Bizarre Patents
Mountable Printable Placard With Headband
A resilient headband in a shape for being mounted on the head of the user. The headband is equipped with a longitudinal slotted member for holding a placard.
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| Number | Title | Issue Date |
| 8063651 | Contact for electrical test of electronic devices, probe assembly and method for manufacturing the same A contact for an electrical test comprises a first area to be bonded to a board, a second area extending in the right-left direction from the lower end portion of the first area, a third area projecting downward from the tip end portion of the second area, and a low... | 11/22/2011 |
| 7868635 | Probe An object is to provide a probe, a probe card, and a testing device which can precisely perform a test for conductive state of a conductive wiring in, for example, a through hole or a contact hole provided in a circuit board. Provided is a probe (10) for perf... | 01/11/2011 |
| 7868636 | Probe card and method for fabricating the same A probe card for testing semiconductor chips on a semiconductor wafer, includes a circuit board receiving electrical signals from outside, a plurality of unit probe modules contacting the semiconductor chips on the wafer to transfer the electrical signals, a space t... | 01/11/2011 |
| 7808261 | Contact with plural beams To precisely control behavior of a probe at a portion near a contact, and to provide a probe with small electric capacity which can be used to inspect chips having high-speed and high-capacity signals. A parallel spring probe based on a principle of a link mechanism... | 10/05/2010 |
| 7800388 | Curved spring structure with elongated section located under cantilevered section A curved spring structure includes a base section extending parallel to the substrate surface, a curved cantilever section bent away from the substrate surface, and an elongated section extending from the base section along the substrate surface under the cantilever... | 09/21/2010 |
| 7791364 | Electronic device probe card with improved probe grouping The probe card includes a plurality of probes arranged on one surface side of a board. These probes belonging to any one of a first probe group including a plurality of probes contacting respective electrodes in a first electrode row of an electronic device, a secon... | 09/07/2010 |
| 7782072 | Single support structure probe group with staggered mounting pattern A probe group can include multiple probes for testing devices having contact pads. The probes can comprise beams, contact tip structures, and mounting portions. The beams can provide for controlled deflection of the probes. The contact tip structures can be connecte... | 08/24/2010 |
| 7737714 | Probe assembly arrangement A probe array is assembled on a probe card platform. Each of the probes in the probe array has a probe base that includes a gripping handle. The probe bases have two or more different shapes. The probe bases of different shapes are interleaved such that any two adja... | 06/15/2010 |
| 7724010 | Torsion spring probe contactor design The present invention relates to a probe for making electrical connection to a contact pad on a microelectronic device. A foot having a length, a thickness, a width, a proximal end, and a distal end, is connected to a substrate. The length of the foot is greater tha... | 05/25/2010 |
| 7688097 | Wafer probe The present invention relates to a probe tip assembly for testing of integrated circuits or other microelectronic devices. The probe tip assembly may include a plurality of independently flexible contact fingers extending from a support, each contact finger spaced a... | 03/30/2010 |
| 7679389 | Probe for electrical test and electrical connecting apparatus using it A probe includes an arm region extending in the back and forth direction, and a tip region extending downward from the front end portion of the arm region. The tip region has a pedestal portion integrally continuous to a lower edge portion at the front end side of t... | 03/16/2010 |
| 7679388 | Cantilever microprobes for contacting electronic components and methods for making such probes Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to various designs of cantilever-like probe structures. Some embodiments ... | 03/16/2010 |
| 7671616 | Semiconductor probe having embossed resistive tip and method of fabricating the same A semiconductor probe having an embossed resistive tip and a method of fabricating the semiconductor probe are provided. The semiconductor probe includes a protrusion portion protruded to a predetermined height on a cantilever in a first direction crossing a length ... | 03/02/2010 |
| 7629806 | Method for forming connection pin, probe, connection pin, probe card and method for manufacturing probe card A probe which can be easily formed, is not limited in a mounting position and number, and capable of sufficiently securing a space allowing a contact to move is provided. The probe has a contact to be brought into contact with an inspection object, and a beam part s... | 12/08/2009 |
| 7629807 | Electrical test probe A probe for electrical test comprises a plate-shaped main portion having a base end to be attached to a support board and a tip end opposite the base end, and a probe tip portion arranged at the tip end of the main portion and having a probe tip to contact an electr... | 12/08/2009 |
| RE41016 | Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits A probe card which can help to enhance the productivity of semiconductor integrated circuits manufacturing and to reduce the manufacturing cost thereof, and a method of probe-testing semiconductor integrated circuits by using the probe card. The probe card is design... | 12/01/2009 |
| 7619429 | Integrated probe module for LCD panel light inspection A probe module which is particularly suitable for testing an LCD panel. The probe module includes a probe base, a plurality of probe pins provided on the probe base, and a high-density circuit interconnection which includes a flexible circuit board that connects the... | 11/17/2009 |
| 7619430 | Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes Disclosed is a probe assembly for use in electrical testing of a test object. The probe assembly has a probe supporter body elongated in a first direction. The probe supporter has a first side surface, a second side surface, a first facing surface and a second facin... | 11/17/2009 |
