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Class 257/460 - With backside illumination (e.g., with a thinned central area or non-absorbing substrate)


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: Subject matter wherein the device is structured to permit
No. of patents: 108
Last issue date: 11/22/2011


1      
NumberTitleIssue Date
8063465Backside illuminated imaging sensor with vertical pixel sensor
A backside illuminated imaging sensor includes a vertical stacked sensor that reduces cross talk by using different silicon layers to form photodiodes at separate levels within a stack (or separate stacks) to detect different colors. Blue light-, green light-, and r...
11/22/2011
8049293Solid-state image pickup device, electronic apparatus using such solid-state image pickup device and method of manufacturing solid-state image pickup device
A back-illuminated type solid-state image pickup device (1041) includes read circuits (Tr1, Tr2) formed on one surface of a semiconductor substrate (1042) to read a signal from a photo-electric conversion element (PD) formed on the semico...
11/01/2011
7973380Method for providing metal extension in backside illuminated sensor for wafer level testing
A method of providing metal extension in a backside illuminated image sensor is provided in the present disclosure. In one embodiment, a first set of pads and a second set of pads, and a metal layer are provided in a backside illuminated image sensor. The first set ...
07/05/2011
7939903Photodetector for backside-illuminated sensor
A backside-illuminated sensor including a semiconductor substrate. The semiconductor substrate has a front surface and a back surface. A plurality of pixels are formed on the front surface of the semiconductor substrate. At least one pixel includes a photogate struc...
05/10/2011
7936039Backside illuminated CMOS image sensor with photo gate pixel
A pixel for a CMOS photo sensor with increased full well capacity is disclosed. The pixel having a photosensitive element, a photo gate, potential well and a readout circuit. The photosensitive element having a front side and a back side, for releasing charge when l...
05/03/2011
7893516Backside-illuminated imaging device and manufacturing method of the same
A backside-illuminated imaging device, which performs imaging by illuminating light from a back side of a semiconductor substrate to generate electric charges in the semiconductor substrate based on the light and reading out the electric charges from a front side of...
02/22/2011
7888763Backside illuminated imaging sensor with improved infrared sensitivity
A backside illuminated imaging sensor includes a semiconductor layer and an infrared detecting layer. The semiconductor layer has a front surface and a back surface. An imaging pixel includes a photodiode region formed within the semiconductor layer. The infrared de...
02/15/2011
7843028Electro-optical device, semiconductor device, display device, and electronic apparatus having the same
An electro-optical device includes: a panel having a display area in which an electro-optical material is interposed between first and second substrates; and a light detection unit disposed on the first or second substrate to detect illuminance of ambient light of t...
11/30/2010
7696595Semiconductor device and method for manufacturing the same
With this semiconductor device, the distortion and cracking of a thinned portion of a semiconductor substrate are prevented to enable high precision focusing with respect to a photodetecting unit and uniformity and stability of high sensitivity of the photodetecting...
04/13/2010
7656000Photodetector for backside-illuminated sensor
A backside-illuminated sensor including a semiconductor substrate. The semiconductor substrate has a front surface and a back surface. A plurality of pixels are formed on the front surface of the semiconductor substrate. At least one pixel includes a photogate struc...
02/02/2010
7498650Backside illuminated CMOS image sensor with pinned photodiode
A backside illuminated CMOS image sensor having an silicon layer with a front side and a backside, the silicon layer liberates charge when illuminated from the backside with light, an active pixel circuitry located on the front side of the semiconductor layer, a pin...
03/03/2009
7420257Backside-illuminated photodetector
The present invention provides a back illuminated photodetector having a sufficiently small package as well as being capable of suppressing the scattering of to-be-detected light. A back illuminated photodiode 1 comprises an N-type semiconductor substrate ...
09/02/2008
7288825Low-noise semiconductor photodetectors
A photodetector is formed from a body of semiconductor material substantially surrounded by dielectric surfaces. A passivation process is applied to at least one surface to reduce the rate of carrier generation and recombination on that surface. Photocurrent is read...
10/30/2007
7271468High-voltage compatible, full-depleted CCD
A charge coupled device for detecting electromagnetic and particle radiation is described. The device includes a high-resistivity semiconductor substrate, buried channel regions, gate electrode circuitry, and amplifier circuitry. For good spatial resolution and high...
09/18/2007
7262498Assembly with a ring and bonding pads formed of a same material on a substrate
An assembly includes a substrate, a device coupled to the substrate; a ring formed on the substrate; and one or more bonding pads formed on the substrate, wherein the ring and bonding pads are formed of a same material. ...
08/28/2007
7234864Measurement of multi-channel cold junction temperature
The cold junction temperature of the channels on a multi-channel terminal block are accurately determined for each terminal pair without affixing a thermistor to each terminal. One embodiment provides accurate cold junction measurement of a six channel device (12 te...
06/26/2007
7235852Integrated variable optical attenuator
A variable optical attenuator. A PIN structure is integrated with an optical detector such as a PIN diode or an APD diode. When the PIN structure is forward biased, the light signal is not affected and is detected by the optical detector. When the PIN structure is r...
06/26/2007
7214971Semiconductor light-receiving device
A semiconductor light-receiving device has a substrate including upper, middle and lower regions in its front side. A p-type layer on the lower region has a top surface including a portion on a level with the middle region. An electrode covers at least part of the b...
05/08/2007
7161222Semiconductor device and semiconductor device fabrication method
An SOI layer is formed on a substrate of a semiconductor device, and one or more elements are formed on the SOI layer. One or more grooves are formed in a substrate of the semiconductor device by removing part of the substrate. The groove is formed directly below an...
