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Class 324/519 - By capacitance measuring


Subclass of Class 324 - Electricity: measuring and testing
Definition: Subject matter where a capacitance related signal is used
No. of patents: 167
Last issue date: 08/09/2011


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NumberTitleIssue Date
7994796Circuit arrangement and method for monitoring the function of a vibration level switch and/or a fill level measuring apparautus
The subject matter relates to a circuit arrangement for monitoring the function of a fill level measuring apparatus, and particularly of a vibration level switch, including a first piezo-electric vibration device as a transmitting device, a second piezo-electric vib...
08/09/2011
7932724Circuit assemblage and method for functional checking of a power transistor
A circuit assemblage for functional checking of a power transistor includes a power transistor having an insulated gate, a first power electrode configured as a drain or as a collector, and a second power electrode configured as a source or an emitter, the first and...
04/26/2011
7808246Apparatus and method for verifying a seal between multiple chambers
An open seal check system for a multi-chamber supply container having at least one elongated seal, the system includes: (i) a base configured to support the multi chamber container; (ii) a plurality of electrodes positioned on the base so as to be at least substanti...
10/05/2010
7764067High voltage cable testing method
A method of testing a cabling system is disclosed. The method may include discharging an input filter capacitor associated with an accessory component, charging an accessory bus capacitor to a desired voltage level, and connecting the accessory bus capacitor to the ...
07/27/2010
7495450Device and method for detecting anomolies in a wire and related sensing methods
A device and method provides for measuring the electrical properties of electronic signal paths, including wires and wireless channels. The device can be used for detecting open circuits, short circuits, and the lengths of wires. The device can include a sensor conf...
02/24/2009
7393702Characterizing the integrity of interconnects
The present invention provides for a system and method of characterizing the integrity of a barrier structure. The barrier structure is an interconnect comprising a porous dielectric layer sandwiched between at least one barrier layer and at least one conducting lay...
07/01/2008
7362106Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes
A method and apparatus for detecting open defects on non-probed node under test of an electrical device using capacitive lead frame technology is presented. In accordance with the method of the invention, a probed node neighboring the non-probed node under test is s...
04/22/2008
7355417Techniques for obtaining electromagnetic data from a circuit board
A system is configured to obtain electromagnetic data from a circuit board. A set of sensing locations resides in a plane which is substantially parallel to the circuit board. The system includes a probe, a robotic assembly coupled to the probe, and a controller cou...
04/08/2008
7353479Method for placing probing pad and computer readable recording medium for storing program thereof
A method for placing probing pad and a computer readable recording medium for storing a program thereof are provided. The method is suitable for placing the probing pads in an integrated circuit (IC). Wherein, appropriate grid spacing is determined and a plurality o...
04/01/2008
7334485System, method and computer-readable medium for locating physical phenomena
A method, system and computer product for detecting the location of a deformation of a structure includes baselining a defined energy transmitting characteristic for each of the plurality of laterally adjacent conductors attached to the structure. Each of the plural...
02/26/2008
7332915Sensor system and method of operating the same
A sensor system comprising a sensor operable to provide an output signal representative of a sensed parameter is provided. The sensor system also comprises a control system coupled to the sensor, wherein the control system is operable to change a physical characteri...
02/19/2008
7327148Method for using internal semiconductor junctions to aid in non-contact testing
Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT. ...
02/05/2008
7323880Ground circuit impedance measurement
Novel apparatus and method accurately measure ground circuit impedance. A ground circuit and electrical current source adjusted to 25 amperes or less simulate a ground fault. Ground impedance is determined by dividing voltage drop by amperage to determine impedance ...
01/29/2008
7323879Method and circuit for measuring capacitance and capacitance mismatch
A circuit and method for measuring capacitance and capacitance mismatch of at least one capacitor pair are provided. The circuit includes a first switch, a second switch, a third switch and a P-type transistor. A terminal of the first switch is connected to a termin...
01/29/2008
7307427Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boards
A method and apparatus is presented for gaining socket testability through the use of a capacitive interposer engineered to create capacitive coupling between signal nodes of a circuit assembly that the tester has access to and nodes of the socket that would not oth...
12/11/2007
7307426Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devices
A method and apparatus for detecting open defects on grounded nodes of an electrical device using capacitive lead frame technology is presented. In accordance with the method of the invention, an accessible signal node that is capacitively coupled the grounded node ...
12/11/2007
7276911Detection of malfunctioning bulbs in decorative light strings
A system for locating a malfunctioning bulb in a decorative light string uses an antenna that produces an output signal corresponding to the strength of the electric field produced by a portion of the light string near the antenna. An amplifier is coupled to the ant...
10/02/2007
7262604Method of testing documents provided with optico-diffractively effective markings
The invention relates to a method of examining the authenticity of a document provided with an optico-diffractively effective element or hologram by subjecting the hologram to capacitive coupling of a voltage and deriving a signal representative of the voltage for c...
08/28/2007
7260796Capacitance measurements for an integrated circuit
A method and apparatus for determining capacitance of wires in an integrated circuit is described. The capacitance information derived according to the invention can be used, for example, to calibrate a parasitic extraction engine or to calibrate an integrated circu...
