Did You Know...
...that in the early 1940s GE engineer James Wright was charged with a task of utmost importance to the war effort: develop a cheap substitute for rubber that could be used to produce tires, gas masks and a whole host of military gear. Wright tackled the task diligently -- and wound up inventing Silly Putty.
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| Number | Title | Issue Date |
| 8138782 | Photovoltaic cell solar simulator Embodiments of the present invention relate to a solar simulator module of a solar cell production line. In one embodiment the solar simulator receives a solar cell module in a horizontal position and reorients the module into a vertical position. A light source is ... | 03/20/2012 |
| 8106665 | 3-D mapping focused beam failure analysis A reflector tool and a method are provided for three-dimensional integrated circuit (IC) failure analysis. An IC (die) has top and bottom surfaces, a perimeter, and a first side. The IC is electrically connected to a current sensing amplifier. The first side of the ... | 01/31/2012 |
| 8106664 | System and method for conducting accelerated soft error rate testing An apparatus for a user to conduct an accelerated soft error test (ASER) on a semiconductor sample is provided. The apparatus comprises a first component for holding the radiation source, where the radiation source may be either an alpha-particle or neutron-particle... | 01/31/2012 |
| 8022708 | Fiber optic fault detection system and method for underground power lines Embodiments of the present invention are directed to a method and fault detection system for detecting and identifying the location of faults in underground power lines that can effectively and quickly identify faults in underground power lines. Embodiments can prov... | 09/20/2011 |
| 7755364 | Image sensor An image sensor has a plurality of pixels, each pixel having a photodiode (12), a voltage amplifier (16) having gain greater than 1 and a sampling capacitor (18) charged by the voltage amplifier. In this arrangement, each pixel provides gain thr... | 07/13/2010 |
| 7701222 | Method for validating printed circuit board materials for high speed applications A method for testing a printed circuit board to determining the dielectric loss associated with the circuit board material relative to a standard. Dielectric losses in the material generate heat when a high frequency electronic signal, such as a microwave frequency ... | 04/20/2010 |
| 7573271 | Apparatus for measuring electric characteristics of semiconductor An apparatus for measuring electric characteristics of a semiconductor includes a light irradiating means for irradiating light to a characteristic measured semiconductor, an alternating-current voltage source, an electric potential measuring means and an impedance ... | 08/11/2009 |
| 7495449 | Non-destructive testing apparatus and non-destructive testing method A non-destructive testing method of improved efficiency. Two one-dimensional images are obtained by scanning an optical line over an object to be tested in an X- and Y-directions each for one scan in lieu of conducting a prior art method of two-dimensionally scannin... | 02/24/2009 |
| 7443170 | Device and method for determining at least one variable associated with the electromagnetic radiation of an object being tested A device determines at least one characteristic of electromagnetic radiation emitted from a test object. A support receives the object. A network of probes is distributed along a substantially circular arc, and the support is disposed in a plane formed by the networ... | 10/28/2008 |
| 7425704 | Inspection method and apparatus using an electron beam An inspection method and apparatus irradiates a sample on which a pattern is formed with an electron beam, so that an inspection image and a reference image can be generated on the basis of a secondary electron or a reflected electron emitted by the sample. An abnor... | 09/16/2008 |
| 7397263 | Sensor differentiated fault isolation Disclosed is an apparatus and method for diagnostically testing circuitry within a device. The apparatus and method incorporate the use of energy (e.g., light, heat, magnetic, electric, etc.) applied directly to any location on the device that can affect the electri... | 07/08/2008 |
| 7375332 | Laser-based irradiation apparatus and method to measure the functional dose-rate response of semiconductor devices A broad-beam laser irradiation apparatus can measure the parametric or functional response of a semiconductor device to exposure to dose-rate equivalent infrared laser light. Comparisons of dose-rate response from before, during, and after accelerated aging of a dev... | 05/20/2008 |
