Did You Know...
...that the Band-Aid Bandage was invented by a Johnson & Johnson employee whose wife had cut herself? Earl Dickson's wife was rather accident prone, so he set out to develop a bandage that she could apply without help. He placed a small piece of gauze in the center of a small piece of surgical tape, and what we know today as the Band Aid bandage was born!
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| Number | Title | Issue Date |
| 7373277 | Methods and systems for detection of selected defects particularly in relatively noisy inspection data Various methods and systems for detection of selected defects particularly in relatively noisy inspection data are provided. One method includes applying a spatial filter algorithm to raw inspection data acquired across an area on a substrate to determine a first po... | 05/13/2008 |
| 7369712 | Automated statistical self-calibrating detection and removal of blemishes in digital images based on multiple occurrences of dust in images A method automatically corrects dust artifact within images acquired by a system including a digital acquisition device including a lens assembly. Multiple original digital images are acquired with the digital acquisition device. Probabilities that certain pixels co... | 05/06/2008 |
| 7342654 | Detection of impurities in cylindrically shaped transparent media The invention relates to a system and method of detecting impurities in a cylindrically shaped transparent medium, wherein the cylindrically shaped transparent medium is illuminated with electromagnetic radiation, and the radiation having components emerging radiall... | 03/11/2008 |
| 7340109 | Automated statistical self-calibrating detection and removal of blemishes in digital images dependent upon changes in extracted parameter values A method of automatically correcting dust artifact within images acquired by a system including a digital camera includes determining that certain pixels correspond to dust artifact regions within a first digitally-acquired image. The dust artifact regions are assoc... | 03/04/2008 |
| 7315658 | Digital camera A digital camera that automatically corrects dust artifact regions within acquired images by compiling a statistical dust map from multiple images acquired under different image acquisition conditions includes an optical system for acquiring an image including a len... | 01/01/2008 |
| 7310450 | Method of detecting and correcting dust in digital images based on aura and shadow region analysis A method of automatically correcting dust artifact regions within images acquired by a digital image acquisition system including a digital camera with a lens assembly includes determining probabilities that certain pixels within multiple digitally-acquired images c... | 12/18/2007 |
| 7305119 | Test head for optically inspecting workpieces Apparatus for simultaneously optically inspecting top and bottom surfaces of a workpiece comprise upper and lower test heads, each head comprising at least one laser for providing a laser beam that scans its associated workpiece surface and at least one detector for... | 12/04/2007 |
| 7305112 | Method of converting rare cell scanner image coordinates to microscope coordinates using reticle marks on a sample media Provided is a method for obtaining a position of an object. A slide which carries at least one object and has reticle marks arranged at positions which form substantially a right angle, is positioned in a slide holder of a first imaging system. A first coordinate sp... | 12/04/2007 |
| 7302148 | Test head for optically inspecting workpieces An optical test head comprises a block of material with a plurality of optical paths extending therethrough. At least one of the optical paths is an input optical path for receiving laser light and holding a lens for focusing the laser light on a workpiece that is p... | 11/27/2007 |
| 7245366 | Surface inspection method and surface inspection apparatus A surface inspection apparatus includes an LD (10 for emitting a laser beam (L0), an irradiation optical system for entering the emitted laser beam (L0) onto an inspection surface (210) of a wafer at predetermined depression angle (α), a... | 07/17/2007 |
| 7227165 | System and method for classification of timber The present invention provides a system and a method to grade a piece of wood and simultaneously to classify this piece of wood by allowing an examination of four longitudinal faces thereof, so as to determine optimal specifications for a subsequent use thereof such... | 06/05/2007 |
| 7206461 | Digital image acquisition and processing system A digital image acquisition and processing system that automatically corrects dust artifact regions within acquired images by compiling a statistical dust map from multiple images acquired under different image acquisition conditions is provided. The system includes... | 04/17/2007 |
