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Class 250/339.08 - Including Fourier transform infrared spectrometry


Subclass of Class 250 - Radiant energy
Definition: Subject matter wherein the detection process includes performing
No. of patents: 209
Last issue date: 01/31/2012


1            
NumberTitleIssue Date
8106360Microscopic infrared analysis by X-ray or electron radiation
An infrared (IR) emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared (IR) microscopy and performing microscopic infrared (IR) analysis by X-ray or electron rad...
01/31/2012
8063374Systems and methods for determining recycled thermoplastic content
A system and method of identifying a reference standard library for thermoplastic content includes preparing a plurality of samples of each one of a plurality of known ratios of virgin thermoplastic/recycled thermoplastic, analyzing each of the plurality of samples ...
11/22/2011
7939805Method and apparatus for infrared spectrometry
A Fourier-Transform Infrared (FTIR) spectrometer for operation in the mid- and long-wave infrared region (about 2-15 micron wavelengths) is disclosed. The FTIR spectrometer is composed of IR-transmitting fiber and uses a broadband IR source. A fiber stretcher is pro...
05/10/2011
7928391Handheld infrared and raman measurement devices and methods
We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a...
04/19/2011
7928390Infrared metrology
A spectroscopic instrument of the type providing an infrared light beam from an infrared light source along an infrared light path, where the infrared light beam includes a wide range of wavelengths of radiation within a target range of from about two microns to abo...
04/19/2011
7781737Apparatus and methods for oil-water-gas analysis using terahertz radiation
Methods and apparatus for analyzing gas-oil-water compounds in oilfield and other applications are disclosed using terahertz radiation. A sample analyzer includes a sample chamber having a fluid communication port configured to receive the sample. The analyzer also ...
08/24/2010
7745789Measuring technique
The present invention relates to apparatuses for use in performing a quantitative analysis of a turbid pharmaceutical sample, e.g. a tablet, a capsule or a similar sample forming a pharmaceutical dose. A pharmaceutical, turbid sample (24, 57, 67) is irradiate...
06/29/2010
7535004Fourier transform infrared spectrophotometer
Disclosed is a Fourier transform infrared spectrophotometer, which comprises: a main interferometer section including a beam splitter, a fixed mirror, a movable mirror, and a phase plate disposed between the beam splitter and the fixed mirror; a control interferomet...
05/19/2009
7528373Method and system for detection of gas leakage sources
A system for detection of gas leakage sources. An open-path FTIR detection system is located before the return filter of recirculating air of a factory to detect gas composition of recirculating air and transmits the result to a data server through a communication n...
05/05/2009
7501629Fenceline monitoring of air contaminants
Methods, systems, and computer program products for the fenceline monitoring of air contaminants. More particularly, methods, systems, and computer program products for correlating temporal variations between simultaneous measurements of at least one point monitor a...
03/10/2009
7420170Fourier transform infrared (FTIR) chemometric method to determine cetane number of diesel fuels containing fatty acid alkyl ester additives
The present invention is a method to determine the cetane number of a diesel fuel containing a fatty acid alkyl ester including determining the infrared spectrum of the fuel and correlating the spectrum to the cetane number using a multivariate-based Mid-FTIR model....
09/02/2008
7388203Non-contact exhaust gas measurement by means of FTIR spectrometry in metallurgical installations
During carrying out metallurgical processes in plant components such as, e.g., a converter, knowledge of a time-dependent exhaust gas composition provides a significant aid in obtaining information about the process advancement. Known analytical methods consist in t...
06/17/2008
7388202Method and apparatus for determining an analyte concentration in a sample having interferents
A method and apparatus are described that permit an analyte concentration to be estimated from a measurement in the presence of compounds that interfere with the measurement. The method reduces the error in the analyte concentration in the presence of interferents. ...
06/17/2008
7372565Spectrometer measurement of diffracting structures
A normal incidence reflectometer includes a rotatable analyzer/polarizer for measurement of a diffracting structure. Relative rotation of the analyzer/polarizer with respect to the diffracting structure permits analysis of the diffracted radiation at multiple polari...
05/13/2008
7355944Authenticatable media and method of authenticating
One method for playing a disk, comprises illuminating a first portion of the optical article with a first laser to obtain a first optical signal, wherein the first laser has a first wavelength, illuminating a second portion with a second laser to obtain a second opt...
04/08/2008
7349092System for reducing stress induced effects during determination of fluid optical constants
A system for determination of optical constants of liquids, including provision for reducing stress induced effects while obtaining data. ...
03/25/2008
7349107System and method for correction for angular spread in determining optical properties of materials
The present invention provides a method and system to correct for angular spread within an HDR used to determine IR optical constants. An algorithm simulates the transmission and polarized reflection actually observed. This is achieved by averaging power scattering ...
03/25/2008
7343217System for monitoring and controlling a semiconductor manufacturing apparatus using prediction model equation
A semiconductor processing apparatus for processing a semiconductor wafer includes a plurality of sensors for monitoring a processing state, a processing result input unit, a model equation generation unit to generate a model equation for predicting a processing res...
03/11/2008
7339169Sample rotating turntable kit for infrared spectrometers
An infrared spectrometer sample rotating turntable kit has a rotatable sample cup containing the sample. The infrared spectrometer has an infrared spectrometer probe for analyzing the sample and the rotatable sample cup is adapted to receive the infrared spectromete...
03/04/2008
7330244Method and apparatus for performing limited area spectral analysis
A method and apparatus for obtaining in-situ data of a substrate in a semiconductor substrate processing chamber is provided. The apparatus includes an optics assembly for acquiring data regarding a substrate and an actuator assembly adapted to laterally move the op...
