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Class 257/E21.264 - Layers comprising fluoro hydrocarbon compounds, e.g., polytetrafluoroethylene (EPO)


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: This subclass is indented under subclass E21.259. This
No. of patents: 63
Last issue date: 09/23/2008


1    
NumberTitleIssue Date
7427559Method of reducing the surface roughness of spin coated polymer films
According to one aspect of the invention, a method of constructing a memory array is provided. An insulating layer is formed on a semiconductor wafer. A first metal stack is then formed on the insulating layer and etched to form first metal lines. A polymeric layer ...
09/23/2008
7326653Method of preparation of organic optoelectronic and electronic devices and devices thereby obtained
A method for preparing an organic electronic or optoelectronic device is described. The method comprises depositing a layer of fluorinated polymer on a substrate, patterning the layer of fluorinated polymer to form a relief pattern and depositing from solution a lay...
02/05/2008
7288488Method for resist strip in presence of regular low k and/or porous low k dielectric materials
A two-step process is disclosed for stripping photoresist material from a substrate, wherein the substrate includes a low k dielectric material underlying the photoresist material and a polymer film overlying both the photoresist material and the low k dielectric ma...
10/30/2007
7253110Method and apparatus for forming a barrier metal layer in semiconductor devices
A method and apparatus for forming a barrier metal layer in semiconductor devices are disclosed. A disclosed method for forming a barrier metal layer in a semiconductor device forms an interlayer insulating layer on a front face of a semiconductor substrate having a...
08/07/2007
7238626Chemically and electrically stabilized polymer films
A method of stabilizing a poly(paraxylylene) dielectric thin film after forming the dielectric thin film via transport polymerization is disclosed, wherein the method includes annealing the dielectric thin film under at least one of a reductive atmosphere and a vacu...
07/03/2007
6699531Plasma treatment method
In a case where a CF film is used as an interlayer dielectric film for a semiconductor device, when a wiring of tungsten is formed, the CF film is heated to a temperature of, e.g., about 400 to 450° C. At this time, a F gas is released from the CF film, ...
03/02/2004
6699798Promoting adhesion of fluoropolymer films to semiconductor substrates
Adhesion of high fluorine content films to semiconductor substrates may be improved by forming an intervening adherence layer. The adherence layer may be formed from a plasma gas. In some cases, the adherence layer may be used to adhere photoresist for ad...
03/02/2004
6699784Method for depositing a low k dielectric film (K>3.5) for hard mask application
A method for depositing a silicon oxycarbide hard mask on a low k dielectric layer is provided. Substrates containing a silicon oxycarbide hard mask on a low k dielectric layer are also disclosed. The silicon oxycarbide hard mask may be formed by a proces...
03/02/2004
6663973Low dielectric constant materials prepared from photon or plasma assisted chemical vapor deposition and transport polymerization of selected compounds
Intermetal dielectric (IMD) and interlevel dielectric (ILD) that have dielectric constants (K) ranging from 2.0 to 2.6 are prepared from plasma or photon assisted CVD (PACVD) or transport polymerization (TP). The low K dielectric (LKD) materials are prepa...
12/16/2003
6645881Method of forming coating film, method of manufacturing semiconductor device and coating solution
A coating solution for used in a scan coating method contains a low vapor pressure solvent having a vapor pressure lower than 1 Torr (133.322 Pa) at room temperature....
11/11/2003
6630396Use of a silicon carbide adhesion promoter layer to enhance the adhesion of silicon nitride to low-k fluorinated amorphous carbon
A plasma enhanced chemical vapor deposition (PECVD) process is provided for depositing one or more dielectric material layers on a substrate for use in interconnect structures of integrated circuits. The method comprises the steps of depositing a fluorina...
10/07/2003
6624063Semiconductor device having low dielectric layer and method of manufacturing thereof
A semiconductor device including a semiconductor substrate, an insulating layer formed on the substrate, a dielectric organic layer formed on the insulating layer and having a dielectric constant of not more than 3.0, and an interconnection layer in conta...
