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| Number | Title | Issue Date |
| 4063091 | High speed switching circuit A high-speed circuit for causing the corpuscular particle beam of a corpuscular particle microprobe such as a scanning electron microscope to be periodically and sequentially displaced from its normal path so as to, in effect, interrupt the beam's bombard... | 12/13/1977 |
| 4057722 | Method and apparatus for the generation of distortion-free images with electron microscope A specimen to be analyzed under an electron microscope is oriented at an inclined angle relative to a plane normal to the beam. The beam is deflected to form a scanning raster to scan the specimen, and the raster and specimen are each rotated independentl... | 11/08/1977 |
| 4041316 | Field emission electron gun with an evaporation source A field emission electron gun provided in a housing defining a vacuum chamber comprises a field emission tip as an electron source, an anode spaced from and facing the field emission tip, the field emission tip and the anode defining a space in which the ... | 08/09/1977 |
| 4041311 | Scanning electron microscope with color image display The system includes a scanning electron microscope (SEM) and a color kinescope (CRT). The electron beams of the SEM and the CRT are driven in a synchronized raster. A first signal representative of back-scattered electrons, for example, is fed to a color ... | 08/09/1977 |
| 4039829 | Stereoscopic measuring apparatus Apparatus capable of tridimensionally measuring the distance between two arbitrary points on the surface of a sample is disclosed. In apparatus wherein the surface of the sample to be observed is scanned with an energized beam, wherein a secondary radiati... | 08/02/1977 |
| 4037101 | Method and apparatus for analyzing fine grained substances A rock specimen is step scanned in an electron probe x-ray microanalyzer. A plurality of x-ray spectrometers (for example three) forming a part of said electron probe x-ray microanalyzer simultaneously detect characteristic x-rays corresponding to three e... | 07/19/1977 |
| 4034220 | Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons A process of elementary and chemical analysis of samples by spectrum analysis of secondary electrons emitted by the sample when it is subjected to a beam of monoenergetic primary electrons concentrated on its surface is characterized in that the intensity... | 07/05/1977 |
| 4031388 | Method for the analysis of isotopes A method for the qualitative or quantitative analysis of isotopes, characterized by bombarding a substance with X rays or electrons of a previously determined dose and energy for analyzing an isotope in the substance to be detected or measured, to produce... | 06/21/1977 |
| 4020343 | Scanning electron device A scanning electron microscope or other type of scanning electron device incorporating a light pen for automatically changing the field of view of a specimen on a CRT. The output of said light pen controls the center and/or width of the scanning area of t... | 04/26/1977 |
| 4011450 | Scanning electron device A scanning electron device having means for creating an electric field for directing secondary electrons to a detecting means comprising auxiliary electrodes and power supplies therefor so as to increase both the output signal intensity and contrast obtai... | 03/08/1977 |
| 4006357 | Apparatus for displaying image of specimen An apparatus is disclosed for facilitating adjustments of an image of a specimen obtained from an electron microscope and displayed on a cathode ray tube by displaying additionally and concurrently a wave form indicating information representative of cont... | 02/01/1977 |
| 4004149 | Apparatus for displaying image produced by electrically charged particle beam A beam of electrically charged particles for illuminating a specimen is deflected by a deflection means so that the specimen is scanned with the beam bi-dimensionally. The information signal thus produced by the specimen is detected by a detector means an... | 01/18/1977 |
| 3993905 | Electron beam scanning apparatus for the structural analysis of specimens In an electron beam scanning apparatus with ray penetration of the specimen, an additional deflection system provided between the specimen and the detector directs the transmitted primary beam always to the same point of the detector. The detector has dif... | 11/23/1976 |
| 3986027 | Stereo scanning microprobe A scanning electron microprobe and display system adaptable to stereoscoptic or side-by-side viewing of an image for comparison on a television type monitor. The apparatus includes means for scanning the microprobe beam in a raster over a specimen and dis... | 10/12/1976 |
| 3984683 | Apparatus and method for analyzing biological cells for malignancy A specimen containing biological cells is exposed to an electron beam. The secondary electrons emitted from the specimen are measured. Specimens with and without malignancy exhibit differences in magnitude of charging under an electron beam and difference... | 10/05/1976 |
| 3978338 | Illumination system in a scanning electron microscope A scanning electron microscope comprising a double gap lens in its electron beam irradiating system. The double gap lens is arranged between the electron gun and the final stage condenser lens, and is excited by a lens current such that a large change of ... | 08/31/1976 |
| 3974381 | Method of electron beam welding with X-ray detection Welding method and apparatus for detecting the penetration depth of an electron beam weld, in which X-rays which occur are guided through several plates of an absorption device to a ray receiver, the plates comprising of plurality of bores of equal diamet... | 08/10/1976 |
| 3963922 | X-ray fluorescence device An electron beam from an electron column instrument impinges on a target foil to produce a primary X-ray beam which, in turn, passes through a collimator to impinge on a specimen. The X-rays fluoresced from the specimen by the primary X-ray beam are detec... | 06/15/1976 |
| 3961190 | Voltage contrast detector for a scanning electron beam instrument A directionally sensitive, high contrast secondary electron detector having a novel geometrical configuration for use in scanning electron microscopes and other electron beam instruments. The aperture of the detector which is placed near the specimen is i... | 06/01/1976 |
| 3959651 | Electron microscope In a field emission charged particle microscope having a housing defining a vacuum chamber, a field emission tip disposed in the chamber for generating charged particles, electrode means for establishing electrostatic focusing and accelerating field for f... | 05/25/1976 |
| 3958124 | Method and apparatus for SEM specimen coating and transfer An improved method and apparatus for facilitating specimen handling during freezing, coating and transfer to and from the main chamber of an SEM. A unique specimen shuttle manipulable by a control rod permits transfer of a specimen between the main chambe... | 05/18/1976 |
| 3944829 | Method and apparatus for processing a video signal from a scanning electron microscope A scanning electron microscope for displaying a scanning image utilizing a time distributed pulsed video signal. The low frequency noises in the pulsed signal are deleted according to the occurrence of sudden pulse intensity variation between adjacent vid... | 03/16/1976 |
| 3942005 | Electron scanning apparatus An electron scanning apparatus is capable of two-dimensional scanning of a specimen with a primary electron beam and also capable of radiating the primary electron beam in spot on the specimen. While moving the specimen in a straight line, the two-dimensi... | 03/02/1976 |
| 3939353 | Electron microscope specimen mounting apparatus An apparatus for releasably and adjustably mounting a specimen in an electron microscope. A specimen-holding unit is releasably and fluidtightly mounted in an evacuatable chamber and abutting the lens of the electron microscope in the mounted position. Th... | 02/17/1976 |
| 3937959 | Method and apparatus for automatically focusing The sum of the intensity changes of one polarity in the video signal is used as a signal indicative of the diameter of the electron beam irradiating a specimen. A storage counter which produces the signal indicative of the beam diameter is reset periodica... | 02/10/1976 |
| 3931519 | Field emission electron gun A field emission gun in which a field emission tip for generating charged particles is axially aligned with apertures in an intermediate electrode and a main electrode. A field electrode is placed in juxtaposition to the field emission tip for developing ... | 01/06/1976 |
| 3931517 | Field emission electron gun A field emission gun in which a field emission tip for generating charged particles is axially aligned with apertures in an intermediate electrode and a main electrode. A field electrode is placed in juxtaposition to the field emission tip for developing ... | 01/06/1976 |
