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| Application No. | Application Title | Issue Date |
| 20120052234 | ADHESIVE STRUCTURE WITH STIFF PROTRUSIONS ON ADHESIVE SURFACE An adhesive structure is provided comprising a surface from which extend substantially cylindrical protrusions comprising a stiff resin having a Young's modulus of greater than 17 MPa. The protrusions are of sufficiently low diameter to promote adhesion by physical attr... | 03/01/2012 |
| 20110314576 | NON-LINEARITY DETERMINATION OF POSITIONING SCANNER OF MEASUREMENT TOOL Determination of non-linearity of a positioning scanner of a measurement tool is disclosed. In one embodiment, a method may include providing a probe of a measurement tool coupled to a positioning scanner; scanning a surface of a first sample with the surface at a first... | 12/22/2011 |
| 20110283784 | METHOD FOR DETERMINING A TWIST STRUCTURE Method for determining a twist structure in the surface roughness of a workpiece which is cylindrical at least in part includes that multiple sampling segments which extend in the axial direction of the workpiece and which are mutually spaced apart in the circumferentia... | 11/24/2011 |
| 20110277543 | Apparatus Having a Roughness Measurement Sensor and Corresponding Methods An apparatus having a roughness sensing system and a roughness measurement sensor, wherein a slide element and a probe tip come to operation, and method of use thereof. The slide element is arranged on an extreme end of a probe pin in the form of a scan-slide element. T... | 11/17/2011 |
| 20110203357 | Dynamic power control for nanoscale spectroscopy Dynamic IR radiation power control for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illum... | 08/25/2011 |
| 20110197665 | SURFACE TEXTURE MEASURING DEVICE A surface texture measuring device includes a threshold value storage module configured to store a threshold input through an operation key, a stylus move distance detector configured to detect a move distance in the trace direction of the stylus, a cumulative move dist... | 08/18/2011 |
| 20110162444 | LEVER-TYPE DETECTOR, STYLUS, AND AUTOMATIC STYLUS EXCHANGER A lever-type detector, a stylus, and an automatic stylus exchanger allow styluses of different types to be exchanged automatically and reduce the burden of exchanging the styluses of different types for the lever-type detector. An approximately U-shaped notch is formed ... | 07/07/2011 |
| 20110138895 | SURFACE TEXTURE MEASURING DEVICE A surface texture measuring device includes a rotation driving device configured to rotate a measured substance, a roughness detector including a stylus provided displaceably at a tip of a detector main body and at least one skid provided at the tip of the detector main... | 06/16/2011 |
| 20110083497 | SURFACE TEXTURE MEASURING MACHINE AND A SURFACE TEXTURE MEASURING METHOD A surface texture measuring machine includes: a stage, a contact-type detector having a stylus, an image probe, a relative movement mechanism and a controller. The controller includes: a center position calculating unit that, when the image probe enters position data of... | 04/14/2011 |
| 20110061452 | Microcantilever with Reduced Second Harmonic While in Contact with a Surface and Nano Scale Infrared Spectrometer Described herein are devices and methods for sensing pulsed forces. Some of the described devices and methods are also useful for measuring infrared absorbances and compiling spectral and chemical maps of surfaces. Also described are microcantilever having reduced harmo... | 03/17/2011 |
| 20110041593 | MATERIAL MEASURES FOR USE IN EVALUATING PERFORMANCE OF MEASURING INSTRUMENT FOR MEASURING SURFACE TEXTURE A material measure for use in evaluating the performance of a measuring instrument for measuring surface texture includes: a measurement area having a plurality of grooves in a predetermined direction. With the configuration, each of the grooves has a simple cross-secti... | 02/24/2011 |
| 20110016956 | Surface texture measuring instrument A surface texture measuring instrument includes a force sensor (1), an actuator (11) and a detector (12). The surface texture measuring instrument further includes: a scanning controller (54) that collects a detection signal from the force se... | 01/27/2011 |
| 20110005307 | Surface texture measuring instrument A surface texture measuring instrument includes a force sensor (1), an actuator (11) and a detector (12). The surface texture measuring instrument further includes: a scanning controller (54) that collects a detection signal from the force se... | 01/13/2011 |