| 7602204 | Probe card manufacturing method including sensing probe and the probe card, probe card inspection system There is provided a method of manufacturing a probe card. A first passivation pattern for implementing a tip portion of an electrical inspection probe and a tip portion of a planarity sensing probe on a sacrificial substrate is formed, and an etching process using t... | 10/13/2009 |
| 7589547 | Forked probe for testing semiconductor devices A novel forked probe design for use in a novel probe card is presented that comprises a forked bending element that more efficiently stores displacement energy. Specifically, the novel probe card comprising a substrate and a forked probe connected to the substrate. ... | 09/15/2009 |
| 7586321 | Electrical test probe and electrical test probe assembly An electrical test probe comprises a probe tip portion and a probe main body portion having a pedestal portion on which the probe tip portion is formed to be protruded. The probe main body portion is made of a conductive material that is greater in toughness than th... | 09/08/2009 |
| 7583100 | Test head for testing electrical components A test head for testing electronic parts including a base having radial slots for receiving contact mounting assemblies. The contact mounting assemblies are removably mounted to the base and are radially adjustable in order to test parts having different diameters a... | 09/01/2009 |
| 7583101 | Probing structure with fine pitch probes A microelectronic resilient structure can comprise a support member and a platform attached to the support member. The platform can comprise a non-conductive, resilient beam that extends away from the support member, and a plurality of conductive members can be disp... | 09/01/2009 |
| 7579855 | Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby Disclosed is an electrical contact element used to test an electronic device. The electrical contact element has a beam portion and a tip portion attached to an end of the beam portion. In representative embodiments, a part of the beam portion is bent, e.g., such th... | 08/25/2009 |
| 7579856 | Probe structures with physically suspended electronic components A probe apparatus can include a substrate, a contact structure attached to the substrate, and an electronic component electrically connected to the contact structure. The electronic component can be attached to the contact structure. ... | 08/25/2009 |
| 7579857 | Electrical contact device of probe card An electrical contact device of a probe card includes a base and probes on the base. The base has a top side with a cavity thereon, and the cavity has sidewalls connected to the top side. Anchored portion are provided on the sidewalls of the cavity. Each of the prob... | 08/25/2009 |
| 7573281 | Probe for inspecting one or more semiconductor chips A probe available for a narrow pitch pad without the need of cleaning is realized by providing a z deformed portion that is elastically deformed in a vertical direction, and a zθ deformed portion that is serially connected to the z deformed portion to rotate while ... | 08/11/2009 |
| 7557595 | Cantilever microprobes for contacting electronic components and methods for making such probes Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to various designs of cantilever-like probe structures. Some embodiments ... | 07/07/2009 |
| 7548082 | Inspection probe A conventional inspection probe has posed such problems that, when a pitch is as fine as up to 40 μm, a positional accuracy is difficult to ensure depending on constituting materials and a production method, pin breaking occurs when fine-diameter pins contact, a go... | 06/16/2009 |
| 7545160 | Probe chip and probe card The present invention provides a probe chip and a probe card in which when troubles such as breakage etc. occur in a probe of a contact portion of a probe card, the contact portion can be easily replaced with another one. In the probe card having a guide frame, a pr... | 06/09/2009 |
| 7511523 | Cantilever microprobes for contacting electronic components and methods for making such probes Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to various designs of cantilever-like probe structures. Some embodiments ... | 03/31/2009 |
| 7511524 | Contact tip structure of a connecting element The present invention relates to a contact tip structure of a connecting element designed for electric testing of electronic components. The connecting element comprises a fixing post coupled to a first electronic component; a beam extending away from said fixing po... | 03/31/2009 |
| 7495461 | Wafer probe The present invention relates to a probe for testing of integrated circuits or other microelectronic devices. ... | 02/24/2009 |
| 7482826 | Probe for scanning over a substrate and a data storage device A data storage device comprises a storage medium for storing data in the form of marks and at least one probe for scanning the storage medium. The storage medium may be comprised in a substrate. The probe comprises a cantilever that comprises terminals serving as el... | 01/27/2009 |
| 7456646 | Wafer probe The present invention relates to a probe for testing of integrated circuits or other microelectronic devices. ... | 11/25/2008 |
| 7442571 | Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe Provided are a semiconductor probe having a resistive tip, a method of fabricating the semiconductor probe, and a method of recording and reproducing information using the semiconductor probe. The semiconductor probe includes a tip and a cantilever. The tip is doped... | 10/28/2008 |
| 7436194 | Shielded probe with low contact resistance for testing a device under test A probe measurement system having low, stable contact resistance for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. ... | 10/14/2008 |
| 7436192 | Probe skates for electrical testing of convex pad topologies A probe for engaging a conductive pad is provided. The probe includes a probe contact end for receiving a test current, a probe retention portion below the contact end, a block for holding the probe retention portion, a probe arm below the retention portion, a probe... | 10/14/2008 |
| 7427868 | Active wafer probe A probe suitable for probing a semiconductor wafer that includes an active circuit. The probe may have a rigid probing member and include a flexible interconnection between the active circuit and a support structure. The active circuit may have a relatively low capa... | 09/23/2008 |
| 7423441 | Contactor assembly A contactor assembly suitable for high frequency testing and having a large overdrive is to be provided. For this purpose, there is realized a multiple beam-synthesized type contactor assembly including: a resin film constituting a base material; an electroconductiv... | 09/09/2008 |
