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Class 702/108 - TESTING SYSTEM


Subclass of Class 702 - Data processing: measuring, calibrating, or testing
Definition: Subject matter wherein the data processing or calculating
No. of applications: 259
Last issue date: 05/24/2012


1              
Application No.Application TitleIssue Date
20120130670System and Method for Computer-Controlled Execution of at Least One Test in a Scanning Microscope
The invention relates to a method and a system for central computer controlled execution of at least one test run in a scanning microscope, particularly a confocal microscope, wherein at least one first software module of an application software is tested. The invention...
05/24/2012
20120109567SYSTEMS AND METHODS FOR ACQUIRING AND MANAGING SENSOR DATA RELATED TO DISSOLUTION TESTING APPARATUS
In acquiring and managing measurement data relating to operating parameters of a dissolution tester, operating parameters are measured by operating one or more sensors. The measured operating parameters are transmitted from the sensors to a user computing device. It is ...
05/03/2012
20120084040Systems And Methods Of Channel Identification Machines For Channels With Asynchronous Sampling
Method for identification of at least one parameter of a sampling system includes transmitting at least one input signal to at least one channel of the sampling system; measuring at least one output signal of the sampling system in response to sampling of the at least o...
04/05/2012
20120072158TEST METHOD AND SYSTEM FOR TESTING IMAGE PROCESSOR OF ELECTRONIC DEVICE
A test system for testing an image processor of an electronic device by controlling the image processor to playback a test image divided into several pixel areas is provided, therein, each pixel area includes several rows of pixels, and pixel values of the rows of pixel...
03/22/2012
20120050728IDENTIFYING DEFECTS
Identifying systematic defects in wafer processing including performing defect inspection of a plurality of wafers, identifying defects in each of the plurality of wafers as not being associated with a trivial and/or known root cause, determining a physical location on ...
03/01/2012
20120029858DYNAMIC CARE AREAS
Various embodiments for determining dynamic care areas are provided....
02/02/2012
20120016617METHOD FOR TESTING ELECTRONIC DEVICE
A method for testing an electronic device is implemented with a host computer. The host computer detects a test status of the electronic device. The host computer stores a test order table that indicates the test status and test order corresponding to the test status. T...
01/19/2012
20120010843IN-PLACE MANAGEMENT OF SEMICONDUCTOR EQUIPMENT RECIPES
Systems and methods for managing optical inspection target components are disclosed. A method may include, but is not limited to: storing at least one external recipe component at an inspection tool node; associating at least one proxy component with the at least one ex...
01/12/2012
20110317900ATTENUATION CORRECTION OF MR COILS IN A HYBRID PET/MR SYSTEM
Nuclear image data generated by a multimodal imaging device, such as a combined position emission tomography (PET)/magnetic resonance (MR) scanner (12, 14), is attenuation-corrected with a combined patient-specific attenuation correction (AC) map and an AC map te...
12/29/2011
20110320160INTEGRATED CIRCUIT, SIMULATION APPARATUS AND SIMULATION METHOD
The disclosed device performs a control of generating a test pattern for the delay test of LSI. The input pattern control circuit counts a cycle number of an input pattern supplied to a test object circuit, and stops supply of the input pattern to the test object circui...
12/29/2011
20110301906LIGHTWEIGHT AUDIO SYSTEM FOR AUTOMOTIVE APPLICATIONS AND METHOD
A lightweight radio/CD player for vehicular application is virtually “fastenerless” and includes a case and frontal interface formed of polymer based material that is molded to provide details to accept audio devices such as playback mechanisms (if desired) and radi...
12/08/2011
20110295542Method and Device for Identifying a Faulty Algorithm
In a method and to a device for identifying an erroneous algorithm (A), data output by a1) of the algorithm (A) to be tested and/or a2) a reference algorithm (B) are categorized, and the reference frequency (R(A), R(B)) at which data of at least one category (Kx) occur ...
12/01/2011
20110282615TEST MODULE, TEST APPARATUS AND TEST METHOD
A test module comprising a compression information storage section that stores compression information associating pattern sequences, pattern sequence identification information, and repetition information with each other; a basic pattern storage section that stores, as...
