Did You Know...
...that the Eveready Battery began as an invention called the "electric flowerpot," which was a tube with a battery and light bulb inside? The idea was to fasten this gizmo to the side of a flowerpot so it would illuminate the flowers from the bottom. The idea died on the vine and the businessman who licensed the flower pot, Conrad Huber, was left with a pile of useless tubes -- until he found a way to market them as batteries to light the world!
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| Number | Title | Issue Date |
| 7872486 | Wing-shaped support members for enhancing semiconductor probes and methods to form the same Example wing-shaped support members for enhancing semiconductor device probes and methods to form the same are disclosed. A disclosed example semiconductor device probe includes a finger having a first end and a second end. The example probe further includes a tip h... | 01/18/2011 |
| 7868634 | Probe or measuring head with illumination of the contact region A probe or measuring head for measuring an electrical signal of an electrical contact has an electrically conducting feeler (1) which protrudes out of a housing (3) and has, at its end, a contact region (4) which comes into touching contact with... | 01/11/2011 |
| 7847571 | Semiconductor test system with self-inspection of electrical channel for Pogo tower A semiconductor test system with self-inspection of an electrical channel for a Pogo tower is disclosed, which provides a short board and closed loops are formed respectively by providing various kinds of contacts to correspondingly electrically contact various kind... | 12/07/2010 |
| 7808260 | Probes for a wafer test apparatus A probe configured for use in the testing of integrated circuits includes a first end portion terminating in a foot (42), the foot defining a substantially flat surface configured to be connected to a substrate (400), a second end portion terminating i... | 10/05/2010 |
| 7772865 | Probe for testing integrated circuit devices A device for providing electrical contact comprises a first reciprocating conductive body having a first abutting body at one end, a second reciprocating conductive body having a second abutting body at one end and a resilient means biasing the first reciprocating c... | 08/10/2010 |
| 7772864 | Contact probe with reduced voltage drop and heat generation A contact probe includes a plurality of probes, each of the probes including: an conductive tube; an conductive plunger, contained in at least one end side of the tube, and having a distal end part protruding outward from the tube in an axial direction of the tube; ... | 08/10/2010 |
| 7764077 | Semiconductor device including semiconductor evaluation element, and evaluation method using semiconductor device Provided are a semiconductor evaluation element capable of analytically estimating the amount of DC variation of a MOS transistor which is caused by formed contacts, and an evaluation circuit and an evaluation method using the semiconductor evaluation element. The s... | 07/27/2010 |
| 7728613 | Device under test pogo pin type contact element A device under test pogo pin type contactor features an active head and an electronic component associated with the active head. A tip is spaced from the active head and a biasing device is between the active head and the tip for biasing the active head against a de... | 06/01/2010 |
| 7724009 | Method of making high-frequency probe, probe card using the high-frequency probe A high frequency probe preparation method for making a high frequency probe for high frequency testing to assure signal integrity by means of making a sleeve assembly subject to the size of a predetermined bare needle and then sleeving bare needle by the sleeve asse... | 05/25/2010 |
| 7692438 | Bimetallic probe with tip end It is an object of the present invention to provide a probe which can provide stable electrical conduction to an electrode of an object to be measured even when it is miniaturized. A probe 100 comprises a columnar contact part 110 which can come in con... | 04/06/2010 |
| 7659739 | Knee probe having reduced thickness section for control of scrub motion An improved knee probe for probing electrical devices and circuits is provided. The improved knee probe has a reduced thickness section to alter the mechanical behavior of the probe when contact is made. The reduced thickness section of the probe makes it easier to ... | 02/09/2010 |
| 7649372 | Die design with integrated assembly aid Methods and systems for inserting and replacing swaged probe pins in a lower die portion of a head having an array of micro-holes for receiving the probe pins are disclosed. The methods and systems include the following: swaged probe pins including substantially cyl... | 01/19/2010 |
| 7639031 | Testing assembly for electric test of electric package and testing socket thereof A testing assembly for an electric package is suitable for electric testing of an electric package. The electric package has many contacts on a contact surface of the electric package. The contacts are arranged along an alignment line. The testing assembly for an el... | 12/29/2009 |
| 7626408 | Electrical spring probe An electrical spring probe has an elongated contact and a helical spring. The spring probe is mounted in a through hole of a non-conductive substrate. The elongated contact includes a head with a V-slot groove for engaging a solder ball lead of an IC package, a shou... | 12/01/2009 |
| 7616019 | Low profile electronic assembly test fixtures Low profile printed circuit board assembly test fixtures and methods are disclosed, the fixtures mountable at a tester having a plurality of conductive interface contacts. The fixture includes a low profile mount defined by a frame having an interface bed at one end... | 11/10/2009 |
| 7612572 | Probe and method of manufacturing a probe A probe 10 to be used when inspecting characteristics of an object of inspection includes: a bar-shaped base member 3 forming a main body; a nickel plating layer 4 constituting a ground layer and a gold plating layer 5 constituting an out... | 11/03/2009 |
| 7586320 | Plunger and chip-testing module applying the same A plunger is suitable for a chip-testing module having a probe card, which has a circuit board and a membrane. The membrane has a circuit layer disposed on a first membrane surface of the membrane, conductive through-vias penetrating the membrane, and bumps disposed... | 09/08/2009 |
| 7570069 | Resilient contact probes Carriers comprising a carrier body having a plurality of openings holding a plurality of resilient contact probes are disclosed. A number of different embodiments for the resilient contact probes is also disclosed. The carriers of the present invention may be secure... | 08/04/2009 |
| 7545159 | Electrical test probes with a contact element, methods of making and using the same Disclosed herein are electrical test probes and methods for making the same. In one embodiment, an electrical test probe comprises: a barrel, a plunger, a contact element, and a spring. The barrel comprises a contact area defined by a stop engagement and an opening ... | 06/09/2009 |
