Quotables
"What, sir, would you make a ship sail against the wind and currents by lighting a bonfire under her deck? I pray you, excuse me, I have not the time to listen to such nonsense."
Napoleon Bonaparte ; When told of the Robert Fulton steamboat
PatentStorm News
Make the Most of Our Site
See this month's Top Inventors and Most Cited Patents.
Stay on top of the latest innovations by subscribing to an RSS feed.
Registered users: Manage your profile.
| Number | Title | Issue Date |
| 7952085 | Surface inspection apparatus and method thereof The invention provides a surface inspection apparatus and a method for inspecting the surface of a sample that are capable of inspecting discriminatingly between the scratch of various configuration and the adhered foreign object that occur on the surface of a work ... | 05/31/2011 |
| 7560720 | Methods and apparatuses of detecting foreign particles or faults in a plurality of filled containers A method of detecting unwanted objects or faults in containers containing a fluid or liquid includes: (a) moving the containers along a path of travel; (b) providing; a light source emitting light of a specific spectral distribution, wherein the containers and their... | 07/14/2009 |
| 7417244 | Surface inspection apparatus and method thereof An apparatus for detecting defects, including: a first illumination optical unit which illuminates from a normal direction or in the vicinity of the normal direction; a second illumination optical unit which illuminates from a first elevation angle; a first detectio... | 08/26/2008 |
| 7394084 | Method of generating image and illumination device for inspecting substrate For generating an image for inspection of a substrate, a camera is provided above this substrate with an optical axis orienting downward and a plurality of multi-colored light emitting members are set around the optical axis of the camera so as to be within a specif... | 07/01/2008 |
| 7366344 | Edge normal process An edge inspection method for detecting defects on a wafer edge normal surface includes acquiring a set of digital images which captures a circumference of the wafer. An edge of the wafer about the circumference is determined. Each digital image is segmented into a ... | 04/29/2008 |
| 7340086 | Inspection method and device An inspection device and a method of checking on correct functioning of the inspection process of containers such as bottles, cans or the like, where a container to be inspected is detected optically at least in part, and the image data thus detected is analyzed wit... | 03/04/2008 |
| 7339660 | Illumination device for product examination An illumination device for use with a product inspection machine inspecting products according to at least one characteristic. The invention also pertains to an illumination device for use in sorting machines that optically sort or separate nonstandard fungible obje... | 03/04/2008 |
| 7330583 | Integrated visual imaging and electronic sensing inspection systems Integrated inspection and test systems for liquid crystal display (LCD) active plates. The integrated inspection and test systems may combine visual imaging inspection and an electronic sensing such as voltage imaging, electron beam sensing or charge sensing, in whi... | 02/12/2008 |
| 7330308 | Alignment method of micro-alignment members and device thereof An alignment method of micro-alignment members includes a first step for moving a reticle, which is movably disposed between a first position and a second position, to face a first microscope in the first position, and for aligning a center of the reticle with an op... | 02/12/2008 |
| 7319518 | Double side polished wafer scratch inspection tool The invention is a method of inspecting a semiconductor wafer surface for scratches. The method includes positioning a semiconductor wafer for illumination by a radiation source and adjacent a background material that will absorb radiation from the radiation source,... | 01/15/2008 |
| 7315366 | Apparatus and method for inspecting defects A defect-inspecting apparatus including an arrangement to convert detected light into a first signal corresponding to light illuminated by a high-angle illumination optical system and/or a second signal corresponding to light illuminated by a low-angle illumination ... | 01/01/2008 |
| 7305119 | Test head for optically inspecting workpieces Apparatus for simultaneously optically inspecting top and bottom surfaces of a workpiece comprise upper and lower test heads, each head comprising at least one laser for providing a laser beam that scans its associated workpiece surface and at least one detector for... | 12/04/2007 |
| 7305114 | Human/machine interface for a machine vision sensor and method for installing and operating the same This invention overcomes the disadvantages of the prior art by providing a human/machine interface (HMI) for use with machine vision systems (MVSs) that provides the machine vision system processing functionality at the sensor end of the system, and uses a communica... | 12/04/2007 |
