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...When G.G. Hubbard learned of his future son-in-law's invention, he called it "only a toy." His daughter was engaged to a young man named Alexander Graham Bell.
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| Number | Title | Issue Date |
| 7423269 | Automated feature analysis with off-axis tilting One embodiment relates to a method of automated microalignment using off-axis beam tilting. Image data is collected from a region of interest on a substrate at multiple beam tilts. Potential edges of a feature to be identified in the region are determined, and compu... | 09/09/2008 |
| 7305115 | Method and system for improving ability of a machine vision system to discriminate features of a target A method and system is disclosed to improve the ability of a machine vision system to distinguish desired features of a target by taking images of the target under different one or more lighting conditions and using image analysis to extract information of interest ... | 12/04/2007 |
| 7295329 | Position detection system A position detection system. In representative embodiments, the position detection system comprises a support structure having a cavity, a first light source configured to emit light into at least part of the cavity, a second light source configured to emit light in... | 11/13/2007 |
| 7279695 | Edge position detecting apparatus and method, and program There is provided an edge position detecting apparatus that includes a reflective optical sensor that outputs light to a supporting surface of a supporting member, and receives a reflected light; a moving unit that moves the reflective optical sensor; a reflected li... | 10/09/2007 |
| 7275803 | System and method for printing a code on an elongate article and the code so printed A method and apparatus for printing a redundant code on an elongate article are disclosed. The apparatus includes an ink unit, at least one printing head and a controller. The printing head includes two, or three, valves, controlled by the controller. As the elongat... | 10/02/2007 |
| 7274472 | Resolution enhanced optical metrology A resolution enhanced optical metrology system to examine a structure formed on a semiconductor wafer includes a source configured to direct an incident beam at the structure through a coupling element. The coupling element is disposed between the source and the str... | 09/25/2007 |
| 7266233 | System and method for measuring an object An image measurement system and method for obtaining measurement data on objects by processing images of the objects is provided. The image measurement system includes an image obtaining device (101) for obtaining a first image of an object to be measured and... | 09/04/2007 |
| 7259873 | Method for measuring the dimension of a non-circular cross-section of an elongated article in particular of a flat cable or a sector cable Method for measuring the cross-sectional dimension of an elongated profile having rounded or sharp edges, in particular of a flat or sector cable by illuminating the article with light sources and determination of a plurality of shadow borders and calculating the pa... | 08/21/2007 |
| 7253910 | Optical measuring device An optical measuring device capable of improving the precision of detection of contamination on a protective glass is disclosed. With threshold values as large as 90%, 50%, 10% of a peak value of a scan signal, measured values Q90, Q50, Q1... | 08/07/2007 |
| 7227164 | Media width detecting apparatus What is disclosed: is a media width detecting apparatus comprising: a first media detecting section to detect media, a second media detecting section put downward from said first media detecting section, to detect media; wherein said second detecting section decide ... | 06/05/2007 |
| 7227163 | Product inspection system and a method for implementing same An inspection system and a method for using the inspection system, wherein the inspection system includes a collimated light source defining a source optical path, the collimated light source being operable to cause a collimated light beam to propagate along the sou... | 06/05/2007 |
| 7227165 | System and method for classification of timber The present invention provides a system and a method to grade a piece of wood and simultaneously to classify this piece of wood by allowing an examination of four longitudinal faces thereof, so as to determine optimal specifications for a subsequent use thereof such... | 06/05/2007 |
| 7212280 | Device for measuring the dimension and controlling of defects in optical fibres during production Disclosed is a device for absolute, high-speed measurement of a diameter of an optical fiber and for detecting defects in the fiber, comprising two complementary signal processing systems including first and second sensors and first and second processing boards wher... | 05/01/2007 |
| 7212293 | Optical determination of pattern feature parameters using a scalar model having effective optical properties Optical characterization of lateral features of a pattern is provided. A plane-wave optical response is calculated for each feature. At least one of these plane-wave responses is calculated from an effective optical property (e.g., a waveguide modal refractive index... | 05/01/2007 |
| 7199385 | Method and an apparatus for the detection of objects moved on a conveyor means by means of an optoelectronic sensor The invention relates to a method and to an apparatus for the detection of objects moved on a segmented conveyor means by means of an optoelectronic sensor, in which in each case the geometric center of the objects is determined via the optoelectronic sensor, whereu... | 04/03/2007 |
| 7193697 | Apparatus for feature detection An apparatus for feature detection of a test object includes at least one light source module and at least one image capturing unit. The light source module provides light to illuminate a test region of the test object, and includes a substrate, a set of light-emitt... | 03/20/2007 |
| 7190458 | Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity A semiconductor wafer having two regions of different dopant concentration profiles is evaluated by performing two (or more) measurements in the two regions, and comparing measurements from the two regions to obtain a reflectivity change measure indicative of a diff... | 03/13/2007 |
| 7190465 | Laser measurement system What is disclosed is a 3-D laser measurement system, including a mirror continuously rotatable about a rotation axis which extends, e.g., in parallel or coaxial with a measuring beam emitted by an optical emitter and impinging on the mirror. ... | 03/13/2007 |
| 7189985 | Tracking separation between an object and a surface using a reducing structure Tracking separation between an object and a surface involves illuminating the surface and reducing the collection angle of light that reflects off of the surface in response to a change in separation between the object and the surface. Reducing the collection angle ... | 03/13/2007 |
