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3M employee and church chorister Art Fry needed something to temporarily mark pages in his hymnal. He was in luck because his colleague, Spencer Silver, accidentally developed a glue that was too weak for other purposes. After initially discouraging consumer response, Post-it Notes became a hit in 1979.
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| Application No. | Application Title | Issue Date |
| 20120053876 | AUTOMATED TIRE INSPECTIONS UTILIZING FLUORESCING NANO-PARTICLES Methods and systems are provided for monitoring a structural health of an object. A state of fluorescence of at least one particle associated with the object is identified, and a structural health parameter associated with the object is determined based on the identifie... | 03/01/2012 |
| 20120046826 | System and method for a vehicle scanner to automatically execute a test suite from a storage card Disclosed are systems and methods for a vehicle scanner to automatically execute applications from a removable storage card. The method includes detecting a presence of one or more executable diagnostic requests in removable data storage, and responsive to the detection... | 02/23/2012 |
| 20120035876 | SYSTEM FOR AUTOMATICALLY GATHERING BATTERY INFORMATION A method that includes affixing a radio frequency identification tag on a storage battery at a battery manufacturing plant. The method also includes storing battery manufacturing information into the radio frequency identification tag at the battery manufacturing plant.... | 02/09/2012 |
| 20110307095 | Method for Processing Flat Products and Corresponding Device A method for processing a plurality of flat printed products is provided. The method includes the steps of determining one of at least two quality statuses for each flat printed product and for each flat printed product, storing a first information representing the dete... | 12/15/2011 |
| 20110288803 | METHOD FOR INSPECTING QUALITY OF GLASS PLATE The present invention provides a quality inspection method of a glass plate, which can predict the shape of the glass plate on a four-point supporting type actual measurement inspection stand from the shape of the glass plate on a three-point supporting type universal a... | 11/24/2011 |
| 20110270555 | PROCESS VARIATION DETECTION APPARATUS AND PROCESS VARIATION DETECTION METHOD A process variation detection apparatus and a process variation detection method are provided. The process variation detection apparatus includes a process variation detector and a compensation signal generator. The process variation detector includes a first process va... | 11/03/2011 |
| 20110257919 | Method and apparatus for automated quality assurance in medical imaging The present invention relates to a computer-implemented quality assurance system, which includes the steps of retrieving quality assurance and supporting information from a database; receiving information on technical variables from monitoring of the patient, and on rad... | 10/20/2011 |
| 20110251811 | METHOD TO DETERMINE A QUALITY ACCEPTANCE CRITERION USING FORCE SIGNATURES A method is provided to determine a quality acceptance criterion using force signatures measured on a first and a second set of elements. The first set has no quality defect and the second set has a deliberate quality defect. Selection of an initial subset of time point... | 10/13/2011 |
| 20110231129 | IDENTIFICATION METHOD OF DATA POINT DISTRIBUTION AREA ON COORDINATE PLANE AND RECORDING MEDIUM A disclosed identification method of identifying a data point distribution area on a coordinate plane includes dividing an area on the coordinate plane into divided areas so that the divided areas radiate from a division center point; selecting, in each of the divided a... | 09/22/2011 |
| 20110224933 | METHOD AND SYSTEM FOR DATA COLLECTION AND ANALYSIS TO ASSIST IN FACILITATING REGULATORY APPROVAL OF A PRODUCT A method for providing a service to assist in obtaining regulatory approval of a product includes using a computing device programmed to search at least one database of literature and programmed to identify data relative to determining substantial equivalence for the pr... | 09/15/2011 |
| 20110224932 | MONITORING OF TIME-VARYING DEFECT CLASSIFICATION PERFORMANCE Systems and methods for monitoring time-varying classification performance are disclosed. A method may include, but is not limited to: receiving one or more signals indicative of one or more properties of one or more samples from one or more scanning inspection tools; d... | 09/15/2011 |
| 20110191049 | SYSTEM AND METHOD FOR VERIFYING MANUFACTURING ACCURACY In a method for verifying manufacturing accuracy, a point cloud of a workpiece is read. A first determined point is determined according to the first point of the point cloud and a second determined point is determined according to the final point of the point cloud. A ... | 08/04/2011 |