09/23/2003
6593650Plasma induced depletion of fluorine from surfaces of fluorinated low-k dielectric materials
A low dielectric constant material having a first fluorine concentration in a near-surface portion and a second fluorine concentration in an interior portion provides an insulator suitable for use in integrated circuits. In a further aspect of the present...
07/15/2003
6593246Process for producing semiconductor device
A process for producing a semiconductor device for forming a highly reliable wiring structure is provided that solves the problem occurring on using a xerogel or a fluorine resin in an inter level dielectric between the wirings to decrease a wiring capaci...
07/15/2003
6589862Process of using siloxane dielectric films in the integration of organic dielectric films in electronic devices
The invention relates to cured dielectric films and a process for their manufacture which are useful in the production of integrated circuits. Dual layered dielectric films are produced in which a lower layer comprises a non-silicon containing organic pol...
07/08/2003
6576569Method of plasma-assisted film deposition
This invention includes: a plasma-making step of making into plasma a film-forming gas including a compound of carbon and fluorine and an etching gas which can etch a film of fluorine-added carbon; and a film-forming step of forming a film of fluorine-add...
06/10/2003
6558756Method of forming interlayer insulating film
A material containing, as a main component, an organic silicon compound represented by the following general formula: R1x Si(OR2)4-x (where R1 is a phenyl group or a vinyl group; R2 is an alkyl ...
05/06/2003
6544901Plasma thin-film deposition method
As thin-film deposition gases, cyclic C5 F8 gas and a hydrocarbon gas, e.g., C2 H4 gas, are used. These gases are activated as plasma under a pressure of, e.g., 0.1 Torr, to deposit a CF film on a semiconductor ...
04/08/2003
6537904Method for manufacturing a semiconductor device having a fluorine containing carbon inter-layer dielectric film
When a semiconductor device using fluorine-containing carbon films (CF films) 21, 22, 23 as inter-layer dielectric films is fabricated using boron nitride films (BN films) as hard masks 31, 32, 33, total inter-wiring capacitance of the semiconductor devic...
03/25/2003
6534616Precursors for making low dielectric constant materials with improved thermal stability
Fluorinated chemical precursors, methods of manufacture, polymer thin films with low dielectric constants, and integrated circuits comprising primarily of sp2 C--F and some hyperconjugated sp3 C--F bonds are disclosed in this inventi...
03/18/2003
6531409Fluorine containing carbon film and method for depositing same
Since there are some cases where a CF film used as an interlayer dielectric film of a semiconductor device has a leak current which is too high to obtain required characteristics, it is required to decrease the leak current of the CF film. Ar gas is used ...
03/11/2003
6514878Method of fabricating a semiconductor device having a multilayered interconnection structure
A method of forming a semiconductor device by forming a first interlayer insulation film on a substrate, forming a second, organic interlayer insulation film on the first interlayer insulation film, forming a first etching stopper film on the second inter...
02/04/2003
6509259Process of using siloxane dielectric films in the integration of organic dielectric films in electronic devices
The invention relates to cured dielectric films and a process for their manufacture which are useful in the production of integrated circuits. Dual layered dielectric films are produced in which a lower layer comprises a non-silicon containing organic pol...
01/21/2003
6479897Semiconductor device having fluorine-added carbon dielectric film and method of fabricating the same
A semiconductor device has a dielectric film made of a fluorine-added carbon film formed on a substrate, a metallic layer formed on the fluorine-added carbon film and an adhesive layer formed between the dielectric film and the metallic layer. The adhesiv...
11/12/2002
6479401Method of forming a dual-layer anti-reflective coating
A method of forming an anti-reflective coating is described. A film is formed on a substrate. A first layer of an anti-reflective coating layer Is deposited on the film by chemical vapor deposition using a canrier gas, an organic halide gas and a hydrogen...
11/12/2002
6468603Plasma film forming method utilizing varying bias electric power
This invention is a method of: making a film-forming gas including a compound gas of carbon and fluorine into plasma in a vacuum container 2 including a stage 4 for an object to be processed 10; and applying a bias electric power to the stage 4 in order t...
