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Class 257/E27.162 - Anti-blooming (EPO)


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: This subclass is indented under subclass E27.15. This subclass
No. of patents: 181
Last issue date: 06/17/2008


1          
NumberTitleIssue Date
7388239Frame shutter pixel with an isolated storage node
A frame shutter type device provides a separated well in which the storage node is located. The storage node is also shielded by a light shield to prevent photoelectric conversion. ...
06/17/2008
6693671Fast-dump structure for full-frame image sensors with lod antiblooming structures
A structure for a fast-dump gate for charge coupled devices that does not require a separate contact to a drain region instead using the existing drain of a lateral overflow drain (LOD) typically used for antiblooming purposes. LOD structures are typicall...
02/17/2004
6680222Split-gate virtual-phase CCD image sensor with a diffused lateral overflow anti-blooming drain structure and process of making
Generally, and in one form of the invention, a monolithic solid state image-sensing device is disclosed. The device utilizes only a single layer of polysilicon deposition in its fabrication process that is split into two or more phases by very narrow gaps...
01/20/2004
6665013Active pixel sensor having intra-pixel charge transfer with analog-to-digital converter
An imaging device formed as a monolithic complementary metal oxide semiconductor integrated circuit in an industry standard complementary metal oxide semiconductor process, the integrated circuit including a focal plane array of pixel cells, each one of t...
12/16/2003
6649442Fast line dump structure for solid state image sensor
The present invention is a structure for a fast-dump gate (FDG) and a fast-dump drain (FDD) for a charge coupled device. It is envisioned that the charge coupled device be a horizontal readout register of a solid-state image sensor. This structure uses a ...
11/18/2003
6624453Lateral overflow drain, anti-blooming structure for CCD devices having improved breakdown voltage
An image sensor having an anti-blooming structure, where the image sensor comprises a substrate of a first conductivity type; a dielectric having a first thin portion and a second thick portion; a buried channel of the second conductivity type within the ...
09/23/2003
6583061Method for creating an anti-blooming structure in a charge coupled device
A method of creating a lateral overflow drain, anti-blooming structure in a charge coupled device, the method includes steps for self-aligning a peripheral edge of the lateral overflow drain to an edge of the thick field oxide, whereby the overflow drain ...
06/24/2003
6507056Fast line dump structure for solid state image sensor
The present invention is a structure for a fast-dump gate (FDG) and a fast-dump drain (FDD) for a charge coupled device. It is envisioned that the charge coupled device be a horizontal readout register of a solid-state image sensor. This structure uses a ...
01/14/2003
6331873High-precision blooming control structure formation for an image sensor
Provided is a blooming control structure for an imager and a corresponding fabrication method. The structure is produced in a semiconductor substrate in which is configured an electrical charge collection region. The electrical charge collection region is...
12/18/2001
6243135Solid state imaging device having overflow drain region
A solid state imaging device of the present invention includes a photoelectric convert part, a vertical charge transfer part, a horizontal charge transfer part, an unnecessary charge expelling region. A channel region of the horizontal charge transfer par...
06/05/2001
6188092Solid imaging device having an antifuse element and method of making the same
A solid imaging device including a substrate voltage generating device possessing high display quality, high reliability, and method of manufacturing. The solid imaging device includes a plurality of photoelectric conversion elements, a vertical charge tr...
02/13/2001
6180935Dynamic range extension of CCD imagers
Dynamic range extension (DRE) is achieved in CCD imagers with charge overflow structures by varying the potential VG on the gate electrodes of the pixel signal charge wells during charge integration. The wells are formed to function with the ch...
01/30/2001
6140147Method for driving solid-state imaging device
A method for driving a solid-state imaging device such as a CCD (Charge Coupled Device) which facilitates control of a blooming suppressing voltage and can reduce a voltage required for shuttering. The solid-state imaging device to be driven typically com...
10/31/2000
6051852Self aligned LOD antiblooming structure for solid-state imagers
A self aligned, lateral-overflow drain antiblooming structure that is insensitive to drain bias voltages and therefore has improved insensitivity to process variations. The length of the antiblooming barrier regions are easily adjusted and determined by p...
04/18/2000
6025210Solid-state imaging device and method of manufacturing the same
A solid-state imaging device provided here comprises a p-type semiconductor substrate, a p-type impurity layer formed thereon, a light-intercepting part formed inside said impurity layer for storing signal charges produced through incident light, and a n-...
02/15/2000
5990953Solid state imaging device having overflow drain region provided in parallel to CCD shift register
A solid state imaging device of the present invention includes a photoelectric convert part, a vertical charge transfer part, a horizontal charge transfer part, an unnecessary charge expelling region. A channel region of the horizontal charge transfer par...
11/23/1999
5972733Self-aligned barrier process with antiblooming drain for advanced virtual phase charged coupled devices
A method for making a virtual phase charge coupled device includes: forming a semiconductor region 24; forming a gate insulator layer 26 over the semiconductor region 24; forming a semiconductor layer over the gate insulator layer 26; forming first, secon...
10/26/1999
5929470Solid state imager with reduced smear
A CCD solid state imaging device can reduce a smear component. This CCD solid state imaging device comprises a plurality of photosensor sections (10) arranged in a matrix fashion, a vertical transfer register (5) having a transfer electrode (16) disposed ...
07/27/1999
5902995CCD image sensor with overflow barrier for discharging excess electrons at high speed
A charge transfer device comprises an array of photodiodes, vertical registers having channels for receiving charge packets from the photodiodes and vertical electrodes for shifting the charge packets along the channels of the vertical registers. A horizo...
05/11/1999
5898195Solid-state imaging device of a vertical overflow drain system
A solid-state imaging device of a vertical overflow drain system according to the present invention includes a first conductive type semiconductor substrate, a second conductive type semiconductor well region formed on the first conductive type semiconduc...
