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| Number | Title | Issue Date |
| 7498829 | Shielded probe for testing a device under test A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path tha... | 03/03/2009 |
| 7498828 | Probe station with low inductance path A probe assembly suitable for high-current measurements of an electrical device. ... | 03/03/2009 |
| 7495459 | Probe card assembly with a dielectric strip structure coupled to a side of at least a portion of the probes A probe card assembly for providing electrical interconnection between a semiconductor device to be tested and a test system is provided. The probe card assembly includes a plurality of probes supported by a support substrate, each of the plurality of probes includi... | 02/24/2009 |
| 7495458 | Probe card and temperature stabilizer for testing semiconductor devices One aspect of the invention provides an apparatus that includes a probe card having probe needles associated therewith. A temperature stabilizer element is couplable to the probe card. The temperature stabilizer is configured to either raise or lower a temperature o... | 02/24/2009 |
| 7492172 | Chuck for holding a device under test A chuck that includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electr... | 02/17/2009 |
| 7492173 | Probe accessories, and methods for probing test points using same Probe accessories, and methods for routing signals between a target and a test instrument using the probe accessories, are disclosed. Some of the probe accessories include a flexible circuit and first and second pairs of contacts. Flexible circuit design varies, but... | 02/17/2009 |
| 7492174 | Testing apparatus for surface mounted connectors This invention describes a device for testing a surface mounted connector using a test probe assembly that utilizes a vacuum to force the test wires and the test probe's wire array into intimate contact with the connector to be tested. ... | 02/17/2009 |
| 7492175 | Membrane probing system A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, an... | 02/17/2009 |
| 7489147 | Inspection equipment of circuit board and inspection method of circuit board An apparatus and method for inspecting a circuit board is described which can well absorb a variation in a height of an electrode to be inspected and can maintain an insulating property between adjacent inspection electrodes even if the electrode to be inspected is ... | 02/10/2009 |
| 7489148 | Methods for access to a plurality of unsingulated integrated circuits of a wafer using single-sided edge-extended wafer translator An apparatus for providing electrical pathways between one or more unsingulated integrated circuits and one or more test circuits external to the integrated circuits, includes a flexible substrate having a first major surface and a second major surface, a plurality ... | 02/10/2009 |
| 7489149 | Shielded probe for testing a device under test A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path tha... | 02/10/2009 |
| 7486089 | Method for controlling parallelism between probe card and mounting table, storage medium storing inspection program, and inspection apparatus In a method for controlling a parallelism between a probe card having a number of probe pins and a mounting table, first, among the probe pins, one or more probe pins corresponding to each of plural distinct locations on an X-Y coordinate system whose origin lies at... | 02/03/2009 |
| 7482822 | Apparatus and method for limiting over travel in a probe card assembly Methods and apparatuses for testing semiconductor devices are disclosed. Over travel stops limit over travel of a device to be tested with respect to probes of a probe card assembly. Feedback control techniques are employed to control relative movement of the device... | 01/27/2009 |
| 7482821 | Probe card and the production method A probe card 1 is composed of a plurality of probe pins 50 having wafer-side plungers51 at one end portion and substrate-side plungers52 on the other end side; two probe guides 30 and 40 one above the other for supporting th... | 01/27/2009 |
| 7482823 | Shielded probe for testing a device under test A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path tha... | 01/27/2009 |
| 7479792 | Methods for making plated through holes usable as interconnection wire or probe attachments Methods are provided for making plated through holes usable for inserting and attaching connector probes. In a first method, a curved plated through hole is formed by bonding curved etchable wires to a first substrate, plating the wires with a non-etchable conductiv... | 01/20/2009 |
| 7479793 | Apparatus for testing semiconductor test system and method thereof A test system includes a tester configured to perform a test operation on a semiconductor wafer; an interface unit configured to interface between the tester and the semiconductor wafer; and a conductive plate configured to provide the interface unit with a current ... | 01/20/2009 |
| 7479794 | Spring loaded probe pin assembly A method and apparatus for constructing a probe card assembly is provided. A probe pin is inserted into an aperture of an inverted socket enclosure to cause a probe pin shoulder of the probe pin to make contact with an aperture shoulder of the aperture. An upper end... | 01/20/2009 |
| 7477061 | Probe card A probe card mainly includes a circuit board, a probe assembly, an elastic support assembly, a plurality of level maintaining assemblies and a turning secure assembly. The circuit board has pads and spring bores. The probe assembly has a electrical signal transform ... | 01/13/2009 |
| 7474109 | Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus A contact terminal for measurement is provided, for transmitting a signal between a desired probe pin among a plurality of probe pins arranged in parallel at a predetermined distance in a predetermined direction on the surface of a probe substrate and an external me... | 01/06/2009 |
| 7474110 | Probe card The present invention provides a probe card that can examine an object with small electrode spacing. A probe supporting plate is provided to a lower face side of a printed wiring board of a probe card. A plurality of probes are supported by the probe supporting plat... | 01/06/2009 |
