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| Number | Title | Issue Date |
| 8044703 | Diversity signal processing system and a producing method thereof Each of APRM units equipped for each of the diversity channels has printed circuit boards having circuit patterns thereon and a circuit description elements installed on the printed circuit board. The circuit description elements are FPGA elements manufactured by mu... | 10/25/2011 |
| 7969229 | On-chip redundancy high-reliable system and method of controlling the same A comparator circuit for comparing outputs of an on-chip redundant system is mounted on a second semiconductor chip that is separate from the on-chip redundant system. The second semiconductor chip which preferably contains a power source circuit for supplying power... | 06/28/2011 |
| 7477091 | Defect tolerant redundancy Circuits, methods, and apparatus for using redundant circuitry on integrated circuits in order to increase manufacturing yields. One exemplary embodiment of the present invention provides a circuit configuration wherein functional circuit blocks in a group of circui... | 01/13/2009 |
| 7432755 | Programming current stabilized electrical fuse programming circuit and method An electrical fuse programming circuit and a method for programming an electrical fuse within the electrical fuse programming circuit use a programming circuit bus to which are electrically connected in parallel the electrical fuse and a bypass resistor. A current w... | 10/07/2008 |
| 7403061 | Method of improving fuse state detection and yield in semiconductor applications Disclosed are embodiments of an apparatus incorporating a detection circuit adapted for determining the state of selected fuses and a programming circuit for blowing selected fuses on demand. Also, disclosed are embodiments of an associated method. The detection cir... | 07/22/2008 |
| 7352606 | Monotonic counter using memory cells A monotonous counter formed as an integrated circuit, each counting bit being provided by a memory cell containing at least one memorization element formed of a polysilicon resistor, programmable by irreversible decrease in its value. ... | 04/01/2008 |
| 7327629 | Circuit and method for reading an antifuse An antifuse circuit and antifuse reading method for determining whether an antifuse is programmed or un-programmed. An antifuse circuit includes a sensing circuit having a sense node coupled to the antifuse that is configured to generate a reference current and comp... | 02/05/2008 |
| 7327628 | Circuit and method for reading an antifuse An antifuse circuit and antifuse reading method for determining whether an antifuse is programmed or un-programmed. An antifuse circuit includes a sensing circuit having a sense node coupled to the antifuse that is configured to generate a reference current and comp... | 02/05/2008 |
| 7317344 | Function selection circuit using a fuse option scheme A semiconductor device is provided as a fuse option circuit. The semiconductor device is configured to include an input, a function selection fuse portion and a reset control circuit portion both connected to the input, and an output connected to the function select... | 01/08/2008 |
| 7304528 | Charge pump with speed control A charge pump circuit includes a test mode control unit for generating a plurality of control signals according to a test mode enable signal and an input signal and fixing one of the plurality of the control signals depending upon whether a fuse has been cut or not,... | 12/04/2007 |
| 7286020 | Techniques for monitoring and replacing circuits to maintain high performance Techniques are provided for monitoring the performance of circuits and replacing low performing circuits with higher performing circuits. A frequency detector compares the frequency of a first periodic signal to the frequency of a second periodic signal. The differe... | 10/23/2007 |
| 7279773 | Protection device for handling energy transients A protection device for handling energy transients includes a plurality of basic unit Zener diodes connected in series to achieve a desired breakdown voltage. Each of the basic unit Zener diodes is formed in a first-type substrate. Each of the basic unit Zener diode... | 10/09/2007 |
| 7277349 | Circuit and method for reading an antifuse An antifuse circuit and antifuse reading method for determining whether an antifuse is programmed or un-programmed. An antifuse circuit includes a sensing circuit having a sense node coupled to the antifuse that is configured to generate a reference current and comp... | 10/02/2007 |
