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Class 219/121.43 - With chamber


Subclass of Class 219 - Electric heating
Definition: Subject matter wherein eroding or abrading of the workpiece
No. of patents: 610
Last issue date: 04/10/2012


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NumberTitleIssue Date
6369349Plasma reactor with coil antenna of interleaved conductors
The invention is embodied in a coil antenna for radiating RF power supplied by an RF source into a vacuum chamber, the coil antenna including plural helical conductors each having a first end and a second end, the first ends being adapted for connection t...
04/09/2002
6363881Plasma chemical vapor deposition apparatus
Disclosed is a plasma chemical vapor deposition apparatus for forming an amorphous thin film, a microcrystalline thin film or a polycrystalline thin film on a surface of a target substrate by utilizing a glow discharge generated by an electric power suppl...
04/02/2002
6359250RF matching network with distributed outputs
An apparatus for distributing RF power outputs to a first electrode in a parallel plate electrode system for generating plasma in depositing films on a substrate. A RF power output is applied to a distributed RF matching network to excite a plasma from a ...
03/19/2002
6355902Plasma film forming method and plasma film forming apparatus
Microwave is introduced into a plasma chamber of a plasma processing apparatus and magnetic field is applied thereto to allow plasma generation gas to be placed in plasma state by the electron cyclotron resonance. This plasma is introduced into a film for...
03/12/2002
6354240Plasma etch reactor having a plurality of magnets
A plasma etch reactor 20 includes a upper electrode 24, a lower electrode 24, a peripheral ring electrode 26 disposed therebetween. The upper electrode 24 is grounded, the peripheral electrode 26 is powered by a high frequency AC power supply, while the l...
03/12/2002
6353201Discharge electrode, RF plasma generation apparatus using the same, and power supply method
A plurality of electrode bars are arranged in parallel with each other, and side electrode bars are connected to the corresponding opposite ends of the electrode bars, thereby forming a ladder-like RF discharge electrode. Power supply points are arranged ...
03/05/2002
6353206Plasma system with a balanced source
A plasma system which is to be coupled to a power source, the plasma system including a chamber defining an internal cavity in which a plasma is generated during operation; a coil which during operation couples power from the power source into the plasma ...
03/05/2002
6353210Correction of wafer temperature drift in a plasma reactor based upon continuous wafer temperature measurements using and in-situ wafer temperature optical probe
The invention solves the problem of continuously monitoring wafer temperature during processing using an optical or fluoro-optical temperature sensor including an optical fiber having an end next to and facing the backside of the wafer. This optical fiber...
03/05/2002
6348669RF/microwave energized plasma light source
Apparatus for radiating energy at one or more predetermined wavelength comprising: a housing (4), a source of microwave energy coupled to and located outside the housing and a window forming part of the wall of the housing, the window being formed from a ...
02/19/2002
6339206Apparatus and method for adjusting density distribution of a plasma
An apparatus and method for adjusting a distribution of a density of a plasma and/or a distribution of a chemical composition of a plasma, thereby adjusting the characteristics of a reaction used to process a substrate. The distribution of the density and...
01/15/2002
6337292Method of forming silicon oxide layer and method of manufacturing thin film transistor thereby
The present method of forming a silicon oxide layer comprises providing two frequency excitation plasma CVD device which comprises a high frequency electrode, a susceptor electrode, and two matching box for impedance matching between the electrodes and a ...
01/08/2002
6326597Temperature control system for process chamber
Temperature control of a process chamber 25 is achieved by directing a flow of gas at an external surface 100 of the chamber 25. In one aspect, gas directed at the chamber 25 passes through a gas flow amplifier 115 that increases the gas flow. Gas for the...
12/04/2001
6323455Separation of isotopes by ionisation for processing of nuclear fuel materials
Processing apparatus and methods are provided which involve the selective ionization of a feed material; the separation of ionized and non-ionized species; a selective excitation of the still ionized species; introduction of a chemical material to cause s...