| 7474111 | Electrical probe assembly with guard members for the probes The probe assembly has a plurality of probes, a probe base provided with the probes, and a plurality of guard members provided on the probe base. Each probe has an arm portion supported on the probe base at its one end and extending from a mounting surface of the pr... | 01/06/2009 |
| 7471094 | Method and apparatus for adjusting a multi-substrate probe structure A probe card assembly comprises multiple probe substrates attached to a mounting assembly. Each probe substrate includes a set of probes, and together, the sets of probes on each probe substrate compose an array of probes for contacting a device to be tested. Adjust... | 12/30/2008 |
| 7471095 | Electrical connecting apparatus and method for use thereof An electrical connecting apparatus is used for electrical inspection of a device under test having electrodes each of which a recess is formed on a flat upside. The electrical connecting apparatus is provided with a plurality of probes, each probe including a base p... | 12/30/2008 |
| 7468611 | Continuous linear scanning of large flat panel media A system performs continuous full linear scan of a flat media. The system includes, in part, a chuck, and at least first, second and third gantries. The chuck is adapted to support the flat media during the test. The first gantry includes at least one linear array o... | 12/23/2008 |
| 7468610 | Electrical connecting apparatus An electrical connecting apparatus comprising: a circuit board on which a reinforcing plate is mounted and a plurality of first electric connections are provided; a probe board on which second electric connections corresponding to the first electric connections are ... | 12/23/2008 |
| 7468609 | Switched suspended conductor and connection A probe assembly having a switch that selectively electrically connects, for example, either a Kelvin connection or a suspended guard element with the probe assembly. ... | 12/23/2008 |
| 7466154 | Conductive particle filled polymer electrical contact A conductive filled polymer contact which is molded at an aperture through a carrier sheet includes an elongated conductive frame introduced prior to the molding process as an insert which is held captive in the molded contact and which extends from at or near the u... | 12/16/2008 |
| 7466152 | Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof A probe card including probes, a build-up interconnection layer having a multilayer interconnection structure therein and carrying the probes on a top surface in electrical connection with the multilayer interconnection structure, and a capacitor provided on the bui... | 12/16/2008 |
| 7466153 | Apparatuses for inspecting pogo pins of an electrical die sorting system and a method for performing the same Apparatuses for inspecting pogo pins of an electrical die sorting (EDS) system are provided and a method for performing the same are provided. Apparatuses for inspecting pogo pins that delivers electrical signals between a tester and a probe when dies on a substrate... | 12/16/2008 |
| 7463043 | Methods of probing an electronic device An electronic device is moved into a first position such that terminals of the electronic device are adjacent probes for making electrical contact with the terminals. The electronic device is then moved horizontally or diagonally such that the terminals contact the ... | 12/09/2008 |
| 7463041 | High-density electroconductive contact probe with uncompressed springs A holder 1 is formed by laminating support members 3, 4 and 5 and passing holder holes 2 through them. A pair of needle members 9 and 10 are provided on either end of the coil spring 8. Each of the needle members 9... | 12/09/2008 |
| 7463042 | Connector probing system An improved probing system is provided for facilitating the making electrical connections to a variety of connectors. The system can be implemented with a plurality of probes capable of being independently translated and pivoted in a plurality of directions under co... | 12/09/2008 |
| 7459925 | Probe card A PCB of a probe card includes a first region, a second region, a third region and a fourth region arranged clockwise. The circuit pattern of the first region corresponds to the circuit pattern of the third region. The circuit pattern of the second region correspond... | 12/02/2008 |
| 7459922 | Microcontactor probe assembly having a plunger and electric probe unit using the same A microcontactor probe has an insulator (6, 7) formed with a support hole (8, 9) having an open end and a close end, a lead conductor (11) exposed inside the support hole (8, 9) at the close end, and a resilient conductive assembly (2,... | 12/02/2008 |
| 7459921 | Method and apparatus for a paddle board probe card A paddle board probe card for connecting a device under test with an ATE tester by means of ZIF connectors is presented. The paddle board probe card may include more than one printed circuit board mounted on a probe card in such a manner that the more than one print... | 12/02/2008 |
| 7459923 | Probe interposers and methods of fabricating probe interposers The invention includes probe interposers and methods of fabricating pose interposers. In one implementation, a method of fabricating a probe interposer includes providing a substrate having a frontside and a backside. Probe tips are lithographically patterned on the... | 12/02/2008 |
| 7459924 | Apparatus for providing electrical access to one or more pads of the wafer using a wafer translator and a gasket Concurrent electrical access to the pads of integrated circuits on a wafer is provided by an edge-extended wafer translator that carries signals from one or more pads on one or more integrated circuits to contact terminals on the inquiry-side of the edge-extended wa... | 12/02/2008 |
| 7456639 | Compliant contact structure A compliant contact structure and contactor card for operably coupling with a semiconductor device to be tested includes a substantially planar substrate with a compliant contact formed therein. The compliant contact structure includes a portion fixed within the sub... | 11/25/2008 |
| 7456643 | Methods for multi-modal wafer testing using edge-extended wafer translator Access to integrated circuits of a wafer for concurrently performing two or more types of testing, is provided by bringing a wafer and an edge-extended wafer translator into an attached state. The edge-extended wafer translator having wafer-side contact terminals an... | 11/25/2008 |