| 7271644 | Multi-state electrical fuse An integrated circuit for programming an electrical fuse includes a first programming device coupled to the electrical fuse for selectively providing the same with a first programming current, and a second programming device coupled to the electrical fuse for select... | 09/18/2007 |
| 7250809 | Boosted voltage generator The present invention provides a boosted voltage generator of a semiconductor device where a boosted voltage efficiency and drivability at a target boosted voltage level can be evaluated accurately by employing an enable signal generator. The boosted voltage generat... | 07/31/2007 |
| 7237169 | Cross-monitoring sensor system and method Cross-monitoring sensor system and method in which a plurality of sensors each having a sensing element, circuitry for processing signals from the sensing element, an output interface for delivering processed signals, and an auxiliary input to which signals from ano... | 06/26/2007 |
| 7233539 | Non-volatile fuse circuit A non-volatile memory cell 100 includes a static latch 125 having a first terminal and a second terminal, a first transistor 124 having a first current electrode coupled to said first terminal of said static latch 125 and a fusible elemen... | 06/19/2007 |
| 7230468 | Systems and methods for providing distributed control signal redundancy among electronic circuits In one embodiment, a distributed redundant control signal distribution system comprises a first control signal source co-located with a first set of control signal controlled circuit elements, at least one second control signal source co-located with a second set of... | 06/12/2007 |
| 7228249 | Methods and apparatus for determining the condition of a sensor and identifying the failure thereof Methods and apparatus are provided which generate an error signal if a sensor is either anticipated to fail or fails. At least two sensors provide input signals having magnitudes that approximately correspond to a sensed event. A processor calculates an actual corre... | 06/05/2007 |
| 7215176 | Analog value adjustment circuit, display driver circuit, and method of adjusting analog value An analog value adjustment circuit includes a fuse circuit that outputs fuse data whose value changes corresponding to whether first through Nth (N is an integer of two or more) fuse elements are in a cutting state, or in a non-cutting state and an analog value outp... | 05/08/2007 |
| 7196570 | Multiple-time programmable resistance circuit Fuse circuit designs and the use thereof are disclosed. In one example, a fuse circuit providing predictable total resistances for multiple rounds of programming comprises a predetermined number of fuse stages coupled in series. Each stage comprises a first and a se... | 03/27/2007 |
| 7190629 | Circuit and method for reading an antifuse An antifuse circuit and antifuse reading method for determining whether an antifuse is programmed or un-programmed. An antifuse circuit includes a sensing circuit having a sense node coupled to the antifuse that is configured to generate a reference current and comp... | 03/13/2007 |
| 7180361 | Antifuse programming circuit in which one stage of transistor is interposed in a series with antifuse between power supplies during programming The antifuse programming circuit of the present invention includes a plurality of antifuses, a first transistor for selecting an antifuse for programming from among the plurality of antifuses, and a second transistor. A selection signal for selecting an antifuse is ... | 02/20/2007 |
| 7119603 | Static, low-voltage fuse-based cell with high-voltage programming A fuse-based cell is described. The fuse-based cell includes a fuse with a programming device coupled to the fuse to program the fuse. A sense device is coupled to the fuse to sense a programming state of the fuse. A pass device is coupled to the sense device to con... | 10/10/2006 |
| 7114084 | Data controlled programmable power supply A power supply, and a method of controlling the power supply, in which more or less power capacity of the power supply is activated depending on the state of a digital data signal on a data bus. The power supply has a control circuit which detects the number of “z... | 09/26/2006 |
| 7098721 | Low voltage programmable eFuse with differential sensing scheme An electronic fuse structure is disclosed for integrated circuits that is programmable with low voltage and incorporates a differential sensing scheme. The programming step is performed at about 1.5 times Vdd while the sense operation is performed at Vdd, which limi... | 08/29/2006 |