| 7302148 | Test head for optically inspecting workpieces An optical test head comprises a block of material with a plurality of optical paths extending therethrough. At least one of the optical paths is an input optical path for receiving laser light and holding a lens for focusing the laser light on a workpiece that is p... | 11/27/2007 |
| 7292329 | Test head for optically inspecting workpieces comprising a lens for elongating a laser spot on the workpieces An optical test head comprises a laser source for providing a laser beam. The laser beam passes through a cylindrical lens for modifying the shape of the beam and a spherical lens for concentrating the beam onto a workpiece (typically a magnetic disk platter). The c... | 11/06/2007 |
| 7289216 | Station for inspecting the painting of motor vehicle parts A station for inspecting the painting of motor vehicle bodywork parts, the station including an optical measuring apparatus and means for attenuating vibration of the moving parts. ... | 10/30/2007 |
| 7265662 | Apparatus and method for inspecting containers This invention relates to an integrated apparatus and method for inspection of a container adapted to hold a pressurized gas. The integrated apparatus comprises (i) an imaging device configured to obtain image data corresponding to the container and to transmit the ... | 09/04/2007 |
| 7248346 | Apparatus for defining orientation of an alignment layer in a pixel unit of an LCD device and the method thereof An apparatus for determining orientation of an alignment layer in a pixel unit of an LCD device is provided. The pixel unit includes a glass substrate having an outer surface provided with the alignment layer treated by photolithographic masking and rubbing operatio... | 07/24/2007 |
| 7242016 | Surface inspection apparatus and method thereof A surface inspection apparatus and a method for inspecting the surface of a sample are capable of inspecting discriminatingly between scratches of various configuration and adhered foreign objects that occur on the surface of a work target when the work target (for ... | 07/10/2007 |
| 7239970 | Robotic system for optically inspecting workpieces A manufacturing cell for inspecting workpieces such as magnetic disk substrates comprises an input conveyor for providing workpieces to be tested, one or more testers for inspecting the workpieces, and three or more output receptacles for receiving tested workpieces... | 07/03/2007 |
| 7227628 | Wafer inspection systems and methods for analyzing inspection data Wafer inspection systems and methods are provided. One inspection system includes a module measurement cell coupled to a host inspection system by a wafer handler. The module measurement cell is configured to inspect a wafer using one or more modes prior to inspecti... | 06/05/2007 |
| 7205498 | Closure lining and color detector A system is disclosed for detecting or inspecting for a lining of a container closure that is formed of a sheet metal and has a panel on an inside surface of the closure. The panel of the closure has a lining formed thereon. The system according to the present inven... | 04/17/2007 |
| 7202491 | Method for sensing wafers located inside a closed wafer cassette Wafers in a cassette are mapped without having to open the cassette. The cassette is at least partially transparent to a particular type of radiation. A source of the radiation is directed into the cassette, through a transparent or translucent part of the cassette,... | 04/10/2007 |
| 7199386 | System and method for detecting defects in a light-management film A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second lig... | 04/03/2007 |
| 7184139 | Test head for optically inspecting workpieces An optical test apparatus comprises: a) a motor rotating a spindle which in turn rotates a workpiece such as a magnetic disk substrate; b) an upper test head comprising a laser for providing an upper laser beam to the upper surface of the workpiece, an upper lens fo... | 02/27/2007 |
| 7173270 | Detector system for detecting a height of a particle, and lithographic apparatus and device manufacturing method including the same. A lithographic apparatus transfers a pattern from a patterning device onto a substrate and includes a projection system to project a patterned radiation beam onto the substrate; a controllable actuator to adjust a distance between the projection system and the subst... | 02/06/2007 |
| 7170592 | Method of inspecting a sphere without orienting the sphere The present invention is directed to a method of inspecting a curved object comprising the steps of acquiring inspection image data of a curved object using a detector, generating adjusted image data by adjusting the inspection image data, and comparing the adjusted... | 01/30/2007 |
