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| Number | Title | Issue Date |
| RE42655 | Mechanism for fixing probe card In a mechanism for fixing a probe card, the probe card and a support frame are joined to each other about the axis of each of the probe card and the support frame by a plurality of first fastening members. Also, the outer circumferential edge portion of the support ... | 08/30/2011 |
| 7944200 | Probe apparatus A probe apparatus includes a holding frame holding a test head through a biasing unit biasing the test head. An annular member is rotatably mounted in an opening of a ceiling plate of a main body. Cam followers are rotatably provided circumferentially on the annular... | 05/17/2011 |
| 7923990 | Wafer holder A wafer holder is provided which includes a holder body with a chuck table having a ring-like wafer receptacle, and a plurality of fixing portions fixing a wafer on the wafer receptacle to hold the wafer, and a carrier supporting the wafer before fixed on the wafer ... | 04/12/2011 |
| 7923991 | Signal testing apparatus A signal testing apparatus includes a number of first switches, a second switch, and a testing terminal. Each first switch includes a static contact, a first dynamic contact, and a second dynamic contact. The second switch includes a static contact and a number of d... | 04/12/2011 |
| 7923989 | Test handler A test handler includes a loading unit for loading semiconductor devices from customer trays onto a test tray; a test chamber for performing a test for the semiconductor devices loaded on the test tray; a pushing unit having at least one pushing member for pushing t... | 04/12/2011 |
| 7902814 | Microscope enclosure system A displaceable light-tight enclosure system housing an automated robotic microscope having electronically controllable components and an image capture device. The enclosure system includes a device(s) for displacement, an externally viewable monitor, and a plurality... | 03/08/2011 |
| 7898242 | Probe card assembly with an interchangeable probe insert A probe card assembly can include an insert holder configured to hold a probe insert, which can include probes disposed in a particular configuration for probing a device to be tested. The probe card assembly can provide an electrical interface to a tester that can ... | 03/01/2011 |
| 7888928 | Component test apparatus having a pair of rotary transport hands A component test apparatus performing a test on an electronic component is disclosed. The component test apparatus includes a component loading device, a transport hand, and a component unloading device. The transport hand includes a plurality of index units each on... | 02/15/2011 |
| 7884599 | HDL design structure for integrating test structures into an integrated circuit design A hardware description language (HDL) design structure for performing device-specific testing and acquiring parametric data on integrated circuits, such that each chip can be tested individually without excessive test time requirements, additional silicon, or specia... | 02/08/2011 |
| 7880461 | System for transferring test trays and a handler having same A system and method is provided for transferring multiple test trays within a test handler. The system includes at least one moving member having a pushing member that pushes a first test tray and a pulling member that pulls on a projection on a second test tray to ... | 02/01/2011 |
| 7876088 | Contacting component, method of producing the same, and test tool having the contacting component A contacting component has a probe contact formed by plating and adapted to be contacted with a target portion. The contacting component includes an insulating substrate, a conductive circuit formed on one surface of the insulating substrate, and the probe contact i... | 01/25/2011 |
| 7876087 | Probe card repair using coupons with spring contacts and separate atachment points Probecard architectures partition the spring compliance required for IC testing between several different components. Such architectures can provide shorter springs, better impedance control, improved power/ground distribution and more direct paths to tester electro... | 01/25/2011 |
| 7876089 | Test handler, method for loading and manufacturing packaged chips, and method for transferring test trays A test handler, a packaged chip loading method, a test tray transferring method, and a packaged chip manufacturing method are provided. The test handler may include a loading unit, a chamber system, an unloading unit, at least one rotating unit and a transferring un... | 01/25/2011 |
| 7872469 | Apparatus and methods of integrated-circuit device testing A motherboard device (MB) interface board (DIB) configured as universal interface to a family of integrated circuit (IC) devices provides the electrical connectivity to automated test equipment (ATE) and physical mating commonality with an IC device handler for redu... | 01/18/2011 |
| 7868608 | Detecting open ground connections in surface mount connectors A device may include a current source for connecting to a printed circuit board. The device may also include a first FET switch pack and a second FET switch pack for connecting to the surface mount connector of the printed circuit board. Additionally, the device may... | 01/11/2011 |
| 7863888 | Efficient switching architecture with reduced stub lengths A switching topology for communicating signals in an automatic test system includes a plurality of switching circuits each for selectively passing signals or crossing signals. Switching circuits are connected together such that each node of any switching circuit con... | 01/04/2011 |
| 7863889 | Component receptacle to segregate components A component receptacle for coupling to a component tester that tests a component is disclosed. The component receptacle includes a plurality of trays mounted in a housing for receiving components, a tray access control system configured to control access to at least... | 01/04/2011 |
| 7863890 | Apparatus for testing integrated circuitry A testing apparatus for testing integrated circuits mounted in a carrier includes a support assembly. A controller is mounted in the support assembly. The controller is programmed to process test signals from the integrated circuits. A retaining assembly is arranged... | 01/04/2011 |
| 7859247 | Device, system and method for monitoring electromagnetic fields A system for monitoring the electromagnetic field strength received at a predetermined point of a monitored area, includes a device that senses the electromagnetic field fed in at a least one frequency band to an antenna by a transmission apparatus and transmits at ... | 12/28/2010 |
| 7859248 | Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus An electronic device test apparatus comprises: a contact arm making an IC device move and pushing it against a socket 301; a control device controlling the contact arm; an instructing unit instructing the control device on a pushing torque of the contact arm;... | 12/28/2010 |
