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Pizza Pie With Concentric Rings of Crust
A pizza mold for forming a plurality of concentric raised ridges of dough (i.e., crust) on the surface of a pizza pie.
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| Number | Title | Issue Date |
| 7336065 | Energy device with an extended dynamic range on current readings Systems and methods are disclosed for accurately measuring delivered or supplied electrical energy over an extended range of values. In one embodiment, a meter for monitoring the energy at a remote site includes a current sensor for measuring the current supplied to... | 02/26/2008 |
| 7337088 | Intelligent measurement modular semiconductor parametric test system An intelligent measurement modular semiconductor parametric test system comprises an engine control module. The engine control module is operable to communicate with a user via a user interface, and is further operable to communicate with and to control the state of... | 02/26/2008 |
| 7336088 | Method and apparatus for determining IDDQ A test apparatus for testing a device under test (DUT) to detect a defect comprises a measurement circuit (ME), a threshold circuit (TH), and a control circuit (CG). The measurement circuit (ME) comprises a counter (C1) which counts clock pulses (OLK) during ... | 02/26/2008 |
| 7336485 | Heat sink detection In one embodiment, a printed circuit board assembly comprises a heat sink having an electrically conductive mounting support and a printed circuit board including detection circuitry to detect an electrical connection between the electrically conductive mounting sup... | 02/26/2008 |
| 7337034 | Method and apparatus for determining a root cause of a statistical process control failure The present invention provides a method and apparatus for determining a root cause of a fault. The method includes detecting at least one fault associated with at least one first wafer processed according to a first processing context and processing at least one sec... | 02/26/2008 |
| 7336066 | Reduced pin count test method and apparatus Testing of an electronic device is carried out by combining power and signal delivery on a single pair of wires. The power delivery is decoupled from the signal delivery, using inductors, so the device power supplied does not interfere with the test signals delivere... | 02/26/2008 |
| 7336212 | Apparatus and methods for measurement of analog voltages in an integrated circuit The present disclosure relates to apparatus and methods for measurement of analog voltages in an integrated circuit. In particular, the apparatus includes an on-chip digital-to-analog converter configured to receive a variable digital input code and output a corresp... | 02/26/2008 |
| 7332924 | Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failure Reliability testing circuitry is built into the wafer or IC package in the form of one or more individual testers that use small-area transistors as DUTs. Stress can be applied to the DUTs in parallel and information about breakdown, wearout or failure can be obtain... | 02/19/2008 |
| 7332905 | Fixture for circuit board A fixture for clamping and fixing a circuit board is provided. The fixture includes a base and a moving element. The base includes a first supporting board and a second supporting board disposed on the first supporting board. At least one positioning bump is dispose... | 02/19/2008 |
| 7333919 | Perturbation detection A method for detecting perturbation of a physical system from a reference state associated with a reference parameter (ω0) to a perturbed state associated with a perturbed parameter (ω) includes firstly deriving the reference parameter (ω0).... | 02/19/2008 |
| 7332904 | On-chip resistor calibration apparatus and method An on-chip resistor is calibrated with a sense circuit that compares a resistance associated with an off-chip resistor to the on-chip resistor via a current-mirror circuit and a comparator. A digital counter circuit evaluates the comparison and adjusts its count suc... | 02/19/2008 |
| 7332907 | Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals The invention provides a semiconductor device that can inspect the connection states of power source terminals and grounding terminals of a test LSI at a low cost and in a short time, and an inspection method for the same. Switches SW1 to SW3 are provi... | 02/19/2008 |
| 7332927 | Apparatus for temporary thermal coupling of an electronic device to a heat sink during test A method, system and apparatus for testing an integrated circuit chip. The system including: means for forming a liquid polyalphaolefine layer on a bottom surface of the integrated circuit chip, a top surface of the integrated circuit chip having and a bottom surfac... | 02/19/2008 |
| 7332926 | Semiconductor test apparatus Good device PASS/FAIL determination is realized by measuring timings of a cross point of differential clock signals CLK and a data signal DATA output from a DUT, and obtaining a relative phase difference between both signals. A semiconductor test apparatus comprises... | 02/19/2008 |
| 7332914 | Conductor inspection apparatus and conductor inspection method Disclosed is a conductor inspection apparatus capable of detecting a state of an inspection-target electric conductor with a high degree of accuracy in a non-contact manner. The inspection apparatus includes a signal supply section 510 for supplying an inspec... | 02/19/2008 |
| 7332718 | Method for finding disconnection of conductive wires formed on plate glass and apparatus therefor The invention relates to a method for finding disconnection of a conductive wire formed on a plate glass. This method includes the steps of (a) applying a voltage to the conductive wire; and (b) imaging thermal radiation from a surface of the conductive wire by an i... | 02/19/2008 |
| 7332918 | Prober and probe testing method for temperature-controlling object to be tested A prober which tests an object to be tested under temperature control is provided. This prober includes a stage base, Z stage, X-Y stage having a frame structure, substrate fixing mechanism arranged on the X-Y stage, a probe card arranged to oppose the substrate fix... | 02/19/2008 |
| 7332925 | Engaging device of circuit board An engaging device of a circuit board is disclosed. The engaging device is for engaging a circuit board having a positioning hole to a housing of an electronic device. The engaging device includes a conductive hook fixed to the housing, the conductive hook including... | 02/19/2008 |
| 7332917 | Method for calculating frequency-dependent impedance in an integrated circuit A method for calculating frequency-dependent impedance in an integrated circuit (IC) having transistors coupled together by a line follows. First, partition the line into a plurality of rectangles of constant material. Then, solve for the minimum dissipated power in... | 02/19/2008 |
