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| Number | Title | Issue Date |
| 4994736 | Method and structure for extracting lateral PNP transistor basewidth data at wafer probe A method to extract at wafer probe the variation of lateral PNP basewidth of transistors formed in an integrated circuit which uses two lateral PNP devices having different and known basewidths before fabrication of the devices in the integrated circuit a... | 02/19/1991 |
| 4538106 | Output transistor driver diagnostic system An apparatus for diagnosing the operation of a plurality of output transistor drivers includes a plurality of detection transistors, a reference resistor and a voltage detector. Each detection resistor is coupled from a collector of one output transistor ... | 08/27/1985 |
| 4520448 | Method of characterizing reliability in bipolar semiconductor devices This invention concerns a method of characterizing the reliability in bipolar semiconductor devices having reliability detracting leakage current due to a parasitic FET transistor between the p-type isolation (source) and base regions (drain) of the bipol... | 05/28/1985 |
