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An armor with rollers is provided that enables a user to move in all positions by rolling on a hard and smooth surface while constantly varying his bearing points on the ground.
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| Number | Title | Issue Date |
| 4129823 | System for determining the current-voltage characteristics of a photovoltaic array A nonlinear load circuit, consisting of a transistor and a resistor in series, is provided for the photovoltaic array under test. Base bias for the transistor is supplied via the source-to-drain path of a field effect transistor (FET). A ramp signal is fe... | 12/12/1978 |
| 4125806 | Non-destructive screening device for glass diode A non-destructive screening device for a glass diode includes a first circuit which determines a semiconductor element is acceptable when detecting a current oscillation caused by a micro plasma oscillation arising when the semiconductor current avalanche... | 11/14/1978 |
| 4114096 | Method of testing semiconductor devices A method of testing semiconductor devices at low temperatures comprises the steps of first directing a relatively cold fluid upon the device for a time long enough to reduce the temperature thereof below the temperature at which it is to be tested, then i... | 09/12/1978 |
| 4090132 | Measurement of excess carrier lifetime in semiconductor devices A system is provided for measuring excess carrier lifetime in semiconductor devices. A series of rectangular current pulses is applied to the device to be tested, and the slope of the open-circuit voltage decay curve following termination of each pulse is... | 05/16/1978 |
| 4080571 | Apparatus for measuring the current-voltage characteristics of a TRAPATT diode An apparatus for measuring the current-voltage characteristics of a TRAPATT diode to determine its operational performance prior to mounting in its intended circuit. The apparatus comprises a pulse generator for generating a pulsed signal which is modulat... | 03/21/1978 |
| 4074195 | Semiconductor tester An apparatus for testing the operating state of single and multiple semiconductor junctions, either in or out of circuit. The tester includes a testing circuit which in turn includes a transformer having a secondary with plurality of voltage tap leads, wh... | 02/14/1978 |
| 4062632 | Constant modulation index technique for measuring the derivatives of device parameters Described is a technique for generating directly certain derivatives of device parameters by measuring the device response to ac modulation under conditions of constant modulation index. In particular, the technique as it applies to measuring directly idF... | 12/13/1977 |
| 4041374 | Interelectrode open and short circuit tester A series of input pulses are applied to one terminal of an electron tube having at least two electrodes. As a result of interelectrode capacitance, the input pulses produce output pulses at the other electrodes, the output pulses having amplitudes which a... | 08/09/1977 |
| 4041388 | Transistor circuit The base-emitter junction of a bipolar transistor is first forward biased to place the transistor in a state of conduction and the forward bias is then removed. A discharge path is provided for the base-emitter capacitance of the transistor, this path inc... | 08/09/1977 |
| 4015203 | Contactless LSI junction leakage testing method An inductively coupled oscillator method for inducing eddy currents in a semiconductor PN junction wafer while irradiating said wafer with pulsed light of selected intensity. The oscillator loading due to the pulsed light modulated eddy current losses is ... | 03/29/1977 |
| 4012695 | Method and apparatus for quality control of semiconductor devices and integrated circuits The present method provides for the use as criterion the coefficient m of a deviation of the actual current-voltage characteristic of the p-n junction of a semiconductor device or integrated circuit under test obtained by applying a varying current in the... | 03/15/1977 |
| 4005361 | Performance assurance apparatus for phased antenna array drives A circuit for monitoring the accuracy of the phase shift produced in an r.f. power distribution network in which the phase shift network includes diodes, means for sensing the conductive state of the terminating diodes, and structure for comparing the sta... | 01/25/1977 |
| 3988672 | Parametric tester for semiconductor devices A tester for conducting parametric tests on semiconductor devices comprises a current source means to be electrically coupled to a particular lead of the device under test to supply the maximum current specified to be drawn by said lead at a fixed voltage... | 10/26/1976 |
| 3976377 | Method of obtaining the distribution profile of electrically active ions implanted in a semiconductor A method of obtaining a distribution profile of electrically active ions, of one type conductivity, implanted into a semiconductor, of an opposite type conductivity, is carried out with the aid of an integral target of the semiconductor. The integral targ... | 08/24/1976 |
| 3975683 | In-circuit diode tester An arrangement is described for testing diodes serially interposed in parallel feed lines between the terminals of a voltage source and corresponding d.c. bus bars. The arrangement provides for in-circuit check out of the diodes by providing a first switc... | 08/17/1976 |
| 3973198 | In-circuit semiconductor tester An apparatus for testing the junctions of a semiconductor while the semiconductor is in an electrical circuit. The apparatus includes a step-down transformer which operates preferably from a 120 volt AC source. A low voltage secondary winding preferably i... | 08/03/1976 |
| 3939415 | Method of and device for measuring life time of carriers of semiconductor There is disclosed a method of and device for measuring characteristics of a semiconductor by way of a microwave. The variation with time in the concentration of carriers which are produced in the semiconductor by applying an energy thereto from an extern... | 02/17/1976 |
