Bizarre Patents
Mouthguard made at least partially from an edible candy
A mouthguard includes a U-shaped upper bite plate which removably fits over upper teeth of a person, with the entire upper bite plate being made from a soft, deformable and edible gummi candy.
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| Number | Title | Issue Date |
| 7116816 | Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen In order to enable the most suitable image processing condition to be set as one in which a dispersion in brightness between comparing images caused by object to be inspected and an image detecting system is not applied as a false information, in the present inventi... | 10/03/2006 |
| 7112791 | Method of inspecting pattern and inspecting instrument A sample inspection system having a sample stage holding a sample to be inspected, electron beam optics so as to radiate an electron beam to the sample, a detector unit that detects a secondly generated signal generated in response to radiation of the sample by the ... | 09/26/2006 |
| 7112803 | Beam directing system and method for use in a charged particle beam column A method and system are presented for directing a charged particle beam towards and away from a sample. The system comprises a lens arrangement having an electrode formed with a beam opening for a charged particle beam passage therethrough; and a magnetic deflector.... | 09/26/2006 |
| 7112790 | Method to prepare TEM samples A method for preparing a transmission electron microscopy (TEM) sample is provided which includes removing a portion of a substrate using a focused ion beam tool and securing the removed portion to a support structure to form a grafted structure. The method further ... | 09/26/2006 |
| 7109482 | Object inspection and/or modification system and method A scanning probe microscope system (100) includes an objective lens (147), a clamping circuit (404), a tip deflection measurement circuit (421), a cantilever (136), and a probe (137) for modifying and inspecting an object ( | 09/19/2006 |
| 7109493 | Particle beam generator The source of electrons is a nanotip in a vacuum as used in near field microscopy. The source of ions is a similar nanotip in vacuum supplied with liquid metal (gallium) as in a liquid-metal ion source. Electrons or ions from this nanometre-sized tip are extracted b... | 09/19/2006 |
| 7109501 | Charged particle beam lithography system, pattern drawing method, and method of manufacturing semiconductor device A charged particle beam lithography system includes: a charged particle beam source which generates a charged particle beam and irradiates a substrate therewith; an aperture in which has been formed a pattern of a shape corresponding to an arbitrary pattern to be dr... | 09/19/2006 |
| 7109703 | Magnetic carbon nanotube A carbon nanotube which shows ferromagnetism without a ferromagnetic metal imparted thereto and also has high thermal stability is provided. The carbon nanotube is characterized by being doped with nitrogen (which differs from carbon in valence electron) such that t... | 09/19/2006 |
| 7109487 | Particle beam device A particle beam device, in particular an electron microscope, having at least two particle beam columns and one object slide having a receiving surface for receiving an object. The particle beam device makes it possible to align the surface of the object perpendicul... | 09/19/2006 |
| 7109480 | Ion source and methods for MALDI mass spectrometry Provided are MALDI ion sources, methods of forming ions and mass analyzer systems. In various embodiments, provided are MALDI ion sources configured to irradiate a sample on a sample surface with a pulse of laser energy at angle within 10 degrees or less of the surf... | 09/19/2006 |
| 7109485 | Charged particle beam apparatus It is an object of the present invention to obtain an image which is focused on all portions of a sample and to provide a charged particle beam apparatus capable of obtaining a two-dimensional image which has no blurred part over an entire sample. In order to achiev... | 09/19/2006 |
| 7109483 | Method for inspecting substrate, substrate inspecting system and electron beam apparatus The present invention relates to a substrate inspection apparatus for inspecting a pattern formed on a substrate by irradiating a charged particle beam onto the substrate. The substrate inspection apparatus comprises: an electron beam apparatus including a charged p... | 09/19/2006 |
| 7109484 | Sheet beam-type inspection apparatus An electron beam apparatus such as a sheet beam based testing apparatus has an electron-optical system for irradiating an object under testing with a primary electron beam from an electron beam source, and projecting an image of a secondary electron beam emitted by ... | 09/19/2006 |
| 7105816 | Electron beam device Disclosed here is a high resolution scanning electron microscope having an in-lens type objective lens. The microscope is structured so as to detect transmission electrons scattering at wide angles to observe high contrast STEM images according to each sample and pu... | 09/12/2006 |
| 7107117 | Sorting a group of integrated circuit devices for those devices requiring special testing A method for sorting integrated circuit (IC) devices of the type having a fuse identification (ID) into those devices requiring enhanced reliability testing and those requiring standard testing includes storing fabrication deviation data, probe data, and test data i... | 09/12/2006 |
| 7105813 | Method and apparatus for analyzing the composition of an object An ion analyzing apparatus for analyzing the composition of an object includes a chamber maintained under a vacuum, a support for supporting a plurality of objects disposed in the chamber, and a drive unit that selects one of the supported objects and rotates the se... | 09/12/2006 |
| 7105817 | Method of forming images in a scanning electron microscope An imaging device having many detector elements is used to construct multiple images of the surface of a specimen in a scanning electron microscope (SEM) using signals from different elements of the imaging device as the specimen is scanned a single time in the SEM.... | 09/12/2006 |
| 7105814 | Electron microscopy system and electron microscopy method A probe-forming electron microscopy system 1 (SEM) is proposed which comprises a position-sensitive detector 15. As a result, position-dependent secondary electron intensities in the object plane 7 or angle-dependent secondary electron intensiti... | 09/12/2006 |
| 7105815 | Method and apparatus for collecting defect images To acquire defect images even when a defect exists below an optically transparent film, an electron optical system of an electron microscope is set to a first imaging condition. A defect position of a specimen is set so as to fall within the visual field of the elec... | 09/12/2006 |
| 7102145 | System and method for improving spatial resolution of electron holography A method for enhancing spatial resolution of a transmission electron microscopy TEM) system configured for electron holography. In an exemplary embodiment, the method includes configuring a first lens to form an initial virtual source with respect to an incident par... | 09/05/2006 |
