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| Number | Title | Issue Date |
| 8154308 | Method for characterizing integrated circuits for identification or security purposes A method of detecting small changes to a complex integrated circuit measuring RF/microwave scattering parameters between every pin over a wide frequency range. The data from a characterization of a known good integrated circuit is stored and compared to each subsequ... | 04/10/2012 |
| 7990158 | Measurement arrangement for determining the characteristic line parameters by measuring scattering parameters The present invention relates to a measurement arrangement for determining the characteristic line parameters by measuring the S-parameters as a function of the frequency of transmission lines. A voltage mesh and a ground mesh in a metal layer are connected symmetri... | 08/02/2011 |
| 7924026 | Method and apparatus for determining a response of a DUT to a desired large signal, and for determining input tones required to produce a desired output A method for determining input tones required to produce a desired output includes the step of extracting a linearization of a spectral map representing a device under test (DUT) that i) is under drive of a large signal having one or more fundamental frequencies wit... | 04/12/2011 |
| 7924025 | System, device, and method for embedded S-parameter measurement An embedded s-parameter measurement system for measuring or determining an s-parameter is provided. The system includes an s-parameter test circuit for connecting to a port of a high-frequency multi-port device-under-test (DUT). The s-parameter test circuit includes... | 04/12/2011 |
| 7919969 | Network analyzer comprising a switchable measuring bridge The invention relates to a network analyzer comprising a signal generator for generating an excitation signal which can be supplied to a measuring object connectable to a network analyzer by means of a measuring line, and a measuring bridge which is connected to the... | 04/05/2011 |
| 7741857 | System and method for de-embedding a device under test employing a parametrized netlist S-parameter data is measured on an embedded device test structure, an open dummy, and a short dummy. A 4-port network of the pad set parasitics of the embedded device test structure is modeled by a parameterized netlist containing a lumped element network having at ... | 06/22/2010 |
| 7671605 | Large signal scattering functions from orthogonal phase measurements The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define “large-signal S-parameters”) with only two distinct phases for small-signals on a frequen... | 03/02/2010 |
| 7667467 | Method and system for determining antenna characterization An antenna and its associated components are consolidated in a small measurement box, and multiple tests are competed simultaneously, with a single vector network analyzer. This can be done by treating the “Far Field” measurements (typically measured on antenna/... | 02/23/2010 |
| 7646205 | S-parameter measurement The invention provides for a method of using a network analyzer and a test controller for measuring S-parameters of a device, which can assume a plurality of states, and which can switch very fast from one state to another. The test controller sends a trigger to the... | 01/12/2010 |
| 7622932 | Measuring apparatus, and detection device A measuring apparatus that measures a characteristic of a device under measurement is provided. The measuring apparatus includes: a signal generating section that outputs a forward signal to the device under measurement through a device side terminal; a directional ... | 11/24/2009 |
| 7592818 | Method and apparatus for measuring scattering coefficient of device under test A measuring method and measurement system that includes a signal source that applies a signal to a device under test, a scalar measuring instrument that measures a reflected wave reflected from the device under test or a transmitted wave transmitted through the devi... | 09/22/2009 |
| 7521939 | Circuits to increase VNA measurement bandwidth Embodiments of the present invention relate to circuits to be inserted in a signal path between a signal generator and a test port of a vector network analyzer (VNA), where the circuits enable the VNA to make scattering parameter measurements for a load (RL) connect... | 04/21/2009 |
| 7511512 | Probe and near-field microscope A probe includes a tubular conductor having an aperture at one end thereof. An electromagnetic wave transmitting unit for transmitting an electromagnetic wave, via the tubular conductor, to a position distant from the aperture is disposed at one of the inside and th... | 03/31/2009 |
| 7495454 | Device for measurement of electrical properties in materials A device for measuring electrical properties, including permittivity, of a material is disclosed. The device includes a first conduit and second conduit terminating at open ends and respectively connected to a first and second connector port. Annuli are formed by th... | 02/24/2009 |
| 7414411 | Signal analysis system and calibration method for multiple signal probes A method and apparatus adapted to calibrate signal path of a signal analysis system such that loading effects of additional probes are substantially removed from the measurement. A signal under test from a device under test is coupled to a test probe and used with s... | 08/19/2008 |
| 7408363 | Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the sig... | 08/05/2008 |
| 7405575 | Signal analysis system and calibration method for measuring the impedance of a device under test A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the... | 07/29/2008 |
| 7389191 | Apparatus and method for S-parameter calculation, and program and recording medium thereof According to the present invention an S-parameter file input section inputs S-parameters for each device constituting a system subject to a transmission analysis, a port position correspondence conversion section converts the input S-parameters so as to correspond t... | 06/17/2008 |
| 7362260 | Method of using continuous-wave radiation for detecting and locating targets hidden behind a surface Continuous-wave radiation is used to detect a target hidden behind a surface. In an embodiment, a transmitter directs a beam of continuous-wave microwave radiation from a transmitting location, and reflected radiation from the target is received at first and second ... | 04/22/2008 |
| 7362130 | Method and device for transmission with reduced crosstalk The invention relates to a method and a device for transmission with reduced crosstalk in interconnections used for sending a plurality of signals, such as the interconnections made with flat multiconductor cables, or with the tracks of a printed circuit board, or i... | 04/22/2008 |
| 7359814 | Multi-port analysis apparatus and method and calibration method thereof A multi-port device analysis apparatus is capable of analyzing a multi-port device having three or more with improved efficiency and accuracy. The multi-port device analysis apparatus includes: a signal source (112) for providing a test signal to one of termi... | 04/15/2008 |
