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| Number | Title | Issue Date |
| 7362148 | Device for controlling a semiconductor element A control device for controlling a load drive semiconductor element for driving a load has a test operation mode for measuring a leak current of the load drive semiconductor element. In the test operation mode, a control terminal of the load drive semiconductor elem... | 04/22/2008 |
| 7363033 | Method of and system for testing equipment during manufacturing A platform system for a mobile terminal for a wireless telecommunications system includes a mobile-terminal platform assembly. The mobile-terminal platform assembly includes a software services component having at least one functional software unit, a hardware compo... | 04/22/2008 |
| 7362089 | Carrier module for adapting non-standard instrument cards to test systems A carrier module that is able to adapt non-standard instrument cards to the architecture of a test system is disclosed. Instrument cards based on non-standard architectures may be combined on a single carrier module. The carrier module is then plugged into the test ... | 04/22/2008 |
| 7363557 | System for at-speed automated testing of high serial pin count multiple gigabit per second devices A system performs automated at-speed testing of a plurality of devices that generate serial data signals having multiple gigabit per second baud rates. The system includes a test head including a device interface board (DIB), the DIB having a device under test holdi... | 04/22/2008 |
| 7363186 | Apparatus and method for self calibration of current feedback The current drawn by a precision resistor that is selectively connected across a load is utilized to calibrate a current sensed by current sensing device that is connected in series with the load. ... | 04/22/2008 |
| 7362124 | Method and apparatus for testing liquid crystal display using electrostatic devices A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate... | 04/22/2008 |
| 7363195 | Methods of configuring a sensor network A sensor network collects time-series data from a process tool and supplies the data to an analysis system where pattern analysis techniques are used to identify structures and to monitor subsequent data based on analysis instructions or a composite model. Time-seri... | 04/22/2008 |
| 7363568 | System and method for testing differential signal crossover using undersampling System and method for testing differential signal crossover in high-speed electronic equipment. A preferred embodiment comprises a test circuit coupled to a device under test (DUT) and an automatic test equipment (ATE). The test circuit comprises a pair of window co... | 04/22/2008 |
| 7363175 | Query based electronic battery tester An electronic battery tester for testing a storage battery provides a test output indicative of a condition of the battery. Electronic measurement circuitry provides a measurement output related to a condition of the battery. The battery condition is determined base... | 04/22/2008 |
| 7362090 | Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same A method of sorting automated tray transfer trays includes detecting if a die remains in the tray. The method includes the ability to interrupt the automated tray transfer process to prevent mixing processed and unprocessed dice. An apparatus includes a sensor for d... | 04/22/2008 |
| 7358717 | Input by-pass circuit for a current probe An input by-pass circuit for a current probe has first and second switches coupled between current probe inputs and current sensing circuit inputs. A switch control is coupled to the switching circuit for selectively coupling and decoupling the current probe inputs ... | 04/15/2008 |
| 7358718 | Semiconductor device and electronics device A plurality of switch circuits are disposed so as to correspond to a plurality of circuit blocks, respectively. Each of the plurality of switch circuits is connected between a power supply terminal of a corresponding circuit block and a power supply line. A setting ... | 04/15/2008 |
| 7357025 | Micromachined apparatus with co-linear drive arrays A mass includes a first set of drive fingers interdigitated with a first array of fixed drive fingers and a second set of drive fingers interdigitated with a second array of fixed drive fingers. Each array of fixed drive fingers is affixed to a substrate using a plu... | 04/15/2008 |
| 7358748 | Methods and systems for determining a property of an insulating film A method for determining a property of an insulating film is provided. The method may include obtaining a charge density measurement of the film, a surface voltage potential of the film relative to a bulk voltage potential of the substrate, and a rate of voltage dec... | 04/15/2008 |
| 7358750 | Inspection apparatus for printed board An inspection apparatus comprises a fixed unit including a control device and a measurement device, and a moving unit including contact terminals, which are brought into contact with contacts formed on a printed board having electrode patterns subjected to electrica... | 04/15/2008 |
| 7360044 | Storage system with primary mirror shadow A storage system with primary mirror shadow comprises a storage array, and a controller. The controller is capable of predefining storage array volumes as a primary volume that is subsequently paired with a secondary volume, emulating a primary logical device and a ... | 04/15/2008 |
| 7358754 | Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment Methods and apparatus are described for connecting a first plurality of signal lines to a second plurality of signal lines. A first assembly includes a plurality of first contact arrays. Each of the contacts in each of the first contact arrays is in electrical conta... | 04/15/2008 |
| 7360137 | Flash programmer for programming NAND flash and NOR/NAND combined flash A method and system for implementing NAND programming of flash devices during in-circuit testing is described. A flash programmer may receive a program file from an in-circuit tester and device information from a NAND flash device, including information regarding ba... | 04/15/2008 |
| 7358753 | Probing apparatus, probing circuit board and probing system for high-voltage matrix probing A probing apparatus, probing circuit board and probing system for high-voltage matrix probing are provided. Switching circuits of the probing apparatus capable of probing a plurality of probing points for high-voltage matrix probing are manufactured with using a mix... | 04/15/2008 |
| 7356435 | Semiconductor test apparatus and control method therefor There is provided a semiconductor test apparatus including: a first waveform generating means that generates a common pattern waveform corresponding to common information common to each of a plurality of semiconductor devices; a plurality of second waveform generati... | 04/08/2008 |