| 7098453 | Scanning probe microscopy system and method of measurement by the same A scanning probe microscopy system has a cantilever having a probe at a distal end thereof and a heating unit for heating the sample. A moving unit effects relative movement between the cantilever probe and the sample to bring the cantilever probe into contact with ... | 08/29/2006 |
| 7098456 | Method and apparatus for accurate e-beam metrology One embodiment disclosed relates to a method for accurate electron beam metrology. A substrate with a target feature is loaded into a scanning electron microscope. An electron beam is scanned over the target feature, and scattered electrons are detected therefrom. A... | 08/29/2006 |
| 7098457 | Electron beam apparatus and device manufacturing method using same A defect inspecting apparatus is provided for generating a less distorted test image to reliably observe a surface of a sample for detecting defects thereon. The defect detecting apparatus comprises a primary electron beam source for irradiating a sample, electrosta... | 08/29/2006 |
| 7096711 | Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby A characterizer for determining the shape of a probe tip for an atomic force microscope and methods of fabricating and using the characterizer. The characterizer includes a micromachined crystalline structure with opposed edges separated by a width suitable for char... | 08/29/2006 |
| 7098454 | Method of sample preparation for atom probes and source of specimens A specimen for atom probe analysis is prepared by providing a slab of material from which the specimen will be taken; defining a plurality of posts in the slab by in the slab; removing at least one post from the slab; and mounting the post. The post is shaped to a t... | 08/29/2006 |
| 7098620 | Minute object manipulating apparatus A minute object manipulating apparatus includes a tool which manipulates a manipulation target object, an observation unit capable of changing the magnification for observating the manipulation target object and tool, a display unit which displays magnified images o... | 08/29/2006 |
| 7095020 | Sensing mode atomic force microscope An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magne... | 08/22/2006 |
| 7095021 | Method, apparatus and system for specimen fabrication by using an ion beam Disclosed are a method and system for separating and preparing a sample for analysis from a wafer without contaminating the wafer with an element such as Ga which would raise a problem in the process. The ion beam process system comprises a first ion beam process ap... | 08/22/2006 |
| 7095035 | Demagnification measurement method for charged particle beam exposure apparatus, stage phase measurement method for charged particle beam exposure apparatus, control method for charged particle beam exposure apparatus, and charged particle beam exposure apparatus A method for measuring a demagnification of a charged particle beam exposure apparatus includes measuring a first stage position of a mask stage in accordance with a mask stage coordinate system, irradiating a first charged particle beam to a first irradiation posit... | 08/22/2006 |
| 7095023 | Charged particle beam apparatus, charged particle detection method, and method of manufacturing semiconductor device A charged particle beam apparatus includes: a charged particle beam source which generates a charged particle beam to irradiate the charged particle beam onto a specimen; a demagnification optical system which demagnifies the charged particle beam; a deflector which... | 08/22/2006 |
| 7095024 | TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope The problem of the present invention is to provide a TEM sample equipped with an identifying function for easily specifying a detailed TEM sample and to provide a system for handling the management of information relating to the TEM sample using the TEM when making ... | 08/22/2006 |
| 7091486 | Method and apparatus for beam current fluctuation correction One embodiment disclosed relates to an electron beam imaging apparatus. An electron source is configured to generate an electron beam, and a beam-limiting aperture is configured to block a portion of the electron beam and to allow transmission of another portion of ... | 08/15/2006 |
| 7091484 | Method and apparatus for crystal analysis The method of measuring crystallographic orientations, crystal systems or the like of the surface of a specimen has steps of: irradiating the specimen with an ion beam; measuring the secondary electrons generated by the irradiation of the ion beam; repeating the irr... | 08/15/2006 |
| 7091485 | Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles A pattern is inspected by acquiring a scanning electron microscope picture of an inspection pattern, and acquiring a scanning electron microscope secondary electron signal profile of the inspection pattern. A determination is made as to whether the inspection patter... | 08/15/2006 |
| 7088852 | Three-dimensional tomography Defect analysis of a semiconductor die is enhanced in a manner that makes possible the viewing of spatial manifestations of the defect from virtually any angle. According to an example embodiment of the present invention, substrate is removed from a semiconductor di... | 08/08/2006 |
| 7084400 | Lattice strain measuring system and method A lattice strain measuring method including the steps of: using a scanning transmission electron microscope 12 to apply convergent electron beams 34 to a sample 32 and obtain a convergent-beam electron diffraction image 36 of the sample | 08/01/2006 |
| 7085676 | Feed forward critical dimension control Feed forward techniques can be used to improve optical metrology measurements for microelectronic devices. Metrology tools can be used to measure parameters such as critical dimension, profile, index of refraction, and thickness, as well as various material properti... | 08/01/2006 |
| 7085911 | Resizable cache sensitive hash table A hash table for a collection of data items includes a set of hash buckets, each hash bucket being associated with a subset of the collection of data items, and a set of properties entries in each of the hash buckets. Each properties entry includes a pointer to an a... | 08/01/2006 |
| 7084399 | Ion beam apparatus and sample processing method For the sake of realizing high throughput and high processing position accuracy in an ion beam apparatus, two kinds of ion beams for processing are prepared of which one is a focusing ion beam for high image resolution and an edge processing ion beam of large beam c... | 08/01/2006 |
| 7081621 | Laminated lens for focusing ions from atmospheric pressure A thin laminated high transmission electro-optical lens populated with a plurality of apertures in communication with its laminates used to improve the collection, focusing, and selection of ions generated from atmospheric pressure sources, such as electrospray, atm... | 07/25/2006 |