| 20110164653 | THERMAL INSPECTION SYSTEM AND METHOD INCORPORATING EXTERNAL FLOW A thermal inspection method is disclosed. The inspection method includes disposing a component in a wind tunnel configured to create a predetermined Mach number distribution for an external surface of the component. A gas is supplied at a known temperature T into the wi... | 07/07/2011 |
| 20110161029 | SURFACE MOUNT TECHNOLOGY MEASUREMENT SYSTEM AND METHOD In a surface mount technology (SMT) measurement system and method, the number of PCBs input to an SMT production line, the frequency of solder paste printing of the PCBs, the frequency of surface mount component placement of the PCBs, and a yield of the PCBs are calcula... | 06/30/2011 |
| 20110161030 | Method And Device For Monitoring Measurement Data In Semiconductor Process An embodiment of the present invention discloses a method for monitoring measurement data in a semiconductor process, which includes: updating measurement data of wafer performance parameters periodically from a real time system into an analysis database; retrieving fro... | 06/30/2011 |
| 20110153248 | OPHTHALMIC QUALITY METRIC SYSTEM A method for automatically measuring and quantitatively evaluating the optical quality of an ophthalmic lens, such as, for example, a contact lens. The method measures an ophthalmic lens with an optical phase measurement instrument to derive measured data. The method cr... | 06/23/2011 |
| 20110137597 | METHOD AND APPARATUS FOR ANALYSIS OF CONTINOUS DATA USING BINARY PARSING A method, apparatus, and a system for generating a binary mapping of wafer regions using measured value. A first measured value relating to processing a first workpiece is acquired. A second measured value relating to a second workpiece is acquired. At least a first reg... | 06/09/2011 |
| 20110135473 | SYSTEM, DEVICE, AND METHOD FOR MONITORING A WIND TURBINE USING DATA QUALITY INDICATORS A method for monitoring a wind turbine is provided. An operating parameter, including a parameter value and a data quality value, is created by a controller. The parameter value is based on a signal received by the controller from a source. The data quality value indica... | 06/09/2011 |
| 20110137595 | YIELD LOSS PREDICTION METHOD AND ASSOCIATED COMPUTER READABLE MEDIUM A yield loss prediction method includes: performing a plurality of types of defect inspections upon a plurality of batches of wafers which begin to be processed during different periods to generate defect inspection data, respectively; for a specific batch of wafers dif... | 06/09/2011 |
| 20110119009 | Measuring Apparatus Measuring apparatus for monitoring the position of the centre of mass of a semiconductor wafer is disclosed. The apparatus includes a wafer support (14) with a ledge for supporting an edge of a wafer (2) when it is lifted at a detection point by a probe (<... | 05/19/2011 |
| 20110079177 | SUBSTRATE PROCESSING SYSTEM, GROUP MANAGING APPARATUS, AND METHOD OF ANALYZING ABNORMAL STATE A maintenance engineer can analyze an abnormal state with less difficulty in a rapid and correct manner independent of his/her skill. A substrate processing system comprises: a substrate processing apparatus configured to operate according to a recipe defining a process... | 04/07/2011 |
| 20110082650 | METHOD FOR UTILIZING FABRICATION DEFECT OF AN ARTICLE A method for utilizing fabrication defect of an article comprises steps of obtaining a defect image from a fabrication process for fabricating the article, wherein the defect image comprises a defect and fabricated circuit patterns around the defect; obtaining coordinat... | 04/07/2011 |
| 20110043802 | BOX INSPECTOR A box inspector for detecting at an inspection station an unacceptable skew in, an item missing from, and/or an unacceptable gap in a box. The box inspector has pairs of aligned emitters and receivers generating a signal when an unacceptable skew is detected, at least t... | 02/24/2011 |
| 20110042006 | E-CHUCK WITH AUTOMATED CLAMPED FORCE ADJUSTMENT AND CALIBRATION The present disclosure describes a semiconductor manufacturing apparatus. The apparatus includes a processing chamber designed to perform a process to a wafer; an electrostatic chuck (E-chuck) configured in the processing chamber and designed to secure the wafer, wherei... | 02/24/2011 |
| 20110020616 | Method of Determining Overlay Error and a Device Manufacturing Method A method of determining an overlay error in a set of superimposed patterns. The patterns are divided into two and a first part of the pattern has a bias of d+s/2 between the first layer and second layer. A second part of the pattern has a bias of d−s/2 between the fir... | 01/27/2011 |
| 20110022524 | PRINTED CIRCUIT BOARD WITH PASSIVE RFID TRANSPONDER A process is provided for testing or operating an integrated circuit that includes providing a passive radio frequency identification transponder in electrical communication with the integrated circuit. The integrated circuit is associated with a printed circuit board o... | 01/27/2011 |
