Did You Know...
...that Thomas Edison's patent application on his phonograph was approved by the Patent Office in just seven weeks? In contrast, it took Gordon Gould, the inventor of the laser, 30 years to obtain his patent -- finally awarded in 1988!
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| Number | Title | Issue Date |
| 7417425 | Continuous observation apparatus and method of magnetic flux distribution A continuous observation apparatus of magnetic flux distribution in which a long sample containing a superconducting material or magnetic material is transferred to an observation position and magnetic flux is observed sequentially at each of certain areas along a l... | 08/26/2008 |
| 7368906 | Tool for measuring magnetic properties at high temperatures The present invention relates to a measuring tool for measuring magnetic properties of a magnetic sample in a closed loop, comprising an electromagnet in a closed loop arrangement with two pole pieces connected to a yoke, said pole pieces forming a gap for the place... | 05/06/2008 |
| 7323870 | Magnetoresistive sensor element and method of assembling magnetic field sensor elements with on-wafer functional test A method of performing an on-wafer function testis provided for multiple magnetic field sensor elements on a wafer. Each sensor element includes a magnetic-field-sensitive structure and a current conductor structure. The current conductor structure provides a test m... | 01/29/2008 |
| 7323843 | Method and device for treating signals for detection of stator and rotor errors in magnetic circuits in a synchronous machine It is possible to determine the types and values of stator and rotor errors in magnetic circuits in a synchronous machine by measuring the induced voltage (ui) for the terminals of measurement loops which can capture an image of the induction in the measu... | 01/29/2008 |
| 7275865 | Temperature measuring apparatus using change of magnetic field A temperature measuring apparatus measures the temperature of a wafer in real time using a change of magnetic field during a thermal process. The temperature measuring apparatus includes: at least one conductive structure disposed on one surface of the wafer, in whi... | 10/02/2007 |
| 7268545 | Magnetic sensor, and method of compensating temperature-dependent characteristic of magnetic sensor A magnetic sensor 10 includes GMR elements 11-18, and heating coils 21-24 serving as heat generating elements. The elements 11-14 and 15-18 are bridge-interconnected to constitute X-axis and Y-axis senso... | 09/11/2007 |
| 7146850 | Roll contour measuring apparatus and method A non-contact apparatus and method for precision measurement of the surface characteristics of work rolls which are used in the manufacture of sheet steel and other sheet metal products. The apparatus and method can be used to accurately measure the parameters of cr... | 12/12/2006 |
| 7141440 | Apparatus and method for measuring a property of a layer in a multilayered structure A property of a layer is measured by: (1) focusing a heating beam on a region (also called “heated region”) of a conductive layer (2) modulating the power of the heating beam at a predetermined frequency that is selected to be sufficiently low to ensure that at ... | 11/28/2006 |
| 7138798 | Azimuth meter having spin-valve giant magneto-resistive elements An azimuth meter using spin-valve giant magneto-resistive elements, which is simple in manufacturing process, can be made compact in size and contribute to power saving, is disclosed. The azimuth meter comprises a quadrilateral plane coil having two pairs of paralle... | 11/21/2006 |
| 7121718 | Method and device for detecting defects in sheet metal segments of electric generators and motors In a method for detecting defects in sheet metal segments of electric generators and motors, wherein between the sheet metal pieces of the sheet metal segment an electric insulating layer is arranged, respectively, and wherein between the sheet metal segments a cool... | 10/17/2006 |
| 7123004 | Method of non-destructive inspection of rear surface flaws and material characteristics using electromagnetic technique and apparatus therefor The non-destructive inspection method, wherein the non-destructive inspection method supplies currents to a conductive inspection subject and evaluates the rear surface flaw and the embedded flaw of these the inspection subject, or the material characteristic using ... | 10/17/2006 |
| 7117732 | Fuel gauge for fuel cartridges Fuel gauges for fuel supplies for fuel cells are disclosed. Each fuel gauge has a property that is readable by an electrical circuit. These properties are related to the remaining fuel in the fuel supplies. These properties include, but are not limited to, electrica... | 10/10/2006 |
| 7092179 | Write precompensation amount setting method and apparatus A write precompensation amount setting method and apparatus comprise a function detecting the respective head characteristics with an electric current used at an ordinary temperature and a irregular electric current, and a function setting an optimum write precompen... | 08/15/2006 |
