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| Application No. | Application Title | Issue Date |
| 20120053877 | METHOD FOR DETECTING ATYPICAL ELECTRONIC COMPONENTS A method for detecting atypical electronic components for the quality control of a set of n electronic components at the end of the manufacturing process, the components being subject to a number p of unit tests providing digital data, this set of n components consistin... | 03/01/2012 |
| 20110307203 | PREDICTIVE AND INTERNET-BASED SAMPLER CONTROL Described is a system for remotely monitoring water quality at one or more locations via a web-enabled application.... | 12/15/2011 |
| 20110290694 | ORAL FILM DOSAGE FORM HAVING INDICIA THEREON The present invention relates to rapidly dissolving edible film dosage form incorporating indicia. The indicia may correspond to an active ingredient that may be evenly distributed throughout the film. The indicia may be associated with at least one surface of the film ... | 12/01/2011 |
| 20110288803 | METHOD FOR INSPECTING QUALITY OF GLASS PLATE The present invention provides a quality inspection method of a glass plate, which can predict the shape of the glass plate on a four-point supporting type actual measurement inspection stand from the shape of the glass plate on a three-point supporting type universal a... | 11/24/2011 |
| 20110246111 | Real-Time Monitoring, Feedback, Identification and Labeling Systems for Condom and Glove Products Quality Information and Methods Thereof The present invention pertains to the technical fields of production and testing of condom and glove products. The invention specifically discloses a type of real-time monitoring, feedback, identification and consistent labeling system for quality information of condom ... | 10/06/2011 |
| 20110172942 | SYSTEMS AND METHODS FOR INDICATING AN AMOUNT OF USE OF A SENSOR Aspects of the present disclosure include systems and methods for indicating an amount of use of a pulse oximetry sensor. According to one embodiment, the system includes an oximeter that monitors the amount of use for a given sensor. The oximeter and/or the sensor may ... | 07/14/2011 |
| 20110137596 | QUALITY CONTROL METHOD AND MICRO/NANO-CHANNELED DEVICES Embodiments of the present invention comprise a quality control system and method for testing micro- or nano-channeled devices. The system and method can utilize a pressure-driven gas flow for the detection and quantification of structural defects. The test method and s... | 06/09/2011 |
| 20110137597 | METHOD AND APPARATUS FOR ANALYSIS OF CONTINOUS DATA USING BINARY PARSING A method, apparatus, and a system for generating a binary mapping of wafer regions using measured value. A first measured value relating to processing a first workpiece is acquired. A second measured value relating to a second workpiece is acquired. At least a first reg... | 06/09/2011 |
| 20110054819 | Method and System for Modeling in Semiconductor Fabrication A method for use in semiconductor fabrication is provided that includes providing manufacturing data of a semiconductor process, providing a plurality of functional transformations, optimizing each of the functional transformations based on the manufacturing data, selec... | 03/03/2011 |
| 20100241380 | SYSTEM FOR MAPPING VEHICLE MUTILATION DEFECTS A system and method for analyzing mutilation defects including a benchmark image of a part and a grid having a plurality of cells plotted onto the benchmark image is provided. The system further includes a computer processing unit having an interface operable to associa... | 09/23/2010 |
| 20100217554 | Method of Inspecting Equipment A method of inspecting equipment to ensure quality control that employs a computer program to assist in the inspection. The program contains an inspection protocol adapted to specific equipment. The inspector follows the protocol to inspect component parts of the equipm... | 08/26/2010 |
| 20100094578 | METHOD AND DEVICE FOR RECALIBRATING PRODUCTION PROCESSES Usually in automated production processes, new model ranges must be created and new calibrations carried out which may be costly, if a product is perfected or individual ingredients are exchanged. The aim of the invention is to simplify and also automate the recalibrati... | 04/15/2010 |
| 20100004772 | SYSTEMS AND METHODS FOR MANAGING MATERIAL STORAGE VESSELS HAVING INFORMATION STORAGE ELEMENTS Material management systems and methods include material storage vessels with information (e.g., electronic information) storage. Information may be communicated from a storage device to a process tool controller and employed to set or adjust a process tool operating pa... | 01/07/2010 |
| 20090299669 | Method of yield management for semiconductor manufacture and apparatus thereof A method of yield management for semiconductor manufacture and an apparatus thereof are provided. The method includes the following steps. Defect data of a layer of a semiconductor wafer is obtained, wherein the defect data includes sizes and locations of defects with r... | 12/03/2009 |
