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Class 257/E21.466 - Diffusion of impurity material, e.g., dopant, electrode material, into or out of semiconductor body, or between semiconductor regions (EPO)


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: This subclass is indented under subclass E21.459. This
No. of patents: 12
Last issue date: 10/28/2008


NumberTitleIssue Date
7442600Methods of forming threshold voltage implant regions
The invention includes methods of forming channel region implants for two transistor devices simultaneously, in which a mask is utilized to block a larger percentage of a channel region location of one of the devices relative to the other. The invention also pertain...
10/28/2008
7396745Formation of ultra-shallow junctions by gas-cluster ion irradiation
Method of forming one or more doped regions in a semiconductor substrate and semiconductor junctions formed thereby, using gas cluster ion beams. ...
07/08/2008
7262119Method for incorporating germanium into a semiconductor wafer
A method of fabricating a semiconductor wafer includes fabricating a gate electrode on a silicon substrate of the semiconductor device and incorporating germanium into the silicon substrate thereafter. ...
08/28/2007
7192853Method of improving the breakdown voltage of a diffused semiconductor junction
A method is provided for forming a graded junction in a semiconductor material having a first conductivity type. Dopant having a second conductivity type opposite the first conductivity type is introduced into a selected region of the semiconductor material to defin...
03/20/2007
5252499Wide band-gap semiconductors having low bipolar resistivity and method of formation
A wide band-gap semiconductor, such as a II-VI semiconductor having low bipolar resistivity and a method for producing such a semiconductor. To form this semiconductor, atomic hydrogen is used to neutralize compensating contaminants. Alternatively, the se...
10/12/1993
5227328Method of producing epitaxial layers of II-VI semiconductors with high acceptor concentrations
Epitaxial layers of II-VI semiconductors in-situ doped with high concentrations of a stable acceptor-type impurity and capped with a diffusion-limiting layer, when subjected to a rapid thermal anneal at a temperature between 700 and 950 degrees C., exhibi...
07/13/1993
5024967Doping procedures for semiconductor devices
A process is described for making semiconductor devices with highly controlled doping profiles. The process involves minimizing or eliminating segregation effects caused by surface electric fields created by Fermi-level pinning. These electric fields act ...
06/18/1991
4904618Process for doping crystals of wide band gap semiconductors
Non-equilibrium impurity incorporation is used to dope hard-to-dope crystals of wide band gap semiconductors, such as zinc selenide and zinc telluride. This involves incorporating into the crystal a compensating pair of primary and secondary dopants, ther...
02/27/1990
4105472Preparation of silicon doped mercury cadmium telluride
Mercury cadmium telluride is described having a quantity of a silicon dispersed therein in an amount to measurably increase the donor concentration of the mercury cadmium telluride. Silicon has been found to substitute for metal, either mercury or cadmium...
08/08/1978
4087293Silicon as donor dopant in Hg1-x Cdx Te
Mercury cadmium telluride is described having a quantity of a silicon dispersed therein in an amount to measurably increase the donor concentration of the mercury cadmium telluride. Silicon has been found to substitute for metal, either mercury or cadmium...
05/02/1978
4053350Methods of defining regions of crystalline material of the group III-V compounds
A thin coating of carbon is used as a mask to define regions of a crystalline material of the group III-V compounds. A carbon mask is coated on portions of a surface of a substrate and the masked substrate contacted with the group III-V material to deposi...
10/11/1977
4038110Planarization of integrated circuit surfaces through selective photoresist masking
An integrated circuit substrate surface, particularly a surface of electrically insulative material, having a pattern of elevated areas and a complementary pattern of unelevated areas is planarized by forming the photoresist pattern in registration with t...
07/26/1977
 
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