01/09/2007
7157742Integrated circuit device
An integrally packaged optronic integrated circuit device (310) including an integrated circuit die (322) containing at least one of a radiation emitter and radiation receiver and having top and bottom surfaces formed of electrically insulative and mec...
01/02/2007
7154156Solid-state imaging device and method for producing the same
A solid-state imaging device includes: a base made of an insulation material and having a frame form in planar shape with an aperture formed at an inner region; a plurality of wirings provided on one surface of the base and extending toward an outer periphery of the...
12/26/2006
7112465Fabrication methods for ultra thin back-illuminated photodiode array
Ultra thin back-illuminated photodiode array structures and fabrication methods. The photodiode arrays are back illuminated photodiode arrays having a substrate of a first conductivity type having first and second surfaces, the second surface having a layer of the f...
09/26/2006
7098519Avalanche radiation detector
The invention relates to an avalanche radiation detector comprising a semiconductor substrate (HK) with a front side (VS) and a back side (RS), an avalanche region (AB) which is arranged in the semiconductor substrate (HK) on the front side (VS) of the semiconductor...
08/29/2006
7086134Alignment apparatus and method for aligning stacked devices
An apparatus for passively aligning first and second substrates having micro-components disposed thereon when the substrates do not include patterned surfaces which face each other. The apparatus includes a first depression which cooperates with an alignment sphere ...
08/08/2006
7079776Optical signal transmission board and apparatus
An individual optical signal transmission substrate includes an optical signal transmission area where at least one of a light emitting element for sending an optical signal to other optical signal transmission substrates or a light receiving element for receiving a...
07/18/2006
7042060Backside thinning of image array devices
Backthinning in an area selective manner is applied to imaging sensors 12 for use in electron bombarded devices. A further arrangement results in an array of collimators 51 aligned with pixels 42 or groups of pixels providing improved image cont...
05/09/2006
6995441Integrated circuits using optical waveguide interconnects formed through a semiconductor wafer and methods for forming same
An integrated circuit with a number of optical waveguides that are formed in high aspect ratio holes. The high aspect ratio holes extend through a semiconductor wafer. The optical waveguides include a highly reflective material that is deposited so as to line an inn...
02/07/2006
6995443Integrated circuits using optical fiber interconnects formed through a semiconductor wafer
An integrated circuit with a number of optical fibers that are formed in high aspect ratio holes. The high aspect ratio holes extend through a semiconductor wafer. The optical fibers include a cladding layer and a core formed in the high aspect ratio hole. These opt...
02/07/2006
6972469Lateral PIN diode and method for processing same
A PIN diode includes a first p-area, an n-area, and in between an intermediate area on a first surface of a substrate, wherein a doping concentration of the intermediate area is lower than a doping concentration of the p-area and lower than a doping concentration of...
12/06/2005
6969839Backthinned CMOS sensor with low fixed pattern noise
This invention deals with the reduction in fixed pattern noise in backthinned CMOS imagers primarily for use in a vacuum environment. Reduction is achieved by effectively shielding the imager. This is done by depositing a conductive layer on the front surface prior ...
11/29/2005
6945106Mass flowmeter
A mass flowmeter of the thermal type, having a planar, thin substrate with a sensing surface that can be brought into direct or indirect contact with a flowing fluid during a measurement, wherein electrically controllable heating elements and temperature sensor elem...
09/20/2005
6933489Back illuminated photodiode array and method of manufacturing the same
Disclosed are a back illuminated photodiode array, which is mass-producible and has an ultra-thin high-performance single-sided electrode structure, and a method of manufacturing the same. Both electrodes of a photodiode on a semiconductor substrate 1, which ...
08/23/2005
6930327Solid-state imaging device and method of manufacturing the same
There are provided a semiconductor substrate 101 on which solid-state imaging devices are formed, and a translucent member 201 provided onto a surface of the semiconductor substrate such that spaces are provided to oppose to light receiving areas of th...
08/16/2005
6924541Semiconductor photodetection device
A semiconductor photodetection device includes a semiconductor structure including an optical absorption layer having a photo-incidence surface on a first side thereof, a dielectric reflecting layer formed on a second side of the semiconductor structure opposite to ...
08/02/2005
6873034Solid-state imaging device, method for producing same, and mask
The present invention provides a solid-state imaging device comprising: a transparent substrate transmitting light therethrough; a first chip including a solid-state imaging element having a light receiving portion; a first resin providing airtight sealing between t...
03/29/2005
6872992Semiconductor device for detecting wide wavelength ranges
A CCD unit is provided on the surface side of a thin shape section that is formed on a first substrate. In the CCD unit, first cells are provided and disposed in the form of an array in a direction in which the thin shape section extends. An InGaAs photodiode unit i...
03/29/2005
6835990Semiconductor light receiving element
A semiconductor light receiving element has a semiconductor portion. The semiconductor portion includes a substrate, a light detecting portion, and a filter portion. The substrate, the light detecting portion, and the filter portion are provided sequentially in a di...
12/28/2004
6815789Semiconductor electronic device and method of manufacturing thereof
A semiconductor electronic device includes a die of semiconductor material and a support. The die of semiconductor material includes an integrated electronic circuit and a plurality of contact pads associated with the electronic circuit and connected electrically to...
11/09/2004
6777769Light-receiving element, light-receiving element array and light-receiving module and method for high frequency characteristics
A light-receiving element, comprises an absorption layer formed on a semiconductor substrate, a window layer formed on the absorption layer, a first electrode formed on the window layer, a second electrode formed on the window layer and electrically connected to the...
08/17/2004
6753587Semiconductor photo detecting device and its manufacturing method
A high response speed semiconductor photo detecting device having a thin photo absorption layer which avoids an optical efficiency loss. The semiconductor photo detecting devices are formed on a semiconductor substrate having an inclined cleavage face to a principal...
06/22/2004
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