| 7342937 | Spectrally flexible band plans with reduced filtering requirements The present invention provides, in one embodiment, a method of simplifying filtering with respect to a band plan. The method includes selecting a reflection point relative to the band plan and designating subchannels as unusable within a filterable separation of the... | 03/11/2008 |
| 7315170 | Calibration apparatus and method using pulse for frequency, phase, and delay characteristic In a device for measuring the properties of a device under test connected by a signal transmission path having reciprocity, a terminal on the device under test side of the signal transmission path is opened; pulse signals are transmitted to a terminal on the measuri... | 01/01/2008 |
| 7309994 | Integrated directional bridge A directional bridge for measuring propagated signals to and from a source device to a load device where both the source device and load device are in signal communication with the directional bridge is disclosed. The directional bridge may include a first bridge ci... | 12/18/2007 |
| 7307428 | Method for single ended line testing and single ended line testing device A single ended line testing method for qualifying an electrically conducting line, including the steps of sending a plurality of randomized excitation signals from a first end of the line towards a second end of the line, subsequently taking measurements, at the fir... | 12/11/2007 |
| 7307431 | System and method for microwave non-destructive inspection A system and method for inspecting a composite structure, such as to assess thermal degradation or resin curing, are provided in which the dielectric constant of the composite structure is determined using a microwave inverse scattering technique. The dielectric con... | 12/11/2007 |
| 7278186 | Ultra low frequency moisture sensor An apparatus for measuring a moisture content value within a volume. A frequency generator generates at least one source signal at frequencies of no more than about one kilohertz. Probes are disposed with surfaces in physical contact with the volume, where no direct... | 10/09/2007 |
| 7271574 | Evanescent microwave probe with enhanced resolution and sensitivity Novel systems of an evanescent microwave probe (EWP) are disclosed, which enable measurements of physical properties of a sample with enhanced sensitivity and resolution, simultaneously. In one embodiment, new shielding features are added to the probe (which may be ... | 09/18/2007 |
| 7271575 | Oscilloscope based return loss analyzer A system, apparatus and method for performing differential return loss measurements and other measurements as a function of frequency uses a digital storage oscilloscope (DSO) having spectral analysis functions. A waveform generator generates a differential test sig... | 09/18/2007 |
| 7266485 | Method for making equivalent circuit model of passive element, simulator, and storage medium A method of deriving an equivalent circuit model for a passive component includes a first step of providing a given frequency characteristic of a capacitor, a second step of forming one of an RC circuit, an RL circuit, and an RCL circuit using frequency-independent ... | 09/04/2007 |
| 7256585 | Match-corrected power measurements with a vector network analyzer A network analysis system and methods facilitate a match-corrected signal power measurement using a vector network analyzer (VNA). The network analysis system includes the VNA and a computer program stored in memory and executed by a controller. The computer program... | 08/14/2007 |
| 7253904 | Method and device for in-line measurement of characteristics of the surface coating of a metallurgy product To measure the characteristics of the surface coating of a moving metal strip, such as the alliation level of a coating including zinc and iron, the product is exposed to the radiation of a radiative source with a predetermined wavelength directed orthogonally to th... | 08/07/2007 |
| 7245985 | Process and apparatus for improving and controlling the vulcanization of natural and synthetic rubber compounds A process for curing a natural or synthetic rubber compound under a plurality of curing conditions by: (1) obtaining time dependent data streams of dielectric or impedance values from a non-bridged impedance sensing circuit and a capacitor having the rubber compound... | 07/17/2007 |
| 7239150 | Pavement material microwave density measurement methods and apparatuses A method of obtaining a material property of a pavement material from a microwave field generally includes generating a microwave frequency electromagnetic field of a first mode about the pavement material. The frequency response of the pavement material in the elec... | 07/03/2007 |
| 7235982 | Re-calculating S-parameter error terms after modification of a calibrated port A two-port S-parameter calibration between a first port and a second port of a test system having a multi-port vector network analyzer is performed to provide a first S-parameter calibration of the test system. A transfer device is connected between the first and se... | 06/26/2007 |
| 7202760 | Resistive voltage divider A radio-frequency impedance device includes a resistor device mounted on a surface of a dielectric layer, and adapted to be connected between a transmission line and an output terminal associated with a load impedance. A ground conductor may extend opposite a portio... | 04/10/2007 |
| 7200502 | Dual connection power line parameter analysis method and system A method and apparatus is disclosed for determining the power line parameters of a system. Specifically, there is provided a method comprising perturbing a voltage waveform through a first connection, measuring a characteristic of the perturbation through a second c... | 04/03/2007 |
| 7190175 | Orthogonal microwave imaging probe A microwave imaging microscope and associated probe, or a read head. The probe or the read head includes a sensor unit with three fixed electrodes, preferably a stimulating electrode surrounding a sensing electrode and isolated by a grounded electrode. Circuitry cou... | 03/13/2007 |
| 7184824 | Method and system for examining tissue according to the dielectric properties thereof A probe, method and system for examining tissue in order to differentiate it from other tissue according to the dielectric properties of the examined tissue are provided. The probe includes an inner conductor, having a plurality of sharp, thin, conductive spikes, at... | 02/27/2007 |
| 7170300 | Apparatus and method for inspecting interface between ground layer and substrate of microstrip by using scattering parameters An apparatus and method for detecting a defect on a ground layer of microstrip by using scattering parameters is disclosed. The apparatus includes: a providing unit for providing a signal to the microstrip by changing a frequency of the signal in a predetermined ran... | 01/30/2007 |