08/21/2007
7256590Capacitance sensor type measuring apparatus
A measuring apparatus having a probe that faces a surface of a target and is configured to supply AC current to the surface, measuring a voltage drop through a space between the probe and the surface, and obtaining a distance between the probe and the surface in acc...
08/14/2007
7242198Method for using internal semiconductor junctions to aid in non-contact testing
Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT. ...
07/10/2007
7239152Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing...
07/03/2007
7236120Ultra-wideband detector systems for detecting moisture in building walls
A non-destructive detection method and system enables detecting a moisture patch located inside a building wall or the like. A transmitter generates a series of ultra-wideband pulses while an ultra-wideband antenna unit, preferably in the form of an antenna array in...
06/26/2007
7227350Bias technique for electric utility meter
The invention contemplates an electrical power meter and method of operating the same, where the meter has electronic components (e.g., a power supply and a voltage sensing circuit) and receives alternating current (AC) voltage from an electrical power line. The inv...
06/05/2007
7227364Test circuit for and method of identifying a defect in an integrated circuit
The embodiments of the present invention enable a new metal diagnosis pattern based on a production test pattern to quickly identify open and short circuits of metal lines which cannot be probed, such as the long lines of a programmable logic device, and to further ...
06/05/2007
7224169Methods and apparatus for non-contact testing and diagnosing of inaccessible shorted connections
A method and apparatus for detecting shorts between accessible and inaccessible signal nodes (e.g., integrated circuit pins) of an electrical device (e.g., an integrated circuit), using capacitive lead frame technology is presented. In accordance with the method of ...
05/29/2007
7212011Capacitor deterioration judgment method
A method for determining the deterioration of a capacitor that increases the measurement accuracy to have an improved reliability is disclosed. In this method for determining the deterioration of a capacitor, the deterioration of a capacitor including a pair of elec...
05/01/2007
7208957Method for non-contact testing of fixed and inaccessible connections without using a sensor plate
A method for testing for a defect condition on a node-under-implicit-test of an electrical device is presented. The technique according to the invention includes stimulating a first node of the electrical device that is capacitively coupled to the node-under-implici...
04/24/2007
7199593Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing...
04/03/2007
7200830Enhanced electrically-aligned proximity communication
One embodiment of the present invention provides a system that facilitates capacitive inter-chip communication. During operation, the system first determines an alignment between a first semiconductor die and a second semiconductor die. Next, electrical signals are ...
04/03/2007
7183759Optical probes with spacing sensors for the wafer level testing of optical and optoelectronic chips
This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light to/from the top of the wafer. During the optical testing, the vertical spacing between an optical probe and the wafer is s...
02/27/2007
7180300System and method of locating ground fault in electrical power distribution system
A method for locating a ground fault in an electrical power distribution system includes providing a plurality of current sensors at a plurality of locations in the electrical power distribution system. The method further includes detecting a ground fault in the ele...
02/20/2007
7173438Measuring capacitance
A method for determining capacitance includes alternately charging a capacitor to a first voltage and discharging the capacitor to a second voltage, generating an output signal having a frequency that is a function of a time period, and determining the capacitance b...
02/06/2007
7138805Device and method for inspection
The present invention provides an inspection apparatus and an inspection method, capable of, when supplying an inspection signal to a circuit wiring, eliminating any need for a pin to be brought into contact with the circuit wiring and detecting any defects includin...
11/21/2006
7132834Capacitive sensor measurement method for discrete time sampled system for in-circuit test
Disclosed is a novel method and apparatus for acquiring multiple capacitively sensed measurements from a circuit under test. Multiple digital sources are respectively connected to stimulate multiple respective first ends of multiple respective nets of interest. Resp...
11/07/2006
7129711Device for detecting interferences or interruptions of the inner fields smoothing layer of medium or high voltage cables
A device for controlling the manufacture of a medium or high voltage cable in particular of the inner and outer semi-conducting layers. For control purposes the current or capacitance is measured by a measuring electrode encircling the cable and connected to a high ...
10/31/2006
7129709Method of testing documents provided with optico-diffractively effective markings
The invention relates to a method of examining the authenticity of a document provided with an optico-diffractively effective element or hologram by subjecting the hologram to capacitive coupling of a voltage and deriving a signal representative of the voltage for c...
10/31/2006
7126359Device monitor for RF and DC measurement
A device monitor for RF and DC measurement. The device monitor comprises a plurality of test cells arranged substantially in line. The test cell comprises a device under test, an input pad, an output pad and at least two reference pads. The input pad is electrically...
10/24/2006
7119545Capacitive monitors for detecting metal extrusion during electromigration
A method and apparatus for detecting metal extrusion associated with electromigration (EM) under high current density situations within an EM test line by measuring changes in capacitance associated with metal extrusion that occurs in the vicinity of the charge carr...
10/10/2006
7109978Object position detector with edge motion feature and gesture recognition
A method of generating a signal comprising providing a capacitive touch sensor pad including a matrix of X and Y conductors, developing capacitance profiles in one of an X direction and a Y direction from the matrix of X and Y conductors, determining an occurrence o...
09/19/2006
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