| 7372942 | Medical imaging system with dosimetry for estimating circuit board life A dosimeter is provided on or adjacent to a circuit board deployed in a radiation environment. The dosimeter may be read or output a value or values indicating radiation dosage over a period of time. The radiation dosage associated with the circuit board may be used... | 05/13/2008 |
| 7320115 | Method for identifying a physical failure location on an integrated circuit A method is disclosed for identifying a physical failure location on an IC without using layout-versus-schematic (LVS) verification tool. In the method, the integrated circuit is tested with one or more test patterns to identify a failure port thereon. Hierarchical ... | 01/15/2008 |
| 7317325 | Line short localization in LCD pixel arrays A method and apparatus for identifying a location of a short between two or more signal lines on a substrate having a plurality of thin film transistors and a plurality of pixels associated with the thin film transistors. The method includes locating the two or more... | 01/08/2008 |
| 7313501 | Method and system for determining the location of a potential defect in a device based on a temperature profile According to one embodiment of the invention a method for determining the location of a potential defect in a device includes scanning a surface of the device with a temperature sensor while operating the device. The method also includes measuring a temperature of t... | 12/25/2007 |
| 7312921 | Microscope and sample observation method For a semiconductor device S as an inspected object, there are provided an image acquisition part 1, an optical system 2 including an objective lens 20, and a solid immersion lens (SIL) 3 movable between an insertion position including an... | 12/25/2007 |
| 7276914 | System and method for guided TDR/TDT computerized tomography A system for detecting a defect or discontinuity in media or at an interface of the media includes a signal generator; a transmission path coupled to the signal generator, wherein the transmission path is arranged along or through the media; a detection circuit for ... | 10/02/2007 |
| 7271903 | Apparatus and method for testing liquid crystal display panel A device and a method for testing a liquid crystal display panel are disclosed in the present invention, which enable to conveniently inspect a cutting plane of an individual unit liquid crystal panel. The apparatus includes a first memory unit storing a reference i... | 09/18/2007 |
| 7256055 | System and apparatus for using test structures inside of a chip during the fabrication of the chip The fabrication of the wafer may be analyzed starting from when the wafer is in a partially fabricated state. The value of a specified performance parameter may be determined at a plurality of locations on an active area of a die of the wafer. The specified performa... | 08/14/2007 |
| 7250758 | Inspection method and apparatus using scanning laser SQUID microscope A non-destructive method of narrowing down the location of a failure in a sample includes a first step of acquiring first and second images of magnetic-field distributions obtained by scanning a laser beam irradiating first and second samples, respectively, and if t... | 07/31/2007 |
| 7248402 | Surgical microscopy system The present invention relates to a surgical microscopy system, comprising a surgical microscope, a stand comprising a base and a plurality of pivotally connected arms, the surgical microscope being mounted to one of the arms, wherein the pivotally connected arms are... | 07/24/2007 |
| 7242176 | Systems and methods for evaluating electromagnetic interference Systems and methods for evaluating electromagnetic interference that may be employed, for among other things, to evaluate electronic system immunity to radiated electromagnetic fields and/or to identify particular electronic system areas that are susceptible to elec... | 07/10/2007 |
| 7239127 | Apparatus and method for inspecting electronic circuits The present invention provides an apparatus and a method for used in a board inspection capable of an inspection of defect in a circuit board with high resolution over a wide range. The method is used for manufacturing a sensor probe comprising layers which include ... | 07/03/2007 |
| 7238958 | Fault position identification system for a semiconductor device and method of identifying a fault position of a semiconductor device A fault position identification system for a semiconductor device includes: a storage unit storing test data of the semiconductor device; a test result analyzer generating test parameters of the semiconductor device, based on failure information of a failure occurre... | 07/03/2007 |
| 7235800 | Electrical probing of SOI circuits Analysis of a semiconductor die having silicon-on-insulator (SOI) structure is enhanced by accessing the circuitry within the die from the back side without necessarily breaching or needing to breach the thin insulator layer of the SOI structure. According to an exa... | 06/26/2007 |
