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Class 118/723FI - Focusing means for ion beam coating material or focused ion beam gas energizing means (i.e., excluding ion plating or ion implanting)


Subclass of Class 118 - Coating apparatus
No. of patents: 104
Last issue date: 01/03/2012


1      
NumberTitleIssue Date
8087379Localized plasma processing
A method of localized plasma processing improves processing speed and reduces work piece damage compared to charged particle beam deposition and etching. In one embodiment, a plasma jet exits a plasma generating chamber and activates a reactive gas. A jet of plasma ...
01/03/2012
7442946Nonuniform ion implantation apparatus and method using a wide beam
A nonuniform ion implantation apparatus comprises a wide ion beam generator for generating a wide ion beam including a plurality of wide ion beams irradiated on at least two sections among a plurality of sections into which a wafer is divided, and a wafer drive unit...
10/28/2008
7439678Magnetic and electrostatic confinement of plasma with tuning of electrostatic field
A system and method for containing plasma and forming a Field Reversed Configuration (FRC) magnetic topology are described in which plasma ions are contained magnetically in stable, non-adiabatic orbits in the FRC. Further, the electrons are contained electrostatica...
10/21/2008
7419546Gas diffusion electrodes, membrane-electrode assemblies and method for the production thereof
A method for forming a noble metal coating on a gas diffusion medium substantially free of ionomeric components comprising subjecting an electrically conductive web to a first ion beam having an energy not higher than 500 eV, then to a second beam having an energy o...
09/02/2008
7389580Method and apparatus for thin-film battery having ultra-thin electrolyte
A method and system for fabricating solid-state energy-storage devices including fabrication films for devices without an anneal step. A film of an energy-storage device is fabricated by depositing a first material layer to a location on a substrate. Energy is suppl...
06/24/2008
7241360Method and apparatus for neutralization of ion beam using AC ion source
There is provided by this invention a unique ion source for depositing thin films on a substrate in a vacuum chamber that neutralizes the positive electric charges that develop on the substrate and vacuum chamber apparatus that may cause arcing and degradation of th...
07/10/2007
7194801Thin-film battery having ultra-thin electrolyte and associated method
A method and system for fabricating solid-state energy-storage devices including fabrication films for devices without an anneal step. A film of an energy-storage device is fabricated by depositing a first material layer to a location on a substrate. Energy is suppl...
03/27/2007
7183559Ion source with substantially planar design
In certain example embodiments of this invention, there is provide an ion source including an anode and a cathode. In certain example embodiments, the cathode does not overhang over the anode, or vice versa. Since no, or fewer, areas of overhang are provided between...
02/27/2007
7180242Formation of a field reversed configuration for magnetic and electrostatic confinement of plasma
A system and method for containing plasma and forming a Field Reversed Configuration (FRC) magnetic topology are described in which plasma ions are contained magnetically in stable, non-adiabatic orbits in the FRC. Further, the electrons are contained electrostatica...
02/20/2007
7171918Focused ion beam deposition
Introducing at least one metal such as cobalt, molybdenum, metal carbonyl, tungsten, platinum, or other suitable metal to a focused ion beam. Introducing the focused ion beam to a substrate within a processing chamber. Forming at least one layer over a substrate. Ap...
02/06/2007
7126284Formation of a field reversed configuration for magnetic and electrostatic confinement of plasma
A system and method for containing plasma and forming a Field Reversed Configuration (FRC) magnetic topology are described in which plasma ions are contained magnetically in stable, non-adiabatic orbits in the FRC. Further, the electrons are contained electrostatica...
10/24/2006
7119491Magnetic and electrostatic confinement of plasma with tuning of electrostatic field
A system and method for containing plasma and forming a Field Reversed Configuration (FRC) magnetic topology are described in which plasma ions are contained magnetically in stable, non-adiabatic orbits in the FRC. Further, the electrons are contained electrostatica...