| 7070476 | In-situ metalization monitoring using eddy current measurements during the process for removing the film A method for measuring conductance of a sample using an eddy current probe with a sensing coil. The method includes N repetitions of measuring first and second voltage pairs including in-phase and quadrature components of an induced AC voltage in the sensing coil, c... | 07/04/2006 |
| 7053607 | Magnetic sensor, and method of compensating temperature-dependent characteristic of magnetic sensor A magnetic sensor 10 includes GMR elements 11–18, and heating coils 21–24 serving as heat generating elements. The elements 11–14 and 15–18 are bridge-interconnected to constitute X-axis and Y-axis sensors, respectively. Th... | 05/30/2006 |
| 7033873 | Methods of controlling gate electrode doping, and systems for accomplishing same The present invention is generally directed to various methods of controlling gate electrode doping, and various systems for accomplishing same. In one illustrative embodiment, the method disclosed herein comprises performing at least one process operation to form a... | 04/25/2006 |
| 7026175 | High throughput measurement of via defects in interconnects Heat is applied to a conductive structure that includes one or more vias, and the temperature at or near the point of heat application is measured. The measured temperature indicates the integrity or the defectiveness of various features (e.g. vias and/or traces) in... | 04/11/2006 |
| 6992477 | Medical device with position sensor having core with high permeability material for determining location coordinates of a portion of the medical device A medical location system includes a medical device having a body and a position sensor at a portion of the body. The position sensor has a core made of a Wiegand effect material and a winding circumferentially positioned around the core. The position sensor provide... | 01/31/2006 |
| 6979991 | Nondestructive, electrical impedance-based, thermal barrier coating inspection A method and apparatus are provided for inspecting a coated substrate such as a multi-layer coating on a substrate of a turbine airfoil. At each of a number of locations along the airfoil a number of frequencies of alternating current are passed through the airfoil.... | 12/27/2005 |
| 6971791 | Identifying defects in a conductive structure of a wafer, based on heat transfer therethrough Heat is applied to a conductive structure that includes one or more vias, and the temperature at or near the point of heat application is measured. The measured temperature indicates the integrity or the defectiveness of various features (e.g. vias and/or traces) in... | 12/06/2005 |
| 6963393 | Measurement of lateral diffusion of diffused layers Any semiconductor wafer fabrication process may be changed to monitor lateral abruptness of doped layers as an additional step in the wafer fabrication process. In one embodiment, a test structure including one or more doped regions is formed in a production wafer (... | 11/08/2005 |
| 6960910 | Method for phase matching by detecting magnetic flux A method for phase matching matches a relative phase of a first element and a second element by detecting a magnetic flux. The method provides a magnetic flux generator to generate the magnetic flux. The method also provides a magnetic sensor in order to detect the ... | 11/01/2005 |
| 6958814 | Apparatus and method for measuring a property of a layer in a multilayered structure An apparatus measures a property of a layer (such as the sheet resistance of a conductive layer) by performing the following method: (1) focusing the heating beam on the heated a region (also called “heated region”) of the conductive layer (2) modulating the pow... | 10/25/2005 |
| 6911349 | Evaluating sidewall coverage in a semiconductor wafer A sidewall or other feature in a semiconductor wafer is evaluated by illuminating the wafer with at least one beam of electromagnetic radiation, and measuring intensity of a portion of the beam reflected by the wafer. Change in reflectance between measurements provi... | 06/28/2005 |
| 6906801 | Measuring a property of a layer in multilayered structure An apparatus measures a property of a layer (such as the sheet resistance of a conductive layer or thermal conductivity of a dielectric layer that is located underneath the conductive layer) by performing the following method: (1) focusing the heating beam on the he... | 06/14/2005 |
| 6868735 | Method for nondestructively evaluating aged deterioration of ferromagnetic construction materials Aged deterioration of ferromagnetic construction materials is nondestructively evaluated by applying to an evaluating material a magnetic field whose magnetic field amplitude is rather low, distinguishing various lattice defects, and quantifying them separately. A m... | 03/22/2005 |