11/17/2011
20110270566SCHEDULING DEVICE, SCHEDULING METHOD, SCHEDULING PROGRAM, STORAGE MEDIUM, AND MASS SPECTROMETRY SYSTEM
The present invention provides a scheduling device which can carry out scheduling of process execution periods of time, included in plural pieces of processing target data, respectively. The scheduling device sorts out plural pieces of substance data by looking up a ret...
11/03/2011
20110270565TEST FIXTURE AND METHOD FOR AUTOMATICALLY TURNING ON COMPUTERS
A test fixture includes a first RS-232 connector and a second RS-232 connector. The data terminal ready (DTR) pin of the first RS-232 connector is connected to the DTR pin of the second RS-232 connector, and the clear to send (CTS) pin of the first RS-232 connector is c...
11/03/2011
20110254580METHOD FOR AN IMPROVED CHECKING OF REPEATABILITY AND REPRODUCIBILITY OF A MEASURING CHAIN FOR SEMICONDUCTOR DEVICE TESTING
A method provides an improved checking of repeatability and reproducibility of a measuring chain, in particular for quality control by semiconductor device testing. The method includes testing steps provided for multiple and different devices to be subjected to measurem...
10/20/2011
20110257903ROTATING ARRAY PROBE SYSTEM FOR NON-DESTRUCTIVE TESTING
A device is disclosed for performing non-destructive inspection and testing (NDT/NDI) of an elongated test object, wherein the inspection system includes: a test object conveyor for conveying the test object along a longitudinal conveyance path; a probe assembly includi...
10/20/2011
20110218754METHOD FOR SUPPORTING ANALYTICAL WORK OF SOLDER PRINTING STATE AND SOLDER PRINTING INSPECTION MACHINE
In a solder printing inspection machine, an identification code and an inspection time of an inspection target board are accumulated in a memory. The accumulated data, whose identification code is matched with that of the current inspection target board, is searched whi...
09/08/2011
20110208464REPORT GENERATION SYSTEM AND METHOD
In a report generation system and method, one or more test parameters, a measured characteristic, and value ranges of the measured characteristic are set. Values of the one or more test parameters and the measured characteristic are retrieved from measurement data. The ...
08/25/2011
20110208465TEST APPARATUS AND INFORMATION PROCESSING SYSTEM
Provided is a test apparatus that tests a device under test, comprising a test unit that sends and receives signals to and from the device under test; a control apparatus that controls the test unit; and a relay apparatus that relays between the control apparatus and th...
08/25/2011
20110202301MIDDLEWARE TEST COMPONENT OPERATING METHOD AND DEVICE
The present invention relates to middleware test component operating method and device. It is possible to improve the system capacity and the efficiency of an SDR (Software Defined Radio) system through the reconfiguration of the system according to a user's request by ...
08/18/2011
20110196638TEST APPARATUS, INFORMATION PROCESSING SYSTEM AND DATA TRANSFER METHOD
Provided is a test apparatus that tests a device under test, comprising a test unit that sends and receives signals to and from the device under test; a control apparatus that controls the test unit; and a relay apparatus that relays between the control apparatus and th...
08/11/2011
20110194075METHOD AND APPARATUS FOR VISUAL FIELD MONITORING
Embodiments provide methods and systems for the modeling and analysis of visual fields. Methods for global and regional measurement of visual sensitivity and quantification of field loss are provided in accordance with various embodiments. Further embodiments provide sy...
08/11/2011
20110196639COMPUTER-IMPLEMENTED METHODS, COMPUTER-READABLE MEDIA, AND SYSTEMS FOR DETERMINING ONE OR MORE CHARACTERISTICS OF A WAFER
Computer-implemented methods, computer-readable media, and systems for determining one or more characteristics of a wafer are provided....
08/11/2011
20110196640TEST APPARATUS AND TEST METHOD
Provided is a test apparatus that tests a device under test having a plurality of output terminals. The test apparatus comprises an executing section that executes a test command sequence for testing the device under test; a storage section that stores a plurality of pi...
08/11/2011
20110156742Chip Testing Circuit
A chip testing circuit is disclosed. The chip testing circuit uses a judging circuit to switch the connection of the data compressing circuit between data compressing base units which compresses 4 XIOs, so as to obtain testing data by one single interface circuit and to...
06/30/2011
20110161039METHOD AND SYSTEM OF TESTING ELECTRONIC DEVICE
A method of testing an electronic device is disclosed. The electronic device includes an embedded controller. The method includes storing a type information of the embedded controller and transmitting the type information to an application module through a data module. ...
