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Class 257/629 - WITH MEANS TO CONTROL SURFACE EFFECTS


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: Subject matter wherein the active junction device has means
No. of patents: 196
Last issue date: 05/22/2012


1          
NumberTitleIssue Date
8183671Semiconductor device and method of manufacturing the same
A semiconductor device includes a device isolation insulating film which is buried in a semiconductor substrate, a gate insulation film which is provided on the semiconductor substrate, a gate electrode which is provided on the gate insulation film, a source region ...
05/22/2012
8169058Semiconductor device and method of stacking die on leadframe electrically connected by conductive pillars
A semiconductor device has a first semiconductor die mounted to a first contact pad on a leadframe or substrate with bumps. A conductive pillar is formed over a second semiconductor die. The second die is mounted over the first die by electrically connecting the con...
05/01/2012
8164166Interfacial roughness reducing film, wiring layer, semiconductor device, and method of manufacturing semiconductor device
An interfacial roughness reducing film which is in contact, on one side thereof, with an insulating film and in contact, on a side opposite from the one side, with wiring comprises a Si—O bond, and is formed using a composition containing a silicon compound that c...
04/24/2012
8154106Coating and developing system and coating and developing method
A coating and developing system for forming a resist film on a substrate by coating the substrate with a liquid resist and developing the resist film after the resist film has been processed by immersion exposure that forms a liquid layer on the surface of the subst...
04/10/2012
8138578Method and system for creating self-aligned twin wells with co-planar surfaces in a semiconductor device
A method and system for providing a twin well in a semiconductor device is described. The method and system include providing at least one interference layer and providing a first mask that covers a first portion of the semiconductor device and uncovers a second por...
03/20/2012
8093689Attachment member for semiconductor sensor device
A semiconductor sensor device is electrically coupled to an object. An attachment member attaches the semiconductor sensor device to the object. The attachment member comprises a first conductive contact region and a second conductive contact region. An insulating p...
01/10/2012
8035200Neutralization of trapped charge in a charge accumulation layer of a semiconductor structure
A semiconductor structure. The semiconductor structure includes a semiconductor layer, a charge accumulation layer on top of the semiconductor layer, a doped region in direct physical contact with the semiconductor layer; and a device layer on and in direct physical...
10/11/2011
7898065Structure and method for device-specific fill for improved anneal uniformity
Disclosed are embodiments of a wafer that incorporates fill structures with varying configurations to provide uniform reflectance. Uniform reflectance is achieved by distributing across the wafer fill structures having different semiconductor materials such that app...
03/01/2011
7692275Structure and method for device-specific fill for improved anneal uniformity
Disclosed are embodiments of a wafer that incorporates fill structures with varying configurations to provide uniform reflectance. Uniform reflectance is achieved by distributing across the wafer fill structures having different semiconductor materials such that app...
04/06/2010
7687890Controlling substrate surface properties via colloidal coatings
Methods and apparatus to control surface properties via colloidal coatings are described. In one embodiment, colloidal coating may be used on a surface to enhance flow control. Other embodiments are also described. ...
03/30/2010
7598595Fabrication of nanoporous antireflection film
A nanoporous antireflection coating preparation method. A sol-gel precursor solution containing an organic template is coated onto a substrate. The sol-gel precursor solution containing the organic template is dried into a film. The organic template within the film ...
10/06/2009
7564119Adhesive sheet for laser dicing and its manufacturing method
An adhesive sheet for laser dicing is used for dicing a workpiece into individual chips by light absorption ablation of laser beam and has at least an adhesive layer on one side of a base material which has a surface opposite to the adhesive layer having no convex p...
07/21/2009
7423330Semiconductor device with strain
A semiconductor device includes: a semiconductor substrate having a p-MOS region; an element isolation region formed in a surface portion of the semiconductor substrate and defining p-MOS active regions in the p-MOS region; a p-MOS gate electrode structure formed ab...