| 20090299670 | PROCESS CONTROL DEVICE AND PROCESS CONTROL METHOD A process control device includes: a determination unit reading device data generated by sensors provided at a process device and determining whether the process device is in a normal state or not; a correction value calculation unit calculating a correction value of a ... | 12/03/2009 |
| 20090281755 | RECIPE PARAMETER MANAGEMENT SYSTEM AND RECIPE PARAMETER MANAGEMENT METHOD In operation to obtain an optimal observation condition in a review system, the number of trial reviews can be reduced to improve efficiency of the operation. For a defect review conducted by the review system, a recipe parameter management system stores, as recipe para... | 11/12/2009 |
| 20090228217 | DEFECT INSPECTION METHOD A recipe server executes an inspection region setup process for designating the inspection region of the object of inspection as the initial setting of a recipe; the recipe server executes optical condition setup process for setting an optical condition for the image pi... | 09/10/2009 |
| 20090210183 | DETERMINING AND ANALYZING INTEGRATED CIRCUIT YIELD AND QUALITY Methods, apparatus, and systems for computing, analyzing, and improving integrated circuit yield and quality are disclosed herein. For example, in one exemplary method disclosed herein, information is received from processing test responses of integrated circuits design... | 08/20/2009 |
| 20090198465 | Proximity sensing systems for manufacturing quality control A manufacturing quality control system for monitoring the proximity of a workpiece to a machine tool is disclosed. The system includes a proximity sensor attached to the machine tool for deriving a first distance measurement based upon the distance between the workpiece... | 08/06/2009 |
| 20090076755 | System and Method for Integrating the Internal and External Quality Control Programs of a Laboratory A system and method that enables a laboratory to integrate its internal and external quality control programs to thereby control the quality of its laboratory testing services. The system comprises a storage device and a processor operable to maintain in the storage dev... | 03/19/2009 |
| 20090018788 | Normalization of process variables in a manufacturing process A method of monitoring and controlling a manufacturing process is described. The value of a process variable is measured and treated. A measurement-based value is normalized using a normalization parameter associated with the process variable. Instances in which the nor... | 01/15/2009 |
| 20080319694 | Methods of monitoring acceptance criteria of vaccine manufacturing systems Methods of monitoring an acceptance criteria of vaccine manufacturing processes are disclosed herein. Consequently, the methods and systems provide a means to perform high-quality manufacturing on an integrated level whereby vaccine manufacturers can achieve data and pr... | 12/25/2008 |
| 20080288198 | Method and Apparatus for Generalized Performance Evaluation of Equipment Using Achievable Performance Derived from Statistics and Real-Time Data A statistical performance evaluation system for a thermodynamic device and process uses the achievable performance derived from statistics and real-time data for the device or process to evaluate the current performance of the device or process, and to adjust the operat... | 11/20/2008 |
| 20080275659 | APPARATUS AND METHOD FOR FULLY AUTOMATED CLOSED SYSTEM QUALITY CONTROL OF A SUBSTANCE The present invention provides an apparatus and method for automated quality control of a substance comprising a compartment wherein a substance is located, a monitoring device coupled to the compartment and configured to monitor at least one quality control parameter p... | 11/06/2008 |
| 20080249730 | System and Method For Determining Characteristics of a Moving Material by Using Microwaves The present invention is related to a system for determining characteristics of a material. The system comprises means for sending and measuring microwave radiation, whereby the microwave radiation is used for determining the characteristics of the material 90. T... | 10/09/2008 |
| 20080249729 | Systems and methods for real time hot mix asphalt production A computer-implemented system performs analysis on a construction material mixture includes accessing a server located on a wide-area-network; sending information collected from the material mixture to the server; applying one or more test methodologies to the collected... | 10/09/2008 |
| 20080215276 | IN-LINE OVERLAY MEASUREMENT USING CHARGED PARTICLE BEAM SYSTEM A method and system for controlling an overlay shift on an integrated circuit is disclosed. The method and system comprises utilizing a scanning electron microscope (SEM) to measure the overlay shift between a first mask and a second mask of the circuit after a second m... | 09/04/2008 |