| 6781370 | Testing device for detecting and determining material inhomogeneities The present invention relates to a testing device for detecting and determining material inhomogeneities in electrically conductive samples (10), comprising a support (30) for the samples (10) to be tested, a temperature regulating device (30... | 08/24/2004 |
| 6617849 | Device for the nondestructive testing of especially hot bar shaped rolling material A device for nondestructive testing of especially hot, bar-shaped rolling material above Curie point during the rolling process by means of an exploring coil system which can be impinged upon by a coolant and which rotates around the rolling material pass... | 09/09/2003 |
| 6549026 | Apparatus and method for temperature control of IC device during test An apparatus for controlling the temperature, during testing, of IC devices formed on a wafer includes a chuck for locating the devices during testing and multiple temperature control devices arranged on the chuck to correspond with the arrangement of the... | 04/15/2003 |
| 6486660 | Thermal slider level transfer curve tester for testing recording heads A head testing apparatus is provided for testing a data recording head. The apparatus includes a test volume, a magnetic field source, a holder and a thermoelectric source. The test volume is adapted to receive the head, and the magnetic field source is p... | 11/26/2002 |
| 6462538 | Eddy current detection type thin film electrical resistance meter The sheet resistance meter has: a coil which produces a magnetic field; a sensor head provided to enable the magnetic field to induce eddy currents in a thin film formed on a substrate so that the lines of a magnetic force exerted by the magnetic field ex... | 10/08/2002 |
| 6430040 | Foldable bicycle computer A bicycle computer includes a base member structured to mount to a structural member of a bicycle. A cover having an inner surface is swingably coupled to the base so that the inner surface may be moved from a closed position where the inner surface faces... | 08/06/2002 |
| 6411102 | Apparatus for testing various structural parameters of an electro-magnetic radiation barrier The design of an electro-magnetic radiation suppression shield and cooling housing for a computer, server or other electronic device having a computer processor may be greatly enhanced and expedited by a test apparatus that permits the placement of electr... | 06/25/2002 |
| 6262584 | IC device temperature control system and IC device inspection apparatus incorporating the same An IC device temperature control system is provided which includes a magnetometric sensor that detects a magnetic field generated around an IC device received in a chamber for inspection when electric current is supplied to the IC device, and a converter ... | 07/17/2001 |
| 6208253 | Wireless monitoring of temperature Temperature sensing through observable, temperature-dependent effects on an interrogating magnetic field is facilitating by a sensing module having, first, a signal element that interacts with the interrogation field to produce a remotely readable magneti... | 03/27/2001 |
| 6166538 | Autoclave cycle monitor for autoclaved instruments An electronic autoclave cycle passively records the number of thermal cycles to which an instrument has been subjected in a steam autoclave. When a sterilization cycle has been completed, and the instrument is next energized in use, a microprocessor is em... | 12/26/2000 |
| 6150812 | Detection of electromagnetic fields as a determinant of an event Method and apparatus for detecting or analyzing chemical reactions, such as an enzyme reaction, and other events in which electron translation is accompanied by photon emission utilizing a magnetometer probe to detect a change in electromagnetic field str... | 11/21/2000 |
| 6037870 | Dector system for access control, and a detector assembly for implementing such a system The present invention provides a detector system for access control, the system comprising: transmitter coils; associated receiver coils; transponders suitable for generating identifiable signatures; and processor circuits adapted firstly to detect a weap... | 03/14/2000 |
| 5936401 | Device and process for measuring electrical properties at a plurality of locations on thin film superconductors A device and process for determining the uniformity of a superconducting film's critical current density and transition temperature over a large area uses an array of ac coils placed in close proximity to a superconducting film. A variable ac current is p... | 08/10/1999 |
| 5834938 | Nondestructive inspection apparatus with superconducting magnetic sensor To provide a nondestructive inspection apparatus with a reduced distance between a superconducting magnetic sensor and an object under inspection, a cryostat for cooling the sensor to a superconducting state is provided with inner and outer vessels. The i... | 11/10/1998 |