| 7113624 | Imaging apparatus and method employing a large linear aperture An apparatus images a surface. An imager stage linearly translates the surface in a first direction. A fiber optic bundle has a first end of parallel first fiber ends defining a linear input aperture perpendicular to the first direction and parallel to the surface, ... | 09/26/2006 |
| 7109458 | Confocal wafer depth scanning inspection method A semiconductor wafer inspection system and method is provided which uses a multiple element arrangement, such as an offset fly lens array. The preferred embodiment uses a laser to transmit light energy toward a beam expander, which expands the light energy to creat... | 09/19/2006 |
| 7061598 | Darkfield inspection system having photodetector array A darkfield surface inspection tool of the invention includes an illumination source for illuminating a workpiece and generating a light scattering pattern. The light scattering pattern being configured such that the positions of the light beams of the scattering pa... | 06/13/2006 |
| 7004329 | Classifying station with dynamic decision zone A classifying station for classifying a piece of wood in a wood processing plant, the classifying station including an area for an operator, a conveyor for transversely conveying pieces of wood before the area, and a console for entering classification related to a ... | 02/28/2006 |
| 6924891 | Method and apparatus for article inspection including speckle reduction A method and apparatus for reducing speckle during inspection of articles used in the manufacture of semiconductor devices, including wafers, masks, photomasks, and reticles. The coherence of a light beam output by a coherent light source, such as a pulsed laser, is... | 08/02/2005 |
| 6909988 | Method for positioning defects in metal billets A process for positioning at least one defect in a billet being forged into an article is described. The size and location of the billet is first determined, using a non-destructive test such as ultrasonic inspection. The movement of the defect under selected forgin... | 06/21/2005 |
| 6710868 | Optical inspection system with dual detection heads Apparatus for inspection of a sample includes an optical assembly made up of first and second optical heads with respective first and second levels of spatial resolution, such that the second level of spatial resolution is substantially higher than the first level. ... | 03/23/2004 |
| 6670627 | Apparatus and method for continuous surface examination comprising a light shielding member at outer ends of the examined surface A surface examining apparatus irradiates an examinatorial light from a projector on a examined body that runs in a Z-direction. The projector is arranged at a distance from the surface of the examined body in a Y-direction orthogonal to the surface thereo... | 12/30/2003 |
| 6622621 | Device for detecting register marks A device for detecting register marks includes at least one receiver for scanning register marks along a track disposed in a direction of movement of the register marks, and a device for positioning the receiver transversely with respect to the track, in ... | 09/23/2003 |
| 6621082 | Automatic focusing system for scanning electron microscope equipped with laser defect detection function A scanning electron microscope equipped with a laser defect detection function has an automatic focusing function that performs the steps of: obtaining a deviation (offset) amount between focal positions of an optical microscope and a scanning electron mi... | 09/16/2003 |
| 6548821 | Method and apparatus for inspecting substrates Substrate inspection apparatus in accordance with the invention comprises optics for reflecting a laser beam off of a substrate and a detector for detecting the reflected laser beam. If a defect is present at the point where the laser reflects off the sub... | 04/15/2003 |
| 6538252 | Method and device for determining the alignment of line formations in areal, especially longitudinally moved, webs of a structural formed body In a method for determining alignment of line formations of a web, a radiation source emitting radiation and a detector with numerous radiation sensors for sensing the radiation are provided. The radiation source and the detector are reciprocated together... | 03/25/2003 |
| 6462813 | Surface defect inspection system and method A system and method for detecting defects on a painted workpiece surface. The system includes an elongated line of light having a pair of sharp transition zones. The line of light falls onto a moving substrate containing a plurality of workpieces to be in... | 10/08/2002 |
| 6426510 | Device and method for inspecting pattern shapes An inspection device for inspecting pattern shapes of rectiles or mask patterns is disclosed. The inspection device includes a light source for irradiating inspection light, a scanning unit for scanning the inspection light, an inspection light dividing u... | 07/30/2002 |