| 7233438 | Specimen temperature adjusting apparatus A specimen temperature adjusting apparatus includes a specimen stage that the observation specimen is to be placed on and a temperature adjustment element that is attached to the specimen stage. The specimen stage has a groove surrounding a portion where the observa... | 06/19/2007 |
| 7221813 | Signal acquisition probing and voltage measurement systems using an electro-optical cavity A signal acquisition probing system uses an optical cavity to acquire a signal under test. The probing system has an optical transmitter and receiver that are coupled to the optical cavity via an optical transmission system. The optical cavity has an electrode struc... | 05/22/2007 |
| 7221502 | Microscope and sample observation method For a semiconductor device S as a sample of an observed object, there are provided an image acquisition part 1 for carrying out observation of the semiconductor device S, and an optical system 2 comprising an objective lens 20. A solid immersion... | 05/22/2007 |
| 7217579 | Voltage contrast test structure A method for electrically testing a semiconductor wafer during integrated-circuit fabrication process, the method including: (i) providing a scanning charged-particle microscope (SCPM), having a defined scanning plane and operative, while in any one mechanical state... | 05/15/2007 |
| 7202690 | Substrate inspection device and substrate inspecting method A laser beam irradiation unit irradiates a laser beam on a top surface pattern portion of a wiring to be inspected among plural wirings formed on a substrate, with an intensity high enough to cause laser abrasion or two-photon absorption at the irradiated portion. A... | 04/10/2007 |
| 7202689 | Sensor differentiated fault isolation Disclosed is an apparatus and method for diagnostically testing circuitry within a device. The apparatus and method incorporate the use of energy (e.g., light, heat, magnetic, electric, etc.) applied directly to any location on the device that can affect the electri... | 04/10/2007 |
| 7199590 | Screening method for laminated ceramic capacitors A laminated ceramic capacitor C has a plurality of internal electrodes embedded in a dielectric base substance in a stratified manner, the internal electrodes are caused to conduct to a pair of terminal electrodes provided on an outer surface of the dielectric base ... | 04/03/2007 |
| 7187187 | Signal acquisition probing system using a micro-cavity laser A signal acquisition probing system uses a micro-cavity laser to acquire an electrical signal from a device under test. The micro-cavity laser has a VCSEL gain medium and an electro-optic optical resonant cavity. The micro-cavity laser is pumped by an external laser... | 03/06/2007 |
| 7188037 | Method and apparatus for testing circuit boards The invention provides a method of apparatus for testing circuit boards which does not require any inner wide power plane so as to detect an open circuit defect and/or a short circuit defect in a conductor path network formed in the circuit board quickly and accurat... | 03/06/2007 |
| 7179553 | Method for detecting electrical defects in membrane electrode assemblies A method and system for detecting imperfections in a membrane electrode assembly of an electrochemical fuel cell, and more particularly for detecting defects within a proton exchange membrane in a membrane electrode assembly which is optionally sandwiched between co... | 02/20/2007 |
| 7176468 | Method for charging substrate to a potential A surface of an insulating substrate is charged to a target potential. In one embodiment, the surface is flooded with a higher-energy electron beam such that the electron yield is greater than one. Subsequently, the surface is flooded with a lower-energy electron be... | 02/13/2007 |
| 7151442 | System, apparatus, and method for testing identification tags An apparatus includes at least one tag holder capable of receiving and holding a plurality of tags. The apparatus also includes at least one antenna capable of receiving wireless signals from the plurality of tags during a test of the tags. The apparatus may further... | 12/19/2006 |
| 7149036 | Solid immersion lens and sample observation method using it Using a solid immersion lens (SIL) having a spherical lens surface with a radius of curvature RL from a material having a refractive index nL, an image of a sample is observed. A geometric aberration characteristic caused by the SIL is evaluate... | 12/12/2006 |
| 7149343 | Methods for analyzing defect artifacts to precisely locate corresponding defects Described are methods and systems for providing improved defect detection and analysis using infrared thermography. Test vectors heat features of a device under test to produce thermal characteristics useful in identifying defects. The test vectors are timed to enha... | 12/12/2006 |
