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Class 324/754 - With probe elements


Subclass of Class 324 - Electricity: measuring and testing
Definition: Subject matter including a feature to enable contact between
No. of patents: 3495
Last issue date: 06/14/2011


                    88  
NumberTitleIssue Date
3975680Non-contact coupling plate for circuit board tester
A circuit circuit tester is provided for testing circuit runs of a circuit board for electrical continuity and electrical shorts. An electrical probe connected to one side of a capacitance meter is used to contact a particular circuit run, and an electric...
08/17/1976
3970934Printed circuit board testing means
There is disclosed a printed circuit board test fixture which comprises a housing, a pair of parallel, opposed platens with press means associated with at least one of the platens. One of the platens supports a printed circuit board and the other supports...
07/20/1976
3970923Apparatus for measuring sheet resistivity of semiconductor materials and diffused layers
A device for measuring sheet resistivity of semiconductor materials and diffused layers uses a linear four-point probe having pneumatically-actuated contact pins coupled to a self-zeroing voltage amplifier and a current source having extremely high output...
07/20/1976
3968433Fixture for testing flatpack modules
A fixture for testing flatpack modules which has a base section having a recess defined therein dimensioned and configured for engagement with the body of a flatpack module. A plurality of first connectors is disposed in a single plane on at least two sid...
07/06/1976
3963985Probe device having probe heads and method of adjusting distances between probe heads
A bar formed of a material having a known coefficient of expansion has probe holders arranged thereon with each of the probe holders being at a selected distance from each of the adjacent probe holders. The distance between adjacent probe holders is selec...
06/15/1976
3949926Apparatus for incremental movement of die frame
Apparatus for moving a frame of the type for supporting a plurality of integrated circuit chips or die members wherein the frame on a track is moved incrementally along the same by one or both of a pair of pawls pivotally mounted below the track and norma...
04/13/1976
3947765Automated electrical resistivity measuring apparatus for semiconductor crystal rods
A semiconductor crystal resistivity measuring station comprised of an enclosed automatically operated probe apparatus electrically connected to a remotely controlled power supply and an electronic computer for automatically executing precise electrical re...
03/30/1976
                    88  
 
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