Did You Know...
...that to encourage use of his new invention, the shopping cart, market owner Sylvan Goldman hired fake shoppers to push the carts around his store in Oklahoma City? Seems his customers were reluctant to give up their hand-carried baskets.
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| Number | Title | Issue Date |
| 7294102 | Method and apparatus for providing depth control or z-actuation A position control apparatus for controlling position along an axis, comprising: an extensible member that can be extended and contracted along said axis, comprising shape memory alloy locatable to expand and contract along said axis, heating means for controlling s... | 11/13/2007 |
| 7295154 | Vehicle obstacle warning radar A method for detecting an object using a transmitting antenna and an array of receiving antennas. The method comprises the step of transmitting a signal from the transmitting antenna. The magnitude and phase of a respective received signal at each of the receiving a... | 11/13/2007 |
| 7295581 | External cavity tunable optical transmitters External cavity optical transmitters are disclosed which include a gain chip and a mirror that define an optical cavity. The optical cavity may include collimating lenses, electro-optic crystals for controlled phase shift, and additional frequency selective optical ... | 11/13/2007 |
| 7292053 | High-voltage measuring device The present invention provides a high-voltage measuring device capable of providing sufficient electric isolation between resistors and between resistors and a voltage measurement circuit without necessity of enlarging a size of a substrate for carry thereon the cir... | 11/06/2007 |
| 7276911 | Detection of malfunctioning bulbs in decorative light strings A system for locating a malfunctioning bulb in a decorative light string uses an antenna that produces an output signal corresponding to the strength of the electric field produced by a portion of the light string near the antenna. An amplifier is coupled to the ant... | 10/02/2007 |
| 7259549 | Shield for tester load board The invention provides tester load board shields for attachment to tester load boards. The shields of the invention protect from physical damage and electromagnetic interference. A preferred embodiment of a tester load board shield of the invention is disclosed in w... | 08/21/2007 |
| 7256572 | Electric-field meter having current compensation An electric-field meter provided with a housing, an electrode assembly, a shield assembly, a movement assembly, a position detection assembly, a charge measurement circuit, and a leakage current compensation circuit. The electric-field meter can be characterized as ... | 08/14/2007 |
| 7250783 | Current mirror multi-channel leakage current monitor circuit and method A current mirror multi-channel leakage monitor circuit and method measures die leakage and generates digital keeper control bits to control a process compensated dynamic circuit. The leakage monitor enables high resolution on-chip leakage measurements in multiple lo... | 07/31/2007 |
| 7250778 | Wafer test apparatus including optical elements and method of using the test apparatus Wafer-level testing is performed on an electronic device to be used in an optical communications system. An optical test signal is generated and is provided to a first photo detector. An electrical output of the first photo detector is supplied to the electronic dev... | 07/31/2007 |
| 7248059 | Low power sensor Embodiments of the present disclosure relate to methods, sensors, and systems for low power sensing. One method for low power sensing includes receiving a detection signal from a detector of a sensor to a delay flip flop (DFF). The method includes switching a DFF ou... | 07/24/2007 |
| 7242176 | Systems and methods for evaluating electromagnetic interference Systems and methods for evaluating electromagnetic interference that may be employed, for among other things, to evaluate electronic system immunity to radiated electromagnetic fields and/or to identify particular electronic system areas that are susceptible to elec... | 07/10/2007 |
| 7239125 | Method and apparatus for electronic meter testing An electronic energy meter senses input voltage and current signals and processes the input voltage and current signals to generate measurements of multiple types of power. The meter comprises a processing system for selecting one of the multiple types of power and ... | 07/03/2007 |
| 7239446 | Optical reduction system with control of illumination polarization An optical reduction system with polarization dose sensitive output for use in the photolithographic manufacture of semiconductor devices having variable compensation for reticle retardation before the long conjugate end. The variable compensation component(s) befor... | 07/03/2007 |