| 6219135 | Device for optically recording, digitally, a parameter on a longitudinally moved thread-type material The invention relates to a device and a method for the optical recording of at least one parameter on a longitudinally moved thread-type material. To enable parameters such as the diameter of a thread-type material, the diameter of a yarn package, the hai... | 04/17/2001 |
| 6167355 | High accuracy particle dimension measurement system A measurement tool connects to an automatic inspection machine for identifying and measuring microscopic dimensions such as area, diameter, height and line width of defects and lines of a photographic mask. An operator draws a rough region of interest aro... | 12/26/2000 |
| 5966677 | High accuracy particle dimension measurement system A measurement tool connects to an automatic inspection machine for identifying and measuring microscopic dimensions such as area, diameter, height and line width of defects and lines of a photographic mask. An operator draws a rough region of interest aro... | 10/12/1999 |
| 5917590 | Optical inspection device and lithographic apparatus provided with such a device A description is given of an optical inspection device for inspecting two oppositely located surfaces (3, 4) of a transparent object (1), for example a lithographic mask. The device is constructed in such a manner that for each inspection beam (a, c) the ... | 06/29/1999 |
| 5808735 | Method for characterizing defects on semiconductor wafers 10A method is described for detecting and characterizing defects on a test surface of a semiconductor wafer. A three-dimensional image of the test surface is aligned and compared with a three-dimensional image of a defect-free reference surface. Intensity... | 09/15/1998 |
| 5798830 | Method of establishing thresholds for image comparison A method is described for optimizing intensity-comparison thresholds used to compare test and reference images for defect detection. Intensity differences between corresponding pixels in the two images that exceed a predefined threshold value are deemed d... | 08/25/1998 |
| 5745244 | Scanning device for scanning a physical property of a fibrous web The invention relates to a scanning device (1) for measuring physical properties of a moving fibrous web (2) which has two longitudinal edges and is intended to run in a predetermined path of movement past or through the scanning device (1). The device (1... | 04/28/1998 |
| 5644392 | Scanning system for lumber A scanning system for wood products to detect grain defects and product geometry simultaneously. Multiple scanner sets cast parallel beams of light at an angle of incidence in a plane that is normal to the surface of the wood product. Scanner sets are pro... | 07/01/1997 |
| 5625197 | Method of determining a scanning interval in surface inspection A scanning interval, at which an area illumination scans a subject surface for surface defect inspection, is determined based on a smallest histogram of histograms for a same value of picture elements of a two-valued image extracted in connection with all... | 04/29/1997 |
| 5621220 | Apparatus for evaluating measuring values An apparatus evaluates measuring values from a laminar material, wherein the laminar material is moving in a single plane in a predetermined direction, the laminar material being moved also being under test. The apparatus comprises a measuring platform wh... | 04/15/1997 |
| 5615777 | Egg candling system A light beam such a laser beam is used to scan the surface of an egg for flaws such as pin holes, cracks, thinned shell regions, etc. The light beam is vibrated with a rocking/rotating movement to describe a closed curve such as a circle, ellipse or an el... | 04/01/1997 |
| 5591985 | Surface state inspecting system including a scanning optical system for scanning a surface to be inspected with a first light and for simultaneously scanning a diffraction grating with a second light A surface state inspecting system includes a scanning optical system for scanning a surface to be inspected, with first light and simultaneously for scanning a diffraction grating with second light, wherein the first light and the second light have mutual... | 01/07/1997 |
| 5559341 | System for detecting defects in articles using a scanning width which is less than width of portion of the article scanned An apparatus for sensing the deflection of a beam directed at an article detects slight deflection of the beam when the beam is directed at a large angle of incidence. The large angle of incidence increases the apparatus sensitivity to detect certain char... | 09/24/1996 |
| 5479252 | Laser imaging system for inspection and analysis of sub-micron particles A laser imaging system is used to analyze defects on semiconductor wafers that have been detected by patterned wafer defect detecting systems (wafer scanners). The laser imaging system replaces optical microscope review stations now utilized in the semico... | 12/26/1995 |