06/30/2011
20110125448THREE-DIMENSIONAL APPLICATION PROGRAM FRAMEWORK STRUCTURE AND A METHOD FOR IMPLEMENTING AN APPLICATION PROGRAM BASED ON THE SAME, AND AN AUTOMATIC TESTING SYSTEM BASED ON A THREE-DIMENSIONAL APPLICATION SOFTWARE FRAMEWORK AND A METHOD THEREFOR
A three-dimensional application program framework structure; a method for implementing an application program based on the same; and an automatic testing system based on a three-dimensional application software framework and a method therefor. The three-dimensional appl...
05/26/2011
20110112788Integrated Systems Testing
A hard disk drive system comprises an interface that receives test configuration data, that transmits test result data, and that transmits and receives application data. A system on chip (SOC) includes integrated system test (IST) modules. A memory module communicates w...
05/12/2011
20110077892System, Method and Computer Program for Remotely Testing System Components Over A Network
The invention is a turn-key, modular platform, including software and hardware, for testing physical system components such as motors remotely over the Internet. The system allows remote customers to test multiple physical system components under the specific loading co...
03/31/2011
20110054824SYSTEM AND METHOD FOR TESTING AN ELECTRONIC DEVICE
There is provided a system for testing an electronic device in a test arrangement. The test arrangement includes a data interface and a user interface that is configured to output user outputs comprising image and/or audio information. The exemplary system comprises an ...
03/03/2011
20110054823SYSTEM, CONTROLLER AND METHOD FOR SYNCHRONIZED CAPTURE AND SYNCHRONIZED PLAYBACK OF DATA
Provided are a method, a test system and a microcontroller (40), for use in a test system for testing vehicles and automotive components. Control signals that are generated by active components within a vehicle during a test drive are sampled and played back to a...
03/03/2011
20110046910Method and System for Sample Testing
The invention provides a system and method for testing samples and, in one embodiment, a system for directing and coordinating the operations of hardware components and performance of tasks of laboratory personnel. The system includes a user interface for receiving requ...
02/24/2011
20110046911HOUSING OR HOUSING PART FOR SANITARY PRODUCT DISPENSER
A housing or housing part (2) for a sanitary product dispenser that can be fastened to a wall, comprising: A) a front (3) comprising a monitor (4), wherein B) the housing part (2) can be detachably fastened to a sanitary product dispenser, C)...
02/24/2011
20110040515Apparatus for testing a conducted energy weapon
Apparatus for testing a conducted energy weapon includes analyzer means to produce characteristic signals representative of characteristics of electrical current pulses delivered by the weapon into a resistive load when the weapon is discharged. Risk estimation means re...
02/17/2011
20110004433SYSTEM AND METHOD FOR TESTING FREQUENCY RANGE
A system is used to test whether a device works normally in a preset frequency range. The system presets a frequency range, and controls a frequency generator to send a test frequency signal to the device according to each of a predetermined number of frequencies of the...
01/06/2011
20100324854MEMORY-DAUGHTER-CARD-TESTING METHOD AND APPARATUS
A memory daughter card (MDC) is described, having a very high-speed serial interface and an on-card MDC test engine that allows one MDC to be directly connected to another MDC for testing purposes. In some embodiments, a control interface allows the test engine to be pr...
12/23/2010
20100318312SIMPLIFYING DETERMINATION OF WHETHER A DISPLAY CONTROLLER PROVIDES VIDEO OUTPUT WITH DESIRED QUALITY
An aspect of the present invention enables a tester (person) to specify multiple test cases of interest to test a display controller, and executes the test cases in a batch mode to cause the display controller to generate corresponding video output. The tester is provid...
12/16/2010
20100280787FEEDBACK CONTROLLER PARAMETER GENERATION WITH STABILITY MONITORING
Stability of a control system for a materials testing system using specified filter parameters is confirmed by inputting to the control system a test signal having a predetermined waveform, automatically monitoring the output of the materials testing system, and automat...
11/04/2010
20100268505METHOD AND APPARATUS FOR CONTROLLING IMAGE DATA ACQUISITION USING A MEASUREMENT PROGRAM PACKAGE
In a method to control the image acquisition and/or image evaluation at an image acquisition device, a measurement program of a measurement program package has at least one protocol step for measurement data acquisition according to a measurement protocol is used to ope...
10/21/2010
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