| 7538568 | Spring loaded probe pin A conductive plunger 3 is received inside a cylindrical conductive barrel 2 so as to be capable of moving backward and forward, an urging coil spring 4 for pushing a rear end 3b of the plunger 3 is received inside the barrel... | 05/26/2009 |
| 7535241 | Test probe with hollow tubular contact with bullet-nosed configuration at one end and crimped configuration on other end An electrical test probe for a connector assembly includes an elongated contact, an elongated helical coil spring, and an elongated, electrically conductive tubular member disposed about the assembly of said elongated contact and elongated helical coil spring. The b... | 05/19/2009 |
| 7521949 | Test pin, method of manufacturing same, and system containing same A test pin includes a compression element (110), a first tip (120) physically coupled to a first end (111) of the compression element, a second tip (130) physically coupled to a second end (112) of the compression element, a first ... | 04/21/2009 |
| 7514948 | Vertical probe array arranged to provide space transformation Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an array having two or more rows parallel to the contact line. With thi... | 04/07/2009 |
| 7492177 | Bendable conductive connector A conductive connector includes a bendable, shape retainable extension having a first end and a second end. The first end is integral with the probing head. The test point connector is integral with said second end. The test point connector is for making electrical ... | 02/17/2009 |
| 7477065 | Method for fabricating a plurality of elastic probes in a row A method of forming a plurality of elastic probes in a row is disclosed. Firstly, a substrate is provided, then, a shaping layer is formed on the substrate so as to offer two flat surfaces in parallel. A photoresist layer is formed on the substrate and on the shapin... | 01/13/2009 |
| 7477066 | Universal grid composite circuit board testing tool The present invention discloses a universal grid composite circuit board testing tool having a probe station, a clamp base and a conducting wire base. The probe station and clamp base separately have a plurality of conducting probes and long needles. Both ends of th... | 01/13/2009 |
| 7471097 | Test probe with planar ground tip extending transversely from the ground barrel for a semiconductor package An embodiment may comprise a test probe to measure electrical properties of a semiconductor package having ball-shaped terminals. The probe may include a signal tip and a ground tip. The signal tip may have a spherical lower surface allowing good contact with a ball... | 12/30/2008 |
| 7468612 | Dermal phase meter with improved replaceable probe tips A probe for a dermal phase meter includes a handle with a removable extension that terminates with a displaceable center conductor. A replaceable tip attaches to the distal end of the extension and includes a center conductor that engages the center conductor in the... | 12/23/2008 |
| 7463046 | Arcuate blade probe with means for aligning the barrel and the shaft An arcuate blade probe is disclosed. The arcuate blade probe includes a shaft with a pair of faces that converge towards each other along a probe axis and terminate at a single edge that includes an arcuate profile. The arcuate profile provides a surface that makes ... | 12/09/2008 |
| 7463045 | Method for pushing a contact probe against object to be measured A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed at a se... | 12/09/2008 |
| 7456645 | Inspection coaxial probe and inspection unit incorporating the same A conductive block is formed with a first face, a second face and a through hole connecting the first face and the second face. A contact probe is provided with a conductive pipe and a conductive plunger, retractably provided in at a first end of the pipe, the plung... | 11/25/2008 |
| 7453278 | Methods of using a blade probe for probing a node of a circuit A method of using a blade probe for probing a node of a circuit where the node includes a pad surface surrounding a node hole is disclosed. A probe having a longitudinal probe axis, a shaft, and a probe blade is provided. The shaft is generally concentric to the lon... | 11/18/2008 |
| 7449906 | Probe for testing an electrical device A probe having a first and a second arm portion extending between first and second connecting portions connecting the first and second arm portions respectively at their front end portion and base end portion, and a needle point portion below the first connecting po... | 11/11/2008 |
| 7449907 | Test unit to test a board having an area array package mounted thereon A test unit to test a board having an area array package mounted therein includes the board, the area array package having an electronic component, a plurality of package pins including a plurality of contact pins connected with the electronic component and a plural... | 11/11/2008 |
| 7446548 | Elastic micro probe and method of making same An elastic micro probe includes an electrically conductive and stretchable spring, which has a first end, a second end opposite to the first end, and connection points disposed adjacent to the first end for connection to an external element, an electrically conducti... | 11/04/2008 |
| 7443182 | Coordinate transformation device for electrical signal connection There is disclosed a coordinate transformation device for electrical signal connection used for a probe card applicable to narrow pitch pads, which particularly simplifies wiring from the terminal onto the inspection apparatus board and prevents electrical contact f... | 10/28/2008 |
| 7436192 | Probe skates for electrical testing of convex pad topologies A probe for engaging a conductive pad is provided. The probe includes a probe contact end for receiving a test current, a probe retention portion below the contact end, a block for holding the probe retention portion, a probe arm below the retention portion, a probe... | 10/14/2008 |
| 7436194 | Shielded probe with low contact resistance for testing a device under test A probe measurement system having low, stable contact resistance for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. ... | 10/14/2008 |
| 7436191 | Differential measurement probe having a ground clip system for the probing tips A differential measurement probe has a ground clip system for electrically coupling outer shielding conductors of differential probing tips together. In one embodiment, the probing tips independently move vertically relative to each other with the ground clip system... | 10/14/2008 |
| 7427869 | Resilient contact probe apparatus Carriers comprising a carrier body having a plurality of openings holding a plurality of resilient contact probes are disclosed. A number of different embodiments for the resilient contact probes is also disclosed. The carriers of the present invention may be secure... | 09/23/2008 |