| 7239124 | Current measurement technique and current measurement apparatus A current measurement method for measuring a current that flows in a transmission line of an electric circuit including steps of installing a magnetooptical device in a magnetic field which is generated based upon current that flows in the transmission line, making ... | 07/03/2007 |
| 7235962 | Inductor-based current sensing A circuit for sensing a current in an inductor is described. Integrator circuitry is operable to generate a first signal representing an integration of a voltage across the inductor. Comparison circuitry is operable to generate a reset signal each time the first sig... | 06/26/2007 |
| 7231060 | Systems and methods of generating control signals Separating a source in a stereo signal having a left channel and a right channel includes transforming the signal into a short-time transform domain; computing a short-time similarity measure between the left channel and the right channel; classifying portions of th... | 06/12/2007 |
| 7224174 | Optical alignment loops for the wafer-level testing of optical and optoelectronic chips This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light to/from the top of the wafer. A wafer level test system uses an optical probe to search for and align with an optical alig... | 05/29/2007 |
| 7221451 | Multi-channeled measuring method and apparatus for measuring spectrum of terahertz pulse A method for measuring a spectrum of a terahertz pulse includes generating a terahertz pulse using an ultrashort pulsed pumping light, generating a white light pulse using an ultrashort pulsed probe light, stretching and chirping the white light pulse modulating the... | 05/22/2007 |
| 7196657 | Radar system using RF noise A radar system that utilizes predetermined, pseudorandom, or random waveforms that may be substantially matched to the impulse response of the radar and any surrounding clutter such that the signal-to-clutter ratio may be optimized and/or such that specific targets ... | 03/27/2007 |
| 7176671 | Current measuring device A current measuring apparatus comprises a current detection unit 10 and a photoelectric converter 20. The current detection unit 10 comprises an optical fiber sensor 11 extended or looped around a conductor 30. A reflective film | 02/13/2007 |
| 7177071 | Semiconductor crystal for generating terahertz waves, terahertz wave-generator incorporating the crystal, semiconductor crystal for detecting terahertz waves, and terahertz waves detector incorporating the crystal A terahertz wave-generating semiconductor crystal includes a zincblende-type III-V compound semiconductor crystal that generates terahertz wave pulses upon application of an ultrashort light pulse in the optical communication band serving as a pump beam. ... | 02/13/2007 |
| 7173956 | Electrically controlled uniform or graded reflectivity electro-optic mirror An electrically controlled variable reflectance mirror that includes a Pockels cell which enables its retardation or birefringence to be controlled in order to vary the light outcoupled from a laser cavity. Since the retardation is a function of the voltage applied ... | 02/06/2007 |
| 7170606 | Multi-way LED-based surface reflectance sensor and spectrophotometer A light sensor circuit based on direct connection of LEDs to I/O pins of a microcontroller. The LEDs are reverse biased and the parasitic junction capacitance is charged in an output mode. Then, the I/O pins placed into an high-impedance input mode. The time for the... | 01/30/2007 |
| 7170277 | Shield for tester load boards The invention provides tester load board shields (10, 40) for attachment to tester load boards. The shields (10, 40) of the invention protect from physical damage and electromagnetic interference. A preferred embodiment of a tester load board shield ( | 01/30/2007 |
| 7166851 | Semiconductor chip-based radiation detector The present invention is a self-contained device for measuring exposure to radiation which includes an integrated circuit device incorporating a polymer dispersed liquid crystal component that resides on a semiconductor substrate. ... | 01/23/2007 |
| 7158012 | Non-invasive powerline communications system A non-invasive powerline communications system includes: means for generating communication signals at a first location for transmission on a powerline; means for reactively coupling the communication signals to the powerline; and means for receiving said communicat... | 01/02/2007 |
| 7147352 | Precision light emitting device A light emitting device includes a hollow truncated spherical housing having an inner surface and an outer surface. The housing is substantially transparent. A light source, that generates a plurality of light rays, is positioned with respect to the housing to minim... | 12/12/2006 |