09/09/2008
7400031Asymmetrically stressed CMOS FinFET
A CMOS device comprising a FinFET comprises at least one fin structure comprising a source region; a drain region; and a channel region comprising silicon separating the source region from the drain region. The FinFET further comprises a gate region comprising a N+ ...
07/15/2008
7397126Semiconductor device
The present invention provides inhibiting an electrical leakage caused by anion migration. A trenched portion 15 is provided as ion migration-preventing zone between a source electrode 4 and a gate electrode 5. The trenched portion 15 is ...
07/08/2008
7364778Container for an electronic component
A container for an electronic component made of a resin, wherein when the container and an electronic component contained in the container are rubbed 20,000 times, a static electrification voltage of at most 2,000V by the absolute value on the surface of the electro...
04/29/2008
7357883Conductive adhesive, method of producing the same, and bonding method
A conductive adhesive is formed by mixing a plurality of conductive fillers into a thermosetting resin. The conductive filler includes a core material made of copper-based metal, a coating film made of silver and a plurality of particles made of silver. The coating ...
04/15/2008
7348610Multiple layer and crystal plane orientation semiconductor substrate
A semiconductor on insulator substrate and a method of fabricating the substrate. The substrate including: a first crystalline semiconductor layer and a second crystalline semiconductor layer; and an insulating layer bonding a bottom surface of the first crystalline...
03/25/2008
7345299Semiconductor device comprising a crystalline layer containing silicon/germanium, and comprising a silicon Enriched floating charge trapping media over the crystalline layer
The invention includes non-volatile memory and logic devices associated with crystalline Si/Ge. The devices can include TFT constructions. The non-volatile devices include a floating gate or floating plate over the Si/Ge, and a pair of source/drain regions. The sour...
03/18/2008
7339213Semiconductor device having a triple gate transistor and method for manufacturing the same
In a semiconductor capable of reducing NBTI and a method for manufacturing the same, a multi-gate transistor includes an active region, gate dielectric, channels in the active region, and gate electrodes, and is formed on a semiconductor wafer. The active region has...
03/04/2008
7335586Sealing porous dielectric material using plasma-induced surface polymerization
A method for sealing a porous dielectric layer atop a substrate, wherein the dielectric layer is patterned to form at least a trench and at least a via, comprises applying a first plasma to a surface of the dielectric layer to silanolize the surface, treating the su...
02/26/2008
7335969Method of monitoring introduction of interfacial species
A method for monitoring a nitridation process, including: (a) providing a semiconductor substrate; (b) forming a first dielectric layer on a top surface of the substrate; (c) introducing a quantity of interfacial species into the substrate; (d) removing the first di...
02/26/2008
7332796Devices and methods of preventing plasma charging damage in semiconductor devices
Methods for protecting semiconductor devices from plasma charging damage are disclosed. An example disclosed method includes depositing an etching stop layer on a substrate with at least one predetermined structure; depositing a premetallic dielectric layer and a ch...
02/19/2008
7333200Overlay metrology method and apparatus using more than one grating per measurement direction
A method of controlling the lithography process used to fabricate patterns on layers of a semiconductor wafer is disclosed. The method includes providing at least two scatterometry targets, each target having a first pattern formed in an upper layer substantially al...
02/19/2008
7317324Semiconductor integrated circuit testing device and method
A plurality of resistors is connected to a plurality of output terminals of a semiconductor integrated circuit, respectively, and a predetermined voltage is applied to the plurality of resistors. Also, a predetermined operation pattern signal used to test functions ...
01/08/2008
7301223High temperature electronic devices
In at least some embodiments, electronic devices suitable for use at temperatures in excess of 200 C. may comprise an integrated circuit fabricated on a silicon carbide substrate, and a thick passivation layer. In other embodiments, electronic devices suitable for u...