| 7173269 | Apparatus for processing photosensitive material and area measurement method A plurality of microswitches are arranged in a photosensitive material receiving section in a row, in a direction perpendicular to the travel direction of a printing plate. The printing plate is carried while being centered with respect to a center of a transport pa... | 02/06/2007 |
| 7161688 | Mass scanning and dimensioning system A package information capture system that provides dimensioning information about, and machine readable codes from, packages passing across a data capture point either singulated or non-singulated. The resulting data can be used to determine, for example, package di... | 01/09/2007 |
| 7146850 | Roll contour measuring apparatus and method A non-contact apparatus and method for precision measurement of the surface characteristics of work rolls which are used in the manufacture of sheet steel and other sheet metal products. The apparatus and method can be used to accurately measure the parameters of cr... | 12/12/2006 |
| 7136159 | Excimer laser inspection system A system and method for inspecting a specimen, such as a semiconductor wafer, including illuminating at least a portion of the specimen using an excimer source using at least one relatively intense wavelength from the source, detecting radiation received from the il... | 11/14/2006 |
| 7126144 | Method for the contactless measurement of an object The invention relates to a method for the contactless measurement of an object in at least one dimension. An object is scanned in a spatially restricted effective zone of a scanning beam field and the size of the object in terms of the measured dimension is deduced ... | 10/24/2006 |
| 7110645 | Method and instrument for microscopy A microscope includes a light source that emits an illuminating light beam for illumination of a specimen, a beam splitter separating measuring light out of the illuminating light beam, and an apparatus for determining the light power level of the illuminating light... | 09/19/2006 |
| 7107003 | Image forming apparatus and document size determination method thereof A image-forming apparatus has a light projection unit for projecting light onto a document. A reflection plate having a predetermined pattern corresponding to a size of the document reflects the light projected onto the document. The light reception unit receives th... | 09/12/2006 |
| 7092096 | Optical scatterometry method of sidewall spacer analysis A method of analyzing structural characteristics of sidewall spacers fabricated on a wafer is disclosed. A grating bar having a plurality of grating targets is provided. A theoretical optical scatterometry spectrum is generated by subjecting the grating targets to o... | 08/15/2006 |
| 7084387 | Multiple-optical-axis photoelectric switch, mounting structure therefor, and fixture therefor A mounting structure for a multiple-optical-axis photoelectric switch comprising, a protrusion of a first member attached to cap members located on either end of the main case of one or both of a light receiving body and a light emitting body. The protrusion is inte... | 08/01/2006 |
| 7076100 | Method and apprartus thereof for detecting a hidden image in a hologram An apparatus for detecting a hidden image, which is formed in a first area of a hologram, is disclosed. The apparatus has a laser device for generating a laser beam and projecting the laser beam to the hologram, and a sensing device for sensing light that reflects f... | 07/11/2006 |
| 7072051 | Laser diffraction process and apparatus for width measurement of elongated objects Size distribution of elongated objects is measured by forward scattering radiation from the objects at a range of scatter angles. The scattered radiation is refracted to locations on a scatter detector based on the scatter angles and independent of the location of t... | 07/04/2006 |
| 7042483 | Apparatus and method for printing using a light emissive array An apparatus and method for printing images from a digital image source onto a photosensitive medium (22) using one or more two-dimensional light-emissive arrays (51) such as OLED arrays. Each image pixel has a corresponding light-emitting element whic... | 05/09/2006 |
| 7042369 | Road traffic monitoring system A traffic monitoring system comprises at least one sensor station (2) and an interferometric interrogation system (9); wherein the at least one sensor station (2) comprises at least one optical fiber sensor (5) deployed in a highway (1... | 05/09/2006 |
| 7009196 | Inspection apparatus for inspecting resist removal width An inspection apparatus for inspecting a resist boundary on a substrate having an outer surrounding portion, includes: an illumination unit which illuminates the outer surrounding portion of the substrate; a detector which detects light reflected from the outer surr... | 03/07/2006 |
| 6956694 | Broad spectrum ultraviolet inspection systems employing catadioptric imaging An ultraviolet (UV) catadioptric imaging system, with broad spectrum correction of primary and residual, longitudinal and lateral, chromatic aberrations for wavelengths extending into the deep UV (as short as about 0.16 μm), comprises a focusing lens group with mul... | 10/18/2005 |
| 6952290 | Sensing of original size An original size sensing method for an apparatus which includes a photoelectric converter for reading an image of an original placed on a platen, and a light source for irradiating the original with light, determines the presence/absence of incidence of ambient ligh... | 10/04/2005 |
| 6941796 | Package handling apparatus detecting package height An apparatus to test integrity of a seal of a package. The apparatus includes a height detector detecting a height of the package, a test portion determining the integrity of the seal based upon a position of the test portion as a function of time when contacting th... | 09/13/2005 |
| 6930784 | Apparatus and method for showing contour lines in modeling An apparatus for depicting contour lines on the surfaces of a model, the apparatus comprising a bed for supporting the model, and at least one laser for projecting a plane of light at a predetermine height from the bed. A method of depicting contour lines on surface... | 08/16/2005 |
| 6927864 | Method and system for determining dimensions of optically recognizable features A method and system for determining dimensions of optically recognizable features provides a low-cost and efficient high speed/high resolution measurement system for determining surface feature dimensions. Multiple imaging subsystems are arranged at predetermined di... | 08/09/2005 |
| 6897421 | Optical inspection system having an internal rangefinder An optical inspection system comprises an optical system for providing an image of an object being inspected. The optical system comprises a plurality of lenses arranged along a normal optical axis, one of the lenses including an objective lens. A collimated laser b... | 05/24/2005 |
| 6891182 | Apparatus for automatically detecting size to be detected and automatic analyzer using the same In the automatic analyzer, the height of the test tubes is measured using the function of the optical information reader installed for discrimination of a sample. Various sensors installed so as to measure the height of the test tubes of the automatic analyzer can b... | 05/10/2005 |