| 7355427 | Clamping top plate using magnetic force A test fixture, for testing an electronic device, includes: a test platform including electrically conductive contacts protruding from a device receiving surface in the test platform; a positioning guide disposed on the device receiving surface; a device retention c... | 04/08/2008 |
| 7355433 | Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests This invention discloses a circuit for performing an unclamped inductive test on a metal oxide semiconductor field effect transistor (MOSFET) device driven by a gate driver. The circuit includes a current sense circuit for measuring an unclamped inductive testing (U... | 04/08/2008 |
| 7355387 | System and method for testing integrated circuit timing margins An integrated circuit load board includes a substrate on which a plurality of integrated circuit sockets and an integrated test circuit are mounted. The integrated test circuit includes circuitry for testing the timing margins of memory devices by determining the re... | 04/08/2008 |
| 7355417 | Techniques for obtaining electromagnetic data from a circuit board A system is configured to obtain electromagnetic data from a circuit board. A set of sensing locations resides in a plane which is substantially parallel to the circuit board. The system includes a probe, a robotic assembly coupled to the probe, and a controller cou... | 04/08/2008 |
| 7355419 | Enhanced signal observability for circuit analysis Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of ... | 04/08/2008 |
| 7354298 | Structured cabling system and patching method A structured cabling system has two patch panels each having a plurality of jacks. Adjacent each jack is a Light-Emitting Diode (LED) which can be illuminated in response to a signal from a processor to identify the associated jack. The processor illuminates each LE... | 04/08/2008 |
| 7355384 | Apparatus, method, and computer program product for monitoring and controlling a microcomputer using a single existing pin A method, apparatus, and computer program product are disclosed for monitoring and controlling a device using only one input/output (I/O) communication pin of the device. The pin is configured to be used to both transmit and receive data. Logical ones are generated ... | 04/08/2008 |
| 7355385 | Voltage injector and detector using pixel array for printed circuit board testing One embodiment includes an injector pixel array having injector pixels each coupled to the bottom surface of a conductive material having a directional electrical conductivity only in a direction corresponding to a path between the bottom surface and top surface of ... | 04/08/2008 |
| 7355386 | Method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester A method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester uses a set of laser distance sensors to align the vacuum nozzles with the target. Alignment occurs when certain combinations of distance and dista... | 04/08/2008 |
| 7355436 | Method for error detection in a drive mechanism A method for error detection in a drive mechanism, having a multiphase electric motor and a converter connected upstream thereof, wherein the converter controls voltages of individual phases of the electric motor, and individual phase currents in the individual phas... | 04/08/2008 |
| 7355867 | Power supply for an electric meter having a high-voltage regulator that limits the voltage applied to certain components below the normal operating input voltage Disclosed is an invention relating to a power supply for use in an apparatus for measuring electrical energy, comprising, in one embodiment, a first switching device, a device for storing electrical charge in electrical connection with the first switching device, a ... | 04/08/2008 |
| 7355422 | Optically enhanced probe alignment A novel probe card that comprises a set of fiducials and a method for using the same are disclosed. The set of fiducials comprises a first fiducial and a second fiducial fixed relative to the probe card substrate. Comparing the relative positions of the fiducials de... | 04/08/2008 |
| 7355432 | Buffer circuit, driver circuit, and semiconductor testing apparatus There is provided a buffer circuit that can deal with input and output signals having a large voltage swing. Such a buffer circuit is designed for outputting an output signal corresponding to an input signal. The buffer circuit includes an input/output circuit for m... | 04/08/2008 |
| 7356742 | Method and apparatus for testing a memory device in quasi-operating conditions A memory test system can screen objects of tests accurately at low cost in quasi-operating conditions by utilizing a personal computer (PC). The system utilizes a PC tester comprising a measurement PC unit that carries a memory module to be used as reference; a sign... | 04/08/2008 |
| 7352193 | Voltage-impressed current measuring apparatus and current buffers with switches used therefor A voltage-impressed current measuring apparatus, wherein the voltage from a direct-current power supply portion is impressed on the terminal of a device under test via a range switching portion and the current flowing in the same terminal is measured; wherein the ra... | 04/01/2008 |
| 7352602 | Configurable inputs and outputs for memory stacking system and method Embodiments of the present invention relate to configurable inputs and/or outputs for memory and memory stacking applications. More specifically, embodiments of the present invention include memory devices that include a die having a circuit configured for enablemen... | 04/01/2008 |
| 7353090 | System, bus monitor assembly and method of monitoring at least one data bus of an aircraft A system is provided for monitoring at least one data bus of an aircraft. The system includes an aircraft adapted to control the operation of stores of a second predetermined type (e.g., Harpoon Block I missiles). However, the aircraft is also capable of carrying a ... | 04/01/2008 |
| 7353307 | Linking addressable shadow port and protocol for serial bus networks Linking addressable shadow port (LASP) and protocol allows addressing the LASP and configuring the connection of multiple Secondary Test Access Ports (TAPs) of the LASP using a single protocol or protocol bypass inputs. Multiple LASPs are cascaded and the connection... | 04/01/2008 |
| 7352169 | Testing components of I/O paths of an integrated circuit Testing the components of I/O paths in an integrated circuit at-speed operation (i.e., the speed at which the integrated circuit would be operated during normal non-test mode). In an embodiment, boundary scan cells of different paths are connected in a scan chain, a... | 04/01/2008 |
| 7352201 | System and method for testing devices utilizing capacitively coupled signaling An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and outpu... | 04/01/2008 |