02/12/2008
7312257Polymer encapsulation of high aspect ratio materials and methods of making same
Embodiments of this invention comprise a pigment comprising one or more substantially spherical-shaped beads, wherein each substantially spherical-shaped bead comprises one or more high aspect ratio particles encapsulated within an encapsulating material. Embodiment...
12/25/2007
7312453Methods for determining corrosion products on substrates using infrared imaging
Methods for determining corrosion products on a substrate are disclosed. In one embodiment, a non-destructive method for determining an amount of corrosion product on a metallic substrate includes non-destructively determining a value Ia of infrared energy absorbed ...
12/25/2007
7304311Whole printing medium evaluation method and device
A method and device for evaluating a printing medium for use in a printing process, in which a set of spectral data is generated from a sample of the printing medium, and the set of spectral data is analysed. The analysis of the set of spectral data comprises detect...
12/04/2007
7294513Method and apparatus for characterizing solutions of small particles
A method and apparatus is described by which means molecules in suspension may be characterized in terms of the size and mass distributions present. As a sample solution is separated by centrifugal means, it is illuminated at a particular radial distance from the ax...
11/13/2007
7289232Dimension measurement method, method of manufacturing semiconductor device, dimension measurement apparatus and measurement mark
A dimension measurement method includes irradiating a measurement mark on a sample on which a pattern to be measured is formed with light from a measurement direction, detecting reflected diffracted light from the measurement mark to measure intensity thereof, and c...
10/30/2007
7276700Method of analysing a pharmaceutical sample
The present invention relates to a method for analysing the amount of free gas within a pharmaceutical sample. According to the invention the method comprises the following steps: providing a sample before an irradiating source; irradiating the sample with at least ...
10/02/2007
7274443Corrosion monitoring system, optical corrosion probe, and methods of use
Optical corrosion monitoring and detection systems as well as methods to detect and monitor corrosion under process conditions and generally in real time using electromagnetic radiation, particularly light. The systems generally provide for incident light to be allo...
09/25/2007
7271918Profiling complex surface structures using scanning interferometry
A method including comparing information derivable from a scanning interferometry signal for a first surface location of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of cha...
09/18/2007
7262414Thermal luminescence surface contamination detection system
A Thermal Luminescent (TL) spectroscopy system and method for remote sensing and detection of surface chemical contamination involves irradiation of a target surface with energy from a near infrared pump beam, and measurement of TL liberated by that surface within a...
08/28/2007
7255835Single pass attenuated total reflection fourier transform infrared microscopy apparatus and method for identifying protein secondary structure, surface charge and binding affinity
Apparatus and method for acquiring an infrared spectrum of a sample having or suspected to have an amide I band, an amide II band, an amide III band, an amide A band, an OH stretching region or a combination thereof. A representative method includes providing a samp...
08/14/2007
7253905Determination and correction for laser induced CCD camera degradation
A process for the determination and correction of laser induced damages of the optical and electronic components within the beam path of a monitor module of a 193 nm excimer lasers is provided herein. Especially state of the art detectors like CCD cameras degrade un...
08/07/2007
7253413Gas identification system
A system for identifying a gas sample includes a canister, a docking station, a thermal desorption device, and a spectrometer. The canister includes a sorbent and a valve. The docking station is configured to removably engage the canister. When the canister is engag...
08/07/2007
7242000Method and apparatus for screening combinatorial libraries of semiconducting properties
This invention discloses methods, materials, and devices for making and screening combinatorial libraries to identify semi-conducting and thermoelectric materials. The disclosed method includes preparing a combinatorial library of materials, and identifying library ...
07/10/2007
7236244Alignment target to be measured with multiple polarization states
An alignment target includes periodic patterns on two elements. The periodic patterns are aligned when the two elements are properly aligned. By measuring the two periodic patterns at multiple polarization states and comparing the resulting intensities of the polari...
06/26/2007
7230705Alignment target with designed in offset
An alignment target includes periodic patterns on two elements. The alignment target includes two locations, at least one of which has a designed in offset. In one embodiment, both measurement locations have a designed in offset of the same magnitude but opposite di...
06/12/2007
7223977Method of measuring thickness of an opaque coating using near-infrared absorbance
The the thickness of an opaque coating may be measured using near-infrared absorbance. One measurement method includes transmitting the near-infrared radiation towards the opaque material and determining relative absorbance levels over a range of near-infrared wavel...
05/29/2007
7216311System and method for evaluating a semiconductor device pattern, method for controlling process of forming a semiconductor device pattern and method for monitoring a semiconductor device manufacturing process
In order to realize a means for acquiring three-dimensional shape information about patterns by nondestruction and evaluate a relationship between the three-dimensional shape information about these patterns and device properties, a semiconductor device pattern eval...
05/08/2007
7212293Optical determination of pattern feature parameters using a scalar model having effective optical properties
Optical characterization of lateral features of a pattern is provided. A plane-wave optical response is calculated for each feature. At least one of these plane-wave responses is calculated from an effective optical property (e.g., a waveguide modal refractive index...
05/01/2007
7209605Packaged optical sensors on the side of optical fibers
The present invention concerns an optical sensor located on a preferred azimuthal portion of the side of an optical fiber. An optical fiber having two opposite ends, a core and a cladding and at least one sensing area is disclosed. Each of the sensing areas is locat...
04/24/2007
7209237Optical system for analyzing multi-channel samples and multi-channel sample analyzer employing the same
Provided are an optical system for analyzing multi-channel samples which uses a mirror rotating at high speeds and an aspherical mirror, and a multi-channel sample analyzer employing the optical system. The optical system for analyzing multi-channel samples, include...
04/24/2007
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