| 20080215277 | Method for manufacturing filter canisters and tracking quality assurance An assembly line for manufacturing filter canisters is disclosed. The method for assembling filter canisters provides a unique serial number for each canister and a database that associates the component lot numbers, activated charcoal weight, and quality assurance test... | 09/04/2008 |
| 20080215275 | Overlay Inspection System A registration detection system realizes both substrate-by-substrate correction and highly accurate correction of an exposure process. Therefore, the registration detection system includes: the first detection apparatus installed on a pathway to a collection in a transp... | 09/04/2008 |
| 20080183411 | Method of Using a Wafer-Thickness-Dependant Profile Library A method for facilitating an ODP measurement of a semiconductor wafer. The method includes obtaining real time wafer characteristic data for a measurement site on said wafer and detecting a measured diffraction signal from a structure within the measurement site of the ... | 07/31/2008 |
| 20080162066 | INSPECTION SYSTEM AND APPARATUS A method and system for identifying a defect or contamination on a surface of a sample. The system operates by detecting changes in work function across a surface via both vCPD and nvCPD. It utilizes a non-vibrating contact potential difference (nvCPD) sensor for imagin... | 07/03/2008 |
| 20080125995 | ELECTROSTATIC DISCHARGE MONITORING AND MANUFACTURING PROCESS CONTROL SYSTEM There are disclosed systems, computer program products, and method for monitoring electrostatic discharge (ESD) fault conditions and controlling manufacturing processes on an assembly line. In an embodiment, each ESD monitored station in an assembly line is provided wit... | 05/29/2008 |
| 20080114559 | Quality control system, analyzer, and quality control method A quality control method using a plurality of analyzers and a control device connected to the analyzers via a network, the method comprising: (a) measuring quality control samples by the analyzers; (b) collecting a plurality of quality control data obtained by measuring... | 05/15/2008 |
| 20080087149 | APPARATUS FOR TESTING DEFECTS OF SHEET-SHAPED PRODUCT HAVING OPTICAL FILM, APPARATUS FOR PROCESSING TEST DATA THEREOF, APPARATUS FOR CUTTING THE SAME, AND PRODUCTION THEREOF A defect testing apparatus according to the present invention is a defect testing apparatus for testing defects of a sheet-shaped product having at least an optical film which is a member of an optical displaying apparatus, including: defect detecting means for detectin... | 04/17/2008 |
| 20080086278 | Optical Time Domain Reflectometer, And Optical Fiber Measuring Method And Optical Fiber Measuring System ... In order to easily and efficiently carry out various characteristic evaluations of optical fibers which have been laid down, a table file which is for carrying out association of optical fibers serving as measuring objects with measured data when the optical fibers have... | 04/10/2008 |
| 20080063212 | CIRCUIT TESTING APPARATUS The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a filtering circuit, an amplifying circuit, a comparing module, and a result-examining module. The filtering circuit filters an analog output sign... | 03/13/2008 |
| 20080059095 | Electronic Device Handling Apparatus and Defective Terminal Determination Method Standard positional information of respective terminals of an electronic device to be a standard is stored in advance, an image of terminals of an electronic device to be tested held by a conveyor apparatus is taken by an image pickup apparatus, obtaining positional inf... | 03/06/2008 |
| 20080021665 | FOCUSING METHOD AND APPARATUS Methods and apparatus for placing wafers axially in an optical inspection system. A “best worst” focus method includes a series of through-focus images of a test wafer acquired using full field of view of the inspection optics. The value of the worst quality in each... | 01/24/2008 |
| 20070282550 | FITTING MULTIDIMENSIONAL MEASUREMENT DATA TO TOLERANCE ZONES HAVING REGARD FOR THE UNCERTAINTY OF THE MEASUREMENTS Measurement data collected within a measurement frame of reference is fitted to geometric tolerance zones having regard for the uncertainties of the measurement. Geometric freedoms for fitting the measurement data are exploited to fit uncertainty zones associated with t... | 12/06/2007 |
| 20070276619 | CONTAINER INSPECTION SYSTEM The container inspection system operates globally at container handling facilities around the world and includes at least one transport apparatus located at a container handling facility having a spreader or other framework for connecting and handling cargo containers o... | 11/29/2007 |