04/27/1999
5877520Trench lateral overflow drain antiblooming structure for virtual phase charge coupled devices with virtual gate element
The lateral overflow drain for charge coupled devices includes: a semiconductor region 70 of a first conductivity type having a trench 92; a drain region 24 of a second conductivity type below the trench 92; a gate 20 in the trench 92 overlying and separa...
03/02/1999
5869854Solid-state imaging device and method of manufacturing the same
A solid-state imaging device provided here comprises a p-type semiconductor substrate, a p-type impurity layer formed thereon, a light-intercepting part formed inside said impurity layer for storing signal charges produced through incident light, and a n-...
02/09/1999
5867055Semiconductor device containing an adjustable voltage generator
A semiconductor device and a method of inspecting the same are described. The semiconductor device does not need voltage adjustment of an external driver circuit, since it contains a voltage generator to inspect and memorize the best value of voltage by c...
02/02/1999
5844264Charge-coupled device image sensor
A charge-coupled device image sensor includes a substrate, a buried channel region of a first conductivity type, formed in the substrate to a predetermined depth, for transferring signal charges, a first high concentration impurity region of a second cond...
12/01/1998
5841126CMOS active pixel sensor type imaging system on a chip
Single substrate device is formed to have an image acquistition device and a controller. The controller on the substrate controls the system operation....
11/24/1998
5804844Solid-state imager with container LOD implant
A CCD pixel 10 has an antiblooming structure including a lateral overflow drain 36 of one conductivity. The drain 36 is mounted on one side by a heavy dope channel stop region. The rest of drain 36 is bounded by a heavily doped container region 38 that is...
09/08/1998
5804465Compact isolation and antiblooming structure for full-frame CCD image sensors operated in the accumulation mode
By introducing an n-type drain implant substantially below the surface of the p-type substrate of a full frame image sensor, then enclosing the drain on the bottom and the sides with a deep p-type implant, and accumulating the surface with a shallow p-typ...
09/08/1998
5763292Method of making a solid state imager with reduced smear
A CCD solid state imaging device can reduce a smear component. This CCD solid state imaging device comprises a plurality of photosensor sections (10) arranged in a matrix fashion, a vertical transfer register (5) having a transfer electrode (16) disposed ...
06/09/1998
5714776Compact isolation and antiblooming structure for full-frame CCD image sensors operated in the accumlation mode
By introducing an n-type drain implant substantially below the surface of the p-type substrate of a full frame image sensor, then enclosing the drain on the bottom and the sides with a deep p-type implant, and accumulating the surface with a shallow p-typ...
02/03/1998
5702971Self-aligned LOD antiblooming structure for solid-state imagers
A self aligned, lateral-overflow drain antiblooming structure that is insensitive to drain bias voltages and therefore has improved insensitivity to process variations. The length of the antiblooming barrier regions are easily adjusted and determined by p...
12/30/1997
5699114CCD apparatus for preventing a smear phenomenon
A CCD for detecting images includes a substrate, a well region formed on the semiconductor substrate, a horizontal CCD (HCCD) formed in the well region, a photodiode region formed in the well region at a prescribed spacing from the HCCD, a channel stop la...
12/16/1997
5619049CCD-type solid state image pickup with overflow drain structure
A charge-coupled device type solid state image pickup in which the overflow drain is formed at a high concentration on each photo-sensitive well. A high-concentration impurity layer is formed in the top layer of a PNPN structure to act as a drain against ...
04/08/1997
5608243Single split-gate MOS transistor active pixel sensor cell with automatic anti-blooming and wide dynamic range
The size of an active pixel sensor cell is reduced by utilizing a single split-gate MOS transistor and a reset gate. The split-gate transistor includes an image collection region which is formed in the drain region and electrically connected to the floati...
03/04/1997
5585298Self aligned antiblooming structure for solid state image sensors
A self aligned, lateral-overflow drain antiblooming structure that is insensitive to drain bias voltages and therefore has improved insensitivity to process variations. The length of the antiblooming barrier regions are easily adjusted and determined by p...
12/17/1996
5585653Solid-state photoelectric imaging device with reduced smearing
A solid-state imaging device which restrains the smear phenomenon effectively without reduction of the dielectric breakdown strength between the transfer electrode and the light shielding film. A first insulating film covers photoelectrical converting reg...
12/17/1996
5483282Method for driving a linear image sensor
In a linear sensor, a charge transfer part is disposed between a one-dimensional array of photodetectors and an overflow drain and includes a CCD having four or more transfer gates for each photodetector for transferring signal charges from the photodetec...
01/09/1996
5464996Process tracking bias generator for advanced lateral overflow antiblooming drain
The process tracking bias generator for antiblooming structures includes a lateral overflow antiblooming drain and bias circuitry coupled to the antiblooming drain for automatically adjusting a bias for the antiblooming drain independent of process variat...
11/07/1995
5455443CCD imager with overflow drain
A CCD solid state imaging device has an overflow mechanism to discharge excess electric charges at the sensor section. An overflow level can be stabilized without adjustment. The CCD solid state imaging device includes an overflow barrier region for deter...
10/03/1995
5453632Advanced lateral overflow drain antiblooming structure for virtual gate photosites
The lateral overflow drain for virtual phase devices includes: a semiconductor region 72 of a first conductivity type; a drain region 24 of the first conductivity type formed in the semiconductor region 72; a threshold adjust region 22 formed in the semic...
09/26/1995
5446297CCD type solid-state image sensor
A CCD type solid-state image sensor a n type silicon substrate, a first p type well formed over the substrate, photodiode regions deeply and widely formed in the first well, second p type wells formed in the first well, each of the second well being overl...
08/29/1995
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