11/27/2001
6323454Apparatus employable for ashing
A method for ashing a resist pattern covered by a hardened layer caused by an ion implantation process previously conducted including a first step for conducting an ashing process at a first temperature e.g. 120° C. or less at which no popping phenomenon...
11/27/2001
6320320Method and apparatus for producing uniform process rates
A plasma processing apparatus for processing a substrate with a plasma is disclosed. The apparatus includes a first RF power source having a first RF frequency, and a process chamber. Further, the apparatus includes a substantially circular antenna operat...
11/20/2001
6313428Apparatus and method for reducing space charge of ion beams and wafer charging
An apparatus for ion beam neutralization is disclosed in this invention. The apparatus is a plasma flood source with an arc discharge chamber enclosed in a source housing with sufficient cooling so that the housing temperature is near room temperature. Ar...
11/06/2001
6307174Method for high-density plasma etching
A method for high-density plasma etching. A substrate is provided. A material layer is formed on the substrate. A patterned photo-resist layer is formed on the oxide layer. The material layer is patterned by the high-density plasma etching, simultaneously...
10/23/2001
6303895Method and apparatus for controlling a temperature of a wafer
A method and apparatus for controlling a temperature of a wafer during processing such as in a gas plasma or nonplasma environment wherein a wafer is positioned on a chuck. The wafer is heated and a pressurized gas is introduced into a space between the w...
10/16/2001
6297468Inductively coupled plasma reactor with symmetrical parallel multiple coils having a common RF terminal
The invention is embodied in a coil antenna for radiating RF power supplied by an RF source into a vacuum chamber of an inductively coupled plasma reactor which processes a semiconductor wafer in the vacuum chamber, the reactor having a gas supply inlet f...
10/02/2001
6291793Inductively coupled plasma reactor with symmetrical parallel multiple coils having a common RF terminal
The invention is embodied in a coil antenna for radiating RF power supplied by an RF source into a vacuum chamber of an inductively coupled plasma reactor which processes a semiconductor wafer in the vacuum chamber, the reactor having a gas supply inlet f...
09/18/2001
6288357Ion milling planarization of semiconductor workpieces
A method and apparatus is presented for planarizing or polishing workpiece surfaces using an ion beam in the presence of a radio frequency generated plasma. A workpiece is placed in a holder within a vacuum chamber equipped with a radio frequency inductiv...
09/11/2001
6281469Capacitively coupled RF-plasma reactor
A capacitively coupled RF plasma reactor allows treatment of large workpiece surfaces with an accurate control of ion bombardment onto the respective electrode surfaces and thus an adjacent workpiece, be it to a desired low or to a desired high level. The...
08/28/2001
6271498Apparatus for vaporizing liquid raw material and method of cleaning CVD apparatus
A vaporizing apparatus has a vaporizing container into which a liquid raw material is introduced and which is made of metal, a heater for heating the vaporizing container to vaporize liquid introduced into the vaporizing container and a metal nozzle (an e...
08/07/2001
6268582ECR plasma CVD apparatus
An ECR plasma CVD apparatus includes a cavity for producing an ECR plasma, a vacuum chamber connected to the cavity, a base plate holder for holding a base plate or substrate, an electrode plate, and a high frequency applying device for applying a high fr...
07/31/2001
6239404Plasma processing apparatus
Plasma processing apparatus frequently incorporates an antenna fed from a power supply and in this invention a power supply feeds a conventional matching circuit (10), which in turn is connected to the primary (11) of a transformer (12). The antenna (15) ...
05/29/2001
6239403Power segmented electrode
A power segmented electrode useful as part of an upper electrode and/or substrate support for supporting a substrate such as a semiconductor wafer in a plasma reaction chamber such as a single wafer etcher. The power segmented electrode includes a plurali...
