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Class 257/430 - With active region having effective impurity concentration less than 10 12 atoms/cm 3


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: Subject matter wherein the active region of the device has
No. of patents: 24
Last issue date: 12/25/2007


NumberTitleIssue Date
7312507Sensitizing dye solar cell
A dye-sensitized solar cell with high conversion efficiency is provided. The dye-sensitized solar cell according to the present invention has, between an electrode (2) formed on a surface of a transparent substrate (1) and a counter electrode (6...
12/25/2007
7259381Methodology for determining electron beam penetration depth
The Grunn equation: Depth = 0.046 ⁢ ⁢ ( ...
08/21/2007
7245696Element-specific X-ray fluorescence microscope and method of operation
An element-specific imaging technique utilizes the element-specific fluorescence X-rays that are induced by primary ionizing radiation. The fluorescence X-rays from an element of interest are then preferentially imaged onto a detector using an optical train. The pre...
07/17/2007
7242006Dual-sided microstructured, position-sensitive detector
The invention relates to a detector for determining the position and/or energy of photons and/or charged particles. Said detector comprises a plurality of diodes made of a semi-conductor material, n-contacts (1) and p-contacts (4), the n-contacts being...
07/10/2007
7238597Boron ion delivery system
A boron ion plasma, generated by use of a cathodic arc, is manipulated and delivered to a large flat product such as a silicon wafer with boron ion energies suitable for incorporation of boron atoms into solid state devices as one of the key steps in manufacturing s...
07/03/2007
7142634Radiation field detection
A radiation field detection system, for use with a radiating device, includes a radiation detector configured to receive radiation and to provide radiation strength indicia of amounts of radiation received, a positioning mechanism connected to the radiation detector...
11/28/2006
7045833Avalanche photodiodes with an impact-ionization-engineered multiplication region
An avalanche photodiode including a multiplication layer is provided. The multiplication layer may include a well region and a barrier region. The well region may include a material having a higher carrier ionization probability than a material used to form the barr...
05/16/2006
7015560Light-receiving device, method for manufacturing the same, and optoelectronic integrated circuit comprising the same
A light-receiving device, a method for manufacturing the same, and an optoelectronic integrated circuit including the same are provided. The light-receiving device includes a substrate; an intrinsic region formed on the substrate; a first region formed to a shallow ...
03/21/2006
6903432Photosensitive device
A photosensitive device for enabling high speed detection of electromagnetic radiation. The device includes recessed electrodes for providing a generally homogeneous electric field in an active region. Carriers generated in the active region are detected using the r...
06/07/2005
6720206Method for manufacturing digital micro-mirror device (DMD) packages
A method for manufacturing a semiconductor package is disclosed. A wafer including a plurality of semiconductor chips is provided. Each chip has one or more mirrors mounted thereon. Further, a plurality of bond pads formed on a periphery of the chip. Next, a photore...
04/13/2004
6670657Integrated circuit having photodiode device and associated fabrication process
An integrated circuit is provided that includes a substrate incorporating a semiconductor photodiode device having a p-n junction. The photodiode device includes at least one capacitive trench buried in the substrate and connected in parallel with the jun...
12/30/2003
6627973Void-free interlayer dielectric (ILD0) for 0.18-micron flash memory semiconductor device
A method of eliminating voids in the interlayer dielectric material of 0.18-μm flash memory semiconductor devices and a semiconductor device formed by the method. The present invention provides a method for eliminating voids in the interlayer dielectric ...
09/30/2003
6525386Non-protruding optoelectronic lens
An optoelectronic component has a lens that is formed in the surface of an encapsulant surrounding a semiconductor diode element. With respect to emitters, the lens reduces internal reflection and reduces dispersion to increase overall efficiency. With re...
02/25/2003
6215164Elevated image sensor array which includes isolation between uniquely shaped image sensors
An image pixel sensor array. The image pixel sensor array includes a substrate. An interconnect structure is formed adjacent to the substrate. A plurality of image pixel sensors are formed adjacent to the interconnect structure. Each image pixel sensor in...
04/10/2001
6177710Semiconductor waveguide type photodetector and method for manufacturing the same
A semiconductor waveguide type photo detector capable of preventing leak current from occurring and excellent in dark current characteristics, and a manufacturing method thereof are provided. In a semiconductor waveguide type photo detector, a layered str...
01/23/2001
5808349Magnetized photoconductive semiconductor switch
A strong magnetic field is applied to a photoconductive semiconductor switch to make the opening time of the switch independent of the recombination time of the photoionized semiconductor. As a result, the switch is capable of shaping current pulses with ...
09/15/1998
4785186Amorphous silicon ionizing particle detectors
Amorphous silicon ionizing particle detectors having a hydrogenated amorphous silicon (a--Si:H) thin film deposited via plasma assisted chemical vapor deposition techniques are utilized to detect the presence, position and counting of high energy ionizing...
11/15/1988
4589006Germanium detector passivated with hydrogenated amorphous germanium
Passivation of predominantly crystalline semiconductor devices (12) is provided for by a surface coating (21) of sputtered hydrogenated amorphous semiconductor material. Passivation of a radiation detector germanium diode, for example, is realized by sput...
05/13/1986
4472728Imaging X-ray spectrometer
An X-ray spectrometer for providing imaging and energy resolution of an X-ray source comprised of a thick silicon wafer (10) having an embedded matrix or grid of aluminum completely through the wafer fabricated, for example, by thermal migration. The alum...
09/18/1984
4415916Germanium semiconducting radiation detector with phosphorus implanted n+ contact
Germanium detectors usable for charged particle spectroscopy and capable of enduring overvoltage without impairment are produced by first implanting phosphorus ions of high energy in a small dose and then implanting more phosphorus ions of lower energy in...
11/15/1983
4292645Charge splitting resistive layer for a semiconductor gamma camera
An improved semiconductor gamma camera is disclosed. The gamma camera includes a p-i-n semiconductor diode which detects the presence and energy of gamma radiation from a source. Typically the source is radioactive material in a patient organ which is det...
09/29/1981
4237470Hyperpure germanium coaxial radiation detector
A radiation detector made of hyperpure germanium has generally the shape of a hollow cylinder with an outer generally cylindrical surface and an inner generally cylindrical surface and is formed with a p+ contact and n+ contact. One ...
12/02/1980
4163240Sensitive silicon pin diode fast neutron dosimeter
A method is disclosed of controlling and improving the sensitivity of silicon PIN diodes to dosage by fast neutrons. The method includes selecting a silicon mass of high resistivity n or p-type material having a relatively long minority carrier lifetime, ...
07/31/1979
4157559Coaxial nuclear radiation detector with deep junction and radial field gradient
Germanium radiation detectors are manufactured by diffusing lithium into high purity p-type germanium. The diffusion is most readily accomplished from a lithium-lead-bismuth alloy at approximately 430° and is monitored by a quartz half cell containing a ...
06/05/1979
 
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