| 7166856 | Apparatus and method to inspect display panels An apparatus and method to inspect a display panel that can correctly detect a defect of the display panel itself. In the method of inspecting the display panel, a first image is captured from the display panel in a state in which no pattern is applied to the displa... | 01/23/2007 |
| 7162070 | Use of patterned, structured light to detect and measure surface defects on a golf ball A method of inspecting a golf ball, comprising the steps of providing a golf ball; providing a first light source emitting a first color of light; illuminating a first area of the golf ball with the first light source; providing a second light source emitting a seco... | 01/09/2007 |
| 7149341 | Wafer inspection apparatus A wafer inspection apparatus has a supporting means (10) for rotatably supporting a wafer (W) formed of a disk, a circumferential edge imaging means (40) for imaging a circumferential edge (S) of the wafer (W) that is supported by the supporting means ... | 12/12/2006 |
| 7143479 | Inspection device on a spinning preparation machine, especially a carding machine, cleaner or the like In a device on a spinning preparation machine, especially a carding machine, cleaner or the like, having a machinery housing, the machine and/or fiber feed and fiber discharge devices are arranged in the interior of the machinery housing. In order that the fi... | 12/05/2006 |
| 7104127 | Nondestructive method for inspecting cladding tubes The present invention relates to a nondestructive method or inspecting defects of the cladding of a nuclear fuel rod, which is featured by a wave emitter obliquely discharging an inspection wave to an inspected tube and a receiver arranged at a side of the inspected... | 09/12/2006 |
| 7107200 | Method and apparatus for predicting clock skew for incomplete integrated circuit design Prediction of a clock skew for an incomplete integrated circuit design, includes (a) selecting a first metal layer having at least one clock design figure, (b) placing, for a minimum clock skew prediction, clock source locations on the clock design figure in accorda... | 09/12/2006 |
| 7096784 | Installation for treating sheets of printed paper The invention concerns an installation comprising means controlling printing quality supplied by a printed sheet feeding device (1–3). Downstream, printing means (12–16) print serial numbers and/or affix other elements. The quality of the number pr... | 08/29/2006 |
| 7079141 | System and method for specifying a machine vision process using different programming methodologies A system and method for specifying a machine vision process utilizing two or more different program creation methodologies. In one embodiment, the different program creation methodologies may include specifying steps or operations for the process using graphical inp... | 07/18/2006 |
| 7051317 | System and method for specifying a computer-implemented process using different programming methodologies A system and method for specifying a computer-implemented process utilizing two or more different program creation methodologies. In one embodiment, the different program creation methodologies may include specifying steps or operations for the process using graphic... | 05/23/2006 |
| 7030400 | Real-time web inspection method and apparatus using combined reflected and transmitted light images An apparatus and method for web inspection utilize simultaneous capturing of reflected and transmitted light images for real-time merging of same. The reflected light and transmitted light image capturing systems are registered with each other in terms of the down-w... | 04/18/2006 |
| 7015445 | Method for optimizing inspection speed in low, and fluorescent light applications without sacrificing signal to noise ratio, resolution, or focus quality The method for optimizing inspection speed during optical inspection of parts in high, low and fluorescent light applications. There are described autofocus mechanisms and methods optimized for fluorescent and non-fluorescent applications that when combined with a h... | 03/21/2006 |
| 7009697 | Method of monitoring closures on containers Method of optical inspection of closures on containers in which the outer edge of a closure is illuminated obliquely from above over the full circumference, and a photograph of the top side of the closure is made perpendicularly from above, and this photograph is us... | 03/07/2006 |
| 7004421 | Inspection device of winding appearance of tape and improvement processing method for the same To provide a winding appearance inspection device of a tape capable of gathering a line speed in an inspection process, as well as capable of inspecting a winding appearance of the tape wound on a roll body core, even in a reel having a flange formed in a roll body ... | 02/28/2006 |