| 20110015887 | METHOD FOR MANUFACTURING AND TESTING THE FUNCTIONALITY IN MANUFACTURING A method is proposed for manufacturing and testing of complex products, in particular motor vehicles in series production, wherein all the data for the individual manufacturing stations in the manufacturing line is stored in a central computer. In this case, different m... | 01/20/2011 |
| 20100332172 | Secure test-for-yield chip diagnostics management system and method A chip diagnostics management system includes secure design information that define production features of integrated circuit devices and are accessible according to selected levels of access privilege. A database of device defect information includes information of def... | 12/30/2010 |
| 20100268501 | Method for assessing data worth for analyzing yield rate A method for assessing data worth for analyzing yield rate includes: getting measured data with data points that corresponds to control variables of semiconductor manufacturing; transforming the data points into a distance matrix with matrix distances corresponding to d... | 10/21/2010 |
| 20100256796 | DEFECT DETECTION METHOD OF DISPLAY DEVICE AND DEFECT DETECTION APPARATUS OF DISPLAY DEVICE A defect detecting method of a display device includes a defect counting process that measuring a feature amount for each partial region of a display device (P32), and counting regions which is determined as a defective portion based on the measured feature amoun... | 10/07/2010 |
| 20100233830 | METHOD FOR MONITORING FABRICATION PARAMETER A method for monitoring fabrication parameters comprises steps of: obtaining a normal parameter variance curve and a comparing parameter variance curve; defining a plurality of normal parameter points on the normal parameter variance curve; defining a plurality of compa... | 09/16/2010 |
| 20100233329 | RECORDING OF POSITION-SPECIFIC WAVELENGTH ABSORPTION SPECTRA The invention relates to recording of position-specific optical measurements of substances such as foodstuff, building materials, combustion products etc. The invention provides online, in-situ recording of wavelength absorption spectra in substances, performed without ... | 09/16/2010 |
| 20100228510 | Quality Information Control Analysis System A quality information collection analysis system includes at least one assembly installation having at least one assembly machine which assembles a component, and outputs an assembly time of an assembly as a production time, at least one inspection machine which inspect... | 09/09/2010 |
| 20100220316 | METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic or monochromatic illumination source. The source forms on the thin film an illuminated line. The light collected ... | 09/02/2010 |
| 20100197050 | METHOD OF FORMING SEMICONDUCTOR THIN FILM AND INSPECTION DEVICE OF SEMICONDUCTOR THIN FILM A method of forming a semiconductor thin film includes the steps of: forming an amorphous semiconductor thin film on a substrate; partially forming a crystalline semiconductor thin film for each element region by irradiating laser light to the amorphous semiconductor th... | 08/05/2010 |
| 20100175965 | PALLET MONITORING SYSTEM AND MONITORING METHOD According to one embodiment, a pallet monitoring system for monitoring pallets sequentially conveyed to stations provided along a conveyor path, the system includes: a monitor, connected to the stations. The monitor includes: a defect information collector configured to... | 07/15/2010 |
| 20100145646 | Predicting Wafer Failure Using Learned Probability Techniques for estimating a quality of one or more wafers are presented. One or more first wafers comprising one or more first dies are tested. A probability of wafer failure is determined in accordance with one or more first test measurements of the one or more first d... | 06/10/2010 |
| 20100131221 | METHOD FOR DETERMINING QUALITY PARAMETER AND THE ELECTRONIC APPARATUS USING THE SAME The invention provides a method for determining quality parameter and the electronic apparatus using the same. The electronic apparatus includes a central processing unit (CPU) and a memory module. The method includes the following steps: performing a CPU overclocking p... | 05/27/2010 |
| 20100118314 | DETERMINING TRACK ORIGIN Apparatus is disclosed for determining the track of origin of a cigarette manufactured in a cigarette making machine having a plurality of tracks. The cigarette making machine (60) is arranged such that the circumferential position of the tipping paper seam and t... | 05/13/2010 |
| 20100121598 | CAPTURING SYSTEM INTERACTIONS A computer-implemented method for capturing interactions in a system is disclosed. The method includes receiving a selection of a first component of the system and receiving a selection of a second component of the system. The method further includes receiving a selecti... | 05/13/2010 |