| 7855549 | Integrated process condition sensing wafer and data analysis system A process condition measuring device and a handling system may be highly integrated with a production environment where the dimensions of the process condition measuring device are close to those of a production substrate and the handling system is similar to a subs... | 12/21/2010 |
| 7852065 | Testing apparatus for testing electronic system with 4-wires resistive touch panel and the method therefor The invention relates to a testing apparatus for 4-wires resistive touch panel of an electronic system. The testing apparatus includes a voltage control unit, a signal control unit, a connecting unit and a determining unit. The determining unit is used for determini... | 12/14/2010 |
| 7847538 | Testing micromirror devices An array of individually addressable micromirrors is characterized by sending a driving signal to a pixel group having a fewer number of micromirrors. A response of the micromirrors in the group is measured; and the micromirror array is characterized based upon at l... | 12/07/2010 |
| 7839139 | Pusher block An electronic device testing apparatus for conducting a test by pressing input/output terminals of an IC to be tested against sockets (50), comprising a pusher (30) provided at least with a pusher base (34) provided to be able to approach and se... | 11/23/2010 |
| 7839138 | Adjustable force electrical contactor An apparatus for testing electric components supported on a test plate for transport along a of travel path through a test station includes an electrical contactor at the station for contacting the plate surface and at least one electronic component transported to t... | 11/23/2010 |
| 7834615 | Bist DDR memory interface circuit and method for self-testing the same using phase relationship between a data signal and a data strobe signal An apparatus and method for self-testing a DDR memory interface are disclosed. In one aspect, a built-in-self-test (BIST) memory interface circuit includes a signal multiplier for receiving a first clock signal from a tester and outputs a multiplied clock signal. A ... | 11/16/2010 |
| 7825651 | Resistor structures to electrically measure unidirectional misalignment of stitched masks An apparatus and method for matched variable resistor structures to electrically measure unidirectional misalignment of stitched masks for etched interconnect layers includes a first test pad and a second test pad for measuring resistance therebetween; a first resis... | 11/02/2010 |
| 7825652 | Method and apparatus for remotely buffering test channels A system is provided to enable leakage current measurement or parametric tests to be performed with an isolation buffer provided in a channel line. Multiple such isolation buffers are used to connect a single signal channel to multiple lines. Leakage current measure... | 11/02/2010 |
| 7825650 | Automated loader for removing and inserting removable devices to improve load time for automated test equipment An SOC tester having test cards with memory cards is presented. The SOC tester may automatically swap memory cards between a memory card rack and a test head between tests on devices under test. Test programs and data on the memory cards may be down loaded onto memo... | 11/02/2010 |
| 7821255 | Test system with wireless communications A test system for testing electronic devices can include a plurality of testers and a test station. The test station can include probes to contact the devices and the tester can control testing. Test data can be received by the test station from the testers using wi... | 10/26/2010 |
| 7821254 | Method and apparatus for improving load time for automated test equipment An SOC tester having test cards with memory cards is presented. The SOC tester may be running a test on a device under test using test programs stored on one set of memory cards. Test programs may be down loaded to a second set of memory cards during testing using t... | 10/26/2010 |
| 7816908 | Display device and liquid crystal television The present invention discloses enabling readily determining which circuit, among a plurality of circuits including an optical source lighting circuit and a power supply circuit, has a failure and repairing the circuits easily in a short period. A liquid crystal tel... | 10/19/2010 |
| 7816907 | Integrated circuit with a measuring circuit and method of configuring an integrated circuit with a measuring circuit An integrated circuit includes an output terminal to be coupled to a light-emitting diode, an output circuit coupled to the output terminal, the output circuit being configured to supply an operating signal to the light-emitting diode, a measuring circuit coupled to... | 10/19/2010 |
| 7816906 | Method for determining anisotropy of 1-D conductor or semiconductor synthesis A method is provided for determining the anisotropy of alignment of a random array of 1-D conductive elements (e.g., carbon nanotube or silicon nanowire) formed on a substrate. A pattern of a plurality of electrodes are arranged on the substrate containing the 1-D c... | 10/19/2010 |
| 7816909 | Mechanical stress characterization in semiconductor device Methods of characterizing a mechanical stress level in a stressed layer of a transistor and a mechanical stress characterizing test structure are disclosed. In one embodiment, the test structure includes a first test transistor including a first stress level; and at... | 10/19/2010 |
| 7816910 | Test handler having size-changeable test site A test handler (122) of the present invention includes a main body, a window (142) formed on a surface of the main body and having a size corresponding to a Hi-Fix board of M×N array (where M and N represent an integer greater than a value of =), a co... | 10/19/2010 |
| 7812595 | Electronic device identifying method There is provided a device identifying method for identifying an electronic device including therein an actual operation circuit and a test circuit having a plurality of test elements provided therein, where the actual operation circuit operates during an actual ope... | 10/12/2010 |
| 7804291 | Semiconductor test device with heating circuit A semiconductor test device includes a test circuit having contacts for applying an electrical signal and measuring electrical parameters of the test circuit. The semiconductor test device also includes an integrally formed heating circuit comprising at least one ci... | 09/28/2010 |
| 7804292 | Method for testing integrated circuits mounted on a carrier A method for testing integrated circuits mounted on a carrier includes the step of securing the carrier. The carrier is displaced into an operative position in which the integrated circuits are in physical and electrical communication with a diagnostic probe. Test s... | 09/28/2010 |
| 7804293 | Power supply and stabilizer Provided is a power supply apparatus including a low pass filter that receives an output voltage of a current output section and allows a low frequency component with a frequency lower than a preset cutoff frequency to pass through; an excess voltage restricting loa... | 09/28/2010 |