| 7091768 | Circuit for controlling internal supply voltage driver Provided is directed to an internal supply voltage driver control circuit which can vary a driver size by way of selecting a driver control signal by using a fuse cutout, and also decide an internal voltage by using fuses, by means of including: a plurality of drive... | 08/15/2006 |
| 7079412 | Programmable MOS device formed by stressing polycrystalline silicon A programmable memory circuit and a method for programming the same are disclosed. A polycrystalline silicon resistor pair are used in a programmable memory cell. The pair includes a first polycrystalline silicon resistor stressable by a predetermined current therea... | 07/18/2006 |
| 7057441 | Block selection circuit Provided is directed to a block selection circuit, comprising a reference fuse block by copying fuse blocks to output a reference signal later than or at the same time to decision signals which are outputted from fuse blocks which distinguish whether an external add... | 06/06/2006 |
| 7002219 | Electrical fuse for integrated circuits An electrically programmable fuse includes a metal-oxide-semiconductor (MOS) programmable transistor that is gate-source coupled by a resistive element. The resistive element can comprise a gate-source coupled MOS transistor. If the MOS transistor is unprogrammed, t... | 02/21/2006 |
| 6989707 | Semiconductor circuit and initialization method A semiconductor circuit has at least one generator fuse for setting a supply voltage and at least one redundancy fuse for activating a redundancy element. A first read-out device is provided for reading out the generator fuse and a second read-out device reads out t... | 01/24/2006 |
| 6972613 | Fuse latch circuit with non-disruptive re-interrogation Information concerning a condition of a fuse is stored in a latch circuit and may be corrected. A first signal is supplied to the latch circuit which sets the latch circuit in a first state when the fuse is in a first condition and keeps the latch circuit unchanged ... | 12/06/2005 |
| 6952119 | Auxiliary output driver A BiCMOS auxiliary output driver is provided to maintain output logic signal levels when integrated circuit chip power supply voltage is outside its nominal range. When the power supply voltage level is within design tolerance for a MOSFET output driver stage, the a... | 10/04/2005 |
| 6949969 | Semiconductor device having relief circuit for relieving defective portion A semiconductor device includes a relief-subject circuit, a relief circuit, and a plurality of fuse elements. The relief-subject circuit implements a predetermined function. The relief circuit is provided to relieve the relief-subject circuit in order to implement t... | 09/27/2005 |
| 6925024 | Zero power chip standby mode A zero power standby mode in a memory device used in a system, such as a battery powered hand held device. By disconnecting the internal power supply bus on the memory device from the external power supply during standby mode, the junction leakage and gate induced d... | 08/02/2005 |
| 6882214 | Circuit and method for trimming locking of integrated circuits A trimming locking circuit is provided for IC using a programmable fuse array for after-assembly trimming procedures. In one embodiment, a trimming locking circuit is provided for a single power supply input into the programmable fuse array. In another embodiment, a... | 04/19/2005 |
| 6879207 | Defect tolerant redundancy Circuits, methods, and apparatus for using redundant circuitry on integrated circuits in order to increase manufacturing yields. One exemplary embodiment of the present invention provides a circuit configuration wherein functional circuit blocks in a group of circui... | 04/12/2005 |
| 6859090 | Buried fuse reading device A buried fuse reading device includes at least one buried fuse and at least one sense amplifier sensing a condition of the buried fuse. A validation circuit in the buried fuse reading device detects and indicates when output from the sense amplifier is valid. ... | 02/22/2005 |
| 6842065 | Electrical fuse programming control circuit An electrical fuse programming control circuit includes a plurality of fuse blocks each having a plurality of electrical fuses and an end fuse block. When all of the fuse blocks are programmed, the end fuse block is enabled and generates a programming control signal... | 01/11/2005 |
| 6819160 | Self-timed and self-tested fuse blow An apparatus and method for blowing fuses in an integrated circuit. The apparatus and method use a plurality of fuse blowing circuits coupled serially. Each successive fuse blowing circuit is activated by an activate signal generated by a previous fuse blowing circu... | 11/16/2004 |