| 20100312495 | INTERMODULATION SCANNING FORCE SPECTROSCOPY We have invented a method of sensing a surface by driving a resonator with two or more frequencies and exploiting the nonlinear phenomenon of intermodulation. When a resonator (for example an oscillating cantilever) with a sharp tip is brought close to a surface, the no... | 12/09/2010 |
| 20100306884 | Scanning Probe Microscope having Improved Optical Access A scanning probe microscope and method for using the same are disclosed. The Scanning probe microscope includes a probe mount for connecting a cantilever arm and a probe signal generator. The probe position signal generator generates a position signal indicative of a po... | 12/02/2010 |
| 20100288033 | METHOD AND APPARATUS FOR MEASURING SURFACE PROFILE OF SAMPLE A method for measuring surface profile of a sample, wherein jumping of a probe can be constrained without applying strong force to the sample, and an apparatus employing such a method. Control operation consists of detection of displacement in a probe in the vertical di... | 11/18/2010 |
| 20100212412 | METHOD OF DISPLAYING CONTOURS OF A SURFACE OF A BEARING Contours of a surface of a bearing which extends about an axis are displayed on a grid. To visualize the contours, points on the surface are measured at a plurality of angular positions to determine the corresponding measured values. The measured values at each angular ... | 08/26/2010 |
| 20100206057 | SYSTEM AND METHOD FOR MEASURING SURFACE ENERGIES An apparatus (402) and method for measuring a surface energy of a test surface (12), which includes a viscoelastic polymer layer (20), disposed on a moveable component (34), that is compressed against the test surface (12) with a compr... | 08/19/2010 |
| 20100154521 | Determining a Repairing Form of a Defect at or Close to an Edge of a Substrate of a Photo Mask Determining a repairing form of a defect at or close to an edge of a substrate. The defect may be scanned with a scanning probe microscope to determine a three-dimensional contour of the defect. The defect may be scanned with a scanning particle microscope to determine ... | 06/24/2010 |
| 20100140473 | NANOROBOT MODULE, AUTOMATION AND EXCHANGE A nanorobot module with a measurement device for the measurement of spatial surface properties with a measurement range in the centimetre range and a resolution in the nanometre range, that can be arranged in a vacuum chamber, for example the vacuum chamber of a microsc... | 06/10/2010 |
| 20100132442 | Measurement of Roughness of a Playing Surface A device (60) and method for measuring the roughness of a playing surface are described. The device includes a carriage (12) which can travel over the playing surface, a rotatable member (80) which can roll over the playing surface, a restraint (... | 06/03/2010 |
| 20100116038 | FEEDBACK- ENHANCED THERMO-ELECTRIC TOPOGRAPHY SENSING A method is provided for determining the topography of an object. A micro-cantilever with a scanning tip is provided. The micro-cantilever includes a thermal sensor. A biased voltage is applied across the thermal sensor. A resistance change of the thermal sensor is then... | 05/13/2010 |
| 20100107745 | Off-axis imaging for indentation instruments Modifications to the indenter probe tips and transducer, and proper selection of optics in an indentation system allow straight down or slightly angled optical viewing of the sample surface under the indentation tip by a microscope, by providing an optical path through ... | 05/06/2010 |
| 20100081362 | APPARATUS AND METHODS FOR TESTING THE POLISHABILITY OF MATERIALS A method and apparatus for measuring the polishability of a solid material such as a dental restorative material includes using a series of apparatus to perform the steps of forming the material into a desired specimen with a generally planar surface, conditioning the s... | 04/01/2010 |
| 20100071447 | Production Method Of A Sensor Film The present invention relates to a production method for producing a sensor film for measuring cracks of a material surface using the comparative vacuum measurement method. A gallery having a predetermined gallery course is milled along a surface of the sensor film usin... | 03/25/2010 |
| 20100064784 | PROBE TIP To eliminate or otherwise reduce unintended movement of a probe tip of a probe assembly being held by a probe arm, the probe assembly includes one or more resilient members that compensate for the contraction or expansion of the probe arm in accordance with the coeffici... | 03/18/2010 |
| 20100058846 | Signal Coupling System For Scanning Microwave Microscope A signal coupling system interposed between a scanning probe and a measurement instrument provides signal communication between the scanning probe and the measurement instrument. The signal coupling system has a pre-stressed shape when the scanning probe is in a neutral... | 03/11/2010 |