| 7139476 | Distributed fiber sensor with detection and signal processing using polarization state management Polarization effects are managed to provide differential timing information for localizing disturbances affecting two or more counter-propagating light signals on one or more optical waveguides passing through a detection zone. Activity can be localized to a point f... | 11/21/2006 |
| 7130340 | Noise margin self-diagnostic receiver logic A noise margin self-diagnostic receiver circuit has been developed. The self-diagnostic circuit includes one comparator for comparing the signal voltage to a high reference voltage, a second comparator for comparing the signal voltage to a low reference voltage, and... | 10/31/2006 |
| 7130048 | Method and apparatus for forming substrate for semiconductor or the like In an apparatus which determines characteristics of a thin film according to the present invention, a temporal change in a refractive index n and an extinction coefficient k of a thin film in a period from start of a change in the thin film as a processing target (e... | 10/31/2006 |
| 7129693 | Modular voltage sensor A voltage sensor is described that consists of a plurality of identical series-connected sections, where each section is comprised of an arrangement of impedance elements. The sensor is optimized to provide an output ratio that is substantially immune to changes in ... | 10/31/2006 |
| 7129491 | Diffraction mode terahertz tomography A method of obtaining a series of images of a three-dimensional object. The method includes the steps of transmitting pulsed terahertz (THz) radiation through the entire object from a plurality of angles, optically detecting changes in the transmitted THz radiation ... | 10/31/2006 |
| 7126348 | Method and a device for voltage measurement in a high-voltage conductor Measuring equipment for forming a measured value for voltage representing an ac voltage on a high-voltage conductor. The measuring equipment includes capacitor equipment with a known capacitance for connection between the high-voltage conductor and ground potential.... | 10/24/2006 |
| 7121737 | Light emitting unit operative at high coupling efficiency, optical sensor system and musical instrument using the same A light emitting device includes an optical fiber plug formed with a through-hole into which a bundle of optical fibers is inserted and a light-emitting device holder formed with a through-hole in which a condenser lens and a light emitting device are accommodated, ... | 10/17/2006 |
| 7123032 | Voltage sensor and dielectric material A voltage sensor is described that consists of an arrangement of impedance elements. The sensor is optimized to provide an output ratio that is substantially immune to changes in voltage, temperature variations or aging. Also disclosed is a material with a large and... | 10/17/2006 |
| 7123676 | Method and system for antenna interference cancellation A wireless communication system can comprise two or more antennas that interfere with one another via free space coupling, surface wave crosstalk, dielectric leakage, or other interference effect. The interference effect can produce an interference signal on one of ... | 10/17/2006 |
| 7119339 | Transmission mode terahertz computed tomography A method of obtaining a series of images of a three-dimensional object by transmitting pulsed terahertz (THz) radiation through the entire object from a plurality of angles, optically detecting changes in the transmitted THz radiation using pulsed laser radiation, a... | 10/10/2006 |
| 7120048 | Nonvolatile memory vertical ring bit and write-read structure A magnetoresistive memory cell and array are provided for nonvolatile storage of binary information. According to an embodiment, a memory cell has a ring-shaped magnetoresistive multilayer element (or bit). A plurality of vias pass through a center hole in the ring-... | 10/10/2006 |
| 7113534 | Device for generating terahertz radiation, and a semiconductor component The invention relates to a device for generating terahertz (THz) radiation comprising a short pulse laser (1) with mode coupling to which a pump beam (3) is supplied, and comprising a semiconductor component equipped with a resonator mirror (M4)... | 09/26/2006 |
| 7109739 | Wafer-level opto-electronic testing apparatus and method A wafer-level testing arrangement for opto-electronic devices formed in a silicon-on-insulator (SOI) wafer structure utilizes a single opto-electronic testing element to perform both optical and electrical testing. Beam steering optics may be formed on the testing e... | 09/19/2006 |