11/27/2007
7294871Top layers of metal for high performance IC's
A method of closely interconnecting integrated circuits contained within a semiconductor wafer to electrical circuits surrounding the semiconductor wafer. Electrical interconnects are held to a minimum in length by making efficient use of polyimide or polymer as an ...
11/13/2007
7294583Methods for the use of alkoxysilanol precursors for vapor deposition of SiOfilms
A method for depositing conformal dielectric films uses alkoxy silanol or silanediol precursors and oxidizing and/or hydrolyzing agents. The method produces a material with liquid-like flow properties capable of achieving improved high aspect ratio gap fill more eff...
11/13/2007
7288463Pulsed deposition layer gap fill with expansion material
Conformal dielectric deposition processes supplemented with a deposited expansion material can fill high aspect ratio narrow width gaps with significantly reduced incidence of voids or weak spots. The technique can also be used generally to form composites, such as ...
10/30/2007
7282375Wafer level package design that facilitates trimming and testing
A wafer level method of packaging, trimming and testing integrated circuits is described. A wafer having trim pads is bumped before the wafer is trimmed. After the bumping, the dice on the wafer are trimmed and tested using standard trim probing and test probing tec...
10/16/2007
7269062Gated diode nonvolatile memory cell
A gated diode nonvolatile memory cell with a charge storage structure includes a diode structure with an additional gate terminal. Example embodiments include the individual memory cell, an array of such memory cells, methods of operating the memory cell or array of...
09/11/2007
7253034Dual SIMOX hybrid orientation technology (HOT) substrates
This invention provides a separation by implanted oxygen (SIMOX) method for forming planar hybrid orientation semiconductor-on-insulator (SOI) substrates having different crystal orientations, thereby making it possible for devices to be fabricated on crystal orient...
08/07/2007
7253514Self-supporting connecting element for a semiconductor chip
A connecting element for electrically connecting a semiconductor chip and a superordinate circuit board includes an elastic metal strip that is bent forming two metal limbs with flattened limb ends, thus forming a base between the metal limbs which is suitable for c...
08/07/2007
7253483Semiconductor device layout and channeling implant process
A device structure and method for forming graded junction using a implant process. Embodiments of the invention comprise implanting ions into said silicon substrate to form doped regions adjacent to said gate. The orientation of the channel region in the Si crystal ...
08/07/2007
7247920Method of composite gate formation
Methods for forming a nitride barrier film layer in semiconductor devices such as gate structures, and barrier layers, semiconductor devices and gate electrodes are provided. The nitride layer is particularly useful as a barrier to boron diffusion into an oxide film...
07/24/2007
7241636Method and apparatus for providing structural support for interconnect pad while allowing signal conductance
A method provides an interconnect structure having enhanced structural support when underlying functional metal layers are insulated with a low modulus dielectric. A first metal layer having a plurality of openings overlies the substrate. A first electrically insula...
07/10/2007
7242063Symmetric non-intrusive and covert technique to render a transistor permanently non-operable
A technique for and structures for camouflaging an integrated circuit structure. The technique including forming active areas of a first conductivity type and LDD regions of a second conductivity type resulting in a transistor that is always non-operational when sta...
07/10/2007
7236244Alignment target to be measured with multiple polarization states
An alignment target includes periodic patterns on two elements. The periodic patterns are aligned when the two elements are properly aligned. By measuring the two periodic patterns at multiple polarization states and comparing the resulting intensities of the polari...
06/26/2007
7232739Multifunctional metallic bonding
Methods are provided for producing a transfer layer of a semiconductor material on a final substrate. In some embodiments, the transfer layer is produced on the final substrate by forming a layer of semiconductor material on an initial support, assembling that layer...
06/19/2007
7230705Alignment target with designed in offset
An alignment target includes periodic patterns on two elements. The alignment target includes two locations, at least one of which has a designed in offset. In one embodiment, both measurement locations have a designed in offset of the same magnitude but opposite di...
06/12/2007
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