Class 702/126 - Signal conversion

Subclass of Class 702 - Data processing: measuring, calibrating, or testing
Definition: Subject matter comprising means for converting an input
No. of applications: 4
Last issue date: 05/01/2008

Application No.	Application Title	Issue Date
20080103719	METHOD OF GENERATING TEST CLOCK SIGNAL AND TEST CLOCK SIGNAL GENERATOR FOR TESTING SEMICONDUCTOR DEVICES A system and method of generating a test clock signal for scan testing of a main circuit in a semiconductor device includes receiving an external clock signal and a control signal and generating a gated clock signal by gating an internal clock signal based on the contro...	05/01/2008
20060136166	Integrated transducer data system An improved sensor module assembly to be used in an array for measuring the distribution of forces, displacements, or temperatures or other physically measurable quantity of an article being tested or measured. A programmable digital processor is installed at each senso...	06/22/2006
20060031037	Continuous digital background calibration in pipelined ADC architecture Disclosed are new methods and systems for achieving calibration in a pipelined ADC system. The methods and systems may be used to provide continuous digital background calibration in a pipelined ADC. Component mismatch error from each DAC in the pipeline is tabulated to...	02/09/2006
20050107974	Method for testing displays This invention relates to a method for testing displays. A user interface is used to provide the user with options for different display modes, different power management modes and mode delay times to be selected. Tests of the display frequency and the power management ...	05/19/2005

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