05/29/2001
6239402Aluminum nitride-based sintered bodies, corrosion-resistant members, metal-buried articles and semiconductor-holding apparatuses
An aluminum nitride-based sintered body is disclosed, which includes aluminum nitride as a main ingredient and magnesium and has a polycrystalline structure composed of aluminum nitride crystals....
05/29/2001
6225592Method and apparatus for launching microwave energy into a plasma processing chamber
A method and apparatus for launching microwave energy to a plasma processing chamber in which the required magnetic field is generated by a permanent magnet structure and the permanent magnet material effectively comprises one or more surfaces of the wave...
05/01/2001
6222153Pulsed-plasma incineration method
A method for the incineration of a fluid or fluidizable material by use of a pulsed plasma is disclosed. The plasma is produced by a confined discharge in a closed chamber having an exit port and containing an ablating material. The method comprises the f...
04/24/2001
6218640Atmospheric pressure inductive plasma apparatus
An inductive plasma torch operating at atmospheric pressure is used for wafer or glass substrate processing. Said torch employs a linear type of plasma confinement. This linear torch is particularly suitable for photoresist etching and processes in which ...
04/17/2001
6215087Plasma film forming method and plasma film forming apparatus
Microwave is introduced into a plasma chamber of a plasma processing apparatus and magnetic field is applied thereto to allow plasma generation gas to be placed in plasma state by the electron cyclotron resonance. This plasma is introduced into a film for...
04/10/2001
6201208Method and apparatus for plasma processing with control of ion energy distribution at the substrates
In plasma processing, a bias voltage is provided from a power supply through a DC blocking capacitor to a platform on which a substrate to be treated is supported within a plasma reactor. The periodic bias voltage applied to the DC blocking capacitor has ...
03/13/2001
6201221Method and apparatus for heat regulating electronics products
A heating/cooling apparatus for electronic components of a wireless base station is described. The apparatus includes a heat exchanger having a material-filled chamber and a plurality of extrusions. The chamber is located adjacent to the electronic compon...
03/13/2001
6198067Plasma processing device for circuit supports
Many boards 7 to be processed are disposed within a metal chamber 1 in an isolated state, and many ground electrode plates 9 are disposed near by both surfaces of the boards 7 so as to be at the same potential as the chamber 1. While a microwave generated...
03/06/2001
6191399System of controlling the temperature of a processing chamber
A CVD processing reactor employs a pyrometer to control temperature ramping. The pyrometer is calibrated between wafer processing by using a thermocouple that senses temperature during a steady state portion of a processing operation....
02/20/2001
6184489Particle-removing apparatus for a semiconductor device manufacturing apparatus and method of removing particles
In a semiconductor device manufacturing apparatus that processing a substrate by applying a voltage to a gas to create a plasma, positively charged particles are trapped or guided at the instant that the cathode voltage is stopped, by an electrode to whic...
02/06/2001
6184488Low inductance large area coil for an inductively coupled plasma source
A low inductance large area coil (LILAC) is provided as a source for generating a large area plasma. The LILAC comprises at least two windings which, when connected to an RF source via impedance matching circuitry, produce a circulating flow of electrons ...
02/06/2001
6177646Method and device for plasma treatment
Plasma is generated in a vacuum chamber (1) by supplying high frequency power to a spiral antenna (5) from an antenna-use high frequency power source (4) and by supplying high frequency power to an electrode (6) by an electrode-use high frequency power so...
01/23/2001
6175095Resonant impedance-matching slow-wave ring structure microwave applicator for plasmas
A microwave applicator has exactly six equal length parallel rods equally distributed in 60° angular intervals in a circle, and at circumferential intervals that are one half the wavelength of operation of a microwave power source. The circumference is t...
01/16/2001
6172322Annealing an amorphous film using microwave energy
A system and method for annealing a film on a substrate in a processing chamber, including a microwave generator disposed to provide microwaves to an area within the interior of the chamber. The microwaves have a frequency such that the film is substantia...
01/09/2001
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