10/10/2006
7109487Particle beam device
A particle beam device, in particular an electron microscope, having at least two particle beam columns and one object slide having a receiving surface for receiving an object. The particle beam device makes it possible to align the surface of the object perpendicul...
09/19/2006
7105813Method and apparatus for analyzing the composition of an object
An ion analyzing apparatus for analyzing the composition of an object includes a chamber maintained under a vacuum, a support for supporting a plurality of objects disposed in the chamber, and a drive unit that selects one of the supported objects and rotates the se...
09/12/2006
7094312Focused particle beam systems and methods using a tilt column
Particle beam systems and methods for interacting with a workpiece according to this invention include a work stage assembly and a first particle beam source. The work stage assembly is adapted a) for supporting a workpiece, b) for translating along a first axis, c)...
08/22/2006
7087525Methods of forming layers over substrates
The invention includes methods of forming films over substrates. A substrate is provided within a reaction chamber, and a mixture is also provided within the chamber. The mixture comprises a precursor of a desired material within a supercritical fluid. The precursor...
08/08/2006
7033647Method of synthesising carbon nano tubes
Method of synthesizing carbon nano tubes (CNTs) on a catalyst layer formed on a support member, by catalytic deposition of carbon from a gaseous phase, whereby an ion beam is used prior to, during, and/or after formation of the carbon nano tubes for modifying the ph...
04/25/2006
7026763Apparatus for magnetic and electrostatic confinement of plasma
An apparatus and method for containing plasma and forming a Field Reversed Configuration (FRC) magnetic topology are described in which plasma ions are contained magnetically in stable, non-adiabatic orbits in the FRC. Further, the electrons are contained electrosta...
04/11/2006
7023128Dipole ion source
A dipole ion source (FIG. 1) includes two cathode surfaces, a substrate (1) and a pole (3); wherein a gap is defined between the substrate and the pole; an unsymmetrical mirror magnetic field including a compressed end, wherein the substrate is ...
04/04/2006
7015646Magnetic and electrostatic confinement of plasma with tuning of electrostatic field
A system and method for containing plasma and forming a Field Reversed Configuration (FRC) magnetic topology are described in which plasma ions are contained magnetically in stable, non-adiabatic orbits in the FRC. Further, the electrons are contained electrostatica...
03/21/2006
6995515Formation of a field reversed configuration for magnetic and electrostatic confinement of plasma
A system and method for containing plasma and forming a Field Reversed Configuration (FRC) magnetic topology are described in which plasma ions are contained magnetically in stable, non-adiabatic orbits in the FRC. Further, the electrons are contained electrostatica...
02/07/2006
6988463Ion beam source with gas introduced directly into deposition/vacuum chamber
An ion source is provided wherein depositing gas and/or maintenance gas is/are introduced into the ion source via the vacuum/depositing chamber, thereby reducing the amount(s) of undesirable insulative build-ups on the anode and/or cathode of the source in an area p...
01/24/2006
6957624Apparatus and a method for forming an alloy layer over a substrate
One embodiment of the invention involves introducing at least two metals into a chamber for forming an alloy layer over a substrate. This is accomplished by a variety of methods. In one embodiment, at least two metals are mixed and introduced into a chamber in which...
10/25/2005
6930316Ion implantation system and ion implantation method
In an ion implantation system including (a) an ion source (b) a mass analyzing portion, (c) an ion acceleration portion, (d) an ion beam focusing/deflecting portion, and (e) an end station chamber for implanting ions onto a semiconductor substrate. The ion source co...
08/16/2005
6911779Magnetic mirror plasma source
The preferred embodiments described herein provide a magnetic mirror plasma source. While the traditional magnetic/electrostatic confinement method is ideal for many applications, some processes are not best served with this arrangement. The preferred embodiments de...
06/28/2005
6874443Layer-by-layer etching apparatus using neutral beam and etching method using the same
A layer-by-layer etching apparatus and an etching method using a neutral beam which enables to control etching depth to an atomic level by controlling the etching of each atom of a material layer to be etched under precise control of the supply of an etching gas and...
