Digital signal processing for real time classification of failure bitmaps in integrated circuit technology development A system and method for processing tester information is provided having a system-under-test. A pattern is written to the system-under-test, and a pattern is read therefrom. The pattern written is then compared to the pattern read from the system-under-test. The sig... | 12/26/2006 |
| 7149340 | Mask defect analysis for both horizontal and vertical processing effects A method and system for detecting defects in a physical mask used for fabricating a semiconductor device having multiple layers is disclosed, where each layer has a corresponding mask. The method and system include receiving a digital image of the mask, and automati... | 12/12/2006 |
| 7149343 | Methods for analyzing defect artifacts to precisely locate corresponding defects Described are methods and systems for providing improved defect detection and analysis using infrared thermography. Test vectors heat features of a device under test to produce thermal characteristics useful in identifying defects. The test vectors are timed to enha... | 12/12/2006 |