| 20100037682 | BIOSENSOR BASED ON POLYMER CANTILEVERS A microcantilever sensor includes a supporting substrate, a cantilever spring element at least partially disposed over the support substrate, a probe layer disposed over the first side of the cantilever spring element, and a piezoresistive transducer attached to the sec... | 02/18/2010 |
| 20100005868 | High Resolution Surface Potential Microscope A scanning probe system and method for using the same are disclosed. The system includes a probe that interacts with a specimen. The probe is caused to vibrate at a first frequency of the probe. A probe deflection signal indicative of an oscillation amplitude of the pro... | 01/14/2010 |
| 20100011472 | Apparatus And Method For The Detection Of Forces In The Sub-Micronewton Range A force microscope for the detection of forces in the sub-micronewton range has a measurement head which is used to carry out a relative movement with respect to a sample holder and to which a carrier molecule is attached on which probe molecules are placed.... | 01/14/2010 |
| 20100000307 | MEASURING INSTRUMENT A surface texture measuring instrument includes a contact piece to be in contact with an object, a sensor driving mechanism that moves the contact piece along the surface of the object, a controller that controls the sensor mechanism, and a force sensor that detects a m... | 01/07/2010 |
| 20090320575 | SURFACE EVALUATION EMPLOYING ORTHOGONAL FORCE MEASUREMENT A method for evaluating a performance of a substrate surface including applying a normal force with a probe to a surface of a substrate, the normal force being substantially perpendicular to the surface, and moving the probe across the surface to generate a force agains... | 12/31/2009 |
| 20090320624 | Method for Preparing Specimens for Atom Probe Analysis and Specimen Assemblies Made Thereby A method for making a specimen assembly for atom probe analysis in an energetic-beam instrument includes milling a post near a region of interest in a sample in the energetic-beam instrument, so that the post has a free end. The probe tip of a nano-manipulator probe sha... | 12/31/2009 |
| 20090300930 | SURFACE SHAPE MEASURING APPARATUS AND SURFACE SHAPE MEASURING METHOD In a surface shape measurement device that measures the surface shape of a sample (W1, W2) by moving a probe (16, 26) in a sliding fashion along the surface of the sample (W1, W2) and thereby detecting the amount of displacement of the... | 12/10/2009 |
| 20090293632 | DEFLECTABLE MICROMECHANICAL SYSTEM AND USE THEREOF The invention relates to deflectable micromechanical systems as well as their use in which the deflection of at least one deflectable element can be determined. In accordance with the invention, a deflectable element is held with at least one spring element and at least... | 12/03/2009 |
| 20090288479 | STANDING WAVE FLUIDIC AND BIOLOGICAL TOOLS The present invention provides standing wave fluidic and biological tools, including: at least one elongated fiber that has mesoscale (i.e. milliscale), microscale, nanoscale, or picoscale dimensions, the at least one elongated fiber having a first end and a second end;... | 11/26/2009 |
| 20090261249 | SCANNING PROBE MICROSCOPE APPARATUS There is provided a scanning probe microscope apparatus which has a high sensitivity for the interaction between the cantilever and the sample and comprises a cantilever that can oscillate stably in dynamic mode even when a mechanical Q value is low. | 10/22/2009 |
| 20090249867 | Displacement Detector A displacement detector capable of making a measurement in two directions of measurement 180 degrees different from each other without the need of a switching operation has been disclosed. This displacement detector comprises a contact arm 41 supported rotatably ... | 10/08/2009 |
| 20090242764 | SPIN-TORQUE PROBE MICROSCOPE A spin-torque probe microscope and methods of using the same are described. The spin-torque probe microscope includes a cantilever probe body, a magnetic tip disposed at a distal end of the cantilever probe body, an electrically conductive sample disposed proximate to t... | 10/01/2009 |
| 20090241648 | Reducing Noise In Atomic Force Microscopy Measurements Exchanging data between an Atomic Force Microscopy (AFM) measuring device and an external controlling device using a wireless link. The wireless link replaces cables leading to the AFM measuring device and thereby mitigates mechanical noise vibrations. The controlling d... | 10/01/2009 |