04/05/2005
6799531Method for making films utilizing a pulsed laser for ion injection and deposition
A simple, relatively inexpensive, yet effective PLD method is provided for forming extremely clean films with reduced particulate densities and size. A PLD system is used for producing the thin films and includes a PLD chamber wherein a laser beam ablates a target m...
10/05/2004
6733590Method and apparatus for multilayer deposition utilizing a common beam source
A single, or common, ion beam source is utilized for ion beam deposition (IBD) of defect-free multilayer coatings, e.g., multilayer, carbon-based protective overcoats for magnetic and/or magneto-optical (MO) data recording/information storage and retrieval media suc...
05/11/2004
6669824Dual-scan thin film processing system
A deposition system is described. The deposition system includes a deposition source that generates deposition flux comprising neutral atoms and molecules. A shield defining an aperture is positioned in the path of the deposition flux. The shield passes t...
12/30/2003
6663747Apparatus and method for enhancing the uniform etching capability of an ion beam grid
A shaper for an ion beam gun has a plate with a non-symmetrical profile including notches and tabs. The shaper is mounted to the surface of an ion beam grid having an array of holes. The shaper is oriented radially on the grid and covers some of the holes...
12/16/2003
6664740Formation of a field reversed configuration for magnetic and electrostatic confinement of plasma
A system and method for containing plasma and forming a Field Reversed Configuration (FRC) magnetic topology are described in which plasma ions are contained magnetically in stable, non-adiabatic orbits in the FRC. Further, the electrons are contained ele...
12/16/2003
6653792Ion implanting system
An ion implanting system including an ion implanting chamber for implanting an ion into a semiconductor wafer, a load lock chamber for loading the semiconductor wafer into the ion implanting chamber, a turbo pump for creating a high vacuum atmosphere in t...
11/25/2003
6645301Ion source
An ion source for use in ion assisted deposition of films, has an ionization region, a gas supply supplying ionizable gas to the ionization region, a gas excitation system causing ionization of the gas, ion influencing means forming the ions into a curren...
11/11/2003
6533908Device and method for coating substrates in a vacuum utilizing an absorber electrode
The invention relates to a device and method for coating substrates in a vacuum, wherein a plasma is to be generated from a target and ionized particles of the plasma are to be deposited on the substrate in the form of a layer, as has long been used in a ...
03/18/2003
6526909Biased ion beam deposition of high density carbon
A device for increasing the incident energy of an ion for coating a disc in an ion beam deposition process. The ion beam deposition process is performed in a chamber with the disc to be coated disposed therein. An ion source, having a voltage level, is in...
03/04/2003
6497194Focused particle beam systems and methods using a tilt column
Particle beam systems and methods for interacting with a workpiece according to this invention include a work stage assembly and a first particle beam source. The work stage assembly is adapted a) for supporting a workpiece, b) for translating along a fir...
12/24/2002
6467426Photomask correction device
A secondary ion detector 130 senses defects on a photomask and outputs image information. The CPU 140 then displays this image information at a monitor 150. An operator then selects a pattern corresponding to a displayed defect from defect patterns record...
10/22/2002
6394025Vacuum film growth apparatus
A correction mechanism including a magnetic body (51) is placed at a position between a vacuum chamber (21) and a steering coil (23) and where line of magnetic force generated from the steering coil is present, to correct torsion and/or bias of a plasma b...
05/28/2002
6365905Focused ion beam processing apparatus
In a charged particle beam apparatus comprising an ion optical system 3 for focusing ions, a secondary charged particle detector 7 for detecting secondary charged particles produced by beam irradiation of scanning a focused ion beam 2 focused by the ion o...
04/02/2002
6331227Enhanced etching/smoothing of dielectric surfaces
A gas cluster ion beam (GCIB) etching apparatus having a system for producing a gas cluster ion beam utilized to controllably etch a substrate. The gas cluster ion beam is initially directed along a preselected longitudinal axis. A portion of the GCIB etc...
12/18/2001
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