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Patent No. 5979328

Vehicular Impact Signaling Device

An apparatus for the deployment of a visible plume to alert other motorists that a proximate motor vehicle has been involved in a collision.

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Class 257/E21.479 - From liquid, e.g., electrolytic deposition (EPO)


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: This subclass is indented under subclass E21.477. This subclass
No. of patents: 18
Last issue date: 08/26/2008


NumberTitleIssue Date
7416975Method of forming contact layers on substrates
A method is provided for manufacturing removable contact structures on the surface of a substrate to conduct electricity from a contact member to the surface during electroprocessing. The method comprises forming a conductive layer on the surface. A predetermined re...
08/26/2008
7358183Method for manufacturing wiring and method for manufacturing semiconductor device
The present invention provides a method for manufacturing a wiring and a method for manufacturing a semiconductor device, which do not require a photolithography step in connecting a pattern of an upper layer and a pattern of a lower layer. According to the present ...
04/15/2008
7332432Method for manufacturing wiring, thin film transistor, light emitting device and liquid crystal display device, and droplet discharge apparatus for forming the same
As a semiconductor device, specifically, a pixel portion included in a semiconductor device is made to have higher precision and higher aperture ratio, it is required to form a smaller wiring in width. In the case of forming a wiring by using an ink-jet method, a do...
02/19/2008
7306962Electroformed metallization
A method is provided for electroforming metal integrated circuit structures. The method comprises: forming an opening such as a via or line through an interlevel insulator, exposing a substrate surface; forming a base layer overlying the interlevel insulator and sub...
12/11/2007
7259095Semiconductor device and manufacturing process therefor as well as plating solution
A semiconductor device of improved stress-migration resistance and reliability includes an insulating film having formed therein a lower interconnection consisting of a barrier metal film and a copper-silver alloy film, on which is then formed an interlayer insulati...
08/21/2007
7208401Method for forming a thin film
Embodiments of methods, apparatuses, devices, and/or systems for forming a thin film are described. ...
04/24/2007
7169195Capacitor, circuit board with built-in capacitor and method of manufacturing the same
In a capacitor 10, a first electrode 21, a dielectric layer 23, a solid electrolytic layer 50 and a second electrode 31 are provided. In a manufacturing process, the dielectric layer 23 and a first solid electrolytic layer
01/30/2007
7141492Method for forming thin-film, apparatus for forming thin-film, method for manufacturing semiconductor device, electro-optical unit, and electronic apparatus
The invention provides a method of forming a high-performance thin-film at low cost using a liquid material in safety, an apparatus to form a thin-film, a method of manufacturing a semiconductor device, an electro-optical unit, and an electronic apparatus. An...
11/28/2006
5512511Process for growing HgCdTe base and contact layer in one operation
A method for fabricating a two layer epitaxial structure by a liquid phase epitaxy (LPE) process, the structure being comprised of a Group II-VI semiconductor material. The method includes the steps of providing an LPE growth chamber that contains a molte...
04/30/1996
5472910Process for making OHMIC contacts and photovoltaic cell with ohmic contact
Ohmic contacts to p-type IIB/VIB semiconductor are obtained by a process which includes the step of depositing a viscous liquid containing a Group IB metal salt on a surface of a semiconductor, substantially free of oxide groups, heating to form a dried l...
12/05/1995
5399524Method of providing an ohmic type contact on p-type Zn(S)Se
A method of providing an improved ohmic contact on an p-type ZnSe or ZnSSe layer provided on a substrate comprising immersing the layer in a Hg bath heated to a temperature in excess of 200° C. for more than two hours....
03/21/1995
5293074Ohmic contact to p-type ZnSe
A semiconductor structure with a p-type ZnSe layer has an improved ohmic contact consisting of a layer of Hgx Zn1-x Tea Seb Sc where x=0-1 with x being 0 at the surface of the ZnSe layer and increasing thereafte...
03/08/1994
4680611Multilayer ohmic contact for p-type semiconductor and method of making same
Novel ohmic contacts are provided for p-type semiconductor compounds comprising at least one of the metals of Class IIB of the Periodic Table of Elements and one of the non-metal elements of Class VIA of the Periodic Table of Elements, as well as a method...
07/14/1987
4666569Method of making multilayer ohmic contact to thin film p-type II-VI semiconductor
A method of making an ohmic content to a thin film of a II-VI compound semiconductor. The contact is made by etching the film with an acidic solution and thereafter treating the etched surface with an alkaline solution. A layer of copper 5 to 50 angstroms...
05/19/1987
4542074Surface metallized semiconductors
The firmly adhesive metallization, in particular partial metallization, of the surface of semiconductors is possible, without pickling, by carrying out the activation with organometallic compounds of metals of the I and VIII Secondary Groups of the Period...
09/17/1985
4472458Process for the production of metallized semiconductors
The firmly adhesive metallization, in particular partial metallization, of the surface of semiconductors is possible, without pickling, by carrying out the activation with organometallic compounds of metals of the IB and VIIIB Groups of the Periodic Table...
09/18/1984
4085500Ohmic contacts to p-type mercury cadmium telluride
Ohmic contacts to p-type mercury cadmium telluride are prepared by depositing a Column IB metal on a surface of the p-type mercury cadmium telluride, depositing a buffer material on the Column IB metal, and contacting the buffer material with a bonding ma...
04/25/1978
4000508Ohmic contacts to p-type mercury cadmium telluride
Ohmic contacts to p-type mercury cadmium telluride are prepared by depositing a Column IB metal on a surface of the p-type mercury cadmium telluride, depositing a buffer material on the Column IB metal, and contacting the buffer material with a bonding ma...
12/28/1976
 
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