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Class 324/512 - For fault location


Subclass of Class 324 - Electricity: measuring and testing
Definition: Subject matter where a signal produced indicates either
No. of patents: 171
Last issue date: 04/10/2012


        5  
NumberTitleIssue Date
4697137Method of nondestructively establishing an earth gradient for cable fault locating
A fault is located in an insulated electrical conductor buried in earth by establishing a voltage gradient through the earth emanating from the fault, and thereafter sensing the direction of the gradient to locate the fault. The voltage gradient is establ...
09/29/1987
4689552Method and device for detecting insulation damage to a buried object
A method of and an apparatus for detecting damage to a buried object which includes the steps of (a) providing a buried object extending in a longitudinal direction which has an electrically insulating layer over a conductive member, (b) connecting one te...
08/25/1987
4649335Equipment for locating a signal reflection point in a transmission line
In an equipment for locating a reflection point in a transmission line a recording is obtained of the impulse response of the path of the echo produced by a transmission signal based on a reference signal x(n) constituted by binary sequences of duration N...
03/10/1987
4617511Electrode probe assembly for glass lined metal vessels
An electrode probe assembly for monitoring and finding fault in the glass lining of metal vessels, pipes or the like, characterized by a cup-shaped electrode with an insulated stud inserted through a hole in the wall of a mounting member. An insulating ga...
10/14/1986
4570231Fault finder
A fault finder for locating faults along a high voltage electrical transmission line. Real time monitoring of background noise and improved filtering of input signals is used to identify the occurrence of a fault. A fault is detected at both a master and ...
02/11/1986
4375050Portable automatic multiple test system for multi-pair cables
A portable, compact test set for multi-pair cables having connectors, where the connectors are mated to adapters in the test set and pulses are generated which sequentially test each pair for open and short conditions, using transistor to transistor logic...
02/22/1983
4342958Automatic test equipment test probe contact isolation detection method
A method for determining whether test probes of a test fixture on an automatic test equipment (ATE) device are in contact with the intended test points on an electronic assembly under test. The undetected failure of the test probes to contact the test poi...
08/03/1982
4292586Testing of circuit arrangements
Testing of thin film modules is facilitated by employing predetermined test procedures, so that analysis of the results is facilitated; and the test signals are supplied to, and the corresponding output signals are supplied from, the module terminals, a p...
09/29/1981
4282479Test apparatus for locating shorts during assembly of electrical buses
A test apparatus for locating electrical shorts that is especially suited for use while an electrical circuit is being fabricated or assembled. A ring counter derives input pulses from a squarewave oscillator. The outputs of the counter are fed through tr...
08/04/1981
4139818Circuit means for collecting operational errors in IC chips and for identifying and storing the locations thereof
The present disclosure describes electronic circuits for use with test and diagnostic (T&D) means to collect errors orignating within integrated circuit (IC) chips during their operation in a system environment. Moreover, the circuits employ counters and ...
02/13/1979
3968426Method of A.C. insulation testing utilizing a variable inductive reactor in parallel with a test specimen
Insulation is tested by the method of connecting a variable inductive reactor across a voltage supply in parallel with a test specimen. The inductance of the reactor is varied until its reactance equals that of the sample as indicated by the supply curren...
07/06/1976
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