| 7332906 | Vacuum circuit interrupter including circuit monitoring leakage or loss of vacuum and method of monitoring a vacuum interrupter for leakage or loss of vacuum A method monitors a vacuum interrupter for leakage or loss of vacuum. The vacuum interrupter includes a line side, a load side and separable contacts electrically connected therebetween. The line side has a line side voltage and the load side has a load side voltage... | 02/19/2008 |
| 7330037 | Electrical characteristic measuring probe and method of manufacturing the same In an electrical characteristic measuring probe of the present invention constructed by assembling a plurality of probe parts, each comprising a base portion, a plurality of terminal portions extended outward from one end of the base portion, wiring patterns extende... | 02/12/2008 |
| 7330024 | Power supply device, test apparatus, and power supply voltage stabilizing device A power supply device for supplying source current to an electronic device comprises: a current output unit for outputting output current including at least the source current as a component of the current thereof; a connection resistor which electrically connects t... | 02/12/2008 |
| 7330040 | Test circuitry wafer Method and apparatus for testing a plurality of devices on a device wafer. One embodiment provides a test circuitry wafer having a first surface and a second surface, the test circuitry wafer comprising a plurality of contact pads disposed on the first surface for c... | 02/12/2008 |
| 7330357 | Integrated circuit die/package interconnect A system may include a plurality of pliant conductive elements, a first end of one of the plurality of pliant conductive elements to be electrically coupled to a first electrical contact of an integrated circuit substrate and a second end of the one of the plurality... | 02/12/2008 |
| 7330025 | Touchdown counter for integrated circuit testers A touch-down counter is provided that maintains a count of how many times integrated circuits are placed into contact with a contactor in a test handler. The test handler has a work press that places integrated circuits into contact with pogo pins in the contactor. ... | 02/12/2008 |
| 7330043 | Semiconductor device and test method for the same A multi-bus semiconductor device and a method of its probing test perform the DC test for individual pads of a device while dealing with an adequate number of devices for simultaneous measurement based on the scheme of input/output pad number compressive test. The s... | 02/12/2008 |
| 7329606 | Semiconductor device having nanowire contact structures and method for its fabrication A semiconductor device having small electrical contacts to impurity doped regions and a method for fabrication of such a device are provided. In accordance with one embodiment of the invention the semiconductor device comprises a semiconductor substrate having a dop... | 02/12/2008 |
| 7330023 | Wafer probe station having a skirting component A probe station includes a fully guarded chuck assembly and connector mechanism for increasing sensitivity to low-level currents while reducing settling times. The chuck assembly includes a wafer-supporting first chuck element surrounded by a second chuck element ha... | 02/12/2008 |
| 7327179 | Pulse generator, optical disk writer and tuner A pulse generator is provided for generating pulses with a selectable variable width and/or delay. The pulse generator comprises an oscillator and a selecting arrangement for selecting how many of a first group of delay elements are connected in series for delaying ... | 02/05/2008 |
| 7327135 | Testing apparatus and testing method using the same An exemplary testing apparatus (200) for testing electronic device (280) includes a workbench (210), a conveyance board (221) for supporting the electronic device to be tested and a testing device (270). The conveyance board is sli... | 02/05/2008 |
| 7327150 | Integrated circuit package resistance measurement For one embodiment, an integrated circuit includes a node to couple one or more components to the integrated circuit to carry current through a package for the integrated circuit. The integrated circuit also includes a monitor to measure a resistance of the package ... | 02/05/2008 |
| 7327610 | DRAM memory with common pre-charger A memory layout where the pre-charger circuits are connected between different pairs of bit lines than are the sense amplifiers: The two bits lines in each bit line pair are connected to different pre-charge circuits and thus they can be charged to different pre-cha... | 02/05/2008 |
| 7327151 | Memory application tester having vertically-mounted motherboard Disclosed is a memory application tester for testing a semiconductor memory device. A plurality of motherboards of the tester are vertically mounted and connected to memory devices to be tested mounted on an interface board via a HiFix board so that a memory applica... | 02/05/2008 |
| 7327152 | Integrated test circuit arrangement and test method An integrated test circuit arrangement is provided that contains integrated test structures, at least one integrated heating element, an integrated detection unit, an integrated supply unit, and a control unit. The integrated detection unit detects at least one phys... | 02/05/2008 |
| 7328381 | Testing system and method for memory modules having a memory hub architecture A testing method and system is used to test memory modules each of which has a memory hub coupled to a plurality of memory devices. The testing system and method includes a test interface circuit having a memory interface that is coupled to transmit and receive memo... | 02/05/2008 |
| 7323895 | Low-current pogo probe card A low-current pogo probe card for measuring currents down to the femtoamp region includes a laminate board having a layer of conductive traces interposed between to dielectric layers. A plurality of probing devices, such as ceramic blades, are edge-mounted about a c... | 01/29/2008 |
| 7323882 | System to place receptacles and distribution blocks An electrified wall panel in a modular furniture environment includes a plurality of multi-port electrical distribution blocks diversely located throughout the panel. Certain ones of the multi-port electrical distribution blocks are fixed to wall panel frame members... | 01/29/2008 |
| 7323862 | Apparatus and method for detecting photon emissions from transistors A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the... | 01/29/2008 |
| 7323861 | Contact plate for use in standardizing tester channels of a tester system and a standardization system having such a contact plate One embodiment of the invention provides a standardization module for use in standardizing tester channels of a tester unit using a standardization unit for making contact with contact faces which are connected to the tester channels and for standardizing the tester... | 01/29/2008 |
| 7323897 | Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipment In one embodiment, a mock wafer for calibrating automated test equipment includes a printed circuit board having a number of interconnect areas, with each interconnect area having a pair of mock die pads that are coupled via a connecting trace. In another embodiment... | 01/29/2008 |