10/22/2002
6455934Polymeric dielectric layers having low dielectric constants and improved adhesion to metal lines
A thermally stable inter-metal dielectric for interlayer dielectric material has enhanced adhesiveness by introduction of an adhesive material. The adhesive material may reside only at the interface of the inter-metal dielectric or interlayer dielectric w...
09/24/2002
6448655Stabilization of fluorine-containing low-k dielectrics in a metal/insulator wiring structure by ultraviolet irradiation
A method for providing regions of substantially lower fluorine content in a fluorine containing dielectric is described incorporating exposing a region to ultraviolet radiation and annealing at an elevated temperature to remove partially disrupted fluorin...
09/10/2002
6440878Method to enhance the adhesion of silicon nitride to low-k fluorinated amorphous carbon using a silicon carbide adhesion promoter layer
A plasma enhanced chemical vapor deposition (PECVD) process is provided for depositing one or more dielectric material layers on a substrate for use in interconnect structures of integrated circuits. The method comprises the steps of depositing a fluorina...
08/27/2002
6429518Semiconductor device having a fluorine-added carbon film as an inter-layer insulating film
In a semiconductor device, a contact layer is provided between a silicon-containing insulating film SiO2, etc. or a metal wiring layer, and a fluorine-containing carbon CF film to increase their adhesion. For this purpose, SiC film deposition g...
08/06/2002
6419985Method for producing insulator film
A method for producing an insulator film for use as an interlayer dielectric film in a semiconductor device having a multi-level interconnection structure is disclosed. An inert plasma producing gas, such as argon, is introduced into a vacuum vessel along...
07/16/2002
6355902Plasma film forming method and plasma film forming apparatus
Microwave is introduced into a plasma chamber of a plasma processing apparatus and magnetic field is applied thereto to allow plasma generation gas to be placed in plasma state by the electron cyclotron resonance. This plasma is introduced into a film for...
03/12/2002
6352937Method for stripping organic based film
There is provided a method used for processing an organic low dielectric constant insulating film to a desired shape for enabling facilitated stripping of an organic film formed on top of the organic low dielectric constant insulating film. Specifically, ...
03/05/2002
6337290Semiconductor device having fluorine-added carbon dielectric film and method of fabricating the same
A semiconductor device has a dielectric film made of a fluorine-added carbon film formed on a substrate, a metallic layer formed on the fluorine-added carbon film and an adhesive layer formed between the dielectric film and the metallic layer. The adhesiv...
01/08/2002
6337519Semiconductor device having a multilayered interconnection structure
A semiconductor device has a multilayer interconnection structure including a lower organic interlayer insulation film, an etching stopper film on the lower interlayer insulation film and an upper organic interlayer insulation film covering the etching st...
01/08/2002
6331485Method of producing semiconductor device
A method for producing semiconductor device for reducing a gas of halogenated product of a group IVB element with H2 by the ECR plasma CVD method to form a thin film of the group IVB element on a substrate is disclosed. This method includes for...
12/18/2001
6303524High temperature short time curing of low dielectric constant materials using rapid thermal processing techniques
A method for curing low k dielectric materials uses very short, relatively high temperature cycles instead of the conventionally used (lower temperature/longer time) thermal cycles. A substrate, such as a semiconductor wafer, coated with a layer of coatin...
10/16/2001
6265779Method and material for integration of fuorine-containing low-k dielectrics
Metal and insulator interconnect structures are described incorporating one or more layers of fluorinated dielectric insulation, one or more conductive wiring levels interconnected by vias and capping and/or liner materials to physically isolate the wirin...
07/24/2001
6258407Precursors for making low dielectric constant materials with improved thermal stability
Fluorinated chemical precursors, methods of manufacture, polymer thin filmswith low dielectric constants, and integrated circuits comprising primarily of sp2 C--F and some hyperconjugated sp3 C--F bonds are disclosed in this inventio...
07/10/2001
6225240Rapid acceleration methods for global planarization of spin-on films
This invention describes improved apparatus and methods for spin-on deposition of semiconductor thin films. The improved apparatus provides for controlled temperature, pressure and gas compositions within the deposition chamber. The improved methods compr...
05/01/2001
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